DE10228793B4 - Electronic component containing stacked microchips - Google Patents

Electronic component containing stacked microchips Download PDF

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Publication number
DE10228793B4
DE10228793B4 DE10228793A DE10228793A DE10228793B4 DE 10228793 B4 DE10228793 B4 DE 10228793B4 DE 10228793 A DE10228793 A DE 10228793A DE 10228793 A DE10228793 A DE 10228793A DE 10228793 B4 DE10228793 B4 DE 10228793B4
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Germany
Prior art keywords
microchip
acceleration
microchips
electronic component
scanning
Prior art date
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Expired - Lifetime
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DE10228793A
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German (de)
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DE10228793A1 (en
Inventor
Toshiya Kariya Ikezawa
Masaaki Kariya Tanaka
Takashige Kariya Saitou
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Murata Manufacturing Co Ltd
Original Assignee
Denso Corp
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Abstract

Elektronisches Bauelement (S1) mit:
einem ersten Mikrochip (3), welcher einen Bondbereich (3a) besitzt;
einem zweiten Mikrochip (5); und
einer Bondschicht (4), welche ein Haftfilm (4) eines Silikontyps ist und sich in Kontakt mit den ersten und zweiten Mikrochips (3, 5) befindet, um die ersten und zweiten Mikrochips (3, 5) auf dem Bondbereich (3a) zu bonden, wobei
die Bondschicht (4) eine Einfriertemperatur besitzt, die größer als +120°C oder kleiner als –40°C ist, um einen Einfluß der Änderung des Elastizitätsmoduls der Bondschicht (4) infolge des Einfrierens bezüglich einer elektronischen Charakteristik des zweiten Mikrochips (5) in dem Temperaturbereich zwischen –40°C und +120°C im wesentlichen aufzuheben;
der zweite Mikrochip (5) ein elektrisches Signal im Ansprechen auf eine Beschleunigung eines Zielobjekts ausgibt;
die Beschleunigung auf der Grundlage des elektrischen Signals erfaßt wird;
und eine obere Erfassungsgrenze der Beschleunigung in dem Bereich zwischen 0,3 g und 1,5 g...Electronic component (S1) with:
a first microchip (3) having a bonding region (3a);
a second microchip (5); and
a bonding layer (4) which is a silicone type adhesive film (4) and is in contact with the first and second microchips (3, 5) to supply the first and second microchips (3, 5) on the bonding region (3a) bonding, where
the bonding layer (4) has a glass transition temperature higher than + 120 ° C or lower than -40 ° C for exerting influence of change of elastic modulus of the bonding layer (4) due to freezing with respect to an electronic characteristic of the second microchip (5) in the temperature range between -40 ° C and + 120 ° C substantially cancel;
the second microchip (5) outputs an electrical signal in response to acceleration of a target object;
the acceleration is detected on the basis of the electrical signal;
and an upper detection limit of acceleration in the range between 0.3 g and 1.5 g ...

Figure 00000001
Figure 00000001

Description

Die vorliegende Erfindung bezieht sich auf ein elektronisches Bauelement, in welchem in der Mehrzahl vorkommende Mikrochips aufgestapelt sind.The The present invention relates to an electronic component, in which majority of microchips are piled up.

Als elektronisches Bauelement dieses Typs wird ein Beschleunigungssensor (Beschleunigungsmesser) vorgeschlagen, welcher einen verarbeitenden Mikrochip, einen abtastenden Mikrochip und ein Gehäuse enthält. Der Beschleunigungssensor wird unter derart harten thermischen Bedingungen verwendet, wie sie in einem Fahrzeug auftreten, in welchem die Temperatur des Sensors im Gebrauch zwischen –40°C und +120°C liegt.When Electronic component of this type becomes an acceleration sensor (Accelerometer) proposed which a processing Microchip containing a scanning microchip and housing. Of the Acceleration sensor is under such harsh thermal conditions used as they occur in a vehicle in which the temperature of the sensor in use is between -40 ° C and + 120 ° C.

Der verarbeitende Mikrochip, welcher in dem Gehäuse befindlich ist, besitzt einen Bondbereich. Auf diesem Bondbereich ist der abtastende Mikrochip befindlich. Der abtastende Mikrochip enthält ein aus einem Halbleiter wie Silizium gebildetes Substrat und ein Abtastgebiet, welches in dem Substrat lokalisiert ist. Das Abtastgebiet dient dem Abtasten einer Beschleunigung eines Zielobjekts, d. h. einer Geschwindigkeitsänderungsrate des Zielobjekts. Wenn die Geschwindigkeit des Zielobjekts ansteigt, ist die Beschleunigung positiv, und wenn die Geschwindigkeit sich verringert, ist die Beschleunigung negativ. Positive und negative Beschleunigungen können auf dieselbe Weise erfaßt werden, was im folgenden lediglich für den Fall gilt, bei welchem eine positive Beschleunigung erfaßt wird.Of the processing microchip, which is located in the housing has a bond area. On this bond area is the scanning microchip located. The scanning microchip contains a semiconductor substrate formed like silicon and a scanning region which is in is localized to the substrate. The scanning area is for scanning an acceleration of a target object, d. H. a rate of change of speed of the target object. When the speed of the target object increases, the acceleration is positive, and when the speed is up reduced, the acceleration is negative. Positive and negative Accelerations can detected in the same way which, in the following, applies only to the case in which a positive acceleration is detected.

