DE1367797U - - Google Patents

Info

Publication number
DE1367797U
DE1367797U DENDAT1367797D DE1367797DU DE1367797U DE 1367797 U DE1367797 U DE 1367797U DE NDAT1367797 D DENDAT1367797 D DE NDAT1367797D DE 1367797D U DE1367797D U DE 1367797DU DE 1367797 U DE1367797 U DE 1367797U
Authority
DE
Germany
Prior art keywords
ywmobtikwit
wmhit
winwr
wbuk
tslsval
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DENDAT1367797D
Other languages
German (de)
English (en)
Publication of DE1367797U publication Critical patent/DE1367797U/de
Active legal-status Critical Current

Links

Landscapes

  • Cosmetics (AREA)
  • Medicines That Contain Protein Lipid Enzymes And Other Medicines (AREA)
DENDAT1367797D Active DE1367797U (enExample)

Publications (1)

Publication Number Publication Date
DE1367797U true DE1367797U (enExample)

Family

ID=681149

Family Applications (1)

Application Number Title Priority Date Filing Date
DENDAT1367797D Active DE1367797U (enExample)

Country Status (1)

Country Link
DE (1) DE1367797U (enExample)

Similar Documents

Publication Publication Date Title
EP0539471B1 (en) Confocal scanning optical microscope
EP0495930A1 (en) Laser for confocal microscope
US6462345B1 (en) Process and arrangement for confocal microscopy
US6094300A (en) Laser scanning microscope
US5296703A (en) Scanning confocal microscope using fluorescence detection
US7433119B2 (en) Scanning microscope
US9234846B2 (en) High-resolution microscope and method for determining the two- or three-dimensional positions of objects
EP0927947A2 (en) Two-dimensional bar code laser marking method
EP1223451B1 (en) Interference microscope and method for operating an interference microscope
US20090161207A1 (en) Optical scanning microscope
WO1996016767A1 (en) Laser marking apparatus
US6781752B2 (en) Optical arrangement for the illumination of specimens for confocal scanning microscopes
JPH10206745A (ja) 走査型光学顕微鏡
GB2115923A (en) Semiconductor wafer alignment
US6930780B2 (en) Method for taking a spatially resolved spectrum by means of a fourier-transform (FT)-spectrometer and such spectrometer
SU1323194A1 (ru) Устройство дл контрол работы радиально-ковочной машины
US20030063367A1 (en) Method for ascertaining position values, and scanning microscope
US20040032651A1 (en) Method for scanning microscopy, and scanning microscope
JP2729451B2 (ja) レーザマーキング方法および装置
JP2005043892A (ja) 共焦点ラスタ顕微鏡
DE1357772U (enExample)
US7453578B2 (en) 4Pi microscope
DE1486913U (enExample)
SU1401275A1 (ru) Способ контрол профил криволинейной поверхности издели и устройство дл его осуществлени
SU157653A1 (enExample)