DE102014216390A1 - projector - Google Patents

projector

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Publication number
DE102014216390A1
DE102014216390A1 DE102014216390.0A DE102014216390A DE102014216390A1 DE 102014216390 A1 DE102014216390 A1 DE 102014216390A1 DE 102014216390 A DE102014216390 A DE 102014216390A DE 102014216390 A1 DE102014216390 A1 DE 102014216390A1
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DE
Germany
Prior art keywords
projector
light sources
light
pattern
according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102014216390.0A
Other languages
German (de)
Inventor
Anton Schick
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE102014216390.0A priority Critical patent/DE102014216390A1/en
Publication of DE102014216390A1 publication Critical patent/DE102014216390A1/en
Withdrawn legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/24Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns

Abstract

A projector (1) for projecting a pattern onto at least a partial area of a surface of an object is proposed which comprises a plurality of light sources (2) and a microlens array (4), the microlens array (4) comprising a plurality of microlenses (41). and in each case at least one of the light sources (4) is assigned to one of the microlenses (41) and optically coupled thereto, that at least a part of the light (6) of the light source (4) associated with the microlens (41) forms the microlens (41). passes through, wherein the light sources (2) are lasers (2).

Description

  • The invention relates to a projector, in particular for depth determination of a partial area of a surface of an object, with a plurality of light sources and a microlens array.
  • For the three-dimensional detection of large objects, in particular of objects greater than or equal to 2 × 2 × 2 m 3 , known prior art projectors can only be used insufficiently. One reason for this is that known projectors are typically provided for the visible spectral range and consequently the power (light output) of the projectors or the light sources used within the projectors is distributed approximately over the entire visible spectral range. For the three-dimensional detection of an object (depth determination), in particular in a production environment, the light or pattern (structured light) projected by the projector onto the surface of the object should not be visible to a person to be examined, ie lie outside the visible spectral range.
  • Furthermore, the three-dimensional detection or measurement of large objects requires a sufficiently large light output of the projector, so that at best approximately the entire surface of the large object is illuminated by means of the projector.
  • Prior art projectors that appear suitable for illuminating large areas or surfaces, such as cinema projectors, typically have expensive cooling because the efficiency of typical light sources, such as xenon lamps, is little greater than 5%.
  • Furthermore, state-of-the-art projectors with a light-emitting diode (LED) are known as light sources. A disadvantage of these projectors is their lower light output compared to projectors with xenon lamps. This is due to the fact that typically only a fraction of the light emitted by the light emitting diode is usable for the projection of the pattern. In particular, in a projector which has a high depth of field and consequently a large depth measuring range, LEDs are disadvantageous due to their comparatively high etendue.
  • The object of the present invention is to improve a projector, in particular for determining the depth of a partial area of a surface of an object.
  • The object is achieved by a projector having the features of independent claim 1, as well as by a method having the features of independent patent claim 9. In the dependent claims advantageous refinements and developments of the invention are given.
  • The projector according to the invention for projecting a pattern onto at least a partial area of a surface of an object comprises a plurality of light sources and a microlens array, wherein the microlens array has a plurality of microlenses. According to the invention, in each case at least one of the light sources is assigned to one of the microlenses and optically coupled thereto, that at least part of the light of the light source associated with the microlens passes through the microlens. According to the invention, the light sources are designed as lasers.
  • In other words, with respect to a projection direction of the projector behind each microlens at least one laser is arranged as a light source. In this case, the light emitted by the laser arranged behind the microlens passes through the microlens associated with the laser. Each of the microlenses thus has its own light source, which is designed as a laser. As a result, the power (light output) of the projector, compared to a homogeneous illumination of the microlens array by means of only a single light source, is increased significantly.
  • Another advantage of the projector according to the invention is that the individual light sources, which are designed as lasers, have a significantly lower etendue compared to light-emitting diodes or xenon lamps. In other words, approximately all of the light emitted by one of the lasers passes through the microlens associated with the laser. It is thus hardly lost light, which increases the light output of the projector.
  • A particular advantage of the projector according to the invention is that the sum of the individual etendues of the laser is always less than a usable etendue (Lagrangeinvariante) of a projection optics. In this case, almost the entire light emanating from one of the lasers passes through the pupil of the projection optics. As projection optics, other optical components, such as lenses, mirrors and / or diaphragms, are referred to here, which are used for the projection. The projector according to the invention thus has over known projectors increased light output and a reduced Gesamtetendue. Due to the increased light output and the reduced total set the use of a shutter with low Diameter allows, so that advantageously increases the depth of field of the projector.
  • The inventive arrangement of the light sources and the microlens array has a certain similarity with a honeycomb capacitor, wherein according to the invention reduced intermediate images of a light source of the honeycomb capacitor by real light sources, that are replaced by the laser. This reduces the overall set-up and allows almost all light from the light sources to be used for projection.
