DE1441412C - Atomic explosion detector device - Google Patents

Description

5 6

This object is achieved in that inven- F i g. 2 shows the circuit diagram of the electrical part of the

according to each receiving channel electrical filter receiver according to Fig. 1,

for preselection of the curve shape of the input side F i g. 3 an embodiment of the logical

contains received signals and that for a radio circuit for evaluating the thermal energy

tion test of a receiving channel a test facility 5 of a nuclear explosion,

device is provided by an electrical F i g. 4 the circuit diagram of one of the infrared receivers

Voltage jump formed test control signal in the following amplifier,

the test state tilts and the test state with a F i g. 5 the circuit diagram of a fast responding

Signal lamp indicates that the test arrangement is in the test. Toggle switch,

state the output of the receiving cue to be checked F i g. 6 the circuit diagram of a slowly responding

nals separates from a trigger arrangement and to which the flip-flop circuit,

Test arrangement switches that also the test arrangement F i g. 7 Circuit features of an output switch

in the test state, a test signal that

an atomic explosion at the entrance to the atomic explosion. 8 the circuit arrangement for the separation

sion detector device incoming signal after- 15 of the channels during the test,

is formed, generated and in the input of the to be tested F i g. 9 shows the circuit diagram of a second flip-flop

the receiving channel and that finally that of the test device,

At the output of the receiving channel to be tested, Fig. 10 shows the circuit diagram of a second embodiment

generated signal that only arises when the test signal example of the invention for evaluating the beam *

to the input of the receiving channel to be tested 20 generation energy of an electromagnetic wave,

arrives and this receiving channel properly Fig. 11 shows the characteristic oscillation train

works, the test arrangement in its resting state of an electromagnetic wave and the working di-

tilts back. programs of the logic circuit,

According to a feature of the invention, the detector is a bistable circuit for analysis designed in such a way that it reacts to the fast and the 25 of the oscillation train of the magnetic waves, slowly increasing thermal impulse responds. According to the invention is for periodic monitoring the infrared spectrum for evaluation chung of the detector is provided a clock that used. The output signal is created by a test program in which the Responding to a combination of the two thermal imitation by causing an explosion Impulses or on the second, slowly rising signal. Shortly before this signal alone. The output of the detector remains, if a device disconnects the detector, when the first, rapidly rising pulse output from the following circuit, so that this is recorded. cannot respond during the exam. Then, according to another feature of the invention, the test circuit provides the appearance of the simulated Detector equipped with an antenna that detects a 35 detected signal and determines whether all necessary logic circuit follows, which performed on a one-time functions of the detector device Vibration train of an electromagnetic wave become. If so, the facility will speaks that occurs in a nuclear explosion. The De- put back into normal operation, and it detector triggers an output signal when the illuminated green lamp lights up. If, however, everyone shone in distress Wave a given curve shape - 40 complex functions do not come to execution, shows. . the device is no longer in the normal Ar- According to another feature of the invention is partially reset and a red lights up a lamp for periodic monitoring of the detector.

Clock generator is provided, which initiates a test program. In the exemplary embodiment of an optical receiver

let, in which there is also the replica of a catcher used to indicate an atomic explosion

an explosion-induced signal is located. F i g. 1 is a base plate 20, an infrared filter 21,

• Regardless of whether the thermal or a photocell 22 and a housing 23 are provided,

electromagnetic wave for evaluation. B. made of cast aluminum

is pulled, two receiving channels should be available and has a neck 24 with a thread

in order to increase the operational safety of the system.

hen and in order to advantageously also allow during the penmast or another stand. A

Test times during which a channel has a monitored raised edge 28 on the base plate

will detect an explosion with the other to internal thread 29 for fastening the housing 23.

be able. The infrared filter 21 consists of a number of

Another advantage according to the invention is provided by 55 filter glass panes 30 to 35

reached the electrical filter, which is indicated for the analysis, ground to the miter at the edges.

frequency range of the input signal is not necessary in order to combine it into a hexagonal

Sieve rich and thereby ease the interference with the column. The filter glass panes are

reduce. '' with each other through a suitable, translucent

The structure and the mode of operation of an inventive glue is glued and connected with a cover disk 37

Appropriate arrangement is provided with a few putty. The filter glass is designed so that it is only for

education explained in more detail. The embodiment has an optical bandwidth of about 7000 to

refers for better understanding because it is only 9000 Angstroms translucent. The photocell 22

to a device that prevents the closing of a door is completely enclosed by the infrared filter 21.

start. 65 sen, so that no unfiltered light a. Tripping

It shows can cause. Eventually becomes the recipient

Fig. 1 mechanical details of an infrared through the housing 23 against external influences

cmpfüngcrs, tightly closed. This can come from a bell

Each of the amplifiers 57, 58 contains the complementary transistors 65, 66 and 65 ', 66' to the desired Minimum gain of 10 to get. The best of resistor 67 and diode 68 -5 The current voltage divider determines the base voltage of the transistor 65. The resistor 69 enables a sufficient current flow through transistor 65 so as to compensate for changes in the collector current.

