DE102011079342B3 - Method for controlling a laser diode in a spectrometer - Google Patents
Method for controlling a laser diode in a spectrometer Download PDFInfo
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- DE102011079342B3 DE102011079342B3 DE201110079342 DE102011079342A DE102011079342B3 DE 102011079342 B3 DE102011079342 B3 DE 102011079342B3 DE 201110079342 DE201110079342 DE 201110079342 DE 102011079342 A DE102011079342 A DE 102011079342A DE 102011079342 B3 DE102011079342 B3 DE 102011079342B3
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- laser diode
- injection current
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- 238000000034 method Methods 0.000 title claims abstract description 18
- 238000002347 injection Methods 0.000 claims abstract description 37
- 239000007924 injection Substances 0.000 claims abstract description 37
- 230000000737 periodic effect Effects 0.000 claims abstract 2
- 238000010521 absorption reaction Methods 0.000 claims description 14
- 238000005259 measurement Methods 0.000 claims description 10
- 230000001419 dependent effect Effects 0.000 claims description 5
- 230000004913 activation Effects 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000004868 gas analysis Methods 0.000 description 1
- 238000012886 linear function Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J3/433—Modulation spectrometry; Derivative spectrometry
- G01J3/4338—Frequency modulated spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/06804—Stabilisation of laser output parameters by monitoring an external parameter, e.g. temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/0687—Stabilising the frequency of the laser
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Verfahren zur periodischen Ansteuerung einer Laserdiode in einem Spektrometer mit einem Injektionsstrom (i), wobei zur Verbesserung der Wellenlängenstabilität der Laserdiode – in mindestens einem Abschnitt (T1) jeder Periode der Injektionsstrom (i) entsprechend einer vorgegebenen und von einerktion (f11) variiert wird, und – in jeder Periode unmittelbar nach dem Abschnitt (T1) mit der veränderbaren Strom-Zeit-Funktion (f11) ein weiterer Abschnitt (T3) eingefügt wird, in dem eine aus einer Veränderung der Strom-Zeit-Funktion resultierende Änderung der der Laserdiode zugeführten Strommenge kompensiert wird.Method for the periodic control of a laser diode in a spectrometer with an injection current (i), wherein in order to improve the wavelength stability of the laser diode - in at least one section (T1) of each period, the injection current (i) is varied according to a predetermined and by a section (f11), and - in each period immediately after the section (T1) with the variable current-time function (f11) a further section (T3) is inserted, in which a change in the amount of current supplied to the laser diode resulting from a change in the current-time function is compensated becomes.
Description
Laser-Spektrometer werden insbesondere für die optische Gasanalyse in der Prozessmesstechnik eingesetzt. Dabei erzeugt eine Laserdiode Licht im Infrarotbereich, das durch das zu messende Prozessgas geführt und anschließend detektiert wird. Die Wellenlänge des Lichts wird auf eine spezifische Absorptionslinie der jeweils zu messenden Gaskomponente des Prozessgases abgestimmt, wobei die Laserdiode die Absorptionslinie periodisch abtastet. Aus der detektierten Absorption in der Mitte der Absorptionslinie kann die Konzentration der interessierenden Gaskomponente bestimmt werden. Diese Messung kann durch weitere Messungen an einem Referenz- oder Nullgas referenziert bzw. normalisiert werden.Laser spectrometers are used in particular for optical gas analysis in process measurement technology. In this case, a laser diode generates light in the infrared range, which is guided through the process gas to be measured and then detected. The wavelength of the light is tuned to a specific absorption line of the respective gas component of the process gas to be measured, wherein the laser diode periodically scans the absorption line. From the detected absorption in the middle of the absorption line, the concentration of the gas component of interest can be determined. This measurement can be referenced or normalized by further measurements on a reference or zero gas.