Bei dem vorgeschlagenen Beschleunigungssensor sind der verarbeitende Mikrochip und der abtastende Mikrochip durch einen Haftfilm eines Polyimidtyps zusammengebondet. Wie in 5 dargestellt, ändert sich jedoch der Elastizitätsmodul des Haftfilms des Polyimidtyps relativ bedeutsam bei etwa 110°C infolge des Einfrierens (glas transition) des Haftfilms des Polyimidtyps. Daher wird die Abtastgenauigkeit des abtastenden Mikrochips durch die relativ bedeutsame Änderung des Elastizitätsmoduls des Haftfilms des Polyimidtyps unerwünscht verringert.In the proposed acceleration sensor, the processing microchip and the scanning microchip are bonded together by a polyimide type adhesive film. As in 5 however, the modulus of elasticity of the polyimide type adhesive film changes relatively significantly at about 110 ° C due to the glass transition of the polyimide type adhesive film. Therefore, the sampling accuracy of the scanning microchip is undesirably lowered by the relatively significant change in the modulus of elasticity of the polyimide type adhesive film.

Der vorgeschlagene Beschleunigungssensor kann verschiedene Beschleunigungsbereiche (dynamischer Bereich) durch Kombinieren der Empfindlichkeit (Ausgangssignal pro Einheit der Beschleunigung) des abtastenden Mikrochips und eines Verstärkungsfaktors des verarbeitenden Mikrochips abdecken. Insbesondere kann der vorgeschlagene Beschleunigungssensor mehrere Beschleunigungsbereiche von einem minimalen Bereich von 0 g–0,3 g bis zu einem maximalen Bereich 0 g–250 g abdecken (die Einheit g ist die Erdbeschleunigung). Jedoch wird in dem Fall, bei welchem der vorgeschlagene Beschleunigungssensor derart entworfen ist, daß er einen relativ kleinen Beschleunigungsbereich abdeckt, beispielsweise in dem Fall, bei welchem die obere Erfassungsgrenze der Beschleunigung in dem Bereich zwischen 0,3 g und 1,5 g liegt, die Abtastgenauigkeit des abtastenden Mikrochips durch die Änderung des Elastizitätsmoduls der Haftschicht des Polyimidtyps ernsthaft verringert.Of the proposed acceleration sensor can have different acceleration ranges (more dynamic Range) by combining the sensitivity (output signal per Unit of acceleration) of the scanning microchip and a gain factor cover the processing microchip. In particular, the proposed acceleration sensor a plurality of acceleration ranges from a minimum range of 0g-0.3 g cover up to a maximum range of 0 g-250 g (the unit g is the gravitational acceleration). However, in the case where the proposed acceleration sensor is designed so that it has a covers relatively small acceleration range, for example in in the case where the upper detection limit of the acceleration is in the range between 0.3 g and 1.5 g, the scanning accuracy of the scanning microchip by the change in modulus of elasticity the adhesion layer of the polyimide type seriously reduced.

In dem Fall, bei welchem der vorgeschlagene Beschleunigungssensor ein Maximum von 5 V in dem durch den vorgeschlagenen Beschleunigungssensor abgedeckten dynamischen Bereich ausgibt und die obere Erfassungsgrenze 50 g beträgt und die Abweichung des Ausgangssignals von dem vorgeschlagenen Beschleunigungssensor durch Dvol (V) dargestellt wird, beträgt das Ausgangssignal (V) pro Einheitsbeschleunigung (g) 0,1 + 0,02 Dvol (V/g). In dem Fall, bei welchem die obere Erfassungsgrenze bei 1,5 g liegt, beträgt das Ausgangssignal (V) pro Einheitsbeschleunigung (g) 3,3 + 0,67 Dvol (V/g). Die Abtastgenauigkeit wird durch die Änderung des Elastizitätsmoduls der Haftschicht des Polyimidtyps ernsthaft verringert, wenn der vorgeschlagene Beschleunigungssensor eine derartige relativ hohe Empfindlichkeit wie in dem zuletzt genannten Fall besitzt.In the case where the proposed acceleration sensor outputs a maximum of 5V in the dynamic range covered by the proposed acceleration sensor and the upper detection limit is 50g and the deviation of the output signal from the proposed acceleration sensor is represented by D vol (V) the output signal (V) per unit acceleration (g) 0.1 + 0.02 D vol (V / g). In the case where the upper detection limit is 1.5 g, the output (V) per unit acceleration (g) is 3.3 + 0.67 D vol (V / g). The sampling accuracy is seriously reduced by the change of the elastic modulus of the polyimide type adhesive layer when the proposed acceleration sensor has such a relatively high sensitivity as in the latter case.

