DE2117990C3 - - Google Patents

Info

Publication number
DE2117990C3
DE2117990C3 DE19712117990 DE2117990A DE2117990C3 DE 2117990 C3 DE2117990 C3 DE 2117990C3 DE 19712117990 DE19712117990 DE 19712117990 DE 2117990 A DE2117990 A DE 2117990A DE 2117990 C3 DE2117990 C3 DE 2117990C3
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19712117990
Other languages
German (de)
Other versions
DE2117990A1 (de
DE2117990B2 (de
Inventor
Meer Abramowitsch Sonkin
Wladimir Sergejewitsch Sumilin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
WSESOJUSNIJ NAUTSCHNO-ISSLEDOWATEL' SKIJ I PROJEKTNO-KONSTRUKTORSKIJ INSTITUT METALLURGITSCHESKOWO MASCHINOSTROJENIJA MOSKAU
Original Assignee
WSESOJUSNIJ NAUTSCHNO-ISSLEDOWATEL' SKIJ I PROJEKTNO-KONSTRUKTORSKIJ INSTITUT METALLURGITSCHESKOWO MASCHINOSTROJENIJA MOSKAU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by WSESOJUSNIJ NAUTSCHNO-ISSLEDOWATEL' SKIJ I PROJEKTNO-KONSTRUKTORSKIJ INSTITUT METALLURGITSCHESKOWO MASCHINOSTROJENIJA MOSKAU filed Critical WSESOJUSNIJ NAUTSCHNO-ISSLEDOWATEL' SKIJ I PROJEKTNO-KONSTRUKTORSKIJ INSTITUT METALLURGITSCHESKOWO MASCHINOSTROJENIJA MOSKAU
Priority to DE19712117990 priority Critical patent/DE2117990B2/de
Publication of DE2117990A1 publication Critical patent/DE2117990A1/de
Publication of DE2117990B2 publication Critical patent/DE2117990B2/de
Application granted granted Critical
Publication of DE2117990C3 publication Critical patent/DE2117990C3/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/043—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE19712117990 1971-04-14 1971-04-14 Photoelektrisches messgeraet zur beruehrungslosen bestimmung der abmessungen von warmwalzgut Granted DE2117990B2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19712117990 DE2117990B2 (de) 1971-04-14 1971-04-14 Photoelektrisches messgeraet zur beruehrungslosen bestimmung der abmessungen von warmwalzgut

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19712117990 DE2117990B2 (de) 1971-04-14 1971-04-14 Photoelektrisches messgeraet zur beruehrungslosen bestimmung der abmessungen von warmwalzgut

Publications (3)

Publication Number Publication Date
DE2117990A1 DE2117990A1 (de) 1972-10-26
DE2117990B2 DE2117990B2 (de) 1973-05-30
DE2117990C3 true DE2117990C3 (OSRAM) 1974-10-31

Family

ID=5804641

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19712117990 Granted DE2117990B2 (de) 1971-04-14 1971-04-14 Photoelektrisches messgeraet zur beruehrungslosen bestimmung der abmessungen von warmwalzgut

Country Status (1)

Country Link
DE (1) DE2117990B2 (OSRAM)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58103604A (ja) * 1981-12-16 1983-06-20 Teijin Ltd フイルムの厚さ測定方法及び測定装置
BE1002583A6 (fr) * 1988-11-07 1991-04-02 Centre Rech Metallurgique Procede et dispositif de mise en place et de protection d'un rugosimetre optique dans un laminoir a froid.

Also Published As

Publication number Publication date
DE2117990A1 (de) 1972-10-26
DE2117990B2 (de) 1973-05-30

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
E77 Valid patent as to the heymanns-index 1977
EHJ Ceased/non-payment of the annual fee