A zener diode 70 and a resistor 71 limit the emitter-collector voltage of the transistor 66. The resistors 72, 73 form the collector load of the transistor 66 and at the same time the Negative coupling branch of transistor 65. The diode

simple, non-filtering glass, which with the thread 39 in the thread 29 of the base plate 20 is screwed in.

The electrical part of the optical receiver from which FIG. Figure 2 shows an embodiment if possible mounted on the base plate 20 and covered by the housing 23. It contains the Photocell 22 and a cathode amplifier 40. The receiver also contains a lamp 46, which is preferably mounted inside the infrared filter 21 io. The sensitivity of the optical The receiver can be set by the resistor 41 when the lamp 45 is on. During the The lamp does not light up during normal operation.

The optical receiver described has a number of advantages which protect transistor 65 from voltage. Because the incident solar peaks and the resistor 76 limit the base light a relatively high content of ultraviolet and current. '' Has a relatively low level of infrared light in the bandwidth of the amplifier, preferably the region of the evaluated bandwidth of light from 0.5 to 30,000 Hz, by the and a nuclear explosion a relatively low overall 20 capacitor 62 and the stray capacitances retains ultraviolet and borders a relatively high content. The gain of the driver-amplifier can have infrared light, the receiver can be adjusted by means of the variable resistor 59. The rheostat 59 will adjust to the difference between the pending spectra for the test periods. Lightning discharges have short-circuited in comparison to the line 77, so that the sunlight has a much higher content in the infrared monitoring of the arrangement, but the thermal energy pulse has a much higher sensitivity.

faster rise time and a wider peak than the amplifier output signal appears

that of a nuclear explosion. The sensitivity of the line 78. To z. B. the response of ultra-receivers However, it can be set in such a way that red extraneous signals can be avoided, for example a sufficient certainty of differentiating between 30 originating from the sun and being through fluctuations Nuclear explosion and lightning results. Furthermore, the genes have an extremely slow rise time, You are also familiar with the following circuits, so appropriate precautions have been taken. For this be set up that pulses with a rise serves the low-pass filter 80 in Fi g. 5, that of two received flank according to an atomic explosion and L-members with the resistors 81 and 83 and the Pulses with the rising edge of a lightning bolt do not consist of 35 capacitors 82 and 84. Frequencies above be evaluated. 700 Hz are not allowed through the filter.

The logic circuit for an atomic explosion detector according to the embodiment of FIG. 3 contains the two channels 48 and 49, in order to provide the necessary redundancy and increased operational reliability that is, when receiving a signal caused by a nuclear explosion, and to continue to do so also ensure reception during the exam. It works z. B. the channel 48 as a receiver,

while channel 49 is checked and vice versa. 45 91 and the coupling resistors 93 and 94. The Each channel contains a fast-responding breakover capacitor 95 which is used to limit the switching time circuit 50 or 50 ', a slowly responding and the diode 96 as overvoltage protection for the Flip-flop 51 or 51 'and a logical switch-base-emitter path of the transistor 90. The condensation 52, 52 '. In addition, each channel has a capacitor 97 and the resistor 98 form a differential Infrared receiver 55 or 55 '. Each receiving element at the output to receive the square-wave pulses of the Catcher is via a cathode amplifier to an Si flip-flop 86 in positive and negative pulse signal amplifier 56 or 56 'connected. to convert pointed. In addition, the tilting

The signal amplifier 56 includes two two stage circuit 86 the load resistors, 99, 100 and Amplifiers 57, 58, which have a common emitter resistor 101 via a gain controller 59 are connected to each other. With this 55 resistors 81 and 83 of the low-pass filter can be formed with set the desired sensitivity, e.g. to add a voltage divider to resistor 102 for the a 20 kilo-ton explosion in a range of signals at the base of transistor 90. 15 to 20 km to be determined without the arrangement. After receiving an impulse, the Tranauf that reacts to sunlight or lightning. sistor 90 conductive and the base of transistor 91 on

In the exemplary embodiment of the signal amplifier 60 is grounded. The additional current through the genach F i g. 4, the infrared receiver 55 is changed to the pure via common emitter resistor 101 Line 60 connected, which can shield its latent potentials and thus accelerate the opening, as indicated by 61. The two times of transistor 91. When the pulse at the input stronger 57, 58 are finished with the exception of the capacities 62, the process is reversed and the tran- and 63 equal. The capacitor 62 serves to under- 65 sistor 90 becomes non-conductive while the transistor suppress unwanted vibrations and the 91 becomes conductive.

