DE102020004948A1 - Test assembly for a missile seeker and method - Google Patents

Abstract

Missile seekers have the function of detecting and optionally tracking other missiles in the shortest possible time. For this purpose, the seekers often have light-sensitive detectors which detect the other missiles on the basis of optical emissions and/or reflections. It is an object of the present invention to propose a test arrangement for a seeker head of a missile, which can be produced inexpensively and has possible variations with regard to the optical signals. For this purpose, a test arrangement 1 for a seeker head 2 of a missile is proposed with a receiving device 12 for receiving the Search head 2, with a projector device 5 for generating a light pattern as an input signal for the search head 2, wherein the projector device 5 has at least one laser device 6 for generating or co-generating the light pattern.

Description

The invention relates to a test arrangement for a seeker head of a missile having the features of the preamble of claim 1. The invention also relates to a corresponding method.

Missile seekers have the function of detecting and optionally tracking other missiles in the shortest possible time. For this purpose, the seekers often have light-sensitive detectors which detect the other missiles on the basis of optical emissions and/or reflections.

In order to prepare the search heads for real operation, they are tested during development or production. Optical signals are fed into the seeker heads in order to test their detection capability and/or tracking capability. For this purpose, projectors are used that provide these optical signals. For example, the projectors can be designed as arrays of light-emitting elements, which can be controlled in terms of time and space as required in order to generate the necessary optical signals.

It is an object of the present invention to propose a test arrangement for a seeker head of a missile which can be produced inexpensively and has possible variations with regard to the optical signals.

This object is achieved by a test arrangement having the features of claim 1 and by a method having the features of claim 14. Preferred or advantageous embodiments of the invention result from the dependent claims, the following description and the attached figures.

The subject matter of the invention is a test arrangement which is suitable and/or designed for testing a seeker head. The seeker head is designed as intended for a missile. The missile can be an airplane. Alternatively and preferably, the missile is designed as a rocket, preferably with its own propulsion.

The seeker head has seeker optics and a seeker head detector, wherein in a detection state an optical signal is passed as an input signal via the seeker optics to the seeker head detector and the seeker head detector detects the optical signal in a time-resolved and/or spatially-resolved manner. The seeker head optionally has a detector actuator in order to move the optical signal relative to the seeker head detector. For example, the seeker head can have movable optics, one or more movable mirrors or the like as detector actuators.

The test arrangement has a receiving device for receiving the seeker head. In the simplest embodiment, the receiving device is designed as a mechanical interface. Optionally, in addition, the test arrangement has a data interface for data-technical coupling between the test arrangement and the seeker head. In particular, a detection result and/or configuration data can be read out of the search head via the data interface.

The test arrangement has a projector device for generating a light pattern as an input signal for the seeker head. In particular, the projector device is designed to project the light pattern, preferably with the interposition of the seeker optics, onto the seeker detector. The projector device is designed to vary the light pattern in time and/or space. In this way, different light patterns can be projected onto the seeker head detector. The light pattern can, for example, be in the form of a dot pattern with a plurality of dots.

In the context of the invention, it is proposed that the projector device has at least one laser device for generating or co-generating the light pattern. In particular, the laser device forms a light source for the light pattern. It is particularly preferred that a laser beam of the laser device is guided through the projector device in such a way that it is directed via the seeker optics to the seeker detector.

It is a consideration of the invention that the laser device makes it possible to guide the laser beam in a targeted and directed manner via the seeker optics onto the seeker detector in order in this way to form or also form the light pattern. In particular, the laser beam from the laser device makes it possible to vary the light pattern in terms of time and space, since such laser beams can be very easily modulated in terms of intensity and can also be changed very easily in terms of local distribution by directing the laser beam at any point in the Beam path, for example, is deflected. The test arrangement can also be implemented cost-effectively due to the laser components becoming cheaper.

