DE102019100461B4 - Light travel time pixels - Google Patents

Abstract

Light time of flight pixel, with: a useful channel (A) a collection node (SKA) in the useful channel (A), a transfer gate (TG A) which is assigned to the collection node (SKA), with a storage node (SPKA) which is assigned to the transfer gate (TG A) is assigned, with a separation gate (SEP A), which is assigned to the storage node (SPK A), and a discard channel with a discard node (VK), with a discard node separation gate (SEP VK), which is assigned to the discard node (VK), wherein a light-active, electrically modulable area (MOD A, B, C) is arranged between the separation gate (SEP A) and the rejection node separation gate (SEP VK).

Description

The invention relates to a time-of-flight pixel according to the preamble of the independent claim.

Light transit time pixels are intended here to include, in particular, pixels that obtain distances from the phase shift of an emitted and received radiation. PMD pixels with photomixing detectors (PMD), as described in the DE 197 04 496 A1 are described. The pixels are used in particular in 3D cameras, such as those available from the company 'ifm electronic GmbH' or 'pmdtechnologies ag' as O3D cameras or as CamBoards.

2D imagers / image sensors use different structures for the purpose of kTC noise reduction using CDS (correlated double sampling) in global shutter operation. From the US 7361877 B2 Corresponding pixels are known that have an additional “pinned diode” as a buffer, which can be read out noise-free.

Furthermore, from the publication: S. Velichko et al., IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 63, NO. 1, JANUARY 2016, “CMOS Global Shutter Charge Storage Pixels With Improved Performance” (DOI: 10.1109/ TED.2015.2443495) also known forms that have a combination of pinned diode with photogate.

From the DE 10 2016 211 053 A1 a pixel cell for a light duration sensor with a photonic mixing element is known. The photonic mixing element comprises a useful channel, a collection node arranged there, a transfer gate assigned to the collection node, a storage node assigned to the transfer gate, and a separation gate assigned to the storage node. The photonic mixing element has several pinning diodes for accumulating charge carriers in a masked pixel area.

The DE 10 2015 223 674 A1 and the DE 10 2015 223 675 A1 each describe a time-of-flight sensor for an optical rangefinder, with several readout fingers for an A and B channel, with a respective readout node having at least one diode node. The photonic mixing elements described there can also have a structure comprising a useful channel with a storage node and a separation gate assigned to the storage node.

From the EP 2 978 216 B1 a method for detecting motion blur during the sensory detection of an object is known, wherein a time-of-flight sensor is described, which includes a useful channel and an anti-blooming gate.

The WO 2017/ 006 781 A1 discloses a photodetector which also includes a useful channel and an anti-blooming gate.

The object of the invention is to improve the dynamic range of a time-of-flight pixel.

The task is solved by a time-of-flight pixel according to claim 1. Advantageous embodiments of the invention are specified in the subclaims.

A light transit time pixel is advantageously provided with a useful channel
a collection node in the useful channel,
a transfer gate that is assigned to the collection node,
with a storage node assigned to the transfer gate,
with a separation gate associated with the storage node,
and a fault channel with a fault node
and with a discard node separation gate (SEP VK) associated with the discard node (VK),
wherein a light-active, electrically modulable region (MOD A, BC) is arranged between the separation gate (SEP) and the rejection node separation gate (SEP VK).

Furthermore, a light transit time pixel is provided, in which the collecting node (SK) is designed as a diode.

In a further embodiment, a time-of-flight pixel is provided, in which the storage node (SPK) is designed as a pinned photodiode.

The rejection node is advantageously permanently at a reference potential, in particular at the reset potential.

A time-of-flight pixel is also advantageously provided, in which a MOS isolation capacitance (SEP VK) and a rejection node (VK) are additionally inserted into the electrically modulable area (MOD A, B).

Furthermore, a light travel time pixel is proposed, in which a second collection node (SK B) is designed as a rejection node (VK B),
with an additional modulation node (SEP VK) that separates the light-active modulated area from the rejection node.

In particular, it is advantageous to provide a time-of-flight pixel in which the pixel channels (A, B) with the associated collection nodes (SK A, B) are arranged diagonally near the corners of the pixel, with the transfer gates (TG), storage nodes (SPK), separation gates ( SEP) and light-active modulable areas (MOD A, B) also have a diagonal arrangement between the collecting nodes (SK A, B).

