DE19914583A1 - Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV light - Google Patents
Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV lightInfo
- Publication number
- DE19914583A1 DE19914583A1 DE1999114583 DE19914583A DE19914583A1 DE 19914583 A1 DE19914583 A1 DE 19914583A1 DE 1999114583 DE1999114583 DE 1999114583 DE 19914583 A DE19914583 A DE 19914583A DE 19914583 A1 DE19914583 A1 DE 19914583A1
- Authority
- DE
- Germany
- Prior art keywords
- bitmap
- production
- illuminated
- light
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
Bei dem vorgestellten Gerät handelt es sich um ein hochflexibles und sehr schnelles Belichtungssystem zum Übertragen eines beliebigen Layouts (s/w oder Graumuster) auf eine fotoempfindliche Schicht.The device presented is a highly flexible and very fast exposure system for transferring any layout (b / w or gray pattern) to a photosensitive layer.
Der Einsatzbereich des Gerätes ist breit, beispielsweise in der Halbleiter- und Mikrosystembranche zum Belichten von Kleinserien oder Prototypen sowie in der Platinenbelichtung.The area of application of the device is wide, for example in the semiconductor and microsystem industries Exposing small series or prototypes as well as in circuit board exposure.
In der Mikrosystem- oder Halbleitertechnik werden Layouts bisher in einem sehr aufwendigen und teueren Verfahren mittels Elektronenstrahlschreibern auf Chrommasken (Transparentmasken) übertragen. Diese Masken werden dann, zum Teil verkleinert, auf Siliziumwafer projiziert und das Layout in eine vorher aufgebrachte fotoempfindliche Schicht übertragen.In microsystem or semiconductor technology, layouts have so far been very complex and expensive Method transferred to chrome masks (transparent masks) using electron beam recorders. This Masks are then projected, partially reduced, onto silicon wafers and the layout into a previous one applied photosensitive layer.
Durch den aufwendigen und teueren Prozeß der Maskenherstellung ist das Verfahren sehr unflexibel. Eventuelle Fehler werden erst spät sichtbar und machen dann Design und Herstellung einer neuen Maske notwendig. Dadurch ist das Verfahren zur Entwicklung von Prototypen oder für kleine Serien ungeeignet.The process is very inflexible due to the complex and expensive process of mask production. Any errors are only visible late and then design and manufacture a new mask necessary. This makes the process unsuitable for developing prototypes or for small series.
Bei dem vorgestellten neuen Verfahren werden die Layoutdaten auf einem PC mit einer beliebigen Layout-Software erzeugt, in ein s/w-Muster (Bitmap) umgesetzt und von einem LCD-Durchlichtpanel dargestellt. Der gesamte Prozeß der Maskenherstellung entfällt. Das "Bild" wird mit einer Optik verkleinert und auf die fotoempfindliche Schicht belichtet.In the new method presented, the layout data on a PC with any Layout software generated, converted into a b / w pattern (bitmap) and from an LCD transmitted light panel shown. The entire process of mask making is eliminated. The "image" is reduced with optics and exposed on the photosensitive layer.
Die aktive Fläche der erwähnten LCD-Panels besteht aus einer Matrix von ca. 800 × 600 quadratischen Punkten, die in 256 Abstufungen von transparent bis lichtundurchlässig wechseln können. Aus den Punkten dieser Matrix wird das gewünschte Bild zusammengesetzt. Das erzeugte Bild wird von einer Lichtquelle durchstrahlt und von einer Optik im gewünschten Verhältnis verkleinert abgebildet. Für Strukturen im µm-Bereich muß die Wellenlänge im nahen UV-Bereich z. B. 436 nm, 405 nm, 380 nm oder darunter liegen. Mit diesen Wellenlängen lassen sich kleinste Strukturen von etwa 2*λ, also 0.8 µm bis 0.9 µm erzeugen. Im UV-Bereich sinkt allerdings die Transparenz der LCD-Panels. Sie liegt bei 430 nm etwa 50% niedriger als bei höheren Wellenlängen ab ca. 530 nm.The active area of the mentioned LCD panels consists of a matrix of approx. 800 × 600 square Dots that can change from transparent to opaque in 256 shades. From the Points of this matrix are put together the desired picture. The generated image is from a The light source shines through and is reduced in size by optics in the desired ratio. For Structures in the µm range, the wavelength in the near UV range z. B. 436 nm, 405 nm, 380 nm or lie below. With these wavelengths, the smallest structures of around 2 * λ, i.e. 0.8 µm to Generate 0.9 µm. In the UV range, however, the transparency of the LCD panels drops. It is at 430 nm about 50% lower than at higher wavelengths from approx. 530 nm.