In a preferred embodiment of the invention, the search head forms part of the test arrangement. In particular, the seeker head is arranged in the receiving device. Optionally, the projector device has a further radiation source, with the further radiation source being, in particular, a static background light tion can form. In particular, the further radiation source is based on thermal radiation. Provision can be made, for example, for the radiation source to be in the form of a resistance grid, with resistances being heated by electric current so that they also emit optical emissions which can be received and detected by the seeker head. The light pattern can be supplemented by the additional radiation source, for example, with uniform but also with non-uniform background lighting or background scene.

In a preferred development of the invention, the projector device has several of the laser devices. In particular, the power of the laser devices can be adjusted and/or controlled independently of one another. In particular, these can be selectively activated and deactivated. It is preferred that the laser devices have at least two different wavelength ranges for the laser beams. In particular, one of the laser devices operates in a first wavelength range and a second of the laser devices operates in a second wavelength range, the first and second wavelength ranges being spaced apart from one another.

Particularly preferably, precisely one, at least one, some or all of the laser devices each have a semiconductor laser as the radiation source. In particular, the semiconductor laser is designed as a QCL (quantum cascade laser) or as an ICL (interband cascade laser).

Preferably, exactly one, at least one, some or all of the laser devices work in an MWIR wavelength range (mid wavelength infrared with wavelengths from 3.0 μm to 8 μm) and/or in an LWIR wavelength range (long-wavelength infrared with wavelengths from 8 to 15 µm). In particular, these wavelength ranges can realistically simulate thermal processes via optical signals.

It is preferred that exactly one, at least one, some or all of the laser devices have exactly or at least one active beam guidance and/or beam shaping component as an actuator. The actuators of the laser devices are particularly preferably adjustable and/or controllable independently of one another. The actuators can lead to a spatial change in the laser beam, in particular to a deflection of the laser beam, so that the laser beam strikes the seeker head detector at a different position. Alternatively or additionally, the actuators can lead to a change in the focus position of the laser beam, so that the laser beam impinges on the seeker head detector with a different beam surface. The position and/or the jet area can thus preferably be varied via the actuators.

In a first possible embodiment of the invention, exactly one, at least one, some or all of the actuators are designed as a scanner. The scanner is particularly preferably implemented as a transmission scanner, with this having, for example, a laterally displaceable pair of lenses. As an alternative to this, the scanner is designed as an acousto-optical scanner. The deflection angle range is preferably selected in such a way that the field of view of the seeker head, in particular the seeker head optics, is completely covered and/or that the laser beam can be directed onto the entire seeker head detector.

In a preferred constructional embodiment of the invention, the projector device has a multi-sided, reflecting pyramid component, in particular a pyramidal mirror component. The pyramidal component has reflective surfaces, with the reflective surfaces being assigned precisely or at least one laser device. The reflection surfaces serve as reflection mirrors, with the respective laser beam being deflected and reflected in the direction of the seeker head and/or in the direction of the recording device.

The projector device particularly preferably has an optical axis, with the laser beams initially running in the same direction as the optical axis in the beam path, and then being deflected at a scanner, preferably a mirror scanner, so that they run in the same direction as a radial plane to the optical axis. The laser beams then impinge on the pyramid component, as a result of which the laser beams are reflected in the direction of the seeker head and/or in the direction of the recording device. With this structure, the laser beams can be offset in a lateral direction in relation to the seeker head detector and/or in relation to a radial plane to the optical axis through the scanner.

In a preferred development of the invention, the test arrangement has a control device for controlling the laser devices. In particular, the control device is designed to monitor, in particular to control, the laser devices independently of one another with regard to the intensity, the beam area and/or the position on a detector plane and/or on the seeker head detector.

The control device is particularly preferably designed in terms of circuitry and/or programming to control the laser devices in such a way that spatiotemporal light patterns are generated for stimulating seeker head patterns of the seeker head and/or projected onto the detector plane and/or onto the seeker detector.