This approach has the advantage that a time-of-flight pixel can be provided in which the light-sensitive area is larger than conventional pixels and the fill factor can thus be improved

It is particularly useful when the Pixel is illuminated from the back.

An image sensor with the aforementioned time-of-flight pixels is also advantageously provided, in which the pixels are arranged in a matrix.

A method for operating an aforementioned time-of-flight pixel or image sensor as a CDS-capable time of flight pixel with a global shutter function is particularly advantageously provided. The process can be divided into three phases: integration, end of integration, reset and readout. From which global shutter operation can be implemented by using a storage node SPK and a separation node SEP.

Integration: During integration, the charge carriers are collected under the storage node SPK (SPK: high voltage, TG: low voltage, SEP: medium voltage), with the voltages at the storage node V _SPK , at the separation node V _SEP and transfer gate V _TG set as follows : V _SPK > V _SEP > V _TG .

End of integration: To end the integration, a low voltage V _{SEP_int_ende} < V _{SEP_int} is applied to the separation gate SEP in order to separate the storage node from the light-active modulation gates (MOD A, B, C) (global shutter operation).

Reset and readout: During the readout, the collecting node SK is first subjected to a high voltage V _SK . This reset voltage S _Reset is read out and buffered in a CDS stage (S _Reset ).

The transfer gate TG is then opened (TG high voltage, (V _TG > V _SPK )), so that all charge carriers collected under the storage node (SPK) are completely transferred to the collection node SK.

The collecting node is now read out a second time (S _signal ). By forming the difference with the initial value stored in the CDS stage (S _Reset - S _signal ), the temporal noise (kTC noise) can be eliminated.

Furthermore, it is provided that during all of the aforementioned steps the reject node is set to a reference potential (V _Reset ) and the associated reject node separation gate (SEP VK) is set to a fixed positive potential V _{SEP VK} with V _MOD <V _{SEP VK} <V _VK . lies.

This procedure ensures operation as a global shutter pixel by combining the storage node as an additional temporary buffer in combination with the separation gate as a separation device for this storage node.

The invention is explained in more detail below using exemplary embodiments with reference to the drawings.

• 1 ein Lichtlaufzeit-Pixel, das zur Verwendung einer CDS Auslese im global shutter Betrieb ausgebildet ist,
• 2 einen typischen zeitlichen Verlauf der angelegten Spannungen, wobei die Spannung am Speicherknoten dauerhaft konstant bleibt,
• 3 einen typischen zeitlichen Verlauf der angelegten Spannungen, wobei die von außen angelegte Spannung am Speicherknoten unmittelbar vor dem Transfer der Ladungsträger auf den Sammelknoten reduziert wird,
• 4 einen typischen Potentialverlauf im Silizium während der Integration und der Auslese,
• 5 ein Füllfaktor optimiertes Speichergate-Pixel in Diagonalanordnung ohne Verwerfknoten,
• 6 eine Ausführung eines one-tap-Pixels mit Nutz- und Vewerfkanal,
• 7 einen Potentialverlauf des one-tap-Pixel gemäß 6,
• 8 einen zeitlichen Verlauf der angelegten Spannungen an einem erfindungsgemäßen one-tap-Pixel.

It shows schematically:

• 1 a light travel time pixel that is designed to use a CDS readout in global shutter operation,
• 2 a typical time course of the applied voltages, whereby the voltage at the storage node remains permanently constant,
• 3 a typical time course of the applied voltages, whereby the externally applied voltage at the storage node is reduced immediately before the charge carriers are transferred to the collection node,
• 4 a typical potential curve in the silicon during integration and readout,
• 5 a fill factor optimized memory gate pixel in a diagonal arrangement without discard nodes,
• 6 a version of a one-tap pixel with useful and discard channel,
• 7 a potential curve of the one-tap pixel 6 ,
• 8th a time course of the voltages applied to a one-tap pixel according to the invention.

In the following description of the preferred embodiments, the same reference numbers designate the same or comparable components.

