DE2259132B2 - - Google Patents
Info
- Publication number
- DE2259132B2 DE2259132B2 DE2259132A DE2259132A DE2259132B2 DE 2259132 B2 DE2259132 B2 DE 2259132B2 DE 2259132 A DE2259132 A DE 2259132A DE 2259132 A DE2259132 A DE 2259132A DE 2259132 B2 DE2259132 B2 DE 2259132B2
- Authority
- DE
- Germany
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49121—Beam lead frame or beam lead device
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19722259132 DE2259132C3 (de) | 1972-12-02 | Verfahren zum Herstellen eines Meßkopfes zum Messen an elektrischen Bauelementen | |
| US421164A US3909934A (en) | 1972-12-02 | 1973-12-03 | Method of producing a measuring head for measuring electrical components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19722259132 DE2259132C3 (de) | 1972-12-02 | Verfahren zum Herstellen eines Meßkopfes zum Messen an elektrischen Bauelementen |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| DE2259132A1 DE2259132A1 (de) | 1974-06-20 |
| DE2259132B2 true DE2259132B2 (en:Method) | 1975-10-30 |
| DE2259132C3 DE2259132C3 (de) | 1976-06-10 |
Family
ID=
Also Published As
| Publication number | Publication date |
|---|---|
| US3909934A (en) | 1975-10-07 |
| DE2259132A1 (de) | 1974-06-20 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C3 | Grant after two publication steps (3rd publication) | ||
| E771 | Valid patent as to the heymanns-index 1977, willingness to grant licences | ||
| 8339 | Ceased/non-payment of the annual fee |