The light patterns can be, for example, "flares" light patterns, ie light patterns which correspond to the thermal and/or optical emissions of IR decoys. IR decoys, also known as decoy flares, are decoys against guided missiles with such a seeker head. The thermal radiation that occurs when using flares is intended to distract the seeker sensors from the actual target, optimally to the thermal radiation of the heat flare. It does this by creating IR clutter from many different heat sources, generating specific emission spectra to present a decoy to the seeker, and creating heat walls to obscure the actual target.

The control device preferably has a memory unit with the search head patterns of the search head to be tested and/or a recording interface for accepting the search head patterns of the search head to be tested. In this refinement, the control device can access the search head pattern of the search head and generate corresponding light patterns in order to test the search head.

In principle, it is possible for a CIL test (computer in the loop) to be carried out on the test arrangement, with the search head being arranged in a stationary manner in the recording device and/or in the test environment. In a preferred development, an HIL test (hardware in the loop) is carried out on the test arrangement, with the recording device and/or the seeker head also being moved in the test environment.

In one possible embodiment of the invention, the test arrangement has a robotic device for manipulating the recording device in order to simulate a flight movement and/or disturbing movement of the seeker head. For example, the robotic device can have two axes of rotation, which are particularly preferably arranged gimballed in order to generate rapid movements of the recording device and thus of the seeker head.

In a preferred development of the invention, the projector device and the recording device are manipulated together by the robot device.

Another object of the invention relates to a method for testing a seeker head, wherein at least one laser beam is fed to the seeker head in a test environment, the at least one laser beam forming a light pattern as an input signal for the seeker head. The method is particularly preferably carried out in the test arrangement as described above or according to one of the preceding claims.

• 1 eine schematische Blockdarstellung von einer Testanordnung als ein erstes Ausführungsbeispiel der Erfindung;
• 2 eine schematische Blockdarstellung von einer Projektorvorrichtung mit einem Suchkopf, wie diese in der 1 einsetzbar ist, in seitlicher Ansicht;
• 3 eine schematische Blockdarstellung von der Projektorvorrichtung mit dem Suchkopf aus der 2 in axialer Ansicht.

Further features, effects and advantages of the invention result from the following description of a preferred exemplary embodiment of the invention and the attached figures. show:

• 1 a schematic block diagram of a test arrangement as a first embodiment of the invention;
• 2 a schematic block diagram of a projector device with a seeker, as in the 1 can be used, in side view;
• 3 a schematic block diagram of the projector device with the seeker from FIG 2 in axial view.

the 1 shows a schematic block diagram of a test arrangement 1 for a seeker head 2. The seeker head 2 detects optical and/or thermal emissions from an object, in particular from a flying object, such as an airplane, a rocket, etc.

The seeker head 2 is carried by a missile, which missile can be, for example, a missile, a missile or another aircraft. The seeker head 2 has seeker optics 3 for beam guidance and beam shaping from the optical and/or thermal emissions as the input signal for the seeker head 2. The input signal is directed to a seeker head detector 4, the seeker head detector 4 defining a detector plane D.

The test arrangement 1 is used to fade in fast-moving, intense point targets of temporally variable irradiance and spectra of all compositions, for example flares or laser sources, into the beam path of the seeker optics 3 during a test procedure.

The test arrangement 1 has a projector device 5 , the projector device 5 having a plurality of laser devices 6 . The laser devices 6 each have a laser source 7, the laser sources 7 being designed as semiconductor lasers, for example. For example, these are designed as QCL or ICL, alternatively they can be implemented as edge emitters or surface emitters. The laser devices 6 each generate a laser beam 8, the laser beams 8 being guided onto the seeker head 2, so that these hit the seeker head detector 4 via the seeker head optics 3 in the detector plane D.

In order to simulate the optical and/or thermal emissions, the laser beams 8 have a wavelength in the infrared range, preferably with a wavelength greater than 3 μm.