The invention is based on the following considerations: By using additional unlit teter photogates, photogenerated electrons can be stored in the charge domain. This intermediate storage of the charge carriers in the charge domain, instead of the typical integration in a diode, enables correlated double sampling and thus the elimination of kTC noise. By integrating the buffer designed as a photogate, “global shutter” operation is also possible. The separation gate acts as a potential barrier to enable global shutter operation. In addition, fill factor optimized layout variants and different operating modes are suggested for this pixel type.

The measurement accuracy of a usual PMD pixel can be limited by the kTC noise, especially at low illuminances or large distances to be measured. This amount of noise can be almost completely eliminated by correlated double sampling. In addition, the selection in global shutter operation offers a decisive advantage compared to rolling shutter operation. In global shutter operation, movement artifacts can be avoided. This means that in global shutter mode, even fast-moving scene elements (e.g. fan rotor blades) are undistorted and sharp.

1. 1. Mindestens einen Sammelknoten (SK)
2. 2. Mindestens ein Transfergate (TG), zu diesem Sammelknoten gehörig
3. 3. Mindestens ein Speicherknoten (SPK), zu diesem Sammelknoten gehörig
4. 4. Mindestens ein Separationsgate (SEP), zu diesem Sammelknoten gehörig
5. 5. Mindestens einen lichtaktiven, elektrisch modulierbaren Bereich (MOD), zu diesem Sammelknoten gehörig (Modulationsgates MOD in verschiedenen Ausführungen)

A possible embodiment is in 1 shown, consisting of the following components, which enables CDS readout in global shutter operation:

1. 1. At least one collection node (SK)
2. 2. At least one transfer gate (TG) belonging to this collection node
3. 3. At least one storage node (SPK) belonging to this collection node
4. 4. At least one separation gate (SEP) belonging to this collection node
5. 5. At least one light-active, electrically modulable area (MOD) belonging to this collecting node (modulation gates MOD in various versions)

An additional unilluminated photogate or a storage node SPK and the associated transfer gate TG per channel A, B are each arranged between the illuminated mixer area (modulation gates) MOD A, MOD B or the separation gate and the corresponding collection node SK. The additional gates transfer gate TG and storage node SPK can be assigned an individually adjustable voltage. The additional storage node SPK is typically assigned a constant voltage to enable the accumulation of charge carriers under this gate SPK.

After the integration time t _int has been completed, the charge carriers collected in this way are transferred to the collection node SK via the transfer gate TG. The electrons are transferred noise-free. At the same time, the gate capacity can be completely drained. The noise-free transfer and the complete emptying of the capacity enable an advantageous combination of the current PMD design with a CDS readout.

The existing separation gates SEP are set to 0V after integration and thus prevent further accumulation of charge carriers under the unlit storage node SPK. This enables global shutter operation of the pixel matrix.

2 shows a typical time sequence of the voltages applied to the gates TG, SPK, SEP and to the transistors Reset and Select. By switching the reset transistor, a defined voltage is applied to the collecting node SK. By switching the select transistor, the pixels to be read are selected and the pixel voltages are transmitted.

This timing can be divided into three phases (reset, integration, readout). Initially, all free charge carriers present in the photoactive area of the pixel are removed via a reset step (high voltage at RESET, TG, SPK and SEP). During integration, the photogenerated charge carriers collect under the storage node SPK. After integration, all collected charge carriers are transferred noise-free to the diode or collection node SK by a voltage pulse on the transfer gate TG.

By comparing the diode voltage read out shortly before the charge transfer (time treset) with the diode voltage after the charge transfer (time tsignal), the kTC noise can be eliminated by forming the difference.

Given the timing of the tensions in 2 the voltage at the storage node remains constant during the integration and readout of the photogenerated charges.

3 shows a timing at which the voltage at the storage node is reduced immediately before the charges are transferred to the diode. This approach has the advantage that the overall time for the transfer can be reduced. In addition, the voltage range of the diode can be used over a larger range.

1. 1. Integration: Bei der Integration sammeln sich alle Ladungsträger unter dem Speicherknoten SPK, während das Transfergate TG eine Potentialbarriere zwischen Speicherknoten SPK und Sammelknoten SK induziert.
2. 2. Integrationsende und Reset: Zur Beendigung der Integration wird eine Potentialbarriere unter dem Separationsgate SEP induziert und somit die Drift oder Diffusion weiterer Ladungsträgern unter den Speicherknoten SPK verhindert (global shutter Betrieb). Gleichzeitig wird der Sammelknoten SK auf eine definierte (hohe) Spannung gesetzt.
3. 3. Auslese: Bei der Auslese wird die Barriere unter dem Transfergate TG durch eine Änderung der Spannung reduziert. Dadurch werden alle unter dem Speicherknoten SPK gesammelten Ladungsträger vollständig zum Sammelknoten SK transferiert.

4 (above) shows an example of a section through the in 1 pixels shown. Below is the typical course of the electrostatic potential in Silicon for the three phases integration, end of integration and reset, as well as the readout are shown:

1. 1. Integration: During integration, all charge carriers collect under the storage node SPK, while the transfer gate TG induces a potential barrier between the storage node SPK and the collection node SK.
2. 2. End of integration and reset: To end the integration, a potential barrier is induced under the separation gate SEP, thus preventing the drift or diffusion of further charge carriers under the storage node SPK (global shutter operation). At the same time, the collecting node SK is set to a defined (high) voltage.
3. 3. Readout: During readout, the barrier under the transfer gate TG is reduced by changing the voltage. As a result, all charge carriers collected under the storage node SPK are completely transferred to the collection node SK.

In addition to the complete integration under the storage node SK just described, the pixel can be operated in a second operating mode: partial integration of charge carriers under the storage node SPK with partial integration in the collection node SK (integration with overflow).

In the latter case, part of the charge is stored under the storage node SPK. At high illuminances, due to the finite storage capacity of the storage node SPK, overflow occurs and part of the charge flows away into the collection node SK before the end of the integration. For this purpose, the potential barrier under the transfer gate TG is lower than in the case described above. This procedure enables different operating modes depending on the illuminance.

In all of the pixel configurations and operating modes mentioned above, the gate SPK described for storing the charge carriers (storage nodes) can be replaced by a “pinned diode”, such as those typically used in 2D pixels. The storage node, designed as a pinned diode, has the advantage of a lower dark current compared to a gate and does not need to be contacted separately via a voltage supply.

The PMD structure is particularly advantageously arranged on a diagonal so that the fill factor can be optimized. Only the modulation gates MOD A and B are transparent for lighting. The remaining components of the pixel (SEP, SPK, TG, SK) must be shielded by appropriate measures (e.g. metal covering). For maximum fill factor and thus maximum sensitivity of the pixel, the light-active area must be kept as large as possible. In order to improve the fill factor of the pixel described above, but above all to enable smaller pixel pitches, a new approach to gate arrangement was implemented.

The separation gate as well as the transfer gate have the task of preventing charge carriers from drifting into the next node. Therefore, there are no special requirements for their area, only their length should be sufficient to enable the functionality mentioned. At the same time, the collection node SK A must have a minimum area that is required to store a minimum necessary number of charge carriers. If you arrange the gates as in 1 the shielded gates cover the entire width of the pixel. If, on the other hand, the gates are guided to the corners of the pixel, the charge carrier channel tapers to the collecting node SK. The area used decreases towards the pixel edge. The area available for the modulation gates is better utilized and the pixel has a higher fill factor. At the same time, the “global shutter” and CDS functionality is retained. 5 shows a concrete layout example for such a pixel.

In order to further increase the photoactive area, it is possible to use only one channel A instead of using two channels A, B (one-tap pixel). 6 and 7 show a concrete example of such a pixel with a useful channel A to be evaluated. In this case, the gates SEP B and TG B and the storage node SPK B, which are necessary for another useful channel B, are omitted. The photoactive area and thus the fill factor of the pixel can be increased to a similar extent. Here the useful channel works as in 4 described, while the second channel is designed as a rejection channel with a rejection node VK. The rejection node VK is separated from the modulation gates or the light-active and modulated area via a rejection node separation gate SEP VK. The reject node is preferably at a high reference potential and here in particular at the reset potential V _Reset , with the reject node separation gate preferably also being kept at a high potential with V _MOD <V _{SEP VK} <V _VK . becomes.

7 shows schematically a corresponding potential curve. The potential curve of the integration, end of integration and readout of the first channel A correspond to those in 4 shown courses. According to the invention, however, the complementary channel is designed here as a rejection node VK, which is preferably permanently at the reset potential V _Reset . The rejection node VK is still separated from the remaining pixel via a rejection node separation gate SEP VK, this separation gate SEP VK preferably also permanently being at a high potential V _{SEP VK} > V _MOD with V _{SEP VK} <V _VK .

8th shows an example of a time course of the potential on a time-of-flight sensor according to the invention, which is in addition to 3 also shows the time course of the potential of the separation gate SEP VK of the rejection channel.

In contrast to the separation gate SEP A of the useful channel A, the rejection node separation gate SEP VK is permanently at a high potential.

Reference symbol list

A

Usable channel A

SEP VK

Discard node separation gate

A, B, C

Potentials at the modulation gate

SK

Collector node (, diode)

TG

Transfergate

SPK

Storage node (gate, photogate, diode, pinned diode)

SEP

Separation gate

MOD

modulation gate

VK

Fault node (diode)

Claims (10)

Light time of flight pixels, with: a useful channel (A) a collection node (SKA) in the useful channel (A), a transfer gate (TG A) that is assigned to the collection node (SKA), with a storage node (SPKA) assigned to the transfer gate (TG A), with a separation gate (SEP A) that is assigned to the storage node (SPK A), and a fault channel with a fault node (VK), with a discard node separation gate (SEP VK) assigned to the discard node (VK), wherein a light-active, electrically modulable area (MOD A, B, C) is arranged between the separation gate (SEP A) and the rejection node separation gate (SEP VK). Light travel time pixels after Claim 1 , in which the collecting node (SK A) is designed as a diode. Light travel time pixels after Claim 1 or 2 , in which the storage node (SPK A) is designed as a pinned photodiode. Light transit time pixel according to one of the preceding claims, in which the rejection node is permanently connected to a reference potential (V _Reset ). Light time of flight pixel according to one of the preceding claims, in which the collection node (SKA) and the discard node (VK) are arranged diagonally near the corners of the pixel, the transfer gate (TG A), the storage node (SPK A), the separation gate (SEP A) , the light-active modulable area (MOD A, B, C) and the discard node separation gate (SEP VK) are sufficient diagonally between the collection node (SKA) and the discard node (VK). Time-of-flight pixel according to one of the preceding claims, in which the pixel is illuminated from the back. Image sensor with time-of-flight pixels according to one of the preceding claims, which are arranged in a matrix. Time-of-flight camera with at least one time-of-flight pixel or image sensor according to one of the preceding claims. Method for operating a time-of-flight pixel according to one of the Claims 1 until 6 as a CDS-capable time-of-flight pixel of an image sensor Claim 7 with CDS-capable time-of-flight pixels or a time-of-flight camera Claim 8 with at least one CDS-capable time-of-flight pixel or with an image sensor with CDS-capable light-time pixels with a global shutter function, with the steps: - Integration in which the modulation gates are supplied with a modulation voltage (V _MOD ) and the voltages at the storage node (V _SPK ), on the separation gate (V _SEP ) and transfer gate (V _TG ) are set as follows: V _SPK > V _SEP > V _TG . - Integration end, in which a low voltage V _{SEP_int_ende} <V _{SEP_int} is applied to the separation gate (SEP) in relation to the integration in order to separate the storage node (SPK) from the light-active modulation gates (MOD A, B, C). - Reset and readout, in which the collecting node is first subjected to a high voltage and the reset voltage (S _Reset ) is read out and buffered in a CDS stage, with the transfer gate (TG) then being opened (V _TG > V _SPK ) so that all charge carriers collected under the storage node (SPK) are completely transferred to the collection node (SK), whereby the collection node is then read out a second time (S _signal ) and by forming the difference (S _Reset - S _signal ) with the in The initial value stored in the CDS stage eliminates the temporal noise is, whereby during all the aforementioned steps the rejection node (VK) is at a reference potential (V _Reset ) and the associated rejection node separation gate (SEP VK) is at a fixed positive potential V _{SEP VK} with V _MOD <V _{SEP VK} <V _VK . lies. Time-of-flight camera designed to carry out the aforementioned method.

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