  • Another advantage of the projector according to the invention is that the light emitted and projected by the projector is spectrally narrow due to the use of lasers. As a result, by means of suitable and appropriate filters, an ambient light interfering with the depth determination can be filtered out. In addition, advantageously, a wavelength of the laser lying outside the visible spectral range can be used, so that the light or pattern projected onto the surface of the object can not be visually recognized by a person to be examined. Of particular advantage is a wavelength of the laser in the infrared spectral range, that is with a wavelength in the range of 1 mm to 780 nm. Due to the possibly high laser or light output, it is expedient to take appropriate and sufficient safety measures for the person testing.
  • The light sources or the lasers can be designed as continuous wave lasers (English: continuous wave laser, short CW laser), as well as pulsed lasers.
  • In the method according to the invention for depth determination of a partial area of a surface of an object, a pattern is projected onto the partial area by means of the projector according to the invention. Furthermore, an image of a pattern reflected by the at least one partial region is detected by means of a detection device, and a depth determination of the at least one partial region of the object is carried out by means of the projected pattern and the image.
  • In other words, the projector according to the invention is used for depth determination of the subarea. The projector according to the invention is therefore advantageous for the depth determination, since it has a high light output and at the same time a low Gesamtetendue. This results in the above-mentioned projector according to the invention similar and equivalent advantages of the method according to the invention.
  • According to an advantageous embodiment of the invention, the projector comprises a condenser, wherein the spatial distance of the light sources and the condenser relative to an optical axis of the projector is at least 5 cm, in particular at least 10 cm.
  • Furthermore, the spatial distance between the microlens array and the condenser relative to the optical axis of the projector can be at least 5 cm, in particular at least 10 cm. The microlens array is in this case arranged in the immediate vicinity of the light sources, wherein the individual microlenses of the microlens array are provided for a collimation of the light of the individual light sources.
  • Advantageously, the light output of the projector is improved at a large depth of field by said large distance between the light sources and the condenser or the microlens array and the condenser. Due to said large distance, the use of a large plurality of light sources and thus a high light output is possible, with a constant small diameter of the aperture of the projector, whereby the depth of field is consistently large. Especially for objects with a size of 5 × 5 × 3 m 3 , the projector is advantageous due to its depth of field and light output. For example, a depth of field in the range of 2 m to 3 m is made possible by the projector. In particular, even greater distances, for example greater than 30 cm, are provided between the light sources and the condenser. Appropriately, a distance is less than or equal to 1 m.
  • By reducing the aperture of the projection optics, in particular by reducing the aperture of a projection lens, the depth of field of the projector is increased. However, the usable etendue would also decrease, and some of the lasers, or part of the light, of the lasers would be blanked out, so that the light flow through the projection optics or the projection objective would be reduced. In order to prevent this and to supply almost all the light generated by all the lasers through the diaphragm unattenuated, it is necessary to increase the distance between the light sources and the condenser (adaptation of the magnification). As a result, the number of light sources whose light is passed through the diaphragm, advantageously obtained. The light output of the projector is therefore not reduced by the above adjustments, even at a high depth of field.
  • Preferably, the projector comprises at least ten light sources and microlenses.
  • An advantage of the large number of larger equal to ten light sources and microlenses is that the Light output of the projector can be further increased. The overall set of the projector advantageously increases only slightly due to the use of lasers as a light source, so that the total amount of the projector does not or only slightly affects the depth of field of the projector through the use of a large number of light sources and microlenses.
  • Another advantage of using a plurality of light sources is that speckles resulting from a coherent superposition of light reflected at the surface of the object are suppressed. This is because the individual light sources (lasers) do not have a fixed phase relationship with each other and consequently incoherent superposition of the light of the lasers occurs. This reduces measurement uncertainties in depth determination. For a number of N lasers, the intensity of speckle is reduced by a factor of N -1/2 . In other words, the use of a high number of light sources, that is a number of at least ten light sources, improves the light output of the projector and reduces the measurement uncertainties.
  • According to an advantageous embodiment of the invention, the plurality of light sources is formed by means of a laser bar.
  • In other words, the light sources form a laser array. In this case, a one-dimensional or two-dimensional laser array can be provided. Laser bars are particularly advantageous in the infrared spectral range.
  • Advantageously, laser bars have a high power density and at the same time a large number of lasers, so that increases the power of the projector. In addition, the measurement uncertainties in depth determination are advantageously further reduced. In particular, a plurality of laser bars may be provided. By using laser bars, powers greater than or equal to 1500 W are made possible by means of continuous wave lasers.