Aus der US 6 212 767 B1 ist ein elektronisches Bauelement bekannt mit: einem ersten Mikrochip, welcher einen Bondbereich besitzt, einem zweiten Mikrochip und einer Bondschicht, welche sich in Kontakt mit den ersten und zweiten Mikrochips befindet, um die ersten und zweiten Mikrochips auf dem Bondbereich zu bonden, wobei die Bondschicht eine Einfriertemperatur besitzt, die größer als +120°C oder kleiner als –40°C ist, um einen Einfluß der Änderung des Elastizitätsmoduls der Bondschicht infolge des Einfrierens bezüglich einer elektronischen Charakteristik des zweiten Mikrochips in dem Temperaturbereich zwischen –40°C und +120°C im wesentlichen aufzuheben.From the US Pat. No. 6,212,767 B1 An electronic device is known, comprising: a first microchip having a bonding region, a second microchip, and a bonding layer in contact with the first and second microchips to bond the first and second microchips to the bonding region, the bonding layer has a glass transition temperature higher than + 120 ° C or lower than -40 ° C, in order to influence the change in elastic modulus of the bonding layer due to freezing with respect to an electronic characteristic of the second microchip in the temperature range between -40 ° C and +120 Essentially cancel.

Die US 5 107 586 A offenbart, daß Halbleiterchips aufweisenden Substrate mit einer Bondschicht aus Siliziumpolyimid verbunden werden.The US 5 107 586 A discloses that semiconductor chips having substrates are bonded to a bonding layer of silicon polyimide.

Aus der US 6 108 210 A ist die Verwendung von Bondschichten mit einer Einfriertemperatur von weniger als –40°C zur Bondung von Mikrochips auf einem Substrat bekannt.From the US Pat. No. 6,108,210 For example, it is known to use bonding layers having a glass transition temperature of less than -40 ° C for bonding microchips to a substrate.

Der DE 197 54 616 B4 ist zu entnehmen, daß der Elastizitätsmodul der Bondschicht bei Raumtemperatur kleiner als 10 MPa ist.Of the DE 197 54 616 B4 It can be seen that the modulus of elasticity of the bonding layer at room temperature is less than 10 MPa.

Aus der US 5 864 062 A ist schließlich noch ein elektronisches Bauelement mit einem Mikrochip, einem zweiten Chip und einer Bondschicht bekannt, wobei die Bondschicht z. B aus Borsilikatglas besteht.From the US 5,864,062 A Finally, an electronic component with a microchip, a second chip and a bonding layer is known, wherein the bonding layer z. B is made of borosilicate glass.

Aufgabe der vorliegenden Erfindung ist es, ein elektronisches Bauelement zu schaffen, welches zwei Mikrochips und eine Bondschicht enthält, in welcher die Mikrochips zusammengebondet sind, und bei welchem der Einfluß des Elastizitätsmoduls der Bondschicht auf die elektronische Charakteristik von einem der Mikrochips vorzugsweise unterdrückt wird.task The present invention is an electronic component to provide, which contains two microchips and a bonding layer, in which the microchips are bonded together, and in which the influence of the modulus of elasticity the bonding layer on the electronic characteristic of one of Microchips preferably suppressed becomes.

Die Lösung der Aufgabe erfolgt durch die Merkmale des Anspruchs 1.The solution the object is achieved by the features of claim 1.

Bei der vorliegenden Erfindung ist die Bondschicht ein Haftfilm eines Silikontyps, welche eine Einfriertemperatur größer als +120°C oder kleiner als –40°C besitzt. Daher wird der Einfluß der Änderung des Elastizitätsmoduls der Bondschicht infolge des Einfrierens auf die elektronische Charakteristik im wesentlichen in dem Temperaturbereich zwischen –40°C und +120°C aufgehoben. Insbesondere ist der Elastizitätsmodul in dem Temperaturbereich zwischen –40°C und +120°C verringert. Daher wird der Einfluß einer thermischen Spannung in einem der Mikrochips auf die elektronische Charakteristik unterdrückt.at According to the present invention, the bonding layer is an adhesive film of Silicone type, which has a glass transition temperature greater than + 120 ° C or less as -40 ° C. Therefore, the influence of the change of the Young's modulus the bonding layer due to freezing on the electronic characteristic essentially canceled in the temperature range between -40 ° C and + 120 ° C. In particular, the modulus of elasticity reduced in the temperature range between -40 ° C and + 120 ° C. Therefore, the influence of a thermal stress in one of the microchips on the electronic Characteristic suppressed.

Die vorliegende Erfindung wird in der nachfolgenden Beschreibung unter Bezugnahme auf die Zeichnung erläutert.The The present invention will become apparent in the following description Explained referring to the drawing.

1 zeigt eine schematische Querschnittsansicht eines Beschleunigungssensors der Ausführungsform der vorliegenden Erfindung; 1 shows a schematic cross-sectional view of an acceleration sensor of the embodiment of the present invention;

2 zeigt einen Graphen, welcher die Korrelation zwischen dem Elastizitätsmodul eines Haftfilms eines Silikontyps und der Temperatur darstellt; 2 Fig. 10 is a graph showing the correlation between the Young's modulus of a silicone type adhesive film and the temperature;

3 zeigt einen Graphen, welcher die Korrelation zwischen dem anfänglichen Fehler bei der Beschleunigung und der Temperatur eines Bezugsbeschleunigungssensors darstellt, welcher einen Haftfilm eines Polyimidtyps enthält; 3 Fig. 10 is a graph showing the correlation between the initial error in acceleration and the temperature of a reference acceleration sensor including a polyimide type adhesive film;

4 zeigt einen Graphen, welcher die Korrelation zwischen dem anfänglichen Fehler bei der Empfindlichkeit und der Temperatur des Bezugsbeschleunigungssensors darstellt; 4 Fig. 10 is a graph showing the correlation between the initial error in sensitivity and the temperature of the reference acceleration sensor;