Die Intensität und Wellenlänge des erzeugten Lichts sind nichtlineare Funktionen des Injektionsstromes und der Betriebstemperatur der Laserdiode. Für unterschiedliche Messungen wird der Injektionsstrom entsprechend unterschiedlicher Strom-Zeit-Funktionen verändert. Bei der Abtastung von Absorptionslinien interessierender Gaskomponenten oder eines Referenzgases können rampen- oder dreieckförmige Strom-Zeit-Funktionen und für eine Nullmessung Strom-Zeit-Funktionen in Form von Bursts verwendet werden (
Aus der
Der Erfindung liegt daher die Aufgabe zugrunde, die Wellenlängenstabilität einer Laserdiode in einem Spektrometer zu verbessern.The invention is therefore based on the object to improve the wavelength stability of a laser diode in a spectrometer.
Gemäß der Erfindung wird die Aufgabe durch das in Anspruch 1 angegebene Verfahren gelöst, von dem vorteilhafte Weiterbildungen in den Unteransprüchen angegeben sind.According to the invention the object is achieved by the method specified in claim 1, are indicated by the advantageous developments in the dependent claims.
Gegenstand der Erfindung ist somit ein Verfahren zur periodischen Ansteuerung einer Laserdiode in einem Spektrometer mit einem Injektionsstrom, wobei
- – in mindestens einem Abschnitt jeder Periode der Injektionsstrom entsprechend einer vorgegebenen und von einer zur nächsten Periode veränderbaren Strom-Zeit-Funktion variiert wird, und
- – in jeder Periode unmittelbar nach dem Abschnitt mit der veränderbaren Strom-Zeit-Funktion ein weiterer Abschnitt eingefügt wird, in dem eine aus einer Veränderung der Strom-Zeit-Funktion resultierende Änderung der der Laserdiode zugeführten Strommenge kompensiert wird.
- - In at least a portion of each period, the injection current is varied according to a predetermined and from the next period variable current-time function, and
- - In each period immediately after the section with the variable current-time function, a further section is inserted, in which a resulting from a change in the current-time function change in the laser diode supplied amount of current is compensated.
Wird beispielsweise die Strom-Zeit-Funktion in einem Abschnitt der Ansteuerungsperiode so geändert, dass die der Laserdiode in diesem Abschnitt zugeführte Strommenge größer ist, als in demselben Abschnitt der vorangegangenen Periode, so ändert sich der Anfangszustand der Laserdiode zu Beginn der nächsten Ansteuerungsabschnitts. So ist z. B. die Temperatur der Laserdiode
Die Erfindung ermöglicht nach jedem Abschnitt einer Ansteuerungsperiode mit einer veränderbaren Strom-Zeit-Funktion eine Kompensation der aus einer Veränderung der Strom-Zeit-Funktion resultierenden Änderung der der Laserdiode zugeführten Strommenge, so dass der der Anfangszustand der Laserdiode zu Beginn des nächsten Ansteuerungsabschnitts weitgehend unverändert leibt. Dieser nächste Ansteuerungsabschnitt kann innerhalb der jeweils aktuellen Ansteuerungsperiode oder in der nächsten Periode liegen. Dabei enthält jede Periode mindestens einen der folgenden Abschnitte:
- – ein Abschnitt zur wellenlängenabhängigen Abtastung einer Absorptionslinie einer zu messenden Gaskomponente eines Messgases,
- – ein Abschnitt zur wellenlängenabhängigen Abtastung einer Absorptionslinie eines Referenzgases,
- – ein Abschnitt zur Nullgasmessung.
- A section for the wavelength-dependent scanning of an absorption line of a gas component of a measuring gas to be measured,
- A section for the wavelength-dependent scanning of an absorption line of a reference gas,
- - a section for zero gas measurement.
Im Weiteren wird die Erfindung unter Bezugnahme auf die Figuren der Zeichnung anhand von Ausführungsbeispielen erläutert; im Einzelnen zeigenFurthermore, the invention will be explained with reference to the figures of the drawing with reference to embodiments; show in detail
Obwohl in beiden aufeinander folgenden Ansteuerungsperioden die zweite Strom-Zeit-Funktion f2 dieselbe ist, sind die Anfangszustände der Laserdiode
Wie
Im Falle des in den
Bei dem in den
Bei dem in den
Bei den gezeigten Ausführungsbeispielen nach den
Das erfindungsgemäße Verfahren ist für Spektrometer in allen Bandbreiten (UV, VIS, IR) geeignet.The method according to the invention is suitable for spectrometers in all bandwidths (UV, VIS, IR).