The laser devices 6 have at least one active beam guidance and/or shaping component, which can move the laser beams 8 laterally on the detector plane D and/or on the seeker head detector 4 . Alternatively or additionally, the or further beam guiding and/or shaping components can change the beam area of the laser beams 8 impinging on the detector plane D and/or on the seeker head detector 4, so that different power densities can be generated.

Beam shaping optics are optionally provided, which adapt the cross-sectional profiles and/or beam areas of the laser beams 8 to the requirements of the irradiance in the detector plane D and/or on the seeker head detector 4 . Also optionally, diffractive elements (passive or active, e.g. electro-optical) could be provided, which are arranged in the beam path of a laser beam 8 and which split the laser beam 8 in order to locally simulate a group of point light sources, for example.

The laser beams 8 are guided, for example, via scanners (mirrors, prisms, lenses, etc.), so that the angles of incidence of the laser beams 8 can be moved over the field of view of the seeker head 2 . The scan speeds are derived from the motion elements of the light pattern scenario. The scanners can be designed as 2-D scanners or as interconnections of 1-D scanners.

The test arrangement 1 and/or the projector device 5 has a control device 9, the control device 9 being designed, for example, as a digital data processing device. The control device 9 controls the laser devices 6. The control device 9 can, for example, check the power of the laser devices 6, the beam area of the laser beams 8 on the detector plane D and/or on the seeker detector 4 and/or the position of the laser beams 8 on the detector plane D and/or or check on the seeker detector 4. The control device 9 can selectively control the laser devices 6, in particular the laser sources 7, and optionally additionally even control the wavelength.

The control device 9 is designed to control the laser devices 6 in such a way that spatiotemporal light patterns for stimulating seeker head patterns of the seeker head 2 are generated. In particular, the position of the laser beams 8 and their intensity and/or power density are varied in the light patterns.

Flare light patterns are examples of such simulations. For example, the heat flare of rockets is simulated as a light pattern. The intensity and the beam area can be changed over the course of time, e.g. to show an approach of the seeker head 2 to the simulated flares and to test the reaction of the seeker head 2.

In order to control the projector device 5 with the laser devices 6 with corresponding light patterns as an input signal for the seeker head 2, the control device 9 optionally has a recording interface 10 for coupling to the seeker head 2 in order to accept the seeker head pattern from the seeker head 2 and to emulate the light pattern of the seeker head patterns and to project. The control device 9 optionally has a memory unit 11 in which the seeker head patterns are stored. The seeker pattern can also be transferred to the memory unit 11 in a different digital way.

To accommodate the seeker head 2, the test arrangement 1 has a receiving device 12 for the seeker head 2 in order to fix it mechanically. Optionally, the recording device 12 includes an interface for data-technical coupling of the seeker head 2, for example with the control device 9.

The test arrangement 1 optionally has a robotic device 13 , the robotic device 13 carrying the receiving device 12 and thus the seeker head 2 and also the projector device 5 . The seeker head 2 can be manipulated in a highly dynamic manner by the robot device 13 in order to simulate flight movements and/or spurious movements. For example, the robot device 13 has two turntables which are gimballed to one another and which can move the seeker head 2 together with the projector device 5 .

the 2 shows a possible configuration of the projector device 5 in a schematic representation. The laser devices 6 each have a laser source 7 and a scanner 14 as a beam guiding and shaping component. The laser beam 8 runs from the laser source 7 parallel to or at least in the same direction as an optical axis A, hits the scanner 14 and is deflected at right angles, so that the laser beam 8 runs in a radial plane to the optical axis A. A pyramid component 15 with a multiplicity is central Number of reflection surfaces 16 arranged, wherein the laser beam 8 is reflected by the reflection surface 16 and again rectified to the optical axis A to the seeker head 2 runs. The laser beam 8 can be deflected by the scanner 14 so that it impinges on different positions on the detector plane D and/or on the seeker head detector 4 . The laser devices 6 or the laser sources 7 are distributed regularly or irregularly around the optical axis A in the circumferential direction.

the 3 FIG. 12 shows an axial rear plan view of the projector device 5 in FIG 2 . The seeker head 2 is shown somewhat enlarged, and the pyramidal component 15 can also be seen in the center of the optical axis A. The laser devices 6 each show - overlapping in the direction of the optical axis A - the laser source 7 and the scanner 14.

