DE2646580A1 - Material analysis photometer with moving filter system - uses filters to compensate for dirty optics or absorbent foreign substances in sample - Google Patents
Material analysis photometer with moving filter system - uses filters to compensate for dirty optics or absorbent foreign substances in sampleInfo
- Publication number
- DE2646580A1 DE2646580A1 DE19762646580 DE2646580A DE2646580A1 DE 2646580 A1 DE2646580 A1 DE 2646580A1 DE 19762646580 DE19762646580 DE 19762646580 DE 2646580 A DE2646580 A DE 2646580A DE 2646580 A1 DE2646580 A1 DE 2646580A1
- Authority
- DE
- Germany
- Prior art keywords
- radiation
- photometer
- sample
- filter system
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000000126 substance Substances 0.000 title claims abstract description 14
- 238000004458 analytical method Methods 0.000 title claims abstract description 5
- 239000000463 material Substances 0.000 title claims abstract description 5
- 230000002745 absorbent Effects 0.000 title description 2
- 239000002250 absorbent Substances 0.000 title description 2
- 230000003595 spectral effect Effects 0.000 claims abstract description 11
- 238000010521 absorption reaction Methods 0.000 claims abstract description 7
- 230000005855 radiation Effects 0.000 claims description 19
- 238000011156 evaluation Methods 0.000 claims description 9
- 238000004868 gas analysis Methods 0.000 claims description 3
- 230000000763 evoking effect Effects 0.000 claims 1
- 230000002238 attenuated effect Effects 0.000 abstract 1
- 239000007788 liquid Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
- G01N21/3518—Devices using gas filter correlation techniques; Devices using gas pressure modulation techniques
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Photometer für die Stoffanalyse Photometer for substance analysis
Die Erfindung bezieht sich auf ein Photometer für die Stoffanalyse, bei dem ein von einer Strahlungsquelle ausgehendes, durch eine bewegliche Filtereinrichtung periodisch beeinflußtes Strahlenbündel die Stoffprobe durchdringt, dabei entsprechend der Konzentration der zu messenden Stoffkomponente geschwächt wird und dann einen Strahlungsempfänger beaufschlagt, an den eine elektrische Auswerteschaltung angeschlossen ist, deren Ausgangssignal ein Maß für die Konzentration der in der Stoffprobe zu messenden Stoffkomponente ist.The invention relates to a photometer for substance analysis, in which one emanating from a radiation source through a movable filter device periodically influenced bundle of rays penetrates the material sample, accordingly the concentration of the substance component to be measured is weakened and then one Radiation receiver acted upon, to which an electrical evaluation circuit is connected whose output signal is a measure of the concentration of the substance in the sample measuring substance component is.
Es ist die Aufgabe der Erfindung, ein derartiges, z. B. in dem US-Patent 253 4657 beschriebenes Photometer so abzuwandeln, daß das Meßergebnis durch Störeinflüsse, wie Verschmutzung der strahlungsdurchlässigen Bauteile oder durch in der Probe enthaltene strahlungsabsorbierende Störkomponenten, nicht wesentlich beeinträchtigt wird.It is the object of the invention to provide such, e.g. B. in the U.S. patent 253 4657 to modify the photometer described in such a way that the measurement result is caused by interference, such as contamination of the radiation-permeable components or those contained in the sample radiation-absorbing interfering components, is not significantly impaired.
Diese Aufgabe wird durch die in den Ansprüchen gekennzeichneten Mittel gelöst.This object is achieved by the means characterized in the claims solved.
Im folgenden werden Aufbau und Wirkungsweise eines Ausführungsbeispiels des erfindungsgemäßen Photometers für die Gasanalyse anhand der Zeichnung näher erläutert.The structure and mode of operation of an exemplary embodiment are described below of the photometer according to the invention for gas analysis with reference to the drawing explained.
