DE1186234B - Microscope objective with a leveled field of view - Google Patents

Microscope objective with a leveled field of view

Info

Publication number
DE1186234B
DE1186234B DEL43110A DEL0043110A DE1186234B DE 1186234 B DE1186234 B DE 1186234B DE L43110 A DEL43110 A DE L43110A DE L0043110 A DEL0043110 A DE L0043110A DE 1186234 B DE1186234 B DE 1186234B
Authority
DE
Germany
Prior art keywords
microscope objective
view
collecting
lens
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DEL43110A
Other languages
German (de)
Inventor
Walter Klein
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ernst Leitz Wetzlar GmbH
Original Assignee
Ernst Leitz Wetzlar GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ernst Leitz Wetzlar GmbH filed Critical Ernst Leitz Wetzlar GmbH
Priority to DEL43110A priority Critical patent/DE1186234B/en
Priority to CH975963A priority patent/CH403331A/en
Priority to GB33231/63A priority patent/GB1037434A/en
Priority to AT788263A priority patent/AT244081B/en
Publication of DE1186234B publication Critical patent/DE1186234B/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/02Objectives

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Lenses (AREA)

Description

BUNDESREPUBLIK DEUTSCHLANDFEDERAL REPUBLIC OF GERMANY

DEUTSCHESGERMAN

PATENTAMTPATENT OFFICE

AUSLEGESCHRIFTEDITORIAL

Internat. Kl.: G 02 bBoarding school Class: G 02 b

Nummer:
Aktenzeichen:
Anmeldetag:
Auslegetag:
Number:
File number:
Registration date:
Display day:

Deutsche Kl.: 42 h-3/01 German class: 42 h -3/01

1186 234
L43110IX a/42h
3. Oktober 1962
28. Januar 1965
1186 234
L43110IX a / 42h
3rd October 1962
January 28, 1965

Es ist bekannt, bei Mikroskopobjektiven, insbesondere bei Trockensystemen, einen dicken negativen Meniskus als Frontlinse zu verwenden, um damit eine Korrektion der Bildfeldwölbung zu erreichen. Die durch diesen dicken negativen Meniskus hervorgerufene Erschwerung bei der Korrektion der übrigen Bildfehler wird dann durch zusätzliche andere Konstruktionselemente in den Objektiven ausgeglichen. Objektive dieser Art sind beispielsweise durch die deutschen Patentschriften 821126,924 539, 970 606 bekanntgeworden.It is known that microscope objectives, especially dry systems, have a thick negative To use meniscus as a front lens in order to achieve a correction of the field curvature. The difficulty in correcting the caused by this thick negative meniscus The remaining image errors are then caused by additional other construction elements in the lenses balanced. Lenses of this type are, for example, by the German patents 821126,924 539, 970 606 became known.

Nach der vorliegenden Erfindung kann nun ebenfalls eine ausgezeichnete Korrektion sämtlicher Bildfehler, insbesondere der Bildfeldwölbung und des Astigmatismus, sowie eine gute Korrektion aller außeraxialen Bildfehler, insbesondere der Asymmetriefehler, erreicht werden. Das ist dadurch möglich, daß in einem Objektiv, wie es beispielsweise in den obengenannten Patentschriften, insbesondere der deutschen Patentschrift 924 539, dargestellt ist, zwei sammelnde Kittflächen angeordnet werden, die ihre hohlen Seiten dem Objekt zukehren. Am zweckmäßigsten werden diese sammelnden Kittflächen im bildseitigen Teil des Objektivs untergebracht. Besonders vorteilhaft ist es, im letzten Glied des objektseitigen Teiles sowie in dem mit großem Abstand darauf folgenden negativen Korrektionsglied diese sammelnden Kittflächen vorzusehen. Dadurch unterscheiden sich die neuen Objektive wesentlich, insbe-According to the present invention, an excellent correction of all image errors, especially the field curvature and astigmatism, as well as a good correction of all off-axis image errors, in particular the asymmetry error, can be achieved. This is possible because that in a lens, as for example in the above-mentioned patents, in particular the German Patent 924 539, is shown, two collecting putty surfaces are arranged, the turn their hollow sides towards the object. These collecting putty surfaces are most useful in the housed image-side part of the lens. It is particularly advantageous in the last link of the object-side Part as well as in the negative corrective element that follows it with a large distance collecting putty surfaces to be provided. As a result, the new lenses differ significantly, in particular

Mikroskopobjektiv mit geebnetem BildfeldMicroscope objective with a leveled field of view

Anmelder:Applicant:

Ernst Leitz G. m. b. H.,Ernst Leitz G. m. B. H.,

Wetzlar, Laufdorfer WegWetzlar, Laufdorfer Weg

Als Erfinder benannt:Named as inventor:

Walter Klein, Wißmar (Kr. Wetzlar)Walter Klein, Wißmar (district of Wetzlar)

sondere von dem in der Fig. 3 der deutschen Patentschrift 924 539 dargestellten Typ.special from that in Fig. 3 of the German The type shown in U.S. Patent 924,539.

Zur Erläuterung der Wirkungsweise der beiden sammelnden Kittflächen kann gesagt werden, daß bei dem erfindungsgemäßen Mikroskopobjektiv durchTo explain the mode of action of the two collecting cemented surfaces, it can be said that with the microscope objective according to the invention

ao die im bildseitigen Negativglied angeordnete sammelnde Kittfläche die Ränder der Komabüschel und durch die im vorhergehenden pupillennahen Glied vorhandene sammelnde Kittfläche die Zonen innerhalb der Komabüschel korrigiert werden.ao the collecting putty surface arranged in the negative element on the image side, the edges of the coma tufts and through the collecting cement surface present in the preceding member near the pupil, the zones within the coma tufts are corrected.

In der Abbildung ist ein gemäß Anspruch 3 ausgebildetes Objektiv nach der Erfindung dargestellt. Die sammelnden Kittflächen sind dabei die Flächen r15. In der Tabelle sind die genauen DatenIn the figure, an objective according to the invention designed according to claim 3 is shown. The collecting putty surfaces are the surfaces r 15 . In the table are the exact dates

r12 undr 12 and

für das Objektiv angegeben. Dabei bedeutetspecified for the lens. Thereby means

r die Radien, r the radii,

d die Linsendicken, d the lens thickness,

/ die Luftabstände,/ the air gaps,

ne den Brechwert des verwendeten Glases für die e-Linie, n e is the refractive index of the glass used for the e-line,

vt, den zu diesen Glassorten gehörigen Abbe-Wert,v t , the Abbe value associated with these types of glass,

fe die Brennweite des Gesamtsystems, f e is the focal length of the entire system,

A die Apertur, A the aperture,

ß'e den Abbildungsmaßstab.ß'e the reproduction scale.

Claims (3)