5 zeigt einen Graphen, welcher die Korrelation zwischen dem Elastizitätsmodul des Haftfilms des Polyimidtyps und der Temperatur darstellt; 5 Fig. 12 is a graph showing the correlation between the elastic modulus of the polyimide type adhesive film and the temperature;

6 zeigt einen Graphen, welcher die Korrelation zwischen dem anfänglichen Fehler bei der Beschleunigung und der Temperatur des Beschleunigungssensors der Ausführungsform darstellt; und 6 Fig. 12 is a graph showing the correlation between the initial error in the acceleration and the temperature of the acceleration sensor of the embodiment; and

7 zeigt einen Graphen, welcher die Korrelation zwischen dem anfänglichen Fehler bei der Empfindlichkeit und der Temperatur des Beschleunigungssensors der Ausführungsform darstellt. 7 FIG. 12 is a graph showing the correlation between the initial error in the sensitivity and the temperature of the acceleration sensor of the embodiment. FIG.

Die vorliegende Erfindung wird detailliert unter Bezugnahme auf eine Ausführungsform und mehrere Modifizierungen der Ausführungsform beschrieben.The The present invention will be described in detail with reference to FIG embodiment and several modifications of the embodiment.

Ein in 1 dargestelltes elektronisches Bauelement ist ein Beschleunigungssensor S1, der unter einer derart rauhen Bedingung verwendet werden kann, wie sie in einem Fahrzeug auftritt, wobei die Temperatur der Sensoren im Gebrauch in einem Bereich zwischen –40°C und +120°C liegt. Der Beschleunigungssensor S1 enthält einen verarbeitenden Mikrochip 3 (einen ersten Mikrochip), einen abtastenden Mikrochip 5 (einen zweiten Mikrochip) und ein Gehäuse 1. Das Gehäuse 1 enthält einen Keramikkörper und ein Verdrahtungsteil für eine elektrische Verbindung. Das Gehäuse 1 wird nicht nur zur Anpassung des verarbeitenden Mikrochips 3 und des abtastenden Mikrochips 5, sondern ebenfalls auch zum Anbringen des Beschleunigungssensors S1 auf einem Zielobjekt und ebenfalls zum Senden eines elektrischen Signals von dem verarbeitenden Mikrochip 3 verwendet. Wie in 1 dargestellt, besitzt der verarbeitende Mikrochip 3 einen Bondbereich 3a, und der abtastende Mikrochip 5 ist auf dem Bondbereich 3a des verarbeitenden Mikrochips 3 lokalisiert, welcher in dem Gehäuse 1 befindlich ist. Bei dem Beschleunigungssensor S1 von 1 sind der verarbeitende Mikrochip 3 und das Gehäuse 1 durch ein aus einem Harz eines Silikontyps gebildetes Haftmittel 2 gebondet, und der abtastende Mikrochip 5 und der verarbeitende Mikrochip 3 sind durch eine Haftschicht 4 (Bondschicht) gebondet.An in 1 The illustrated electronic component is an acceleration sensor S1 that can be used under such a harsh condition as occurs in a vehicle, with the temperature of the sensors in use ranging between -40 ° C and + 120 ° C. The acceleration sensor S1 includes a processing microchip 3 (a first microchip), a scanning microchip 5 (a second microchip) and a housing 1 , The housing 1 includes a ceramic body and a wiring part for an electrical connection. The housing 1 will not only adapt to the processing microchip 3 and the scanning microchip 5 but also for attaching the acceleration sensor S1 on a target object and also for transmitting an electrical signal from the processing microchip 3 used. As in 1 shown, owns the processing microchip 3 a bond area 3a , and the scanning microchip 5 is on the bond area 3a of the processing microchip 3 located in the housing 1 is located. In the acceleration sensor S1 of 1 are the processing microchip 3 and the case 1 by an adhesive formed of a silicone type resin 2 bonded, and the scanning microchip 5 and the processing microchip 3 are through an adhesive layer 4 (Bonding layer) bonded.

Der abtastende Mikrochip 5 enthält ein aus einem Halbleiter wie Silizium gebildetes Substrat und ein Abtastgebiet. Obwohl nicht dargestellt, befindet sich das Abtastgebiet in dem Substrat, um eine Beschleunigung des Zielobjekts abzutasten. Obwohl nicht dargestellt, enthält das Abtastgebiet eine bewegliche Elektrode und eine feste Elektrode. Jede Elektrode besitzt Ausleger, welche die Form von Kammzähnen besitzen, wobei zwei Sätze von Auslegern ineinander greifen. Jeder Ausleger der beweglichen Elektrode bewegt sich relativ, wobei die Kapazität zwischen der beweglichen Elektrode und der festen Elektrode verändert wird, wenn sich die Geschwindigkeit des Zielobjekts erhöht oder verringert. Die Beschleunigung des Zielobjekts wird auf der Grundlage der Änderung der Kapazität erfaßt.The scanning microchip 5 includes a substrate formed of a semiconductor such as silicon and a sensing region. Although not shown, the sensing area is located in the substrate to sense acceleration of the target. Although not shown, the scanning region includes a movable electrode and a fixed electrode. Each electrode has cantilevers which are in the form of comb teeth with two sets of cantilevers. Each movable electrode cantilever relatively moves, changing the capacitance between the movable electrode and the fixed electrode as the speed of the target increases or decreases. The acceleration of the target object is detected based on the change of the capacity.

