DE1186234B - Microscope objective with a leveled field of view - Google Patents
Microscope objective with a leveled field of viewInfo
- Publication number
- DE1186234B DE1186234B DEL43110A DEL0043110A DE1186234B DE 1186234 B DE1186234 B DE 1186234B DE L43110 A DEL43110 A DE L43110A DE L0043110 A DEL0043110 A DE L0043110A DE 1186234 B DE1186234 B DE 1186234B
- Authority
- DE
- Germany
- Prior art keywords
- microscope objective
- view
- collecting
- lens
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/02—Objectives
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
Description
DEUTSCHESGERMAN
PATENTAMTPATENT OFFICE
AUSLEGESCHRIFTEDITORIAL
Internat. Kl.: G 02 bBoarding school Class: G 02 b
Nummer:
Aktenzeichen:
Anmeldetag:
Auslegetag:Number:
File number:
Registration date:
Display day:
Deutsche Kl.: 42 h-3/01 German class: 42 h -3/01
1186 234
L43110IX a/42h
3. Oktober 1962
28. Januar 19651186 234
L43110IX a / 42h
3rd October 1962
January 28, 1965
Es ist bekannt, bei Mikroskopobjektiven, insbesondere bei Trockensystemen, einen dicken negativen Meniskus als Frontlinse zu verwenden, um damit eine Korrektion der Bildfeldwölbung zu erreichen. Die durch diesen dicken negativen Meniskus hervorgerufene Erschwerung bei der Korrektion der übrigen Bildfehler wird dann durch zusätzliche andere Konstruktionselemente in den Objektiven ausgeglichen. Objektive dieser Art sind beispielsweise durch die deutschen Patentschriften 821126,924 539, 970 606 bekanntgeworden.It is known that microscope objectives, especially dry systems, have a thick negative To use meniscus as a front lens in order to achieve a correction of the field curvature. The difficulty in correcting the caused by this thick negative meniscus The remaining image errors are then caused by additional other construction elements in the lenses balanced. Lenses of this type are, for example, by the German patents 821126,924 539, 970 606 became known.
Nach der vorliegenden Erfindung kann nun ebenfalls eine ausgezeichnete Korrektion sämtlicher Bildfehler, insbesondere der Bildfeldwölbung und des Astigmatismus, sowie eine gute Korrektion aller außeraxialen Bildfehler, insbesondere der Asymmetriefehler, erreicht werden. Das ist dadurch möglich, daß in einem Objektiv, wie es beispielsweise in den obengenannten Patentschriften, insbesondere der deutschen Patentschrift 924 539, dargestellt ist, zwei sammelnde Kittflächen angeordnet werden, die ihre hohlen Seiten dem Objekt zukehren. Am zweckmäßigsten werden diese sammelnden Kittflächen im bildseitigen Teil des Objektivs untergebracht. Besonders vorteilhaft ist es, im letzten Glied des objektseitigen Teiles sowie in dem mit großem Abstand darauf folgenden negativen Korrektionsglied diese sammelnden Kittflächen vorzusehen. Dadurch unterscheiden sich die neuen Objektive wesentlich, insbe-According to the present invention, an excellent correction of all image errors, especially the field curvature and astigmatism, as well as a good correction of all off-axis image errors, in particular the asymmetry error, can be achieved. This is possible because that in a lens, as for example in the above-mentioned patents, in particular the German Patent 924 539, is shown, two collecting putty surfaces are arranged, the turn their hollow sides towards the object. These collecting putty surfaces are most useful in the housed image-side part of the lens. It is particularly advantageous in the last link of the object-side Part as well as in the negative corrective element that follows it with a large distance collecting putty surfaces to be provided. As a result, the new lenses differ significantly, in particular
Mikroskopobjektiv mit geebnetem BildfeldMicroscope objective with a leveled field of view
Anmelder:Applicant:
Ernst Leitz G. m. b. H.,Ernst Leitz G. m. B. H.,
Wetzlar, Laufdorfer WegWetzlar, Laufdorfer Weg
Als Erfinder benannt:Named as inventor:
Walter Klein, Wißmar (Kr. Wetzlar)Walter Klein, Wißmar (district of Wetzlar)
sondere von dem in der Fig. 3 der deutschen Patentschrift 924 539 dargestellten Typ.special from that in Fig. 3 of the German The type shown in U.S. Patent 924,539.