Patentansprüche:Patent claims: 1. Mikroskopobjektiv mit geebnetem Bildfeld, bei dem auf einen dicken negativen Meniskus als Frontlinse mindestens drei weitere Glieder in Abständen, die jeweils kleiner sind als die Mittendicke des vorhergehenden Gliedes, folgen, bei dem in einem großen Abstand ein weiteres negatives Glied auf der Bildseite vorgesehen ist, dadurch gekennzeichnet, daß in dem1. Microscope objective with a flattened field of view with a thick negative meniscus as Front lens at least three more links at intervals that are smaller than the center thickness of the preceding term, followed by another negative one at a large distance Link is provided on the image side, characterized in that in the 409 770/168409 770/168 ί 186 234ί 186 234 Objektiv zwei sammelnde Kittflächen vorgesehen sind, die ihre hohlen Seiten dem Objekt zukehren. Objectively two collecting cemented surfaces are provided, which turn their hollow sides towards the object. 2. Mikroskopobjektiv nach Anspruch 1, dadurch gekennzeichnet, daß die sammelnden Kittflächen in den bildseitigen Gliedern des Objektivs vorgesehen sind.2. Microscope objective according to claim 1, characterized in that the collecting cemented surfaces are provided in the image-side members of the lens. 3. Mikroskopobjektiv nach den Ansprüchen 1 und 2, gekennzeichnet durch folgende Daten:3. Microscope objective according to claims 1 and 2, characterized by the following data: r2 =r 2 = r„ =r "= Ta = Ta = Γ- =Γ- = r =r = ra = r a = 1IO = 1 IO = ru r u == ri5 = r i5 = rie = r ie = fe =fe = dodo = 0,17= 0.17 1,524911.52491 = 0,8807= 0.8807 1,788691.78869 VeVe I0 I 0 = 4,56= 4.56 58,358.3 -2,392-2,392 dx d x = 0,25= 0.25 1,487721.48772 -3,96-3.96 1I 1 I. = 1,9= 1.9 43,543.5 -23,999-23.999 d2 d 2 = 0,33= 0.33 1,553791.55379 -7,98-7.98 kk = 1,0= 1.0 1,487721.48772 81,681.6 + 158,795+ 158.795 d3 d 3 = 4,9= 4.9 +7,877+7.877 dt d t = 0,65= 0.65 1,812721.81272 49,449.4 -9,002-9.002 VV = 1,0= 1.0 1,487721.48772 81,681.6 -40,845-40.845 d5 d 5 = 4,0= 4.0 + 8,148+ 8.148 d6 d 6 = 0,3= 0.3 1,487721.48772 40,640.6 -18,522-18.522 hH = 5,0= 5.0 1,460111.46011 81,681.6 + 11,37+ 11.37 d7 d 7 = 1,0= 1.0 -7,548-7,548 ds d s = 17,65= 17.65 1,791921.79192 81,681.6 +22,942+22.942 hH — 9 5- 9 5 1,704441.70444 67,367.3 + 11,47+ 11.47 d » = 0,9= 0.9 -15,35-15.35 dio d io = 150,0= 150.0 25,525.5 + 6,502+ 6.502 hH = 40,007= 40.007 29,829.8 4,01574.0157 ß'eß'e Blattsheet A = 0,75 A = 0.75 Hierzu 1 ]For this 1] Zeichnungendrawings
770/168 1.65 Q Bundesdruckerei Berlin770/168 1.65 Q Bundesdruckerei Berlin
DEL43110A 1962-10-03 1962-10-03 Microscope objective with a leveled field of view Pending DE1186234B (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DEL43110A DE1186234B (en) 1962-10-03 1962-10-03 Microscope objective with a leveled field of view
CH975963A CH403331A (en) 1962-10-03 1963-08-07 Microscope objective with a leveled field of view
GB33231/63A GB1037434A (en) 1962-10-03 1963-08-22 Improvements in or relating to microscope objectives
AT788263A AT244081B (en) 1962-10-03 1963-10-01 Microscope objective with a leveled field of view

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DEL43110A DE1186234B (en) 1962-10-03 1962-10-03 Microscope objective with a leveled field of view

Publications (1)

Publication Number Publication Date
DE1186234B true DE1186234B (en) 1965-01-28

Family

ID=7270161

Family Applications (1)

Application Number Title Priority Date Filing Date
DEL43110A Pending DE1186234B (en) 1962-10-03 1962-10-03 Microscope objective with a leveled field of view

Country Status (4)

Country Link
AT (1) AT244081B (en)
CH (1) CH403331A (en)
DE (1) DE1186234B (en)
GB (1) GB1037434A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3410633A (en) * 1965-09-13 1968-11-12 Bausch & Lomb Metallurgical microscope objective
US3497290A (en) * 1967-07-03 1970-02-24 Bausch & Lomb 100x magnification semi-objective with field flattening lens
US3524694A (en) * 1965-11-26 1970-08-18 Leitz Ernst Gmbh Flat-field micro objective with increased magnification

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3410633A (en) * 1965-09-13 1968-11-12 Bausch & Lomb Metallurgical microscope objective
US3524694A (en) * 1965-11-26 1970-08-18 Leitz Ernst Gmbh Flat-field micro objective with increased magnification
US3497290A (en) * 1967-07-03 1970-02-24 Bausch & Lomb 100x magnification semi-objective with field flattening lens

Also Published As

Publication number Publication date
CH403331A (en) 1965-11-30
GB1037434A (en) 1966-07-27
AT244081B (en) 1965-12-10

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