  • In an advantageous embodiment of the invention, the projector comprises at least three light sources, one of the three light sources having a wavelength in the optically red, one of the three light sources having a wavelength in the optically green and one of the three light sources having a wavelength in the optically blue spectral range.
  • As a result, white light can be generated by the three light sources. Advantageously, a projector for a color-coded triangulation is made possible by the colored light sources. Each microlens thus has one of the primary colors red, green or blue (RGB). For additive mixing of the respective color of the light, targeted control of the three light sources can take place. In other words, a mixed color is caused by additive color mixing of the primary colors red, green and blue.
  • In this case, in turn, each colored light source is assigned a microlens of the microlens array. After passing through the microlens array, the light of the colored light sources is mixed additively in the region of an image plane to be projected by means of the projector. Here, the arrangement of a projection element is provided in the image plane to be projected.
  • According to an advantageous embodiment of the invention, the optical coupling of a light source with the microlens associated with the light source by means of an optical waveguide.
  • Particularly preferred here is an optical waveguide which is designed as a monomode optical waveguide, that is to say an optical waveguide which essentially only guides one mode, typically the fundamental mode. Due to the advantageous embodiment of the coupling between the light source and the microlens associated with the light source by means of an optical waveguide, the geometric arrangement of the light sources of the geometric configuration of the microlens array and / or the microlenses can be decoupled. As a result, a packing density can be provided for the microlenses, which is increased in comparison with a packing density of the light sources. As a result, it is ensured, for example, that the light sources, that is to say the lasers, can experience sufficient cooling. In addition, the number of light sources can be further increased and is almost arbitrary. Furthermore, space is saved by the use of optical waveguide and the distance between the microlens array and the condenser can be selected as small as possible.
  • In an advantageous development of the invention, the projector comprises a projection element, wherein the projection element has at least one slide.
  • In other words, the pattern provided for the depth determination is generated by the slide. Furthermore, the structuring or shaping of the light can also take place by means of a spatial modulator (English: Spatial Light Modulator, abbreviated to SLM). Other optical components may be provided for the projector.
  • If a phase triangulation is used as the method for depth determination, the phase position can be adjusted by means of a displacement of the slide. Other possibilities for adjusting the phase position are digital Digital Light Processor (DLP), a digital micromirror device (DMD) and / or other projection methods by means of a liquid crystal display (LCD) and or liquid crystals on a silicon substrate (liquid-crystal-on-silicon, LCoS for short).
  • It may also be advantageous to use a rotating disk that generates a sinusoidal pattern for depth determination.
  • According to a particularly preferred embodiment, the light sources, the microlens array and the projection element are arranged such that the projection element is almost completely illuminated by at least part of the light of each light source.
  • In other words, the projection element, for example the slide, is completely captured and illuminated by each light source. In this case, the light of the light source first passes through the microlens associated with the light source, then strikes the condenser and is finally guided onto the projection element such that an approximately complete illumination or illumination of the projection element takes place. This is advantageous because the light output of the projector is increased by the multiple illumination of the projection element. In addition, speckles are reduced by the incoherent superposition of the light emitted by the light sources. As a result, the measurement uncertainties in depth determination can be further reduced.
  • In an advantageous embodiment of the invention, a color-coded color pattern is projected as a pattern on the surface of the object.
  • Advantageously, the projection of a color-coded color pattern enables a color-coded triangulation of the at least one subregion of the surface of the project. In other words, the depth is determined by means of active, color-coded triangulation.
  • According to a further advantageous embodiment of the invention, a phase-modeled and monochromatic pattern is projected onto the subregion of the surface of the object.
  • In other words, the projector allows phase-encoded triangulation of the portion of the surface of the object. In this case, in particular, a rotating disk may be provided for modulating the light emanating from the projector.
  • Preferably, a spatial modulator for light is used to generate the pattern.
  • This allows an advantageous coding of the light emanating from the projector. In this case, a modulation of the intensity and / or phase of the light emanating from the projector can be provided.
  • Further advantages, features and details of the invention will become apparent from the embodiments described below and with reference to the drawings. Showing:
  • 1 a schematic representation of a projector having a plurality of lasers and a microlens array;
  • 2 a schematic representation of a projector having a plurality of lasers and a microlens array, wherein the light of the laser is guided by means of individual optical fibers to the microlens array; and
  • 3 a schematic representation of a projector with a plurality of lasers and a microlens array, wherein the projector comprises a DMD or LCoS.
  • Similar or equivalent elements may be provided with the same reference numerals in the figures.
  • 1 schematically shows a side view of a projector 1 holding a microlens array 4 with a plurality of microlenses 41 includes. In addition, the projector points 1 a plurality of light sources 2 on that as a laser 2 trained and as laser arrays 3 are arranged. Furthermore, the projector includes 1 a condenser 8th , Lenses 12 , a slide 10 and a panel 14 , The microlens array 4 , the lenses 12 , the slide 10 , the condenser 8th and the aperture 14 are around a common optical axis 100 of the projector 1 arranged.