Der verarbeitende Mikrochip 3 enthält ein aus einem Halbleiter wie Silizium gebildetes Substrat und ein verarbeitendes Gebiet. Obwohl nicht dargestellt enthält das verarbeitende Gebiet eine C/V-Wandlerschaltung und befindet sich in dem Substrat, um ein kapazitives Signal von dem abtastenden Mikrochip 5 zu verarbeiten. Die C/V-Wandlerschaltung ist unter Verwendung von Transistoren wie einem MOSFET und einem Bipolartransistor gebildet, welche mit einem Halbleiterherstellungsverfahren auf bekannte Weise gebildet worden sind. Wie in 1 dargestellt sind der abtastende Mikrochip 5 und der verarbeitende Mikrochip 3 elektrisch mit einem Bonddraht 6 verbunden, und es sind der verarbeitende Mikrochip 3 und das Gehäuse 1 mit einem Bonddraht 7 elektrisch verbunden. Das kapazititve Signal wird von dem abastenden Mikrochip 5 dem verarbeitenden Mikrochip 3 durch den Bonddraht 6 übertragen, und es wird das kapazitive Signal durch die C/V-Wandlerschaltung in ein Potentialsignal umgewandelt. Danach wird das Potentialsignal dem Gehäuse 1 durch den Bonddraht 7 ausgegeben.The processing microchip 3 includes a substrate formed of a semiconductor such as silicon and a processing region. Although not shown, the processing area includes a C / V converter circuit and is located in the substrate to receive a capacitive signal from the scanning microchip 5 to process. The C / V converter scarf is formed using transistors such as a MOSFET and a bipolar transistor, which have been formed by a semiconductor manufacturing method in a known manner. As in 1 shown are the scanning microchip 5 and the processing microchip 3 electrically with a bonding wire 6 connected, and it is the processing microchip 3 and the case 1 with a bonding wire 7 electrically connected. The capacitive signal is from the sampling microchip 5 the processing microchip 3 through the bonding wire 6 and the capacitive signal is converted into a potential signal by the C / V converter circuit. Thereafter, the potential signal is the housing 1 through the bonding wire 7 output.

Der Haftfilm 4, welcher zum Bonden des abtastenden Mikrochips 5 und des verarbeitenden Mikrochips 3 verwendet wird, ist ein Haftmittelfilm 4 eines Silikontyps, welcher aus Silikonharz mit einer Einfriertemperatur von etwa –100°C gebildet ist. Daher wird der Einfluß der Änderung des Elastizitätsmoduls des Haftfilms 4 infolge des Einfrierens in Bezug auf die Abtastgenauigkeit des abtastenden Mikrochips 5 wenigstens in dem Temperaturbereich zwischen –40°C und +120°C im wesentlichen aufgehoben. Darüber hinaus beträgt der Elastizitätsmodul des Haftfilms 4 in etwa 1 MPa und ist im wesentlichen in dem Temperaturbereich zwischen –40°C und +120°C wie in 2 dargestellt konstant, in welcher der Elastizitätsmodul zwischen +20°C und 200°C dargestellt ist. Daher ist die thermische Spannung, welche durch eine Temperaturdifferenz zwischen den Mikrochips 3, 5 hervorgerufen wird, in dem abtastenden Mikrochip 5 in dem Temperaturbereich zwischen –40°C und +120°C relativ niedrig, und es wird der Einfluß der thermischen Spannung auf die Abtastgenauigkeit des abtastenden Mikrochips 5 unterdrückt. Es ist möglich, anstelle des Silikonharzes andere Materialien zu verwenden, die eine Einfriertemperatur besitzen, welche größer als 120°C oder kleiner als –40°C ist, und einen Elastizitätsmodul zwischen 1 MPa und 10 MPa in dem Temperaturbereich zwischen –40°C und +120°C besitzen. Die anderen Materialien sind Epoxidharz, Polyimidharz, Acrylharz, Urethanharz, Gummi, ein Flüssigkristallpolymer, usw.The film of detention 4 which is used to bond the scanning microchip 5 and the processing microchip 3 is used is an adhesive film 4 a silicone type which is formed of silicone resin having a glass transition temperature of about -100 ° C. Therefore, the influence of the change of the elastic modulus of the adhesive film becomes 4 due to freezing with respect to the scanning accuracy of the scanning microchip 5 at least in the temperature range between -40 ° C and + 120 ° C substantially canceled. In addition, the modulus of elasticity of the adhesive film is 4 in about 1 MPa and is substantially in the temperature range between -40 ° C and + 120 ° C as in 2 shown constant, in which the modulus of elasticity between + 20 ° C and 200 ° C is shown. Therefore, the thermal stress is due to a temperature difference between the microchips 3 . 5 caused in the scanning microchip 5 in the temperature range between -40 ° C and + 120 ° C relatively low, and it becomes the influence of the thermal stress on the scanning accuracy of the scanning microchip 5 suppressed. It is possible to use, in place of the silicone resin, other materials having a glass transition temperature which is greater than 120 ° C or less than -40 ° C, and a modulus of elasticity between 1 MPa and 10 MPa in the temperature range between -40 ° C and + 120 ° C own. The other materials are epoxy resin, polyimide resin, acrylic resin, urethane resin, rubber, liquid crystal polymer, etc.

Die Auslegen der beweglichen Elektrode, welche sich relativ bewegen, so daß sich die Kapazität im Ansprechen auf die Beschleunigung des Zielobjekts ändert, bewegen sich ebenfalls, so daß sich die Kapazität ändert, wenn sich der Elastizitätsmodul des Haftfilms 4 relativ bedeutsam ändert oder wenn eine relativ große thermische Spannung in dem Mikrochip 5 gebildet wird. Daher liefert wie in 3 und 4 dargestellt ein Bezugsbeschleunigungssensor, welcher einen Haftfilm eines Polyimidtyps enthält, dessen Elastizitätsmodul sich relativ bedeutsam bei etwa 110°C infolge des Einfrierens wie in 5 dargestellt ändert, relativ große Meßfehler bei der Beschleunigung und Empfindlichkeit. Der Bezugsbeschleunigungssensor besitzt dieselbe Struktur wie der Beschleuni gungssensor S1 von 1 mit der Ausnahme, daß der Haftfilm des Polyimidtyps verwendet wird. Der Bezugsbeschleunigungssensor besitzt denselben dynamischen Bereich, dessen obere Grenze 1,5 g beträgt, wie der Beschleunigungssensor S1.The laying out of the movable electrode, which relatively moves so that the capacitance changes in response to the acceleration of the target object, also moves, so that the capacitance changes as the elastic modulus of the adhesive film increases 4 relatively significant changes or when a relatively large thermal stress in the microchip 5 is formed. Therefore, as in 3 and 4 FIG. 15 illustrates a reference acceleration sensor including a polyimide type adhesive film whose modulus of elasticity is relatively significant at about 110 ° C due to freezing as in FIG 5 shown changes, relatively large errors in acceleration and sensitivity. The reference acceleration sensor has the same structure as the acceleration sensor S1 of FIG 1 with the exception that the polyimide type adhesive film is used. The reference acceleration sensor has the same dynamic range whose upper limit is 1.5 g as the acceleration sensor S1.

Demgegenüber ist wie in 2 dargestellt der Elastizitätsmodul des Haftfilms des Silikontyps viel kleiner und stabiler als derjenige des Haftfilms des Polyimidtyps, so daß die thermische Spannung vorzugsweise niedrig und stabil in dem Beschleunigungssensor S1 von 1 ist. Daher liefert wie in 6 und 7 dargestellt, der Beschleunigungssensor S1 von 1 kleinere Fehler bei der Beschleunigung und der Empfindlichkeit als der Bezugsbeschleunigungssensor. In 3 und 6 wird ein Toleranzbereich durch die Toleranzlinien dargestellt, welcher auf der Grundlage der Toleranzen (±50 mV) bei der Abweichung Dvol gezogen worden sind. In 4 und 7 wird ein Toleranzbereich durch die Toleranzlinien dargestellt, welche auf einer Grundlage der Toleranz von (±1,4%) des Fehlers der Empfindlichkeit gezogen worden sind. In 3, 4, 6 und 7 sind eine Mehrzahl von Meßergebnissen bei –30°C, +25°C und 85°C von einer Mehrzahl von Beschleunigungssensoren S1 und einer Mehrzahl von Bezugssensoren aufgezeichnet. Alle Meßergebnisse von den Beschleunigungssensoren S1 liegen wie in 6 und 7 dargestellt in den Toleranzbereichen.In contrast, as in 2 For example, the elastic modulus of the silicone-type adhesive film is much smaller and more stable than that of the polyimide-type adhesive film, so that the thermal stress is preferably low and stable in the acceleration sensor S1 of FIG 1 is. Therefore, as in 6 and 7 shown, the acceleration sensor S1 of 1 minor errors in acceleration and sensitivity than the reference acceleration sensor. In 3 and 6 a tolerance range is represented by the tolerance lines drawn on the basis of the tolerances (± 50 mV) at the deviation D vol . In 4 and 7 a tolerance range is represented by the tolerance lines drawn on the basis of the tolerance of (± 1.4%) the error of sensitivity. In 3 . 4 . 6 and 7 For example, a plurality of measurement results at -30 ° C, + 25 ° C and 85 ° C are recorded by a plurality of acceleration sensors S1 and a plurality of reference sensors. All measurement results from the acceleration sensors S1 are as in 6 and 7 shown in the tolerance ranges.

Der Beschleunigungssensor S1 von 1 wird wie folgt hergestellt. Nachdem das Haftmittel 2 auf die innere Oberfläche des Gehäuses 1 aufgetragen worden ist, wird der verarbeitende Mikrochip 3 auf dem Haftmittel 2 plaziert. Danach wird das Haftmittel 2 ausgehärtet. Es wird bevorzugt, daß die Tröpfchen (beads), welche eine vorbestimmte Teilchengröße besitzen, einstweilig dem Haftmittel 2 hinzugefügt werden, um die Dicke des Haft mittels 2 zu homogenisieren und den verarbeitenden Mikrochip 3 relativ genau auf einem vorbestimmten Pegel zu tragen.The acceleration sensor S1 of 1 is made as follows. After the adhesive 2 on the inner surface of the housing 1 has been applied, the processing microchip 3 on the adhesive 2 placed. After that, the adhesive becomes 2 hardened. It is preferred that the beads having a predetermined particle size be temporarily the adhesive 2 be added to the thickness of the detention means 2 to homogenize and the processing microchip 3 to carry relatively accurately at a predetermined level.