Durch die Möglichkeit, Graustufen zu belichten, ist das Verfahren geeignet für die integrierte Optik. Hier werden Graustufen in Lackdicken umgesetzt, was bei einem anschließenden Ätzprozess unterschiedliche Ätztiefen ergibt und zur Herstellung von 3-dimensionalen. Strukturen benutzt wird.The possibility of exposing grayscale makes the process suitable for the integrated optics. Here grayscale are implemented in lacquer thicknesses, which is different in a subsequent etching process Etching depths result and for the production of 3-dimensional. Structures is used.
Die angestrebte Reduzierung der Bildgröße durch eine Optik liegt im Bereich 10 : 1 bis 50 : 1. Bei einer Bildgröße, die die gesamte aktive Fläche des LCD-Panels (26.6 mm × 20 mm) ausnutzt, und einer 10 : 1- Reduktionsoptik entsteht damit auf der Fotoschicht ein Bild von 2.66 mm × 2 mm Kantenlänge mit einer Auflösung von 800 × 600 quadratischen, fast nahtlos aneinandergefügten Bildpunkten. Die einzelnen abgebildeten Bildpunkte haben dann eine Kantenlänge von 3.33 µm. Um größere Layouts aus einzelnen Belichtungen zusammensetzen zu können, wird die fotoempfindliche Schicht im Raster von 2.66 mm × 2 mm verschoben. Die Auflösung des dazu verwendeten Verschiebetisches muß ca. 10- bis 20-fach höher als die kleinste erzeugte Struktur sein, damit der Versatz unter der von der Optik vorgegebenen Auflösungsgrenze liegt. Daraus ergibt sich eine reproduzierbare Positioniergenauigkeit des Tisches von etwa 0.1 µm. Diese Genauigkeit wird von handelsüblichen Positioniertischen erreicht.The desired reduction in image size through optics is in the range 10: 1 to 50: 1 Image size that uses the entire active area of the LCD panel (26.6 mm × 20 mm) and a 10: 1 Reduction optics thus create an image with an edge length of 2.66 mm × 2 mm on the photo layer Resolution of 800 × 600 square, almost seamlessly connected pixels. The single ones The pixels shown then have an edge length of 3.33 µm. To make larger layouts out of individual To be able to compose exposures, the photosensitive layer has a grid of 2.66 mm × 2 mm shifted. The resolution of the sliding table used for this must be approx. 10 to 20 times higher than the smallest structure created so that the offset is less than that specified by the optics Resolution limit. This results in a reproducible positioning accuracy of the table from about 0.1 µm. This accuracy is achieved by standard positioning tables.
Es ist auch problemlos möglich, nur das LCD-Display mit Ansteuerung in bestehende Belichtungsanlagen, sog. Stepper, einzusetzen. Solche Anlagen werden in der Halbleiterindustrie verwendet und bilden eingelegte Transparentmasken (Reticle) in einem bestimmten Verhältnis (Reduktion) ab. Anstelle einer solchen (teuer und aufwendig produzierten) Transparentmaske wird ein LCD-Display eingesetzt. Es stellt dann ein "virtuelles Reticle" dar.It is also possible without any problems, only the LCD display with control in existing exposure systems, so-called stepper. Such systems are used in the semiconductor industry and form inserted transparency masks (reticle) in a certain ratio (reduction). Instead of one Such (expensive and elaborately produced) transparent mask, an LCD display is used. It puts then a "virtual reticle".
Für Anlagen zur Platinenbelichtung und andere Anwendungen, die geringere Anforderungen an die Auflösung steilen, genügt es, Verschiebetische mit einfachen, preiswerten Schrittmotoren zu verwenden.For systems for circuit board exposure and other applications that have lower requirements Steep resolution, it is enough to use sliding tables with simple, inexpensive stepper motors.
