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Priority to DES44101ApriorityCriticalpatent/DE1110908B/de
Publication of DE1110908BpublicationCriticalpatent/DE1110908B/de
Application grantedgrantedCritical
Publication of DE1110908C2publicationCriticalpatent/DE1110908C2/de
G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
G01T1/16—Measuring radiation intensity
G01T1/24—Measuring radiation intensity with semiconductor detectors
H—ELECTRICITY
H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
H10F99/00—Subject matter not provided for in other groups of this subclass
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Physics & Mathematics
(AREA)
Health & Medical Sciences
(AREA)
Life Sciences & Earth Sciences
(AREA)
General Physics & Mathematics
(AREA)
High Energy & Nuclear Physics
(AREA)
Molecular Biology
(AREA)
Spectroscopy & Molecular Physics
(AREA)
Semiconductor Integrated Circuits
(AREA)
Hall/Mr Elements
(AREA)
Light Receiving Elements
(AREA)
DES44101A1955-05-261955-05-26Anordnung zum Nachweis von Strahlungsenergieaenderungen durch AEnderung der Frequenz einer Wechselspannung
GrantedDE1110908B
(de)