Capacitor 63 as a coupling capacitor accordingly causes an atomic explosion

subsequent filter. generated first impulse with rapid rise

. 309 610/91

A coupling capacitor 85 holds signals at a very slow rate Rise, such as B. annoying sunlight, back.

The flip-flop 86 is also used to receive the first thermal signal with a steep rising edge a fast responding Schmitt trigger. This stage contains a transistor that is de-energized in the idle state 90, a transistor that is conductive when idle

1

time an output signal on the line 104. This output signal depends on the rising edge of the incoming pulses. The various filters and capacities eliminate all disruptive influences that arise from fluctuations in the infrared content of sunlight and only allow impulses that come from an atomic explosion to pass through. In addition, the filter 80 rejects signals resulting from lightning.

The facilities provided for receiving slow rising edge pulses are shown in FIG. 3 by the reference number 51 and in FIG. 6 shown in detail. The output 105 a of the filter 80 (FIG. 5) is connected to the input 105 b of the slowly responding multivibrator in FIG. 6. This flip-flop circuit consists of a Schmitt trigger 106, an OR circuit 107 and an AND circuit 108, a delay circuit 110 (150 ms) and a coupling transistor 111. The diodes 112, 113, the Zener diode 114 and the resistor 115 form the OR circuit 107 . the Zener diode 114 limits the voltage signal which comes through the diodes 112, 113, to the voltage coming through the diode 116 to adapt. The diodes 116, 117 and the resistor 118 form the AND circuit 108. The diode 119 applies large negative pulse voltages to ground.

The resistor 120 and the capacitor 121 represent a delay circuit with a time constant of 150 ms. The base bias of the transistor 111 is small in the quiescent state because of the current flow through the resistor 120, the diode 117 and the resistor 115. If the diodes 116 and 117 are made nonconductive by a positive voltage on the cathodes, the capacitor 121 charges and an exponentially increasing voltage appears at the base of the transistor 111. The time constant of the delay circuit 110 (resistor 118 and capacitor 121) is dimensioned so that the voltages on its capacitor do not cause the Schmitt trigger 106 to respond before about 50 ms.

The fast-responding logic circuit reacts to thermal impulses with a rapidly and slowly rising pulse edge. The arrangement also responds when the impulse appears with a slow rise time and the first impulse is so weakened that it can no longer be picked up. On the other hand, a pulse with a fast rising edge is not picked up by itself. If a pulse with a rapid rise time is attenuated too much before a slow pulse appears, an input signal of the AND circuit 108 is switched off so that no output signal is produced.

In addition, circuit arrangements are provided which trigger a signal when an infrared pulse arrives, but do not respond to a test process. These arrangements are shown in FIG. 3 with the reference numerals 130 and 131 and in FIG. 7 shown in detail. The F i g. 7 essentially shows an OR circuit 132 and a flip-flop circuit 133. The OR circuit 132 consists of the resistor 134, the diode 135, the resistor 136 and the diode 137. When an anode of the diodes 135 or 137 goes positive, the base of the NPN- Transistor 138 is also positive and the flip-flop operates. The capacitors 139 and 140 separate the OR circuit 132 from the outside

DC circuit. The resistors 142, 143 serve as discharge resistors for the capacitors 139, 140 during the switchover by the channel separation relays.

The flip-flop circuit 133 and the reset device 144 with the double base diode 158 are described below. The NPN transistors 138, 145 form the flip-flop circuit 133, the collector resistance of the transistor 145 consists of the resistor 146 and the winding of the relay 147. The resistor 146 limits the voltage across the relay 147 in order to avoid damage by overvoltages. The remaining components of the flip-flop 133 are the base voltage divider 150, 151, the emitter and collector resistor 152, 153 for the transistor 138, a coupling resistor 154 and a base resistor 155 for the transistor 145. The emitter resistor 152 common to the transistors 138, 145 provides the Schmitt trigger effect.

The quick response toggle switch 133 is reset after a short period of time. For this purpose, an automatic reset device 144 is provided, which contains a double base diode 158 . The resistors 159, 160 and the capacitor 161 form an adjustable time constant element in the base bias voltage source of the double base diode 158. When the collector potential of the transistor 145 approaches the potential B + (by a positive signal voltage which is passed through the OR circuit 132 to the base of the transistor 138 ) the voltage across the capacitor 161 and the emitter potential of the double base diode 158 also assume the value B +. However, the magnitude of the voltage rise is limited by the resistors 159, 160. Reach the emitter voltages of about 60% of the voltage at the base B 2, the double base diode 158 becomes conductive and produces a positive voltage peak across the resistors 162, 163. (As a result of Leitendwerdens the double base diode 158, the charging of the capacitor 161 is discharged). This voltage peak is fed to the transistor 145 via the diode 164 , so that the flip-flop 133 returns to its rest position.