In modified embodiments, it is possible to position more or fewer laser devices 6. It is also optionally possible for an additional radiation source, for example a resistance grid, to be provided for generating a background scene. A thermally luminous background can be formed by the additional radiation source.

The projector device 5 can also have only one laser device 6, which has a scanner 14, which is formed, for example, from a pair of laterally displaceable lenses or as an acousto-optical scanner. The scanner sits on the optical axis A of the seeker head 2 or the seeker head optics 3 and feeds the laser beam 8 into the seeker head optics 3 . Only one so-called hotspot or, with the help of a DOE, a correlated group of hotspots can be realized with this arrangement.

To realize multiple uncorrelated point sources (for example, to test the combination of a flare and an additional missile as a seeker pattern), the embodiment according to the 2 and 3 be used.

Reference List

1

test arrangement

2

seeker head

3

seeker optics

4

seeker detector

5

projector device

6

laser device

7

laser source

8th

laser beams

9

control device

10

recording interface

11

storage unit

12

recording device

13

robotic device

14

scanner

15

pyramid component

16

reflection surface

D

detector level

Claims (15)

Test arrangement (1) for a seeker head (2) from a missile with a receiving device (12) for receiving the seeker head (2), with a projector device (5) for generating a light pattern as an input signal for the seeker head (2), characterized in that that the projector device (5) has at least one laser device (6) for generating or co-generating the light pattern. Test arrangement (1) according to claim 1 , characterized in that the test arrangement (1) has the search head (2). Test arrangement (1) according to one of the preceding claims, characterized in that the projector device (5) has several of the laser devices (6), Test arrangement (1) according to one of the preceding claims, characterized in that at least one laser device (6) has a semiconductor laser as the laser source (7). Test arrangement (1) according to one of the preceding claims, characterized in that at least one laser device (6) has an active beam guiding and/or shaping component. Test arrangement (1) according to claim 5 , characterized in that the at least one active beam guidance and/or beam shaping component is designed as a scanner (14). Test arrangement (1) according to one of the preceding claims, characterized in that the projector device (5) has a multi-sided, reflecting pyramid component (15), the pyramid component (15) being arranged in the beam paths of the laser devices (6) in such a way that the Laser beams (8) are deflected and reflected in the direction of the seeker head (2) and/or the recording device (12). Test arrangement (1) according to one of the preceding claims, characterized in that it has a control device (9) for controlling the laser devices (6). Test arrangement (1) according to claim 8 , characterized in that the control device (9) is designed to control the laser devices (6) so that spatiotemporal light patterns for stimulating seeker patterns of the seeker head (2) are generated. Test arrangement (1) according to claim 8 or 9 , characterized in that the control device (9) has a storage unit (11) with the seeker pattern and/or a recording interface (10) for accepting the seeker pattern of the seeker (2). Test arrangement (1) according to one of the preceding claims, characterized by a robot device (13) for manipulating the recording device (12) in order to simulate a flight movement and/or disturbing movement of the seeker head (2). Test arrangement (1) according to one of the preceding claims, characterized in that the projector device (5) and the recording device (12) are manipulated jointly by the robot device (13). Test arrangement (1) according to one of the preceding claims, characterized in that the robotic device (13) implements a two-dimensional movement. Method for testing a seeker head (2) of a missile, wherein at least one laser beam (8) is supplied to the seeker head (2) in a test environment, which laser beam forms a light pattern as an input signal for the seeker head (2). procedure after Claim 14 , characterized in that the method in the test arrangement (1) according to one of Claims 1 until 13 is carried out.

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