Darauffolgend werden der Haftfilm 4 und der abtastende Mikrochip 5 einer nach dem anderen in dieser Reihenfolge auf dem Bondbereich 3a des verarbeitenden Mikrochips 3 angebracht. Nachdem ein Blatt, welches eine Mehrzahl von Haftfilmen 4 enthält, an einem Wafer befestigt worden ist, welcher eine Mehrzahl von abtastenden Mikrochips 5 enthält, werden alternativ der Wafer und das Blatt geschnitten und in eine Mehrzahl von Paaren des abtastenden Mikrochips 5 und der Haftschicht 4 getrennt, und danach wird eines der Paare en bloc auf dem Bondbereich 3a angebracht.Subsequently, the adhesive film 4 and the scanning microchip 5 one by one in this order on the bond area 3a of the processing microchip 3 appropriate. After a sheet containing a plurality of adhesive films 4 has been attached to a wafer which has a plurality of scanning microchips 5 alternatively, the wafer and the sheet are cut and cut into a plurality of pairs of the scanning microchip 5 and the adhesive layer 4 After that, one of the pairs will be en bloc on the bond area 3a appropriate.

Wenn ein flüssiges Haftmittel anstelle des Haftfilms 4 verwendet wird, können Bondinseln des verarbeitenden Mikrochips, auf welchem die Bonddrähte 6, 7 gebondet sind, durch Polymere mit einem niedrigen Molekulargewicht verunreinigt werden, welche von den flüssigen Haftmitteln auslaufen, und es kann die Drahtbondqualität verringert werden. Bei dem Beschleunigungssensor S1 von 1 werden der abtastende Mikrochip 5 und der verarbeitende Mikrochip 3 nicht mit dem flüssigen Haftmittel sondern mit dem Haftfilm 4 gebondet. Daher besteht ein Vorteil dahingehend, daß sich die Drahtbondqualität durch die Verunreinigung in dem Beschleunigungssensor S1 von 1 nicht verringert.If a liquid adhesive instead of the adhesive film 4 can be used, Bonding islands of the processing microchip, on which the bonding wires 6 . 7 are contaminated by low molecular weight polymers leaking from the liquid adhesives and the wire bond quality can be reduced. In the acceleration sensor S1 of 1 become the scanning microchip 5 and the processing microchip 3 not with the liquid adhesive but with the adhesive film 4 bonded. Therefore, there is an advantage in that the wire bonding quality is affected by the contamination in the acceleration sensor S1 of FIG 1 not reduced.

Nachdem der Haftfilm 4 und der abtastende Mikrochip 5 auf dem Bondbereich 3a des verarbeitenden Mikrochips 3 angebracht worden sind, wird der Haftfilm 4 gehärtet, um die Mikrochips 3, 5 relativ fest und dauerhaft zu bonden. Danach werden die Mikrochips 3, 5 und das Gehäuse durch den Bonddraht 6, 7 elektrisch verbunden, welcher aus Gold oder Aluminium hergestellt wird, um den in 1 dargestellten Beschleunigungssensor S1 fertigzustellen.After the adhesive film 4 and the scanning microchip 5 on the bond area 3a of the processing microchip 3 are attached, the adhesive film 4 Hardened to the microchips 3 . 5 to bond relatively firmly and permanently. After that, the microchips 3 . 5 and the housing through the bonding wire 6 . 7 electrically connected, which is made of gold or aluminum to the in 1 completed acceleration sensor S1 to be completed.

Beispiele für Haftfilme eines Silikontyps aufweisende elektronische Bauelemente sind ein Winkelgeschwindigkeitssensor, ein Drucksensor, ein Temperatursensor oder ein optischer Sensor durch Ersetzen des abtastenden Mikrochips 5 mit entsprechenden Abtastchips. Zusätzlich zu der C/V-Wandlerschaltung kann der verarbeitende Mikrochip 3 eine Speicherschaltung enthalten, welche unter Verwendung von Transistoren wie einem MOSFET und einem Bipolartransistor gebildet wird. Bei dem Beschleunigungssensor S1 von 1 wird der abtastende Mikrochip 5 auf dem verarbeitenden Mikrochip gestapelt. Daher kann die Stapelstruktur entgegengesetzt sein, d. h. es kann der Verarbeitungsmikrochip 3 auf dem abtastenden Mikrochip 5 gestapelt werden. Die vorliegende Erfindung kann ebenfalls auf ein elektronisches Bauelement angewandt werden, bei welchem zwei abtastende Mikrochips oder zwei verarbeitende Mikrochips aufgestapelt sind.Examples of silicone-type adhesive films include an angular velocity sensor, a pressure sensor, a temperature sensor, or an optical sensor by replacing the scanning microchip 5 with corresponding scanning chips. In addition to the C / V converter circuit, the processing microchip 3 a memory circuit formed using transistors such as a MOSFET and a bipolar transistor. In the acceleration sensor S1 of 1 becomes the scanning microchip 5 stacked on the processing microchip. Therefore, the stack structure may be opposite, ie, the processing microchip may be 3 on the scanning microchip 5 be stacked. The present invention can also be applied to an electronic component in which two scanning microchips or two processing microchips are stacked.

