DE112016005845T8 - Vorrichtung und Verfahren für einen On-Chip-Zuverlässigkeitscontroller - Google Patents

Vorrichtung und Verfahren für einen On-Chip-Zuverlässigkeitscontroller Download PDF

Info

Publication number
DE112016005845T8
DE112016005845T8 DE112016005845.4T DE112016005845T DE112016005845T8 DE 112016005845 T8 DE112016005845 T8 DE 112016005845T8 DE 112016005845 T DE112016005845 T DE 112016005845T DE 112016005845 T8 DE112016005845 T8 DE 112016005845T8
Authority
DE
Germany
Prior art keywords
chip reliability
reliability controller
controller
chip
reliability
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE112016005845.4T
Other languages
English (en)
Other versions
DE112016005845T5 (de
Inventor
Clark N. Vandam
Balkaran Gill
Junho Song
Suriya Ashok Kumar
Kasyap Pasumarthi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of DE112016005845T5 publication Critical patent/DE112016005845T5/de
Application granted granted Critical
Publication of DE112016005845T8 publication Critical patent/DE112016005845T8/de
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0793—Remedial or corrective actions
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0721—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/079—Root cause analysis, i.e. error or fault diagnosis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • Executing Machine-Instructions (AREA)
  • Advance Control (AREA)
DE112016005845.4T 2015-12-19 2016-11-18 Vorrichtung und Verfahren für einen On-Chip-Zuverlässigkeitscontroller Expired - Fee Related DE112016005845T8 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/975,751 US10078544B2 (en) 2015-12-19 2015-12-19 Apparatus and method for an on-chip reliability controller
US14/975,751 2015-12-19
PCT/US2016/062766 WO2017105765A1 (en) 2015-12-19 2016-11-18 Apparatus and method for an on-chip reliability controller

Publications (2)

Publication Number Publication Date
DE112016005845T5 DE112016005845T5 (de) 2018-09-06
DE112016005845T8 true DE112016005845T8 (de) 2018-10-31

Family

ID=59057305

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112016005845.4T Expired - Fee Related DE112016005845T8 (de) 2015-12-19 2016-11-18 Vorrichtung und Verfahren für einen On-Chip-Zuverlässigkeitscontroller

Country Status (5)

Country Link
US (2) US10078544B2 (de)
CN (1) CN108292253B (de)
DE (1) DE112016005845T8 (de)
TW (1) TWI742012B (de)
WO (1) WO2017105765A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2664759C1 (ru) * 2017-11-29 2018-08-22 федеральное государственное бюджетное образовательное учреждение высшего образования "Московский государственный технический университет имени Н.Э. Баумана (национальный исследовательский университет)" (МГТУ им. Н.Э. Баумана) Способ повышения надежности гибридных и монолитных интегральных схем
US10775434B2 (en) * 2018-09-26 2020-09-15 Intel Corporation System, apparatus and method for probeless field scan of a processor
US11837285B2 (en) 2021-08-22 2023-12-05 Applied Materials, Inc. Bias temperature instability correction in memory arrays