During the period in which the transistor 145 is conductive, a signal is coupled out via the line 166 in order to switch the slowly responding logic circuit 51, FIG. 3, to release. After the automatic reset, this decoupling signal is disconnected in order to prevent the slow-responding logic circuit from anticipating a response of the AND circuit 108 .

The output circuit according to FIG. 7 is again in the slow-responding logic circuit 51, as indicated by reference number 131 in FIG. 3 shown, provided. The arrangement 131 differs from that according to FIG. 7 only because the time constant, which is given by the resistors 159, 160 and the capacitor 161 , makes the double base diode conductive only after about half a second.

The flip-flop 133 (transistor 145 conductive) energizes one of the relays 147, 168 depending on whether the fast-responding logic circuit 50 or the slow-responding logic circuit 51 has responded. The door closer is then actuated via contact 169 or 170. These contacts form a neither-nor circuit, because the door closes when neither contact 169 nor the

A TX ί S A

Contact 170 is closed. The capacitors 171, 172 serve to quench the contacts 169, 170

The relays 147, 168 are components of a reset and test circuit 173, which is essentially the right side of FIG. 3 and 7 is shown. In addition to these relays, the circuit 173 contains a Differentiator 174 for converting pulses, which when the test switch 175 is converted into a the channel positions 176, 177 is brought. The output 178 a of the differentiator is with the Connection 178 6 of the channel separation circuit according to FIG. 8 connected. As shown in FIG. 3 shows a similar connection. The test takes place automatically after the switch 175 closes selected channel to be tested. The test is controlled by a timer 180 which has a Contains DC motor, which has a gear (not shown) at one revolution per hour drives two cams. Each cam actuates one or more microswitches to determine the test sequence. The microswitches lead the test circuits 52 or 52 '(Fig. 3) depending on the position of switch 175 signals.

Switching means are also provided, one channel of the detector device from the output circuit to be disconnected and to be connected to the test facility. This allows a, to imitate an explosion Test signal actuate the detector device without triggering an alarm. The test circuit can be a simple relay with an associated control circuit (Fig. 8), which consists of a There is flip-flop 182 with four transistors. The diodes 183, 184 form a control circuit through which the flip-flop 182 only responds to positively directed voltages. Such a control signal comes from timer 180 and appears on port 178. Another such control signal comes from the fast-responding flip-flop 86 via the capacitor 185. The resistors 186, 187, 188 serve as overvoltage protection for transistor 189.

The remaining switching elements are the base voltage divider 190 for the NPN transistor 189, a Emitter voltage divider 191, 192, a load resistor 193, an emitter resistor 194 for the NPN transistor 195, a base voltage divider 196 and the load resistor 186.

The current through the output transistor 200 controls the pull-in or the drop-out of the channel isolating relay 201. Resistor 202 serves as overvoltage protection for the relay. A zener diode 203 and the Resistor 204 stabilize the voltage across transistor 200 so that it is directly from the transistor 205 can be coupled to form a current amplifier. The resistor 206 is used for generation the base bias for PNP transistor 200 and the emitter bias of the transistor 205. Resistor 207 is the collector resistance for transistor 205.

When a test is initiated, flip-flop 182 overrides flip-flop 208 for the test shown in FIG. 9 is shown. It has two inputs 210, 211, which are controlled as a function of the contacts' 212 of the relay 201 (FIGS. 3 and 8) by the rapidly or slowly responding logic circuit. It also contains two outputs 213 α and 214 a, which lead to the connections b with the same reference number in the circuits of FIGS. 8 and 6. The circuit of FIG. 9 is essentially the same as that shown in the left-hand dashed rectangle in FIG. 6 is shown.

When the output 214 is energized α, receives an input of the OR circuit 107 (F i g. 3 and 6) a criterion to release the slowly responding logical circuit so that it can respond to a simulated explosion. If the output 213 a is energized, then the channel separation circuit according to FIG. 8 left on. The relay 201 is energized, the output circuits 130 and 131 switched off and the test procedure carried out.

If an atomic explosion of the required size occurs in the reception area of the detector device on, the thermal signal is picked up by the optical receiver 55, through the photocell 22 converted into electrical signals and fed to the amplifier 57 via the cathode amplifier 40.

The signal is then passed through amplifiers 57, 58

amplifies and reaches the filter 80. This filter '

"withstands high frequencies, for example caused by lightning Signals and those with a very slow rise time caused by the sun's rays can, back.

A fast and a slow signal from a nuclear explosion with an amplitude from Z. B. 4 volts causes the flip-flop 86 to deliver a • positive pulse, which through the contacts 220 of the non-energized channel separation relay reaches the fast-responding output circuit 130 This contains the OR circuit 132, which allows a signal from the channel 50 or 50 'to pass through. from From the OR circuit 132, the pulse is sent to the flip-flop circuit 133, which controls the relay 147. The The relay is energized in the idle state and supplies power to the load circuit via contacts 169. The impulse the fast response flip-flop 86 changes the state of the flip-flop 133, and the relay 147 falls off.