Vorstehend wurde ein elektronisches Bauelement offenbart, welches aufgestapelte Mikrochips enthält. Das elektronisches Bauelement enthält zwei Mikrochips und eine Bondschicht, in welcher die Mikrochips zusammengebondet sind. Die Bondschicht ist eine Haftschicht eines Silikontyps, welche eine Einfriertemperatur besitzt, die größer als +120°C oder kleiner als –40°C ist. Daher wird der Einfluß der Änderung des Elastizitätsmoduls der Bondschicht infolge des Einfrierens in Bezug auf die elektronische Charakteristik von einem der Mikrochips in dem Temperaturbereich zwischen –40°C und +120°C im wesentlichen aufgehoben. Darüber hinaus ist der Elastizitätsmodul in dem Temperaturbereich zwischen –40°C und +120°C ver ringert. Daher wird der Einfluß einer thermischen Spannung in einem der Mikrochips in Bezug auf die elektronische Charakteristik unterdrückt.above an electronic component was disclosed which piled up Contains microchips. The electronic component contains two microchips and one Bonding layer in which the microchips are bonded together. The Bonding layer is a silicone-type adhesive layer which has a glass transition temperature owns that larger than + 120 ° C or is less than -40 ° C. Therefore becomes the influence of the change of the modulus of elasticity the bonding layer due to freezing with respect to the electronic characteristic of one of the microchips in the temperature range between -40 ° C and + 120 ° C substantially canceled. About that In addition, the modulus of elasticity is in the temperature range between -40 ° C and + 120 ° C ver reduced. Therefore, the Influence of a thermal stress in one of the microchips in relation to the electronic Characteristic suppressed.

Claims (4)

Elektronisches Bauelement (S1) mit: einem ersten Mikrochip (3), welcher einen Bondbereich (3a) besitzt; einem zweiten Mikrochip (5); und einer Bondschicht (4), welche ein Haftfilm (4) eines Silikontyps ist und sich in Kontakt mit den ersten und zweiten Mikrochips (3, 5) befindet, um die ersten und zweiten Mikrochips (3, 5) auf dem Bondbereich (3a) zu bonden, wobei die Bondschicht (4) eine Einfriertemperatur besitzt, die größer als +120°C oder kleiner als –40°C ist, um einen Einfluß der Änderung des Elastizitätsmoduls der Bondschicht (4) infolge des Einfrierens bezüglich einer elektronischen Charakteristik des zweiten Mikrochips (5) in dem Temperaturbereich zwischen –40°C und +120°C im wesentlichen aufzuheben; der zweite Mikrochip (5) ein elektrisches Signal im Ansprechen auf eine Beschleunigung eines Zielobjekts ausgibt; die Beschleunigung auf der Grundlage des elektrischen Signals erfaßt wird; und eine obere Erfassungsgrenze der Beschleunigung in dem Bereich zwischen 0,3 g und 1,5 g liegt.Electronic component (S1) comprising: a first microchip ( 3 ), which has a bond area ( 3a ); a second microchip ( 5 ); and a bonding layer ( 4 ), which is an adhesive film ( 4 ) of a type of silicone and is in contact with the first and second microchips ( 3 . 5 ) to the first and second microchips ( 3 . 5 ) on the bond area ( 3a ), wherein the bonding layer ( 4 ) has a glass transition temperature which is greater than + 120 ° C or less than -40 ° C, in order to detect an influence of the change of the elastic modulus of the bonding layer ( 4 ) due to freezing with respect to an electronic characteristic of the second microchip ( 5 ) in the temperature range between -40 ° C and + 120 ° C substantially cancel; the second microchip ( 5 ) outputs an electrical signal in response to acceleration of a target object; the acceleration is detected on the basis of the electrical signal; and an upper detection limit of acceleration is in the range between 0.3 g and 1.5 g. Elektronisches Bauelement (S1) nach Anspruch 1, dadurch gekennzeichnet, daß die Einfriertemperatur kleiner als –40°C ist.Electronic component (S1) according to claim 1, characterized characterized in that Freezing temperature is less than -40 ° C. Elektronisches Bauelement (S1) nach Anspruch 1 oder 2, dadurch gekennzeichnet, daß der Elastizitätsmodul kleiner als 10 MPa in dem Temperaturbereich zwischen –40°C und +120°C ist, um einen Einfluß einer thermischen Spannung in dem zweiten Mikrochip (5) in Bezug auf die elektronische Charakteristik zu unterdrücken.Electronic component (S1) according to claim 1 or 2, characterized in that the modulus of elasticity is less than 10 MPa in the temperature range between -40 ° C and + 120 ° C in order to detect an influence of a thermal stress in the second microchip ( 5 ) with respect to the electronic characteristic. Elektronisches Bauelement (S1) nach Anspruch 3, dadurch gekennzeichnet, daß der Elastizitätsmodul in dem Bereich zwischen 1 MPa und 10 MPa liegt.Electronic component (S1) according to claim 3, characterized characterized in that modulus of elasticity in the range between 1 MPa and 10 MPa.
DE10228793A 2001-07-06 2002-06-27 Electronic component containing stacked microchips Expired - Lifetime DE10228793B4 (en)

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