DE1761827U - LIGHT ELECTRIC GLOSS KNIFE. - Google Patents
LIGHT ELECTRIC GLOSS KNIFE.Info
- Publication number
- DE1761827U DE1761827U DEG16589U DEG0016589U DE1761827U DE 1761827 U DE1761827 U DE 1761827U DE G16589 U DEG16589 U DE G16589U DE G0016589 U DEG0016589 U DE G0016589U DE 1761827 U DE1761827 U DE 1761827U
- Authority
- DE
- Germany
- Prior art keywords
- gloss
- following
- meter according
- gloss meter
- cone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 8
- 230000000007 visual effect Effects 0.000 claims description 3
- 238000005286 illumination Methods 0.000 claims description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims 1
- 238000010586 diagram Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 229910052711 selenium Inorganic materials 0.000 claims 1
- 239000011669 selenium Substances 0.000 claims 1
- 230000004907 flux Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
- G01J3/504—Goniometric colour measurements, for example measurements of metallic or flake based paints
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
Gebrauchsmuster Rolf Friderici Anmelder : Geräte für Licht-und Strahlungsmessung Berlin-Wilmersdorf, Fehrbelliner Platz 3 Bezeichnung : Lichtelektrischer Glanzmesser Die objektive Messung des Glanzes von Oberflächen mittels Photozellen derart durchzuführen, daß die Meßergebnisse mit dem visuellen Glanzeindruck übereinstimmen, ist die Aufgabe des Glanzmessers. Utility model Rolf Friderici Applicant: Devices for light and radiation measurement Berlin-Wilmersdorf, Fehrbelliner Platz 3 Description: Photoelectric gloss meter To carry out the objective measurement of the gloss of surfaces by means of photocells in such a way that The task is that the measurement results agree with the visual gloss impression of the glossmeter.
Seine Entwicklung geht auf Untersuchungen (1) zurück, die zeigten, daß die bisherigen Methoden der objektive Glanzmessung unzulänglich sind. Es wurde festgestellt, daß der Glanz einer Oberfläche nicht durch eine, sondern zwei Maßzahlen bestimmt wird, Spiegelwert und Bildschärfe. Der Spiegelwert ist der streng nach dem Reflexionsgesetz von der Probenoberfläche zurückgeworfene Lichtstrom (regulärer Strahl). Die Bildschärfe ist bestimmt durch den innerhalb eines Streukegels # zurückgeworfenen Lichtstrom. Der Scheitel des Streukegels liegt auf der Probenoberfläche, die Achse ist die Richtung des regulären Strahl.s Das neue Verfahren der Glanzmessung besteht darin, eine Analyse des Lichtstroms innerhalb des Streukegels derart auszuführen, daß Ergebnisse erhalten werden, die in Beziehung ZUG visuellen Glanzeindruck stehen.Its development goes back to studies (1) which showed that the previous methods of objective gloss measurement are inadequate. It was found that the gloss of a surface is not through one, but two dimensions is determined, mirror value and image sharpness. The mirror value is strictly according to Luminous flux reflected back from the sample surface according to the law of reflection (regular Beam). The image sharpness is determined by the amount reflected within a scattering cone # Luminous flux. The vertex of the scattering cone lies on the sample surface, the axis is the direction of the regular beam. The new method of gloss measurement exists in carrying out an analysis of the luminous flux within the scattering cone in such a way that that results are obtained which are related to visual gloss impression.
