DE19681756T1 - Time phase adjustment circuit for semiconductor test system - Google Patents

Time phase adjustment circuit for semiconductor test system

Info

Publication number
DE19681756T1
DE19681756T1 DE19681756T DE19681756T DE19681756T1 DE 19681756 T1 DE19681756 T1 DE 19681756T1 DE 19681756 T DE19681756 T DE 19681756T DE 19681756 T DE19681756 T DE 19681756T DE 19681756 T1 DE19681756 T1 DE 19681756T1
Authority
DE
Germany
Prior art keywords
test system
adjustment circuit
phase adjustment
time phase
semiconductor test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19681756T
Other languages
German (de)
Inventor
Shinichi Hashimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Advantest America Inc
Original Assignee
Advantest Corp
Advantest America Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Advantest America Inc filed Critical Advantest Corp
Priority claimed from PCT/US1996/006582 external-priority patent/WO1997043813A1/en
Publication of DE19681756T1 publication Critical patent/DE19681756T1/en
Ceased legal-status Critical Current

Links

DE19681756T 1996-05-10 1996-05-10 Time phase adjustment circuit for semiconductor test system Ceased DE19681756T1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1996/006582 WO1997043813A1 (en) 1994-11-11 1996-05-10 Timing adjustment circuit for semiconductor test system

Publications (1)

Publication Number Publication Date
DE19681756T1 true DE19681756T1 (en) 1999-12-02

Family

ID=22255067

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19681756T Ceased DE19681756T1 (en) 1996-05-10 1996-05-10 Time phase adjustment circuit for semiconductor test system

Country Status (1)

Country Link
DE (1) DE19681756T1 (en)

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8125 Change of the main classification

Ipc: G01R 31/3183

8607 Notification of search results after publication
8131 Rejection