  • A distance 101 of the condenser 8th and the laser array 3 here is at least 10 cm, in particular a distance 101 greater than or equal to 30 cm and less than or equal to 100 cm is provided. Through the between the laser array 3 and the condenser 8th increased distance 101 will be a high light output of the projector 1 even with a small diameter of the aperture 14 allows.
  • Every microlens 41 of the microlens array 4 is at least one of the lasers 2 assigned. Here, a plurality of successively arranged microlens arrays 4 be provided. In particular, three are different in color with respect to their color 2 a microlens 41 assigned. The different colors of the lasers 2 , for example, red, green and blue, are represented by hatching corresponding to the color.
  • That of one of the lasers 2 outgoing light 6 becomes the laser 2 associated microlens 41 of the microlens array 4 guided and by means of the microlens 41 on the condenser 8th displayed. Here are the microlens array 4 and the condenser 8th arranged such that the slide 10 through every single laser 2 is almost completely illuminated. The size of the slide 10 is in 1 indicated by arrows.
  • Furthermore, there is an incoherent superposition of the laser 2 outgoing light 6 at the place of the slide 10 , Due to the incoherent superposition speckle, which due to the reflection of the projector 1 Outgoing light at a portion of a surface of an object, reduced. The incoherent superposition of the individual lasers 2 is therefore because there is no fixed phase relationship between the individual lasers 2 consists.
  • After the slide 10 the light becomes the laser 2 which now by means of the slide 10 spatially and / or color-coded or coded to another lens 12 guided. Between two lenses 12 and within the aperture 14 this results in an intermediate image 20 of the slide 10 , which intermediate picture 20 is projected onto the surface of the object. In other words, a slide becomes the slide 10 corresponding pattern projected onto the surface of the object. The size of the projected pattern is indicated by an in 1 illustrated double arrow 21 indicated. Here, the projected pattern corresponds to an enlarged image of the slide 10 ,
  • The number of lasers 2 can be bigger equal 100 , in particular greater than or equal to 144. With a number of 144 lasers 2 is a distance 101 of 40 cm between the laser array 3 and the condenser 8th intended. An acceptance angle of the slide 10 in this case is about 8 °.
  • 2 shows a schematic section of a projector 1 with a plurality of lasers 2 and a microlens array 4 where the light is the laser 2 by optical fiber 24 to the microlens array 4 to be led. This is every laser 2 or each optical fiber 24 a microlens 41 of the microlens array 4 assigned.
  • The light of a laser 2 gets from one with the laser 2 optically coupled fiber optic cable 24 and added to the laser 2 associated microlens 42 of the microlens array 4 guided. In this case, in particular, a monomode optical waveguide 24 advantageous. Starting from the microlens array 4 the light will turn on a condenser 8th by means of the microlens array 4 displayed.
  • Advantageously, by guiding or guiding the light of the laser 2 to the microlens array 4 a packing density of the lasers 2 from a packing density of the microlenses 41 within the microlens array 4 be decoupled. This can advantageously the microlenses 41 within the microlens array 4 denser than the lasers 2 within the laser array 3 to be ordered. This is advantageous because the densest possible arrangement of the laser 2 possibly sufficient cooling of the individual lasers 2 prevented.
  • In 3 is a schematic representation of a projector 1 shown a DMD 16 (English Digital Micromirror Device) or an LCoS 16 (Liquid-Crystal-on-Semiconductor). In other words, the projector forms 1 a DMD or LCoS projector. Furthermore, the projector points 1 - As in the previous figures - a plurality of lasers 2 and a microlens array 4 with a plurality of microlenses 41 on. Every laser 2 is at least a microlens 41 of the microlens array 4 assigned. Furthermore, the projector includes 1 a condenser 8th , a panel 14 and a plurality of lenses 12 ,
  • At the in 3 displayed DMD or LCoS projector 1 becomes the light 6 the laser 2 after passing through the microlens array 4 and the condenser 8th at the DMD 16 or LCoS 16 reflected and to the other lenses 12 or to the aperture 14 of the projector 1 guided. Through the DMD 16 or LCoS 16 an adjustment of the spatial phase position of the light takes place 6 , so that a depth determination of a surface of an object by means of a phase triangulation is made possible. Becomes a DMD 16 used, the said reflection and spatial structuring of the light takes place 6 using micromirrors of the micromirror system (DMD).
  • The projector 1 In general, for imaging or projection of the pattern, further optical components, for example lenses, mirrors, gratings, beam splitters and / or prisms and / or entire optical devices, for example lenses, may comprise. In addition, a camera, in particular a three-chip camera, can be provided for receiving an image of the projected pattern which is reflected by the surface of the object. By a computer-aided evaluation of the image taken by means of the camera, the depth determinations can be made.
  • By the projector according to the invention a high-performance projection of the pattern is made possible with a small Gesamtetendue the projector. As a result, the projector can be used for the depth determination of large objects whose subarea of the surface is, for example, greater than or equal to 25 m 2 . In addition, almost all of the light generated by the light sources of the projector is usable for the projection. This is particularly advantageous with a high depth of field, as even with a small diameter of the aperture of the projector is still sufficient light for depth determination available. The projector according to the invention thus enables a high depth of field with a high light output.
  • Although the invention has been further illustrated and described in detail by the preferred embodiments, the invention is not limited by the disclosed examples, or other variations can be derived therefrom by those skilled in the art without departing from the scope of the invention.