Ein von der Strahlungsquelle 1 mit konstanter Intensität ausgehendes Strahlenbündel wird durch ein Filter 2 so beeinflußt, das die aus dem Filter austretende Strahlung nur Strahlungsanteile entsprechend der Absorptionscharakteristik des zu messenden Gasbestandteils in dem Probengas aufweist. Die gefilterte Strahlung wird, bevor sie in einen mit strahlungsdurchlässigen Fenstern 3 und 4 versehenen Behälter 5 gelangt, der mit dem Probengas beschickt ist, durch eine nach dem Filter 2 im Strahlenweg angeordnete, von einem Motor 6 angetriebene Filterscheibe 7 moduliert. Dazu weist die Filterscheibe zwei Filterküvetten 8 und 9 auf, die abwechselnd in den Strahlenweg eintreten. Eine der Filterküvetten ist mit dem zu messenden Gasbestandteil gefüllt und absorbiert ebenso wie der zu messende Gabestandteil im Probengas einen eil der durch das Filter 2 ausgeblendeten Strahlung der Strahlungsquelle 1. Die andere Küvette ist evakuiert oder mit nicht absorbierendem Gas gefüllt, so daß die gefilterte Strahlung nicht beeinflußt wird. An die Stelle dieser Küvette kann auch eine Öffnung in der Filterscheibe treten.One emanating from the radiation source 1 with constant intensity The beam is influenced by a filter 2 so that the emerging from the filter Radiation only radiation components corresponding to the absorption characteristics of the to having measuring gas component in the sample gas. The filtered radiation is before they are in a container provided with radiation-permeable windows 3 and 4 5 arrives, which is charged with the sample gas, through a after the filter 2 in The filter disk 7, which is arranged in the beam path and driven by a motor 6, is modulated. For this purpose, the filter disk has two filter cuvettes 8 and 9, which alternate in enter the beam path. One of the filter cuvettes is with the gas component to be measured filled and absorbed just like the gas component to be measured in the sample gas part of the radiation of the radiation source 1 masked out by the filter 2 other cuvette is evacuated or filled with non-absorbing gas so that the filtered radiation is not affected. In place of this cuvette can also step through an opening in the filter disc.
Die aus dem Gasbehälter 3 austretende Strahlung fällt auf einen photoelektrischen Strahlungsdetektor 10 dessen elektrisches Ausgangssignal einer Auswerteschaltung 11 zugeführt wird. Die Auswerteschaltung bildet den Quotienten der beiden durch die Filterscheibe sich ergebenden Komponenten des Detektorsignals als Maß für die Konzentration des zu messenden Gasbestandteils im Probengas.The radiation emerging from the gas container 3 falls on a photoelectric one Radiation detector 10 whose electrical output signal one Evaluation circuit 11 is supplied. The evaluation circuit forms the quotient of the two components of the detector signal resulting from the filter disc as a measure of the concentration of the gas component to be measured in the sample gas.
Die Auswerteeinrichtung umfaßt eine Schalteinrichtung zur Trennung der beiden Signalkomponenten, Speicher für die Signalkomponenten und eine Recheneinheit. Für die Schalteinrichtung wird ein Steuersignal benötigt, das mit Hilfe einer Lichtquelle 12, eines Schlitzes 13 in der Filterscheibe und einer zugeordneten Photozelle 14 gewonnen und über eine Leitung 15 der Schaltvorrichtung in der Auswerteeinrichtung zugeführt wird. Eine derartige, hier kurz angedeutete Auswertevorrichtung ist für Photometer Stand der Technik und z. B. bei dem in der deutschen Offenlegungsschrift 24 07 133 beschriebenen Photometer angewendet.The evaluation device comprises a switching device for separation of the two signal components, memory for the signal components and a computing unit. A control signal is required for the switching device, which is generated with the aid of a light source 12, a slot 13 in the filter disk and an associated photocell 14 obtained and via a line 15 of the switching device in the evaluation device is fed. Such an evaluation device, briefly indicated here, is for State of the art photometer and z. B. in the case of the German Offenlegungsschrift 24 07 133 described photometer is used.
An die Auswerteschaltung ist ein Meßgerät 16 angeschlossen, zur Anzeige der Konzentration des zu messenden Gasbestandteils.A measuring device 16 is connected to the evaluation circuit for display purposes the concentration of the gas component to be measured.