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD240714A1 (de) * 1982-02-05 1986-11-12 Mittweida Ing Hochschule Anordnung zur fehlererkennung an strukturen durch rechnergestuetzte zuverlaessigkeitsdiagnose
US4939694A (en) * 1986-11-03 1990-07-03 Hewlett-Packard Company Defect tolerant self-testing self-repairing memory system
US5677913A (en) * 1996-07-01 1997-10-14 Sun Microsystems, Inc. Method and apparatus for efficient self testing of on-chip memory
US6326800B1 (en) * 1999-06-10 2001-12-04 International Business Machines Corporation Self-adjusting burn-in test
US7006947B2 (en) 2001-01-08 2006-02-28 Vextec Corporation Method and apparatus for predicting failure in a system
US6728916B2 (en) * 2001-05-23 2004-04-27 International Business Machines Corporation Hierarchical built-in self-test for system-on-chip design
AU2002343545A1 (en) 2001-10-19 2003-06-10 Auburn University Estimating reliability of components for testing and quality optimization
US7020820B2 (en) * 2002-12-20 2006-03-28 Sun Microsystems, Inc. Instruction-based built-in self-test (BIST) of external memory
US7412353B2 (en) 2005-09-28 2008-08-12 Intel Corporation Reliable computing with a many-core processor
US7716006B2 (en) 2008-04-25 2010-05-11 Oracle America, Inc. Workload scheduling in multi-core processors
US8032804B2 (en) * 2009-01-12 2011-10-04 Micron Technology, Inc. Systems and methods for monitoring a memory system
US9104411B2 (en) * 2009-12-16 2015-08-11 Qualcomm Incorporated System and method for controlling central processing unit power with guaranteed transient deadlines
US9268390B2 (en) * 2010-12-14 2016-02-23 Microsoft Technology Licensing, Llc Human presence detection
US8972707B2 (en) 2010-12-22 2015-03-03 Via Technologies, Inc. Multi-core processor with core selectively disabled by kill instruction of system software and resettable only via external pin
US20130031431A1 (en) * 2011-07-28 2013-01-31 Eran Sharon Post-Write Read in Non-Volatile Memories Using Comparison of Data as Written in Binary and Multi-State Formats
US9534924B2 (en) * 2011-11-11 2017-01-03 Qualcomm Incorporated Sensor auto-calibration
US9310426B2 (en) * 2012-09-25 2016-04-12 Globalfoundries Inc. On-going reliability monitoring of integrated circuit chips in the field
TWI516776B (zh) * 2014-01-23 2016-01-11 瑞昱半導體股份有限公司 系統性故障分析方法以及機器可讀媒體
CN105630732B (zh) * 2015-12-17 2018-09-14 西北工业大学 一种双模冗余微处理器的热切换方法

Also Published As

Publication number Publication date
DE112016005845T5 (de) 2018-09-06
US10592331B2 (en) 2020-03-17
CN108292253B (zh) 2022-01-11
TWI742012B (zh) 2021-10-11
CN108292253A (zh) 2018-07-17
US20170177434A1 (en) 2017-06-22
US20180365098A1 (en) 2018-12-20
WO2017105765A1 (en) 2017-06-22
US10078544B2 (en) 2018-09-18
TW201730753A (zh) 2017-09-01

Similar Documents

Publication Publication Date Title
IL249468A0 (en) Test device, test method and method for preparing the device
IL250577B (en) Inspection device, inspection method and production method
DE112014000905A5 (de) Verfahren und Vorrichtung für einen Überholassistenten
KR20180084843A (ko) 생산 라인 설비의 스케쥴링 방법 및 장치
IL259578B (en) Inspection apparatus and method
PL3267348T3 (pl) Sposób i urządzenie do rozpoznawania ryzykownego zachowania
DE112015004070A5 (de) Automatisiertes regallagersystem und verfahren zum sicheren betreiben desselben
DE112014000172A5 (de) Verfahren und Vorrichtung für einen automatischen Lenkeingriff
BR112016027102A2 (pt) método e aparelho
GB201510267D0 (en) Method and apparatus for monitoring pipeline
KR102217253B9 (ko) 행동패턴 분석 장치 및 방법
IL258474B (en) Method and apparatus for inspection and metrology
GB2546522B (en) Method and apparatus for measuring flows
FI20145798A (fi) Menetelmä ja järjestelmä elektronisen yksikön testaamiseksi
PL3251300T5 (pl) Metoda i urządzenie do wykonywania pomiarów w zakresie zarządzania zasobami radiowymi
GB201409152D0 (en) Method and apparatus for automated manufacture
GB201521885D0 (en) Method and apparatus for monitoring
SG10201504081PA (en) Method and apparatus for resin-sealing electronic components
GB201607804D0 (en) Inspection method
DK3365658T3 (da) Prøvetestapparat og -fremgangsmåde
GB201620548D0 (en) Bond test apparatus and method
PL3377849T3 (pl) Sposób kontroli elementu podłużnego
PL3358944T3 (pl) Aparat diagnostyczny i sposób badania
DE112016005845T8 (de) Vorrichtung und Verfahren für einen On-Chip-Zuverlässigkeitscontroller
DE112015004735A5 (de) Verfahren und Vorrichtung für die Backofenreinigung

Legal Events

Date Code Title Description
R012 Request for examination validly filed
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee