DE10345467B3 - Forming control instruction for mask writer for semiconductor manufacturing involves inserting auxiliary surface with second color value into intermediate region before dividing first area so first area is divided into two sub-areas - Google Patents
Forming control instruction for mask writer for semiconductor manufacturing involves inserting auxiliary surface with second color value into intermediate region before dividing first area so first area is divided into two sub-areas Download PDFInfo
- Publication number
- DE10345467B3 DE10345467B3 DE10345467A DE10345467A DE10345467B3 DE 10345467 B3 DE10345467 B3 DE 10345467B3 DE 10345467 A DE10345467 A DE 10345467A DE 10345467 A DE10345467 A DE 10345467A DE 10345467 B3 DE10345467 B3 DE 10345467B3
- Authority
- DE
- Germany
- Prior art keywords
- area
- color value
- areas
- intermediate region
- sub
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/76—Patterning of masks by imaging
- G03F1/78—Patterning of masks by imaging by charged particle beam [CPB], e.g. electron beam patterning of masks
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/3175—Lithography
- H01J2237/31761—Patterning strategy
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/3175—Lithography
- H01J2237/31777—Lithography by projection
- H01J2237/31788—Lithography by projection through mask
Abstract
The method involves providing a circuit layout (10) containing the pattern to be transferred with a first area (30) associated with a first color value characterizing an exposure, at least one second area (20) enclosing the first in at least one intermediate region (40) and associated with a different color value, dividing the first area into rectangular exposure areas (31), translating and storing the exposure areas into/in the control instruction. An auxiliary surface (50) with the second color value is inserted into the intermediate region before dividing the first area so the first area is divided into two sub-areas, one of which is rectangular so it can be filed with a rectangular exposure area in the division step.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10345467A DE10345467B3 (en) | 2003-09-30 | 2003-09-30 | Forming control instruction for mask writer for semiconductor manufacturing involves inserting auxiliary surface with second color value into intermediate region before dividing first area so first area is divided into two sub-areas |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10345467A DE10345467B3 (en) | 2003-09-30 | 2003-09-30 | Forming control instruction for mask writer for semiconductor manufacturing involves inserting auxiliary surface with second color value into intermediate region before dividing first area so first area is divided into two sub-areas |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10345467B3 true DE10345467B3 (en) | 2005-04-28 |
Family
ID=34399097
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10345467A Expired - Fee Related DE10345467B3 (en) | 2003-09-30 | 2003-09-30 | Forming control instruction for mask writer for semiconductor manufacturing involves inserting auxiliary surface with second color value into intermediate region before dividing first area so first area is divided into two sub-areas |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE10345467B3 (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6361911B1 (en) * | 2000-04-17 | 2002-03-26 | Taiwan Semiconductor Manufacturing Company | Using a dummy frame pattern to improve CD control of VSB E-beam exposure system and the proximity effect of laser beam exposure system and Gaussian E-beam exposure system |
-
2003
- 2003-09-30 DE DE10345467A patent/DE10345467B3/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6361911B1 (en) * | 2000-04-17 | 2002-03-26 | Taiwan Semiconductor Manufacturing Company | Using a dummy frame pattern to improve CD control of VSB E-beam exposure system and the proximity effect of laser beam exposure system and Gaussian E-beam exposure system |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8100 | Publication of the examined application without publication of unexamined application | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |