DE102019109129A1 - Contact pin for a test device for testing an electrical contact and test device - Google Patents

Abstract

The invention relates to a contact pin (12) for a test device for testing an electrical contact, in particular a high-voltage contact (10), comprising a test head (14) with at least one lateral contact area (22) for electrically conductive contacting of the electrical contact; a pen body (28) connected to the test head (14) with a spring area (16) wound in a spiral around a longitudinal axis of the pen body (28) and an interface (30) by means of which the pen body (28) is attached to an adapter (18) of the The test device can be fastened, the test head (14) being contactable with its lateral contact area (22) on the electrical contact with the spring area (16) flexing laterally away from the interface (30). The invention also relates to a test device with at least one contact pin (12) for checking an electrical contact, in particular a high-voltage contact (10).

Description

Technical area

The present invention relates to a contact pin for a test device for testing an electrical contact and a test device.

State of the art

Electrical contacts, such as high-voltage contacts, for electrically driven motor vehicles are usually subjected to an electrical function test before such contacts are installed. In the case of plug connectors, for example, it is common per se to check them on the front side with appropriate contact pins for checking purposes. For this purpose, contact pins are pressed on the front side against corresponding contact elements within such plug connectors in order, for example, to carry out a current measurement and / or to check that the relevant contact element is correctly seated.

In the high-voltage range in particular, it is often necessary or customary for safety reasons to at least partially enclose contact elements of such contacts with housing parts. This makes the accessibility of such contact elements from high-voltage contacts difficult or even impossible, at least at the front.

If such electrical contacts are to be checked, it is often unavoidable to bring contact pins laterally to corresponding contact elements of such contacts. This makes reliable and repeatable contacting considerably more difficult, not least because of tolerance fluctuations in the test devices used for checking and / or the electrical contacts.

Description of the invention

It is therefore the object of the present invention to provide a solution by means of which a reliable checking of an electrical contact, in particular a high-voltage contact, is made possible from the side.

This object is achieved by a contact pin for a test device for testing an electrical contact, in particular a high-voltage contact, with the features of claim 1. Further possible embodiments of the invention are specified in the dependent claims.

The contact pin according to the invention for a test device for testing an electrical contact, in particular a high-voltage contact, comprises a test head with at least one lateral contact area for electrically conductive contact with the electrical contact. In addition, the contact pin comprises a pin body connected to the test head with a spring area wound in a spiral around a longitudinal axis of the pin body and an interface by means of which the pin body can be attached to an adapter of the test device, the test head with lateral elastic bending of the spring area with respect to the interface its lateral contact area on the electrical contact can be contacted.

The contact pin is suitable for both plugs and sockets, particularly high-voltage contacts. As a result of the spirally wound spring area, the pin body or the contact pin has sufficient elasticity and deformability, and at the same time a sufficiently large contact pressure can be ensured when checking the electrical contact by means of the spring area. Particularly when high-voltage contacts are to be checked, due to the high currents it is often necessary to ensure that a relatively large contact pressure is applied to corresponding contact elements of such a high-voltage contact so that a reliable and safe function check can be carried out.

The contact pin can for example be made from a copper alloy, in particular from a hardened copper alloy, such as from copper beryllium or the like. This ensures, on the one hand, good electrical conductivity and, on the other hand, relatively good durability. The contact pin can easily be attached to the test device with its interface, for example by plugging the interface into said adapter of the test device and fixing it therein. Other fastening options or other forms of the adapter are of course also possible.

If the contact pin with its interface has been attached in or on the test device, the spring area of the pin body can be elastically bent laterally outwards opposite the interface, as a result of which the test head connected to the pin body is also deflected accordingly. If, for example, two of the contact pins are used within the test device, they can be bent apart in opposite directions, whereby, due to their respective spring area, they can then exert a corresponding contact pressure with the test head on a contact element of the relevant electrical contact, in particular high-voltage contact. Appropriate design of the spring area of the contact pin can ensure that the contact pin is suitable for the respective application, that is for the respective electrical contact to be checked can be deflected or bent away far enough without being damaged.

The test head thus serves as a type of tangential electrical contact when checking the relevant electrical contact, in particular high-voltage contact. The test head, in particular the contact area of the test head, can be coated with gold or silver, for example, in order to achieve a particularly low contact resistance. The spirally wound spring area can, for example, be helical, that is to say have a constant pitch. However, other shapes with a non-constant pitch and / or other materials are also possible.

The spring area can be produced, for example, in that material is milled out of the pen body. It is also possible to produce the spring area from a type of metallic flat strip which is wound up in a spiral. Furthermore, it is also possible, for example, for the spring area of the contact pin or the entire contact pin in particular to be produced by laser sintering or another 3D printing process.

By means of the contact pin according to the invention, it is therefore possible in a reliable manner to contact and check an electrical contact, in particular a high-voltage contact, from the side. The contact pin according to the invention has advantages, particularly in the case of high-voltage contacts that are appropriately enclosed for safety reasons, since it can easily be placed laterally on corresponding contact elements of the high-voltage contact. Due to the spiral-shaped spring area, a sufficiently high contact pressure can be exerted by means of the test head, which is necessary and advantageous with the usually high currents of high-voltage contacts.

One possible embodiment of the invention provides that the test head is non-destructively releasably connected to the pen body. For example, if necessary, the test head can easily be exchanged and replaced with a new test head, for example if the test head has been damaged. It is then not necessary to replace the entire contact pin.

Another possible embodiment of the invention provides that the test head can be fastened to the pin body by means of a screw connection. A particularly simple releasable connection can thereby be established.

According to a further possible embodiment of the invention, it is provided that the contact pin has several test head variants which differ from one another with regard to their shape. Depending on what type of electrical contact is to be checked or tested, the appropriate test head variant can be selected which, in particular, geometrically matches the shape of the electrical contact to be checked. In principle, this means that the same contact pin can be used in a particularly flexible manner simply by exchanging the different test head variants.

Another possible embodiment of the invention provides that the contact pin has several pin body variants which differ from one another with regard to their spring stiffness. In this case, the spring areas of the different pen body variants are designed differently, so that the different spring stiffnesses come about. Different spring stiffnesses or flexibilities can be realized, for example, by a different gradient of the spiral-shaped spring area. It is also possible, for example, to vary the material thickness of the spring area in order to achieve different spring stiffnesses. In addition, it is also possible, for example, to simply design the spring area of different lengths, as a result of which the spring stiffness or flexibility can also be influenced accordingly. Depending on the requirements of the test, in particular with regard to the contact pressure to be applied, the appropriate pen body variant can be selected. In particular in combination with the various test head variants, a type of modular system results for the contact pin, so that it can be adapted to the corresponding test situation particularly easily by exchanging the components accordingly.

Another possible embodiment of the invention provides that the test head is connected to the pin body by means of a soldered connection. In that case it can be provided that the test head is connected to the pen body in a non-releasable manner. As a result, the contact pin can be designed in a particularly cost-effective manner, since no complex connecting means have to be provided for the releasable connection of the test head to the pin body.

According to a further possible embodiment of the invention, it is provided that the pen body has a sleeve-like receiving area for receiving a test head shaft of the test head. The test head shaft simply has to be inserted into the sleeve-like receiving area of the pen body. As a result, the pen body and the test head can be arranged and fixed to one another with a particularly simple fit with one another.

Another possible embodiment of the invention provides that the interface has a shaft that can be inserted into the sleeve-like receiving area of the adapter. The contact pin can thus be inserted into said adapter of the test device in a particularly simple manner.

Another possible embodiment of the invention provides that the interface has a thread for producing a screw connection with the receiving area of the adapter. As a result, the contact pin can be fastened in or on the test device in a particularly simple and releasable manner.

The test device according to the invention comprises the contact pin according to the invention or a possible embodiment of the contact pin according to the invention. In particular, it can be provided that the test device has two of the contact pins, which are aligned parallel to each other and fastened in respective adapters of the test device, so that the contact arranged between the contact pins can be contacted with a defined contact force by bending the spring areas sideways.

For example, the contact pins are simply pushed into a high-voltage contact designed as a socket, the contact pins being bent away from one another, as a result of which they laterally apply a correspondingly large contact pressure to a socket-shaped contact element arranged between them. This enables the relevant contact, in particular high-voltage contact, to be checked in a reliable manner. It is also possible, for example, to insert the two contact pins of the test device into a housing in which a plug part of a high-voltage contact serving as a contact element is arranged. The contact pins are bent apart when they are inserted or positioned on the plug part and exert a sufficiently large contact pressure on the plug part so that high currents occurring in the high-voltage range in particular do not pose a problem when checking the plug contact.

In particular, the test device enables an arrangement of two of the contact pins serving as test pins so that, for example, a Kelvin measurement or 4-pole measurement can be made possible. In addition, it is also possible by means of the test device to accommodate far more than two contact pins, for example ten or more of them. Thereby it is e.g. possible to contact a relatively large surface so that correspondingly high currents can be transmitted.

Further possible advantages, features and details of the invention emerge from the following description of possible exemplary embodiments and with reference to the drawing. The features and feature combinations mentioned above in the description as well as the features and feature combinations shown below in the description of the figures and / or in the figures alone can be used not only in the respectively specified combination, but also in other combinations or alone, without the scope of the invention to leave.

Figure list

• 1 eine Seitenansicht eines als Buchse ausgebildeten Hochvoltkontakts, in welchen zwei Kontaktstifte zur Überprüfung des Hochvoltkontakts eingeführt worden sind;
• 2 eine Draufsicht auf eine Öffnung des als Buchse ausgebildeten Hochvoltkontakts, wobei die Anordnung der jeweiligen Kontaktstifte innerhalb der Buchse erkennbar ist;
• 3 eine Seitenansicht eines als Stecker ausgebildeten Hochvoltkontakts, wobei an einem Kontaktelement des Hochvoltkontakts die beiden Kontaktstifte seitlich anliegen;
• 4 eine Draufsicht auf das Steckerelement, an welchem die beiden Kontaktstifte anliegen;
• 5 eine Perspektivansicht auf einen der Kontaktstifte; und in
• 6 eine Explosionsdarstellung von einem der Kontaktstifte.

The drawing shows in:

• 1 a side view of a high-voltage contact designed as a socket, into which two contact pins have been inserted for checking the high-voltage contact;
• 2 a plan view of an opening of the high-voltage contact designed as a socket, the arrangement of the respective contact pins within the socket can be seen;
• 3 a side view of a high-voltage contact designed as a plug, the two contact pins resting laterally on a contact element of the high-voltage contact;
• 4th a plan view of the plug element on which the two contact pins are applied;
• 5 a perspective view of one of the contact pins; and in
• 6th an exploded view of one of the contact pins.

Identical or functionally identical elements have been provided with the same reference symbols in the figures.

A high-voltage contact designed as a socket 10 is in a side view in 1 shown. In the high-voltage contact 10 were two contact pins 12 with their respective probes 14th introduced. To the probes 14th respective spring areas close 16 with the contact pins 12 in respective adapters 18th an unspecified and shown test device are arranged. The feather areas 16 are spiral around the respective longitudinal axes of the contact pin 12 tortuous. The feather areas 16 serve to apply a sufficiently large contact pressure to the high-voltage contact 10 exercise, more precisely, to ensure that the probes 14th a sufficiently large contact pressure in the horizontal and / or along the longitudinal axis of the contact pin 12 exercise.

In 2 is the high-voltage contact designed as a socket 10 shown in a front view. In this view you can see a contact element 20th of the high-voltage contact designed as a socket 10 recognize on which the two probes 14th the contact pins not specified here 12 lie on the side. The probes 14th can have different shapes and sizes and are in particular designed in such a way that a corresponding pressing force on the high-voltage contact is effective and over a large area 10 to raise. In 2 are the probes 14th symmetrical to the longitudinal axis of the contact element 20th arranged, with a different number of probes 14th and other arrangements of probes 14th relative to the longitudinal axis of the contact element 20th are provided.

In 3 is a high-voltage contact designed as a plug 10 shown. The contact pins 12 lie with their probes 14th again on a contact element 20th of the high-voltage contact 10 to the side, whereby this is plug-shaped. There are respective lateral contact areas 22nd of the probes 14th marked, between which the contact element 20th is jammed. Again, the spirally wound spring areas take care of it 16 for that by means of the probes 14th a sufficiently large contact pressure is exerted.

In 4th is the high-voltage contact designed as a plug 10 shown in a front view, it can be seen here again how the contact element 20th between the probes 14th is jammed. The contact pins 12 are therefore particularly suitable for lateral or tangential contacting of contact elements 20th of high-voltage contacts 10 to realize.

In 5 is one of the contact pins 12 shown in a perspective view. In the present case, the spiral around the longitudinal axis of the contact pin can be seen 12 winding spring area 16 detect. This can be produced, for example, by milling out the recesses, which are not described in any more detail here and which produce the spiral shape. It is also possible, for example, to wind up a metallic flat strip in a spiral shape in order to form the spiral spring area 16 to get. It is also possible, for example, to laser sinter the spring area 16 to manufacture. The adapter 18th can belong to a test device not shown in detail, so that the contact pin 12 simply into the adapter 18th can be plugged in and attached. Alternatively, it is also possible that the adapter 18th to the contact pin 12 heard.

There is still a tool attack area 24 shown which serves the contact pin 12 into the adapter 18th screw in or screw out. If the adapter 18th still to the contact pin 12 belongs to the tool attack area 24 then add the remaining contact pin 12 into the adapter 18th screw in and out of this.

The entire contact pin 12 or only parts thereof can be made from a hardened copper alloy, for example, which has good current-conducting properties, in particular the spring area 16 also has sufficiently good resilient properties or sufficiently good elasticity. The spring stiffness of the spring area 16 can for example be adjusted by changing the slope of the spring area 16 chosen accordingly, the material thickness chosen accordingly or the length of the spring area 16 is chosen accordingly.

In 6th is one of the contact pins 12 shown in an exploded view. The probe 14th can be removed non-destructively with a pen body 28 connectable, which the spring area 16 includes. The probe 14th can for example by means of a screw connection on the pen body 28 be attachable. The contact pin 12 can also have several different test head variants which differ from one another with regard to their shape. Depending on how the geometric boundary conditions within the high-voltage contact to be tested 10 the appropriate probe variant can then be selected and used. It is also possible that the contact pin 12 has several pen body variants, which differ from one another in terms of their spring stiffness. So depending on the boundary conditions, the right pen body can be used 28 with the appropriate spring area 16 to be chosen. Alternatively, it is also possible that the test head 14th by means of a soldered connection to the pin body 28 connected is.

The pen body 28 has a sleeve-like receiving area, not designated in any more detail here - according to the present illustration - in an upper area for receiving a test head shaft 26th of the probe 14th on. This probe shaft 26th can then simply be inserted into the sleeve-like receiving area of the pen body 28 be inserted and screwed in, for example. The pen body 28 also includes an attached to the feather area 16 subsequent interface 30th , by means of which the pen body 28 on or in the adapter 18th is attachable. the interface 30th comprises a sleeve-like receiving area of the adapter, which is not designated in any more detail here 18th insertable shaft 32 on. Below the shaft 32 or as part of the shaft 32 includes the interface 30th a thread 34 for establishing a screw connection with the receiving area of the adapter 18th .

As soon as the contact pin 12 so with its interface 30th in the adapter 18th has been arranged, at least essentially only the spring area protrudes 16 from the adapter 18th out. The shaft 32 is from the adapter 18th enclosed and held in place. In this state, the spring area 16 to the side of the actual longitudinal axis of the contact pin 12 or to the side of the longitudinal axis of the adapter 18th be bent away. According to the spring stiffness of the spring area 16 this then exerts a corresponding restoring force, so that by means of the test head 14th a corresponding contact force on the relevant contact element 20th of the high-voltage contact 10 can be exercised.

Whenever a lateral contact on the contact element 20th of the relevant high-voltage contact 10 is required, the contact pins described here are 12 particularly well suited. Through the spiral-shaped spring areas 16 On the one hand, a sufficiently large contact pressure can be achieved, on the other hand, through the spiral-shaped spring areas 16 the probes 14th can also be deflected laterally accordingly. Even with relatively large positional tolerances of high-voltage contacts to be checked 10 can the contact pins 12 can be used relatively easily and over a wide range within possible tolerance fluctuations.

List of reference symbols

10

High voltage contact

12

Contact pin

14th

Probe

16

spiral spring area

18th

adapter

20th

Contact element of the high-voltage contact

22nd

lateral contact areas on the probe

24

Tool attack area

26th

Probe shaft

28

Pen body

30th

interface

32

Shank of the interface

34

Thread of the interface

Claims (11)

Contact pin (12) for a test device for testing an electrical contact, in particular a high-voltage contact (10), comprising - A test head (14) with at least one lateral contact area (22) for electrically conductive contacting of the electrical contact; - A pen body (28) connected to the test head (14) with a spring area (16) wound in a spiral around a longitudinal axis of the pen body (28) and an interface (30) by means of which the pen body (28) is attached to an adapter (18) the test device can be fastened, the test head (14) being contactable with its lateral contact area (22) on the electrical contact with the spring area (16) flexing laterally away from the interface (30). Contact pin (12) Claim 1 , characterized in that the test head (14) is non-destructively releasably connected to the pin body (28) again. Contact pin (12) Claim 2 , characterized in that the test head (14) can be attached to the pin body (28) by means of a screw connection. Contact pin (12) Claim 2 or 3 , characterized in that the contact pin (12) has several test head variants which differ from one another with regard to their shape. Contact pin (12) according to one of the Claims 2 to 4th , characterized in that the contact pin (12) has several pin body variants which differ from one another in terms of their spring stiffness. Contact pin (12) Claim 1 , characterized in that the test head (14) is connected to the pin body (28) by means of a soldered connection. Contact pin (12) according to one of the preceding claims, characterized in that the pin body (28) has a sleeve-like receiving area for receiving a test head shaft (26) of the test head (14). Contact pin (12) according to one of the preceding claims, characterized in that the interface (30) has a shaft (32) which can be inserted into the sleeve-like receiving area of the adapter (18). Contact pin (12) according to one of the preceding claims, characterized in that the interface (30) has a thread (34) for producing a screw connection with the receiving area of the adapter (18). Test device with at least one contact pin (12) according to one of the preceding claims, which is fastened in an adapter (18) of the test device. Test device according to Claim 10 , characterized in that the test device has two of the contact pins (12) which are aligned parallel to one another and are fastened in respective adapters (18) of the test device so that through lateral bending away of the spring areas (16), the contact arranged between the contact pins (12) can be contacted with a defined contact force.

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