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE1999114583 DE19914583A1 (en) | 1999-03-31 | 1999-03-31 | Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV light |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE1999114583 DE19914583A1 (en) | 1999-03-31 | 1999-03-31 | Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV light |
Publications (1)
Publication Number | Publication Date |
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DE19914583A1 true DE19914583A1 (en) | 2000-10-05 |
Family
ID=7903060
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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DE1999114583 Withdrawn DE19914583A1 (en) | 1999-03-31 | 1999-03-31 | Lithography device for production of semiconductor or micro- mechanical structures generates a mash for illuminating a photosensitive circuit by creation of a bitmap using software, which bitmap can then be illuminated with UV light |
Country Status (1)
Country | Link |
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DE (1) | DE19914583A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1628157A1 (en) * | 2004-08-17 | 2006-02-22 | ASML Netherlands B.V. | Lithographic apparatus, method and a computer program product for generating a mask pattern on an addressable mask and device manufacturing method using same |
US7713667B2 (en) | 2004-11-30 | 2010-05-11 | Asml Holding N.V. | System and method for generating pattern data used to control a pattern generator |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5171490A (en) * | 1988-11-29 | 1992-12-15 | Fudim Efrem V | Method and apparatus for production of three-dimensional objects by irradiation of photopolymers |
US5344748A (en) * | 1986-01-13 | 1994-09-06 | Rohm And Haas Company | Microplastic structure and method of manufacture |
US5558884A (en) * | 1989-04-03 | 1996-09-24 | Omnichrome Corporation | System for rapidly producing either integrated circuits on a substrate, Interconnections on a printed circuit board or rapidly performing lithography |
WO1997045770A1 (en) * | 1996-05-29 | 1997-12-04 | Chiu Tzu Yin | Reconfigurable mask |
US5742362A (en) * | 1993-03-21 | 1998-04-21 | Nec Corporation | Process for forming a photosensitive material and an exposure apparatus used for the process |
DE19522936C2 (en) * | 1995-06-23 | 1999-01-07 | Fraunhofer Ges Forschung | Device for structuring a photolithographic layer |
-
1999
- 1999-03-31 DE DE1999114583 patent/DE19914583A1/en not_active Withdrawn
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5344748A (en) * | 1986-01-13 | 1994-09-06 | Rohm And Haas Company | Microplastic structure and method of manufacture |
US5171490A (en) * | 1988-11-29 | 1992-12-15 | Fudim Efrem V | Method and apparatus for production of three-dimensional objects by irradiation of photopolymers |
US5558884A (en) * | 1989-04-03 | 1996-09-24 | Omnichrome Corporation | System for rapidly producing either integrated circuits on a substrate, Interconnections on a printed circuit board or rapidly performing lithography |
US5742362A (en) * | 1993-03-21 | 1998-04-21 | Nec Corporation | Process for forming a photosensitive material and an exposure apparatus used for the process |
DE19522936C2 (en) * | 1995-06-23 | 1999-01-07 | Fraunhofer Ges Forschung | Device for structuring a photolithographic layer |
WO1997045770A1 (en) * | 1996-05-29 | 1997-12-04 | Chiu Tzu Yin | Reconfigurable mask |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1628157A1 (en) * | 2004-08-17 | 2006-02-22 | ASML Netherlands B.V. | Lithographic apparatus, method and a computer program product for generating a mask pattern on an addressable mask and device manufacturing method using same |
JP2006058882A (en) * | 2004-08-17 | 2006-03-02 | Asml Netherlands Bv | Lithography device and method for generating mask and pattern, computer program product and device manufacturing method using the same |
US7500218B2 (en) | 2004-08-17 | 2009-03-03 | Asml Netherlands B.V. | Lithographic apparatus, method, and computer program product for generating a mask pattern and device manufacturing method using same |
JP2011095755A (en) * | 2004-08-17 | 2011-05-12 | Asml Netherlands Bv | Lithographic apparatus, method, and computer program product for generating mask pattern, and method of manufacturing device using the same |
US7713667B2 (en) | 2004-11-30 | 2010-05-11 | Asml Holding N.V. | System and method for generating pattern data used to control a pattern generator |
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