From the flip-flop 133, the signal is also sent to the slowly responding flip-flop 51

the OR circuit 107 and the AND circuit 108 are supplied. The signal from the filter 80 also reaches the AND circuit 108, where it is matched with the signal of the Toggle circuit 133, which comes via the OR circuit 107, comes into agreement. The signal from the low-pass filter 80 must be present longer than about 50 ms before the circuit allows the output circuit 131 is knocked over.

Before the circuit with the double base diode flips back or at the same time as the slow one Pulse appears, the signal from the optical receiver 55 is also passed through the AND circuit 108 another output circuit 131, which controls the fall of the relay 168, fed. While the time in which the relays 147 and 168 have dropped out, a signal is sent to the door locking device. The time for this can e.g. B. can be set with 1 to 3 seconds. Then the flip-flops go 133 and 133 'automatically return to the rest position, and the output relays 147, 168 pick up again.

A test sequence can be initiated by either an automatic timer 180 or a push button switch 221 can be initiated manually. This causes a voltage jump to the flip-flop circuit 182, the

then changes its state, and the relay 201 energizes, which triggers the following processes:

1. Isolation of the output relays 147 and 168 from the signal path so that they cannot be excited by the test signal.

2. Closing the contacts 222, which switch the signal amplifier 56 to maximum amplification.

3. Switching on the test lamp 46 via the contacts 223 and the line 224 (FIGS. 2 and 3) to the receiver 55.

4. Connection of the signal path to the actuated contacts 212, 225 to the test circuit 52.

5. Switch off the voltage from the control lamp 226 and apply it to the lamp 227 to monitor the test.

The automatically or manually supplied signal at the same time releases the relay 201 'in order to switch on the channel 49 for the reception of a possibly occurring atomic explosion for the time in which the channel 48 is checked.

The lighting up of the test lamp 46 in the optical receiver 55 generates a signal in the photocell 22 which is passed through the amplifier 56, the filter 80 and the flip-flop circuit 86 to the flip-flop circuit 106 . The two inputs of the flip-flop 208 simulate the inputs to the relays 147 and 168 . This flip-flop is set in the idle state so that the stage connected to the flip-flop 182 is not energized. The signal supplied by the flip-flop circuit 86 changes the state of the flip-flop circuit 208. The stage of the flip-flop circuit that is live in the idle state is now switched off, and the other applies a positive signal to the OR circuit 107 and the AND circuit 108. The mode of operation of this circuit is the same as if it were triggered by a nuclear explosion. The output signal of the flip-flop 106 is fed via the contacts 225 of the channel separation relay to the flip-flop circuit 208 , which returns to its idle state. The first stage of the flip-flop circuit 182 is energized, the relay 201 drops out, and the channel 48 is returned to the normal operating mode.

If, as a result of a faulty switching, no (correct) idle output signal occurs from the flip-flops 133 and 182 , the channel isolating relay 201 does not return to its idle position and the monitoring lamp 227 remains illuminated. If the toggle switch 182 is to be reset to the idle position to separate the channels, either because a fault has temporarily occurred or a switch-on voltage surge has caused an incorrect setting in the toggle switch, a reset switch 230 is actuated to apply a voltage to the toggle switch 182 ' im Bring channel 49 , which returns this to the correct position. In order to bring the test circuit into the correct starting position, the switch 221 must be operated and a test sequence carried out.

In a further embodiment of the invention, electromagnetic Waves that arise during the atomic explosion are evaluated as a criterion. This energy spreads from the source of the explosion in the same way as radio signals from an omnidirectional antenna. By doing The embodiment according to FIG. 10 is only one receiving channel shown. It is, however, expedient, analogously to FIG. 3, insert two channels.

As mentioned at the beginning, the

plosion-related magnetic wave can be understood as a binary signal. This can e.g. B. the binary Correspond to code "010". Should the magnetic wave of another explosion another Have code, the arrangement according to the invention can also be set to this code.

The explosion detector shown in FIG. 10 has an antenna 250, a logic circuit 251, a test circuit 252 and an output circuit 253 . The antenna, which is in the open air, should be able to withstand the explosion wave if possible. The circuit 251 contains all the necessary electronic devices. A detailed description of the same is unnecessary and it is therefore necessary to refer to the preceding description of FIGS. 3 to 9 referenced. The antenna 250 consists of a vertical rod which, for. B. was pulled from a steel tube. This tube is preferably located on an antenna base that is attached at ground level. An opening and a space are provided in the antenna base, in which the antenna connections can be made and the lightning protection devices are accommodated. The signal is fed to the control station via a coaxial cable. This signal, which forms a single oscillation train with a duration of approximately 100 microseconds and has the critical curve shape, is shown arbitrarily in FIG. All other signals are undesirable. In order to prevent most of the undesired signals from triggering a function, a filter 255 is provided in the amplifier section of the electronic control, which causes only signals with the waveform shown in FIG. 11 appear at the output of amplifier 256 . The amplifier 256 is so created that the first negative reception pulse 254 generates a negative output pulse 257 (FIG. 11) at point P1 (FIG. 10). The following positively directed pulse 258 of the received signal causes positive and negative output pulses 259 and 260. In other words, a negative input signal followed by a positive one results in two negative output pulses 257, 260 at point P1, which are separated by a positively directed pulse. Other curve shapes can also be used for the evaluation.