Zur Erläuterung der Wirkungsweise der beiden sammelnden Kittflächen kann gesagt werden, daß bei dem erfindungsgemäßen Mikroskopobjektiv durchTo explain the mode of action of the two collecting cemented surfaces, it can be said that with the microscope objective according to the invention
ao die im bildseitigen Negativglied angeordnete sammelnde Kittfläche die Ränder der Komabüschel und durch die im vorhergehenden pupillennahen Glied vorhandene sammelnde Kittfläche die Zonen innerhalb der Komabüschel korrigiert werden.ao the collecting putty surface arranged in the negative element on the image side, the edges of the coma tufts and through the collecting cement surface present in the preceding member near the pupil, the zones within the coma tufts are corrected.
In der Abbildung ist ein gemäß Anspruch 3 ausgebildetes Objektiv nach der Erfindung dargestellt. Die sammelnden Kittflächen sind dabei die Flächen r15. In der Tabelle sind die genauen DatenIn the figure, an objective according to the invention designed according to claim 3 is shown. The collecting putty surfaces are the surfaces r 15 . In the table are the exact dates
r12 undr 12 and
für das Objektiv angegeben. Dabei bedeutetspecified for the lens. Thereby means
r die Radien, r the radii,
d die Linsendicken, d the lens thickness,
/ die Luftabstände,/ the air gaps,
ne den Brechwert des verwendeten Glases für die e-Linie, n e is the refractive index of the glass used for the e-line,
vt, den zu diesen Glassorten gehörigen Abbe-Wert,v t , the Abbe value associated with these types of glass,
fe die Brennweite des Gesamtsystems, f e is the focal length of the entire system,
A die Apertur, A the aperture,
ß'e den Abbildungsmaßstab.ß'e the reproduction scale.
Claims (3)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEL43110A DE1186234B (en) | 1962-10-03 | 1962-10-03 | Microscope objective with a leveled field of view |
CH975963A CH403331A (en) | 1962-10-03 | 1963-08-07 | Microscope objective with a leveled field of view |
GB33231/63A GB1037434A (en) | 1962-10-03 | 1963-08-22 | Improvements in or relating to microscope objectives |
AT788263A AT244081B (en) | 1962-10-03 | 1963-10-01 | Microscope objective with a leveled field of view |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEL43110A DE1186234B (en) | 1962-10-03 | 1962-10-03 | Microscope objective with a leveled field of view |
Publications (1)
Publication Number | Publication Date |
---|---|
DE1186234B true DE1186234B (en) | 1965-01-28 |
Family
ID=7270161
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DEL43110A Pending DE1186234B (en) | 1962-10-03 | 1962-10-03 | Microscope objective with a leveled field of view |
Country Status (4)
Country | Link |
---|---|
AT (1) | AT244081B (en) |
CH (1) | CH403331A (en) |
DE (1) | DE1186234B (en) |
GB (1) | GB1037434A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3410633A (en) * | 1965-09-13 | 1968-11-12 | Bausch & Lomb | Metallurgical microscope objective |
US3497290A (en) * | 1967-07-03 | 1970-02-24 | Bausch & Lomb | 100x magnification semi-objective with field flattening lens |
US3524694A (en) * | 1965-11-26 | 1970-08-18 | Leitz Ernst Gmbh | Flat-field micro objective with increased magnification |
-
1962
- 1962-10-03 DE DEL43110A patent/DE1186234B/en active Pending
-
1963
- 1963-08-07 CH CH975963A patent/CH403331A/en unknown
- 1963-08-22 GB GB33231/63A patent/GB1037434A/en not_active Expired
- 1963-10-01 AT AT788263A patent/AT244081B/en active
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3410633A (en) * | 1965-09-13 | 1968-11-12 | Bausch & Lomb | Metallurgical microscope objective |
US3524694A (en) * | 1965-11-26 | 1970-08-18 | Leitz Ernst Gmbh | Flat-field micro objective with increased magnification |
US3497290A (en) * | 1967-07-03 | 1970-02-24 | Bausch & Lomb | 100x magnification semi-objective with field flattening lens |
Also Published As
Publication number | Publication date |
---|---|
CH403331A (en) | 1965-11-30 |
GB1037434A (en) | 1966-07-27 |
AT244081B (en) | 1965-12-10 |
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