DE20303868U1 - Horizontal differential induction probe for defect analysis on pipes by stray flux technique has shape of parallelogram with angle in same direction as overrun angle of test head over defect - Google Patents

Horizontal differential induction probe for defect analysis on pipes by stray flux technique has shape of parallelogram with angle in same direction as overrun angle of test head over defect

Info

Publication number
DE20303868U1
DE20303868U1 DE20303868U DE20303868U DE20303868U1 DE 20303868 U1 DE20303868 U1 DE 20303868U1 DE 20303868 U DE20303868 U DE 20303868U DE 20303868 U DE20303868 U DE 20303868U DE 20303868 U1 DE20303868 U1 DE 20303868U1
Authority
DE
Germany
Prior art keywords
probes
angle
parallelogram
overlap
shape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE20303868U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZIMMERMANN, JAN, DE
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE20303868U priority Critical patent/DE20303868U1/en
Publication of DE20303868U1 publication Critical patent/DE20303868U1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0033—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining damage, crack or wear
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0025—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings of elongated objects, e.g. pipes, masts, towers or railways
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0083—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by measuring variation of impedance, e.g. resistance, capacitance, induction

Abstract

The induction probe has the shape of a parallelogram where the angle (5) of the parallelogram is in the same direction as the angle at which the test head passes over the defect. Individual probes (1-4) are arranged in the form of printed coils on a circuit board. Each circuit board has two parallel rows of printed probes with probes in one row offset relative to those in the other row.

Description

Der Beschreibungstext wurde nicht elektronisch erfaßt The description text was not recorded electronically  

Der Beschreibungstext wurde nicht elektronisch erfaßt The description text was not recorded electronically  

Der Beschreibungstext wurde nicht elektronisch erfaßtThe description text was not recorded electronically

Claims (12)

1. Form und Anordnung 2 von liegenden Differenzsonden, dadurch gekennzeichnet, dass die Sonden die Form von Parallelogrammen haben.1. Shape and arrangement 2 of horizontal differential probes, characterized in that the probes are in the form of parallelograms. 2. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass der Winkel des Parallelogramms die gleiche Richtung hat wie der Überlaufwinkel des Prüfkopfes über den Fehler.2. Device according to claim 1, characterized in that the angle of the parallelogram is in the same direction as the overflow angle of the test head over the error. 3. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass die Einzelsonden in Form von gedruckten Spulen auf einer Leiterplatte angeordnet sind.3. Device according to claim 1, characterized in that the individual probes in the form of printed coils are arranged on a circuit board. 4. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass die jeweilige Leiterplatte zwei parallel liegende Reihen aufgedruckter Sonden aufweist, wobei die Sonden der einen Reihe versetzt zu den Sonden der zweiten Reihe liegen.4. The device according to claim 1, characterized in that the respective circuit board two has parallel rows of printed probes, the probes of one row offset to the second row probes. 5. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass die zwei parallel liegenden Reihen aufgedruckter Sonden eine Isolierung kleiner 0.1 mm gegeneinander aufweisen.5. The device according to claim 1, characterized in that the two parallel rows of printed probes have insulation smaller than 0.1 mm from each other. 6. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass die zwei parallel liegenden Reihen aufgedruckter Sonden so angeordnet sind, dass die 1. aufeinanderfolgende Sonde auf Reihe 1 angeordnet ist und die nächste Sonde auf Reihe 2, usw.6. The device according to claim 1, characterized in that the two parallel rows of printed probes are arranged so that the 1st successive probe is arranged on row 1 and the next probe on row 2, etc. 7. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass sich die Sonden Überlappen.7. The device according to claim 1, characterized in that the probes overlap. 8. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass die Überlappung so groß ist, dass punktförmige Fehler immer von beiden Leiterschleifen einer Sonde erfasst werden.8. The device according to claim 1,  characterized in that the overlap is so large that punctiform errors are always detected by both conductor loops of a probe. 9. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass die Überlappung entsprechend der Prüfvorgabe (variabler Durchmesserbereich) durch die Form des Parallelogramms minimiert wird.9. The device according to claim 1, characterized in that the overlap according to the test specification (variable Diameter range) is minimized by the shape of the parallelogram. 10. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass die Überlappung durch die Anzahl der Kanäle und der Sondenbreite dem Prüfdurchmesser der Prüfrohre so angepasst wird, dass die Überlappung minimal wird.10. The device according to claim 1, characterized in that the overlap by the number of channels and the Probe width is adjusted to the test diameter of the test tubes so that the overlap becomes minimal. 11. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass der Abstand der beiden magnetisch wirksamen Differenzleiterschleifen der Sonden auf die zu detektierenden Innenfehler, bei größtmöglicher, technisch prüfbarer Wandstärke, optimiert werden.11. The device according to claim 1, characterized in that the distance between the two magnetically active Differential conductor loops of the probes to the internal defects to be detected, with the largest possible, technically verifiable wall thickness. 12. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, dass der Abstand der beiden magnetisch wirksamen Differenzleiterschleifen der Sonden auf die zu detektierenden Innenfehler, der maximal prüfbaren Wandstärke des Rohrherstellers angepasst wird.12. The device according to claim 1, characterized in that the distance between the two magnetically active Differential conductor loops of the probes to the internal defects to be detected, is adapted to the maximum testable wall thickness of the pipe manufacturer.
DE20303868U 2003-03-04 2003-03-04 Horizontal differential induction probe for defect analysis on pipes by stray flux technique has shape of parallelogram with angle in same direction as overrun angle of test head over defect Expired - Lifetime DE20303868U1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE20303868U DE20303868U1 (en) 2003-03-04 2003-03-04 Horizontal differential induction probe for defect analysis on pipes by stray flux technique has shape of parallelogram with angle in same direction as overrun angle of test head over defect

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE20303868U DE20303868U1 (en) 2003-03-04 2003-03-04 Horizontal differential induction probe for defect analysis on pipes by stray flux technique has shape of parallelogram with angle in same direction as overrun angle of test head over defect

Publications (1)

Publication Number Publication Date
DE20303868U1 true DE20303868U1 (en) 2003-09-18

Family

ID=28459085

Family Applications (1)

Application Number Title Priority Date Filing Date
DE20303868U Expired - Lifetime DE20303868U1 (en) 2003-03-04 2003-03-04 Horizontal differential induction probe for defect analysis on pipes by stray flux technique has shape of parallelogram with angle in same direction as overrun angle of test head over defect

Country Status (1)

Country Link
DE (1) DE20303868U1 (en)

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Legal Events

Date Code Title Description
R207 Utility model specification

Effective date: 20031023

R081 Change of applicant/patentee

Owner name: ZIMMERMANN, JAN, DE

Free format text: FORMER OWNER: ZIMMERMANN, JAN, 72768 REUTLINGEN, DE

Effective date: 20040517

R156 Lapse of ip right after 3 years

Effective date: 20061003