Claims (12)

  1. Projector ( 1 ) for projecting a pattern onto at least a portion of a surface of an object, comprising a plurality of light sources ( 2 ) and a microlens array ( 4 ), wherein the microlens array ( 4 ) a plurality of microlenses ( 41 ) and in each case at least one of the light sources ( 4 ) one of the microlenses ( 41 ) is associated with and optically coupled to this, that at least a part of the light ( 6 ) of the microlens ( 41 ) associated light source ( 4 ) the microlens ( 41 ), whereby the light sources ( 2 ) Laser ( 2 ) are.
  2. Projector ( 1 ) according to claim 1, with a condenser ( 8th ), whereby the spatial distance ( 101 ) of the light sources ( 2 ) and the condenser ( 8th ) relative to an optical axis ( 100 ) of the projector ( 1 at least 5 cm is.
  3. Projector ( 1 ) according to claim 1 or 2, with at least ten light sources ( 2 ) and microlenses ( 41 ).
  4. Projector ( 1 ) according to one of the preceding claims, comprising a laser bar, wherein the plurality of light sources ( 2 ) is formed by means of the laser bar.
  5. Projector ( 1 ) according to one of the preceding claims, with at least three light sources ( 2 ), one of the three light sources ( 2 ) one wavelength in the optically red, one of the three light sources ( 2 ) one wavelength in the optically green and one of the three light sources ( 2 ) has a wavelength in the optically blue spectral range.
  6. Projector ( 1 ) according to one of the preceding claims, characterized in that the optical coupling of a light source ( 2 ) with the light source ( 2 ) associated microlens ( 41 ) by means of an optical waveguide ( 24 ) he follows.
  7. Projector ( 1 ) according to one of the preceding claims, with a projection element ( 10 ), wherein the projection element ( 10 ) at least one slide ( 10 ).
  8. Projector ( 1 ) according to claim 7, characterized in that the light sources ( 2 ), the microlens array ( 4 ) and the projection element ( 10 ) are arranged such that the projection element ( 10 ) almost completely by at least a portion of the light ( 6 ) of each light source ( 2 ) is illuminated.
  9. Method for depth determination of a partial area of a surface of an object, in which a pattern is applied to the partial area by means of a projector ( 1 ) according to one of the preceding claims, in which an image of a pattern reflected by the partial region is detected by means of a detection device, and in which a depth determination of the at least one partial region takes place by means of the projected pattern and the image.
  10. A method according to claim 9, wherein a color-coded color pattern is patterned onto the at least one portion.
  11. The method of claim 9, wherein a phase modulated monochromatic pattern is projected onto the at least one portion.
  12. A method according to claim 11, wherein a spatial modulator for light is used to generate the pattern.
DE102014216390.0A 2014-08-19 2014-08-19 projector Withdrawn DE102014216390A1 (en)