Even if a single negative signal is received, there is no output signal, be it another negative signal is received 200 μ after the falling edge of the first negative signal. The signals 257, 259 and 260 of FIG. 11 are fed to a Schmitt trigger 264, as shown in FIG. This is the detailed circuit of the logic arrangement 265 of the block diagram of FIG. 10. This Schmitt trigger responds only when the signal which is fed to the terminal 266 is below a predetermined comparison level. Accordingly, when a negative signal is applied to the Schmitt trigger 264 , the latter generates pulses as represented by A and B in FIG. The flip-flop 268 is then actuated by the falling edge of the first output signal of the Schmitt trigger with a switching time of 200 fts, as indicated by C and D in FIG. 11 is indicated. The Α signal of the Schmitt trigger and the D signal of the flip-flop 268 are fed to the input of the Undstufc 269. This is also where the output of a flip-flop 270 arrives at a rate of 1 ms.

The signal of the amplifier 256 and the signal C of the flip-flop 268 reach the and stage 272, the there is no output signal under the given circumstances (negative input pulses). That is why it is located the output of flip-flop 270 is permanently in the "!" position. When the next negative pulse comes on the connection terminal 266 appears and the trigger stage 268 (200 με) a 1-signal at the "And-stage" 269 causes an output signal 274 (FIG. 11). ίο

Special precautions have been taken to hold back unwanted signals. To the simple Description assume that the wrong signal for pulse 254 has positive polarity, d. that is, the corresponding critical curve shape is the reverse of the uppermost curve in FIG Fig. 11. Accordingly, a first positive pulse is received by the AND circuit 272 and causes the flip-flop 270 (1 ms) to change its state and thereby the release signal from the and stage 269 separates. Subject to these conditions, until the end of the 1 ms period, no signal can get through the output stage.

In the circuit of FIG. 10, a signal is received as a result of a correct negative pulse 254 through the emitter follower 278 serving for impedance conversion and through the filter 255, where very slow ones Frequencies are eliminated. Then the signals are amplified and passed through a gain controller 279 and then amplified again in an amplifier 280. Another emitter follower 281 at the output of the amplifier 280 is used to load the same by the following logic circuit 265 to avoid. The signal is then, as described above, through the logisehe Circuit 265 (Fig. 12). The output signal of the logic circuit 265 reaches an output trigger circuit via contacts of a channel isolating relay 288 282, which are essentially like the circuit according to FIG. 7 is constructed. In the rest position the output signals via the contacts can influence the flip-flop 282, thereby reducing the contacts 283 of the output relay can be closed. The time the output relay remains energized is controlled by a double base diode, which resets the flip-flop to the rest position, as already described in the explanation of the circuits 133 and 144.

The radiation detector device also contains a function test device. It consists of one DC motor whose rotating cam closes contacts 284 periodically so that once in the An automatic test takes place every hour. According to the embodiment of FIG. 3 can the stages 278, 255, 256, 279, 280, 281, 266 and 265 are provided twice in the arrangement 285. This allows nuclear explosions to be monitored with the other channel while testing one channel will.

Once an hour, a test flip-flop 286 checks the voltage of a power source through a Timer contact 284 supplied. As a result, a relay control circuit 287 is started, which thereby a test relay 288 energized. Its contacts 289 close and switch the amplification of the amplifier 256, 280 to maximum gain. The output of logic circuit 265 is applied to test flip-flop 286 switched over, and the status indicators (lamps »Normal« and »Test / Failure«) change from the rest position to the test display. This makes the power supply voltage a dual base timer 291, which operates in the same way as circuit 144 (FIG. 7).

The dual base timer 291 generates a single pulse upon initiation of a test sequence of about 300 ms. The main purpose of the delay is to enable all relay contacts to be actuated can and that the »Check / Ausfalk indicator light can light up long enough. The output of the pulse generator 291 causes a Flipper 292 with a turnaround time of 100 μβ to generate a pulse which is fed to an oscillator 293. This calls a single vibration train with a frequency of 10 kHz, which is precise in terms of curve shape and polarity Represents a replica of the vibrational train that occurs in an atomic explosion. This vibration reaches the emitter follower 278 via the antenna connection. The oscillator signal is then passed through the subsequent circuit is processed in the same way as a real signal. The output of the logical Circuit 265 causes the test flip-flop 286 to return to its rest position. This brings the relay 288 to waste and then return the assembly to normal operation.

