DE10345754A1 - Device for determining the thickness of moving metallic strip-like materials comprises detectors for acquiring X-ray fluorescent radiation arranged on the side of the material on which an X-ray radiation source is arranged - Google Patents

Device for determining the thickness of moving metallic strip-like materials comprises detectors for acquiring X-ray fluorescent radiation arranged on the side of the material on which an X-ray radiation source is arranged Download PDF

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Publication number
DE10345754A1
DE10345754A1 DE2003145754 DE10345754A DE10345754A1 DE 10345754 A1 DE10345754 A1 DE 10345754A1 DE 2003145754 DE2003145754 DE 2003145754 DE 10345754 A DE10345754 A DE 10345754A DE 10345754 A1 DE10345754 A1 DE 10345754A1
Authority
DE
Germany
Prior art keywords
ray
determining
thickness
acquiring
metallic strip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE2003145754
Other languages
German (de)
Inventor
Wolfgang Pilz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mesacon Messelektronik GmbH Dresden
Original Assignee
Mesacon Messelektronik GmbH Dresden
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mesacon Messelektronik GmbH Dresden filed Critical Mesacon Messelektronik GmbH Dresden
Priority to DE2003145754 priority Critical patent/DE10345754A1/en
Publication of DE10345754A1 publication Critical patent/DE10345754A1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

Device for determining the thickness of moving metallic strip-like materials comprises detectors (1, 2) for acquiring X-ray fluorescent radiation and/or scattered Compton radiation arranged on the side of the material (3) on which an X-ray radiation source (5) is arranged. An independent claim is also included for a process for determining the thickness of moving metallic strip-like materials using the above device.
DE2003145754 2003-09-23 2003-09-23 Device for determining the thickness of moving metallic strip-like materials comprises detectors for acquiring X-ray fluorescent radiation arranged on the side of the material on which an X-ray radiation source is arranged Ceased DE10345754A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE2003145754 DE10345754A1 (en) 2003-09-23 2003-09-23 Device for determining the thickness of moving metallic strip-like materials comprises detectors for acquiring X-ray fluorescent radiation arranged on the side of the material on which an X-ray radiation source is arranged

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2003145754 DE10345754A1 (en) 2003-09-23 2003-09-23 Device for determining the thickness of moving metallic strip-like materials comprises detectors for acquiring X-ray fluorescent radiation arranged on the side of the material on which an X-ray radiation source is arranged

Publications (1)

Publication Number Publication Date
DE10345754A1 true DE10345754A1 (en) 2005-04-21

Family

ID=34353258

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2003145754 Ceased DE10345754A1 (en) 2003-09-23 2003-09-23 Device for determining the thickness of moving metallic strip-like materials comprises detectors for acquiring X-ray fluorescent radiation arranged on the side of the material on which an X-ray radiation source is arranged

Country Status (1)

Country Link
DE (1) DE10345754A1 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011051365A1 (en) * 2011-06-27 2012-12-27 Rayonic Sensor Systems Gmbh System and method for measuring the thickness of a zinc layer on steel and measuring the iron content of a zinc layer
US8454234B2 (en) 2008-04-04 2013-06-04 Danieli Automation Spa Thickness measurer for metal sheet and relative measuring method
DE102011122930B3 (en) * 2011-06-27 2014-07-17 Rayonic Sensor Systems Gmbh Device for determining thickness of zinc layer on iron layer of test object and iron content in zinc layer on iron layer of test object, has X-ray source for determining X-ray radiation on test object with zinc layer on iron layer
WO2016185012A1 (en) * 2015-05-21 2016-11-24 Ims Messsysteme Gmbh Method and device for characterizing the microstructure of a strip or sheet of metal
WO2019198039A3 (en) * 2018-04-14 2019-11-14 Lohia Corp Limited An integrated intelligent system and a method for estimating actual thickness of extruded films
WO2020160106A1 (en) * 2019-01-30 2020-08-06 Ndc Technologies Inc. Radiation-based thickness gauge