Die Arbeitsweise des erfindungsgemäßen Photometers beruht auf dem Sachverhalt, daß das Lambert-Beer'sche Gesetz, das die Schwächung einer Strahlung, die ein absorbierendes Medium durchläuft in Abhängigkeit von der Konzentration des Mediums beschreibt, nicht streng erfüllt ist. Wäre das Gesetz streng erfüllt, so bliebe der Quotient der beiden Signalkomponenten des Strahlungsdetektors bei Konzentrationsänderungen des zu messenden Gasbestandteils konstant. Tatsächlich ergibt sich aber eine Änderung in Abhängigkeit von der Konzentration und damit die Möglichkeit einer Messung, mit der bereits eingangs erwähnten erhöhten Unempfindlichkeit gegenüber Störeinflüssen.The operation of the photometer according to the invention is based on the Fact that the Lambert-Beer law, which is the attenuation of a radiation, which an absorbent medium passes through depending on the concentration of the Medium describes, is not strictly fulfilled. If the law were strictly complied with, so the quotient of the two signal components of the radiation detector would remain with changes in concentration of the to be measured Constituent gas constant. Indeed it turns out but a change depending on the concentration and thus the possibility a measurement with the increased insensitivity to that already mentioned at the beginning Interference.
Die Erfindung ist nicht auf Photometer für die Gasanalyse beschränkt, sondern auch für Flüssigkeitsphotometer geeignet, wenn die Probenflüssigkeit spektrale Absorptionseigenschaften aufweist. Anstelle von nichtselektiven Strahlungsquellen können grundsätzlich auch spektrale Strahler z. B. gasgefüllte Hohlkatodenlampen benutzt werden, falls notwendig mit Filtern zur Ausblendung einer geeigneten monochromatischen Strahlung oder einzelner Spektrallinien, entsprechend den Absorptionseigenschaften des zu messenden Bestandteils.The invention is not limited to photometers for gas analysis, but also suitable for liquid photometers when the sample liquid is spectral Has absorption properties. Instead of non-selective radiation sources can basically also spectral emitters z. B. gas-filled hollow cathode lamps be used, if necessary with filters to hide a suitable monochromatic Radiation or individual spectral lines, according to the absorption properties of the component to be measured.
L e e r s e i t eL e r s e i t e
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19762646580 DE2646580A1 (en) | 1976-10-15 | 1976-10-15 | Material analysis photometer with moving filter system - uses filters to compensate for dirty optics or absorbent foreign substances in sample |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19762646580 DE2646580A1 (en) | 1976-10-15 | 1976-10-15 | Material analysis photometer with moving filter system - uses filters to compensate for dirty optics or absorbent foreign substances in sample |
Publications (1)
Publication Number | Publication Date |
---|---|
DE2646580A1 true DE2646580A1 (en) | 1978-04-20 |
Family
ID=5990534
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19762646580 Withdrawn DE2646580A1 (en) | 1976-10-15 | 1976-10-15 | Material analysis photometer with moving filter system - uses filters to compensate for dirty optics or absorbent foreign substances in sample |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE2646580A1 (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3029945A1 (en) * | 1980-08-07 | 1982-02-18 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | ARRANGEMENT FOR DETERMINING THE CONCENTRATION OF A SUBSTANCE IN A SUBSTANCE MIXTURE |
EP0196428A1 (en) * | 1985-03-04 | 1986-10-08 | Hartmann & Braun Aktiengesellschaft | Photometer |
EP0349839A2 (en) * | 1988-07-07 | 1990-01-10 | Bodenseewerk Perkin-Elmer Gmbh | Multicomponent photometer |