If for any reason a successful test is not performed, the relay will remain 288 is energized and the "test / failure" lamp continues to light because the test toggle 286 is not in the rest position returns.

A reset switch 294 is provided which controls the test toggle 286 when the first Switching on the system remains in the test position. If an error occurs and the "check / failure" - If the lamp continues to glow, the test circuit can also be reset manually using the reset switch 291 to initiate another check. In addition, an examination by the Actuation of a test switch 295 can be brought about by hand.

For this purpose 4 sheets of drawings 309 610 91

Claims (10)

Patent claims: 1. Atomic explosion detector device with one or more reception channels set up for analyzing the curve shape of thermal and / or high-frequency signals, which when receiving a characteristic thermal or / and high-frequency signal at their output, which occurs only in the event of an atomic explosion, generate a signal at their output that is in a connected triggering device triggers a warning and / or a work function, characterized in that each receiving channel (48, 49, 251) contains electrical filters (80, 85, 255) for preselection of the curve shape of the signals received on the input side and that one for a functional test Receiving channel, a test device (52, 252) is provided, which switches to the test state by a test control signal designed as an electrical voltage jump and indicates the test state with a signal lamp (227) that the test arrangement in the test state the output of the receiving channel to be tested (48 , 285) from a trigger ano rdnung (130, 131, 253) separates and switches to the test arrangement that furthermore the test set-up in the test state generates a test signal which is modeled on the signal arriving at the input of the atomic explosion detector device in the event of an atomic explosion and enters the input of the test signal Receiving channel conducts and that finally the signal generated at the output of the receiving channel to be tested, which only arises when the test signal arrives at the input of the receiving channel to be tested and this receiving channel is working properly, tilts the test system back to its idle state. 2. Atomic explosion detector device according to claim 1, characterized in that the test arrangement (52, 252) contains a flip-flop circuit (182, 286) which defines the state of the test circuit and which controls an isolating relay (201, 288) which is in the flipped state the flip-flop switches the output or the outputs of the receiving channel (48) to be tested, and that the isolating relay switches on a replica device (46, 291 to 293) for generating the test signal in the test state of the test system. 3. Atomic explosion detector device according to one of claims 1 or 2, characterized in that the tripping arrangement (130, 131, 253 ) contains a trigger circuit (133, 282) , in particular designed as a flip-flop circuit, which in the tilted state has a trigger relay ( 147, 168) and a reset arrangement (144) switches on, that the contacts (169, 170, 283) of the release relay trigger a door closer or a public alarm and that the reset arrangement automatically switches the toggle switch, which is in the tilted state, to the idle state after a preset time tilts back. 4. Atomic explosion detector device according to one of the preceding claims, characterized in that two receiving channels (48, 49) are provided and that during the functional test of one receiving channel, the other receiving channel is ready to receive and is connected to the triggering arrangement (130, 131, 253) . 5. Atomic explosion detector device according to one of the preceding claims, characterized in that a clock (180) controls the test sequence and the flip-flop (182) of the test arrangement (52) of the channel to be tested (48) with a test control signal, in particular via a channel selector switch (175 ) flips into the test state. 6. Atomic explosion detector device according to one of the preceding claims, characterized in that a detector receiver (55) with a photo cell (22) enclosed by an infrared filter (21) is provided in each receiving channel, that each receiving channel (48, 49) has a flip-flop circuit ( 86) for pulses with a rapid rise and a flip-flop circuit (106) for pulses with a slow rise, that a triggering arrangement (130) assigned to the rapidly rising pulses and a triggering arrangement (131) assigned to the slowly rising pulses are also provided, and finally the flip-flops (86, 106) and triggering arrangements (130, 131) are connected to one another in such a way that the triggering arrangements trigger a warning or work function when the rapidly rising and slowly rising pulse or only the slowly rising pulse of the thermal signal generated by an atomic explosion is received. 7. Atomic explosion detector device according to claim 6, characterized in that the infrared filter (21) consists of filter glass panes (30 to 37) which are transparent to light only for an optical bandwidth of about 7000 to 9000 angstroms. 8. atomic explosion detector device according to ■ claim 6 or 7, characterized in that the detector receiver (55) contains a lamp (46), in particular within the infrared filter (21) is attached and which is switched on in the test state of the test arrangement (52). 9. Atomic explosion detector device according to one of claims 1 to 5, characterized in that the detector receiver is an antenna (250) for high-frequency electromagnetic waves, that further in a logic circuit (265). of the receiving channel (251) a Schmitt trigger stage (264 ) generates a binary-coded digital signal (A, B) from the wave (257, 259, 260) which has passed through the receiving channel, and that in the logic circuit (265) digital linking stages ( 269, 270) and time-delayed flip-flops (268, 270) are connected to one another in such a way that an output signal (274) is only produced at the output of the logic circuit when the binary-coded digital signal (A, B) has a predetermined, in particular a nuclear explosion characteristic. 