DE2041280B2 - CONTACT DEVICE FOR DETACHABLE ELECTRICAL CONTACT WITH THE CONTACT POINTS OF A CIRCUIT ARRANGEMENT - Google Patents

CONTACT DEVICE FOR DETACHABLE ELECTRICAL CONTACT WITH THE CONTACT POINTS OF A CIRCUIT ARRANGEMENT

Info

Publication number
DE2041280B2
DE2041280B2 DE19702041280 DE2041280A DE2041280B2 DE 2041280 B2 DE2041280 B2 DE 2041280B2 DE 19702041280 DE19702041280 DE 19702041280 DE 2041280 A DE2041280 A DE 2041280A DE 2041280 B2 DE2041280 B2 DE 2041280B2
Authority
DE
Germany
Prior art keywords
contact
circuit arrangement
detachable electrical
points
electrical contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19702041280
Other languages
German (de)
Other versions
DE2041280A1 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to DE19702041280 priority Critical patent/DE2041280B2/en
Publication of DE2041280A1 publication Critical patent/DE2041280A1/en
Publication of DE2041280B2 publication Critical patent/DE2041280B2/en
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
DE19702041280 1970-08-19 1970-08-19 CONTACT DEVICE FOR DETACHABLE ELECTRICAL CONTACT WITH THE CONTACT POINTS OF A CIRCUIT ARRANGEMENT Granted DE2041280B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19702041280 DE2041280B2 (en) 1970-08-19 1970-08-19 CONTACT DEVICE FOR DETACHABLE ELECTRICAL CONTACT WITH THE CONTACT POINTS OF A CIRCUIT ARRANGEMENT

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19702041280 DE2041280B2 (en) 1970-08-19 1970-08-19 CONTACT DEVICE FOR DETACHABLE ELECTRICAL CONTACT WITH THE CONTACT POINTS OF A CIRCUIT ARRANGEMENT

Publications (2)

Publication Number Publication Date
DE2041280A1 DE2041280A1 (en) 1972-02-24
DE2041280B2 true DE2041280B2 (en) 1972-12-21

Family

ID=5780207

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19702041280 Granted DE2041280B2 (en) 1970-08-19 1970-08-19 CONTACT DEVICE FOR DETACHABLE ELECTRICAL CONTACT WITH THE CONTACT POINTS OF A CIRCUIT ARRANGEMENT

Country Status (1)

Country Link
DE (1) DE2041280B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0121936A2 (en) * 1983-04-12 1984-10-17 Fuji Photo Film Co., Ltd. Connection terminal assembly employable for ionic activity detector
DE8806162U1 (en) * 1988-05-09 1989-09-07 Nixdorf Computer Ag, 4790 Paderborn, De

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2924262C2 (en) * 1979-06-15 1984-12-13 Feinmetall Gmbh, 7033 Herrenberg Spring-loaded contact module for measuring and testing purposes

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0121936A2 (en) * 1983-04-12 1984-10-17 Fuji Photo Film Co., Ltd. Connection terminal assembly employable for ionic activity detector
EP0121936A3 (en) * 1983-04-12 1986-08-27 Fuji Photo Film Co., Ltd. Connection terminal assembly employable for ionic activity detector
DE8806162U1 (en) * 1988-05-09 1989-09-07 Nixdorf Computer Ag, 4790 Paderborn, De

Also Published As

Publication number Publication date
DE2041280A1 (en) 1972-02-24

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
E77 Valid patent as to the heymanns-index 1977
EHJ Ceased/non-payment of the annual fee