WO1993016371A1 (en) * | 1992-02-07 | 1993-08-19 | Alan John Hayes | Fluid monitoring |
EP0703444A1 (en) * | 1994-09-26 | 1996-03-27 | Marquette Electronics, Inc., | Infrared gas analyzer and method |
DE29800213U1 (en) | 1998-01-09 | 1998-03-05 | Jeske, Uwe, 73635 Rudersberg | Device for calibration and calibration control for photometer process measurement technology |
-
1976
- 1976-10-15 DE DE19762646580 patent/DE2646580A1/en not_active Withdrawn
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3029945A1 (en) * | 1980-08-07 | 1982-02-18 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | ARRANGEMENT FOR DETERMINING THE CONCENTRATION OF A SUBSTANCE IN A SUBSTANCE MIXTURE |
EP0196428A1 (en) * | 1985-03-04 | 1986-10-08 | Hartmann & Braun Aktiengesellschaft | Photometer |
EP0349839A2 (en) * | 1988-07-07 | 1990-01-10 | Bodenseewerk Perkin-Elmer Gmbh | Multicomponent photometer |
EP0349839A3 (en) * | 1988-07-07 | 1991-04-03 | Bodenseewerk Perkin-Elmer Gmbh | Multicomponent photometer |
WO1993016371A1 (en) * | 1992-02-07 | 1993-08-19 | Alan John Hayes | Fluid monitoring |
EP0703444A1 (en) * | 1994-09-26 | 1996-03-27 | Marquette Electronics, Inc., | Infrared gas analyzer and method |
DE29800213U1 (en) | 1998-01-09 | 1998-03-05 | Jeske, Uwe, 73635 Rudersberg | Device for calibration and calibration control for photometer process measurement technology |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE2553565C3 (en) | Device for determining the nitrogen oxide concentration in a gas mixture | |
EP1091205A2 (en) | Spectrophotometric and nephelometric detecting system | |
DE69012088T2 (en) | OPTICAL READING SYSTEM. | |
DE2851455A1 (en) | COMBINED GONIOPHOTOMETER AND REFLECTOMETER (GONIOREFLECTOMETER) FOR THE DIFFERENTIATED QUANTITATIVE EVALUATION OF THE GLOSS CAPACITY OF SURFACES, IN PARTICULAR ORGANIC COATINGS | |
DE2364184B2 (en) | METHOD AND DEVICE FOR MEASURING THE FLUID LEVEL OF FLUIDS | |
DE2646580A1 (en) | Material analysis photometer with moving filter system - uses filters to compensate for dirty optics or absorbent foreign substances in sample | |
DE3541165A1 (en) | DEVICE FOR CONTINUOUSLY DETERMINING CONCENTRATION CHANGES IN MIXTURES | |
DE19509822A1 (en) | Optical oil conc. measuring device | |
DE2635171A1 (en) | Photoelectric gas analyser with tunable laser radiation source - has radiation passing through test gas sample to detector feeding logarithmic signal processing circuit | |
DE3238179C2 (en) | ||
DE2245734A1 (en) | DEVICE FOR DETECTING SURFACE DEFECTS | |
DE1598021A1 (en) | Device for indicating gas concentrations | |
DE4403763A1 (en) | Infra red gas absorption for rapid, sensitive and accurate, quantified analysis | |
EP0087077A2 (en) | Measuring device for optical gas analysis | |
EP0014375A2 (en) | Double-beam flicker colorimeter | |
US3153722A (en) | Apparatus for determining the quantity of contaminant in a substance | |
EP0555508B1 (en) | Method and device for simultaneous determination of concentrations of molecular compounds in gases and liquids | |
DE2840867A1 (en) | Gas measuring and test device - has pipe through which gas flows, and system of optical fibres applying light to it and collecting reflected light | |
DE3782928T2 (en) | ATOMIC ABSORPTION SPECTRAL PHOTOMETER. | |
DE3318574A1 (en) | METHOD FOR CARRYING OUT CHEMICAL ANALYZES | |
DE2537089A1 (en) | Colour location of colour sample measuring device - is by brightness method and has three photoelectric receivers with colour filters | |
EP3683566B1 (en) | Device and method for detecting properties of a fluid to be examined | |
DE2032195C3 (en) | Multi-channel colorimeters, especially flow-through colorimeters | |
DE2222202C3 (en) | Photometer | |
EP0020801A1 (en) | Double-beam infrared spectrometer |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8141 | Disposal/no request for examination |