10. Atomic explosion detector device according to claim 9, characterized in that an oscillator (293) is provided, which after triggering with a test pulse a single vibration 1 44 1 41 Z 3 4 Zug and that this single vibrational atomic explosion occurs, consists in the radiation Zug a replica of a single oscillation train of an electromagnesion during an atomic explosion Occurring vibration train is and over tables wave. This vibration train is through the the antenna connection in the receiving channel polarity of the first two half-waves and the intervening (251) got. 5 time difference. Of half of these two half-waves can be interpreted as a binary code signal, and the evaluation circuit of the detector can be set up so that they only responds when the correct binary code is recorded lo men will. It is already known to detect a nuclear explosion with optical devices. This is in one Case (Technische Rundschau, Volume 54, No. 17 of 13.4.1962, p. 2) a bundle of 200 telescopic The invention relates to an atomic explosion detector 15 provided with filter sets and photomultipliers, Tor device with one or more connected to the analog with electronic evaluation devices analysis of the curve shape of thermal or / and are. In another case there is an order Reception channels equipped with high-frequency signals from wide-angle lenses for recording the fluorescent tubes, the reception of a chance light from the atmosphere, from interference filter, only arise in an atomic explosion, photo multipliers and the electronic unit thermal and / or high-frequency signaling devices, in particular amplifiers and analyzers produce a signal at their output, which in ren. Each arrangement has six separate complete an activated triggering device a warning ^ channels, which, in order to rule out falsifications, in and / or work function triggers. . . "three coincidence pairs with different spectra The technical requirements that are placed on an atoler's sensitivity. In both cases mexplosionsdetektor are provided, are manifold, a considerable equipment-technical effort is required. The most important requirement is that one of these. Such a device must never fail, because you can also detect high-frequency detonation first-time response in an emergency may be their only electromagnetic waves is known, first function. Therefore a device for measuring the explosion has to be provided become known that the facility is uninterrupted by atomic explosions (German chen itself monitored and with an error display Auslegeschrift 1176 898), which with the help of a Druckfür any kind of necessary repair ■ transducer the characteristic pressure wave of an atomic accident is. The detector must respond to a phenomenon, 35 relay circuit analyzed and evaluated. The soft occurs in every atomic explosion. Also must know the pressure wave is however for early detection this phenomenon is unsuitable in terms of its timing of an atomic explosion, If the event occurs, it can be received with the greatest possible certainty, after all it is known to be monitored because if it occurs and disappears before the event on monitoring equipment periodically Detector can respond, so will simulate explosion 40 (German Auslegeschrift 1130 633) not displayed. On the other hand, when the detector is open and thus the monitoring device itself closes consider a phenomenon that occurs much later. The monitoring device is located thus considerable damage can occur before both briefly and periodically alternating one after the other. For example, a shelter door is closed, in the monitoring and in the test state. If it fails it has been found that reliable practice of the periodic change as a result of the entry phenomenon, which during a nuclear explosion is the least of the event to be monitored or as a result of occurs, represents a thermal signal, which two of a functional failure occurs the alarm message. characteristic energy peaks in the ultraviolet, a monitoring device designed in this way and the ultra-red light spectra. However, it assumes that the surveillance die first peak has a very fast rise time, 50 event lasts longer than a state period, the second tip a slow one. The first energy - which is not the case for a nuclear explosion, Point occurs at the moment of the detonation of the atom. In addition, the alarm must clearly have a dual explosion and the second a moment later see the occurrence of an actual atomic explosion ter. Depending on the extent of the explosion, a distinction can be made between a functional failure and a functional failure. Period between the two energy peaks of 55 The object of the invention is to provide a a few hundred milliseconds to several se- new, improved atomic explosion detector announcements last. create, which is provided with an error display and The first thermal pulse contains about 1% of that immediately following the first thermal pulse total thermal energy that responds to the explosion and emits thermal energy when the second is received will. Therefore, the response of the 60 see pulse of a nuclear explosion can be a signal from the device does not trigger the receipt of the first impulse. not be made dependent. The detector must also be aimed at a work even if only the second thermal implosion occurs, electromagnetic wave impulse is recorded. Since this, however, speak the tip to trigger an alarm when this the 65 must have a predetermined curve shape only much later than the first pulse reached. Detector also record this, in order to ensure a fast. Furthermore, an automatic test device should Allow response to the atomic explosion. be present, which continuously over- Another phenomenon that is awake during one and immediately indicates any error.