DE254517C - - Google Patents

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Publication number
DE254517C
DE254517C DENDAT254517D DE254517DA DE254517C DE 254517 C DE254517 C DE 254517C DE NDAT254517 D DENDAT254517 D DE NDAT254517D DE 254517D A DE254517D A DE 254517DA DE 254517 C DE254517 C DE 254517C
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DE
Germany
Prior art keywords
ground
changing
reflecting surface
partly
interference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DENDAT254517D
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German (de)
Publication of DE254517C publication Critical patent/DE254517C/de
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V3/00Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
    • G01V3/12Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with electromagnetic waves

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Remote Sensing (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • Environmental & Geological Engineering (AREA)
  • Geology (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Radar Systems Or Details Thereof (AREA)

Description

Δ — —Δ - -

und die Tiefe h and the depth h

h — \ j/ Δ2 + 2 α Δ h - \ j / Δ 2 + 2 α Δ

wo α den horizontalen Abstand der beiden Stationen bedeutet und die reflektierende Fläche der Einfachheit halber parallel der horizontalen Oberfläche angenommen ist, was bei Grundwasser annähernd erfüllt ist.where α means the horizontal distance between the two stations and, for the sake of simplicity, the reflecting surface is assumed to be parallel to the horizontal surface, which is approximately fulfilled for groundwater.

Statt die Wellenlänge zu verändern, könnte man auch den Abstand der Stationen ändern. Dies würde aber die Beobachtung erschweren und außerdem leicht zu Täuschungen 35 .·, führen, da hierbei die Strahlenwege stetig in andere Gebiete verlegt werden würden. .Instead of changing the wavelength, you could also change the distance between the stations. However, this would make observation more difficult and also easily lead to deceptions 35. lead, since the radiation paths would be constantly relocated to other areas. .

Patent-A ν Spruch:Patent-A ν saying:

Verfahren zum Nachweis unterirdischeiv.^^ J? Erzlager und Grundwasserspiegel mittels elektrischer Wellen, dadurch gekennzeich-' net, daß an einer horizontal über dem Erdboden ausgespannten Empfangsantenne die Interfeienz der Wellen beobachtet wird, welche von einer zu der Empfangsantenne parallel verlaufenden Sendeantenne ausgesandt und teils direkt, teils nach Reflexion an dem unterirdischen Erzlager (oder Grundwasserspiegel) von der Empfangsantenne aufgenommen werden.Method of detection undergroundiv. ^^ J? Ore deposit and groundwater level by means of electric waves, thereby marked ' net that the interference of the waves is observed on a receiving antenna stretched horizontally above the ground, which are transmitted by a transmitting antenna running parallel to the receiving antenna and partly directly, partly after reflection at the underground ore deposit (or groundwater level) be picked up by the receiving antenna.

Hierzu 1 Blatt Zeichnungen.1 sheet of drawings.

Claims (1)

KAISERLICHESIMPERIAL PATENTAMT.PATENT OFFICE. Die Erfindung betrifft ein Verfahren zum Nachweis unterirdischer Erzlager und Grund-The invention relates to a method for the detection of underground ore deposits and ground ■·. wasserspiegel mittels elektrischer Wellen und beruht auf der. Verwendung der Interferenzmethode. ■ ·. water level by means of electric waves and is based on the. Using the interference method. Zwei Antennen 5 und E werden parallel dicht über dem Erdboden.ausgespannt. Die Empfangswirkung in E rührt, falls sich unter dem Erdboden eine reflektierende Fläche befindet, teils von den reflektierten, teils von den direkt durch . die Luft übermittelten Wellen her. Durch Veränderung der Wellenlänge der ausgesandten Strahlung kann man •— ohne den gegenseitigen Abstand des Sen-Two antennas 5 and E are stretched out in parallel, close to the ground. If there is a reflecting surface below the ground, the reception effect in E is partly due to the reflected and partly to the direct. waves transmitted by the air. By changing the wavelength of the emitted radiation, you can • - without changing the distance between the transmitters X 5 ders und Empfängers zu ändern — durch Beobachtung der Interferenzmaxima und -minima das Vorhandensein und die Tiefe der reflektierenden Fläche feststellen. Sind X1 ■< X2 X 5 ders and receiver to change - determine the presence and depth of the reflecting surface by observing the interference maxima and minima. If X 1 ■ <X 2 ; zwei aufeinanderfolgende Wellenlängen, für welche etwa ein' Minimum beobachtet wurde, so ist der Gangunterschied Δ; two consecutive wavelengths, for which approximately a minimum was observed, then the path difference Δ
DENDAT254517D Active DE254517C (en)

Publications (1)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0911650A2 (en) * 1997-10-23 1999-04-28 Yuri Markov Apparatus and method for the detection of materials
US6344818B1 (en) 1998-05-22 2002-02-05 Yuri Markov Apparatus and method for the detection of materials

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0911650A2 (en) * 1997-10-23 1999-04-28 Yuri Markov Apparatus and method for the detection of materials
EP0911650A3 (en) * 1997-10-23 1999-09-01 Yuri Markov Apparatus and method for the detection of materials
US6344818B1 (en) 1998-05-22 2002-02-05 Yuri Markov Apparatus and method for the detection of materials

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