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DE102014216390.0A DE102014216390A1 (en) 2014-08-19 2014-08-19 projector
PCT/EP2015/068449 WO2016026733A1 (en) 2014-08-19 2015-08-11 Projector

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Citations (7)

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US20020110320A1 (en) * 2001-02-12 2002-08-15 Silicon Light Machines Illumination system for one-dimensional spatial light modulators employing multiple light sources
US20020196414A1 (en) * 2000-07-10 2002-12-26 Manni Jeffrey Glenn Systems and methods for speckle reduction through bandwidth enhancement
US20080055556A1 (en) * 2006-09-04 2008-03-06 Seiko Epson Corporation Image display device
EP2280239A1 (en) * 2009-07-27 2011-02-02 Sick Ag Illumination device for lighting a monitored area
WO2011160962A1 (en) * 2010-06-21 2011-12-29 Leica Geosystems Ag Optical measurement method and measurement system for determining 3d coordinates on a measurement object surface
US20130250255A1 (en) * 2012-03-21 2013-09-26 Casio Computer Co., Ltd. Light source device and projector
DE102012206472A1 (en) * 2012-04-19 2013-10-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Projection system with static pattern elements and multiple optical channels for optical 3d measurement

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112009001652T5 (en) * 2008-07-08 2012-01-12 Chiaro Technologies, Inc. Multichannel recording
EP2772676B1 (en) * 2011-05-18 2015-07-08 Sick Ag 3D camera and method for three dimensional surveillance of a surveillance area
CN104471348A (en) * 2012-03-26 2015-03-25 曼蒂斯影像有限公司 Three dimensional camera and projector for same

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020196414A1 (en) * 2000-07-10 2002-12-26 Manni Jeffrey Glenn Systems and methods for speckle reduction through bandwidth enhancement
US20020110320A1 (en) * 2001-02-12 2002-08-15 Silicon Light Machines Illumination system for one-dimensional spatial light modulators employing multiple light sources
US20080055556A1 (en) * 2006-09-04 2008-03-06 Seiko Epson Corporation Image display device
EP2280239A1 (en) * 2009-07-27 2011-02-02 Sick Ag Illumination device for lighting a monitored area
WO2011160962A1 (en) * 2010-06-21 2011-12-29 Leica Geosystems Ag Optical measurement method and measurement system for determining 3d coordinates on a measurement object surface
US20130250255A1 (en) * 2012-03-21 2013-09-26 Casio Computer Co., Ltd. Light source device and projector
DE102012206472A1 (en) * 2012-04-19 2013-10-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Projection system with static pattern elements and multiple optical channels for optical 3d measurement

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