Claims (7)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE201110079342 DE102011079342B3 (en) | 2011-07-18 | 2011-07-18 | Method for controlling a laser diode in a spectrometer |
PCT/EP2012/063781 WO2013010938A1 (en) | 2011-07-18 | 2012-07-13 | Method for driving a laser diode in a spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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DE201110079342 DE102011079342B3 (en) | 2011-07-18 | 2011-07-18 | Method for controlling a laser diode in a spectrometer |
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DE102011079342B3 true DE102011079342B3 (en) | 2012-12-06 |
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DE201110079342 Expired - Fee Related DE102011079342B3 (en) | 2011-07-18 | 2011-07-18 | Method for controlling a laser diode in a spectrometer |
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DE (1) | DE102011079342B3 (en) |
WO (1) | WO2013010938A1 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102013201459A1 (en) | 2013-01-30 | 2014-07-31 | Siemens Aktiengesellschaft | Method for measuring concentration of gas component in measurement gas, involves detecting intensity light of laser diode after irradiating gas, where current intensity of burst signal corresponds to current value of current-time function |
DE102013202289A1 (en) | 2013-02-13 | 2014-08-28 | Siemens Aktiengesellschaft | Method and arrangement for driving a wavelength-tunable laser diode in a spectrometer |
DE102013213458A1 (en) * | 2013-07-09 | 2015-01-15 | Siemens Aktiengesellschaft | Method for measuring the concentration of a gas component in a sample gas |
AT519690A1 (en) * | 2017-02-21 | 2018-09-15 | Acm Gmbh | Method and device for determining the concentration of a predetermined gas |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5642371A (en) * | 1993-03-12 | 1997-06-24 | Kabushiki Kaisha Toshiba | Optical transmission apparatus |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5331409A (en) * | 1992-06-12 | 1994-07-19 | George Thurtell | Tunable diode laser gas analyzer |
EP2072979B1 (en) | 2007-12-21 | 2012-02-29 | Siemens Aktiengesellschaft | Method for measuring the concentration of a gas component in a measuring gas |
-
2011
- 2011-07-18 DE DE201110079342 patent/DE102011079342B3/en not_active Expired - Fee Related
-
2012
- 2012-07-13 WO PCT/EP2012/063781 patent/WO2013010938A1/en active Application Filing
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5642371A (en) * | 1993-03-12 | 1997-06-24 | Kabushiki Kaisha Toshiba | Optical transmission apparatus |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102013201459A1 (en) | 2013-01-30 | 2014-07-31 | Siemens Aktiengesellschaft | Method for measuring concentration of gas component in measurement gas, involves detecting intensity light of laser diode after irradiating gas, where current intensity of burst signal corresponds to current value of current-time function |
DE102013201459B4 (en) * | 2013-01-30 | 2017-01-05 | Siemens Aktiengesellschaft | Method for measuring the concentration of a gas component in a sample gas |
DE102013202289A1 (en) | 2013-02-13 | 2014-08-28 | Siemens Aktiengesellschaft | Method and arrangement for driving a wavelength-tunable laser diode in a spectrometer |
US9640945B2 (en) | 2013-02-13 | 2017-05-02 | Siemens Aktiengesellschaft | Method and arrangement for actuating a wavelength-tunable laser diode in a spectrometer |
DE102013213458A1 (en) * | 2013-07-09 | 2015-01-15 | Siemens Aktiengesellschaft | Method for measuring the concentration of a gas component in a sample gas |
DE102013213458B4 (en) * | 2013-07-09 | 2015-07-09 | Siemens Aktiengesellschaft | Method for measuring the concentration of a gas component in a sample gas |
AT519690A1 (en) * | 2017-02-21 | 2018-09-15 | Acm Gmbh | Method and device for determining the concentration of a predetermined gas |
AT519690B1 (en) * | 2017-02-21 | 2018-12-15 | Acm Automatisierung Computertechnik Mess Und Regeltechnik Gmbh | Method and device for determining the concentration of a predetermined gas |
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WO2013010938A1 (en) | 2013-01-24 |
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