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2729901A1 (en) * 1976-07-02 1978-01-05 John J Allport THICKNESS MEASURING DEVICE WITH X-RAYS OR GAMMA RAYS
DE2747638A1 (en) * 1976-12-13 1978-06-15 Pertti Puumalainen METHOD OF MEASURING AREA WEIGHTS
JPH01242908A (en) * 1988-03-24 1989-09-27 Shimadzu Corp X-ray plating analyzing device
US5579362A (en) * 1991-09-19 1996-11-26 Rigaku Industrial Corp. Method of and apparatus for the quantitative measurement of paint coating
DE19919990A1 (en) * 1999-04-30 2000-11-16 Rayonic Sensor Systems Gmbh Measuring thickness of zinc layers on iron or steel comprises radiating primary photons onto the layer, measuring the intensity of secondary photons scattered from the layer, and determining the thickness

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2729901A1 (en) * 1976-07-02 1978-01-05 John J Allport THICKNESS MEASURING DEVICE WITH X-RAYS OR GAMMA RAYS
DE2747638A1 (en) * 1976-12-13 1978-06-15 Pertti Puumalainen METHOD OF MEASURING AREA WEIGHTS
JPH01242908A (en) * 1988-03-24 1989-09-27 Shimadzu Corp X-ray plating analyzing device
US5579362A (en) * 1991-09-19 1996-11-26 Rigaku Industrial Corp. Method of and apparatus for the quantitative measurement of paint coating
DE19919990A1 (en) * 1999-04-30 2000-11-16 Rayonic Sensor Systems Gmbh Measuring thickness of zinc layers on iron or steel comprises radiating primary photons onto the layer, measuring the intensity of secondary photons scattered from the layer, and determining the thickness

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8454234B2 (en) 2008-04-04 2013-06-04 Danieli Automation Spa Thickness measurer for metal sheet and relative measuring method
DE102011051365A1 (en) * 2011-06-27 2012-12-27 Rayonic Sensor Systems Gmbh System and method for measuring the thickness of a zinc layer on steel and measuring the iron content of a zinc layer
DE102011051365B4 (en) * 2011-06-27 2013-08-22 Rayonic Sensor Systems Gmbh Detection device and system for measuring the thickness of a zinc layer on steel and measuring the iron content of a zinc layer
DE102011122930B3 (en) * 2011-06-27 2014-07-17 Rayonic Sensor Systems Gmbh Device for determining thickness of zinc layer on iron layer of test object and iron content in zinc layer on iron layer of test object, has X-ray source for determining X-ray radiation on test object with zinc layer on iron layer
US9036778B2 (en) 2011-06-27 2015-05-19 Rayonic Sensor System Gmbh System and method for measuring the thickness of a zinc layer on steel and for measuring the iron concentration in a zinc layer
WO2016185012A1 (en) * 2015-05-21 2016-11-24 Ims Messsysteme Gmbh Method and device for characterizing the microstructure of a strip or sheet of metal
WO2019198039A3 (en) * 2018-04-14 2019-11-14 Lohia Corp Limited An integrated intelligent system and a method for estimating actual thickness of extruded films
WO2020160106A1 (en) * 2019-01-30 2020-08-06 Ndc Technologies Inc. Radiation-based thickness gauge
US11079222B2 (en) 2019-01-30 2021-08-03 Ndc Technologies Inc. Radiation-based thickness gauge
CN113728247A (en) * 2019-01-30 2021-11-30 Ndc技术公司 Radiation-based thickness gauge
CN113728247B (en) * 2019-01-30 2023-08-22 诺信公司 Radiation-based thickness gauge

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Legal Events

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OP8 Request for examination as to paragraph 44 patent law
R002 Refusal decision in examination/registration proceedings
R003 Refusal decision now final

Effective date: 20110408