Hierzu wurde der lichtelektrische Glanzmesser entwickelt (Abb. 1). Das Licht der Beleuchtungslampe B wird durch die Linse 1 1 gesammelt, durch die Blende S 1 begrenzt und gerichtet unter dem Glanzwinkeld, auf die Probenoberfläche ? geworfen. Das reflektierte Licht gelangt in den Empfängertubus E. Das Lichtbündel wird gegebenenfalls durch die Blende S 2 begrenzt und durch die Linse L 2 so gerichtet, daß das Bild der Lampenwendel innerhalb der Ebene E der Blende S 3 liegt. Die Strahlen, die unter dem Winkel <S, gemessen gegen den regulären Strahl, von der Oberfläche reflektiert werden, treffen auf konzentrischen Kreisen auf E. Die notwendige Analyse kann auf zwei Wegen durchgeführt werden : 1. Die Blende S 3 ist eine Irisblende, hinter der sich eine Photozelle zur Messung der lichtintensität befindet. Gemessen wird die lichtintensität bei versohiedenen Öffnungen der Irisblende.The photoelectric gloss meter was developed for this purpose (Fig. 1). The light of the illumination lamp B is collected by the lens 1 1, through the Aperture S 1 limited and directed at the glancing angle on the sample surface ? thrown. The reflected light reaches the receiver tube E. The light beam is optionally limited by the diaphragm S 2 and directed through the lens L 2 so that that the image of the lamp filament lies within the plane E of the diaphragm S 3. The Rays, those at the angle <S, measured against the regular ray, from the surface be reflected, meet on concentric circles on E. The necessary analysis can be done in two ways: 1. The aperture S 3 is an iris diaphragm behind which there is a photocell for measuring the light intensity is located. The light intensity is measured at different openings of the iris diaphragm.
2. Die Blende S 3 ist eine oder mehrere Ring-oder Schlitzblenden, hinter denen sich eine oder mehrere Photozellen befinden, die die Lichtintensität in gewissen Intervallen von zu messen gestatten.2. The diaphragm S 3 is one or more ring or slit diaphragms, behind which there are one or more photocells that control the light intensity allow to measure at certain intervals of.
Die erhaltenen Meßergebnisse werden als Glanzkoordinaten 1 in ein
Nomogramm eingetragen, das entsprechend dem unter 1 bzw. 2 beschriebenen Meßverfahren
so berechnet wurde, daß Spiegelwert s und Bildschärfe b einer Oberfläche graphisch
ermittelt werden können (Abb. 2).
1) Lichtelektrischer Glanzmesser, dadurch gekennzeichnet, daß regulär von der Probe reflektiertes Licht und diffus reflektiertes Licht innerhalb eines Streukegels mit dem regulären Lichtstrahl als Achse getrennt gemessen werden können.1) Photoelectric gloss meter, characterized in that regular light reflected from the sample and light reflected diffusely within one Scatter cones can be measured separately with the regular light beam as the axis.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEG16589U DE1761827U (en) | 1957-11-04 | 1957-11-04 | LIGHT ELECTRIC GLOSS KNIFE. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEG16589U DE1761827U (en) | 1957-11-04 | 1957-11-04 | LIGHT ELECTRIC GLOSS KNIFE. |
Publications (1)
Publication Number | Publication Date |
---|---|
DE1761827U true DE1761827U (en) | 1958-02-20 |
Family
ID=32784058
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DEG16589U Expired DE1761827U (en) | 1957-11-04 | 1957-11-04 | LIGHT ELECTRIC GLOSS KNIFE. |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE1761827U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2851455A1 (en) * | 1977-12-09 | 1979-06-13 | Vianova Kunstharz Ag | COMBINED GONIOPHOTOMETER AND REFLECTOMETER (GONIOREFLECTOMETER) FOR THE DIFFERENTIATED QUANTITATIVE EVALUATION OF THE GLOSS CAPACITY OF SURFACES, IN PARTICULAR ORGANIC COATINGS |
-
1957
- 1957-11-04 DE DEG16589U patent/DE1761827U/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2851455A1 (en) * | 1977-12-09 | 1979-06-13 | Vianova Kunstharz Ag | COMBINED GONIOPHOTOMETER AND REFLECTOMETER (GONIOREFLECTOMETER) FOR THE DIFFERENTIATED QUANTITATIVE EVALUATION OF THE GLOSS CAPACITY OF SURFACES, IN PARTICULAR ORGANIC COATINGS |
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