DE102009028600A8 - Positionierung eines Trägerelements - Google Patents
Positionierung eines Trägerelements Download PDFInfo
- Publication number
- DE102009028600A8 DE102009028600A8 DE200910028600 DE102009028600A DE102009028600A8 DE 102009028600 A8 DE102009028600 A8 DE 102009028600A8 DE 200910028600 DE200910028600 DE 200910028600 DE 102009028600 A DE102009028600 A DE 102009028600A DE 102009028600 A8 DE102009028600 A8 DE 102009028600A8
- Authority
- DE
- Germany
- Prior art keywords
- positioning
- carrier element
- carrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details
- H01J37/265—Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/202—Movement
- H01J2237/20278—Motorised movement
- H01J2237/20285—Motorised movement computer-controlled
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102009028600A DE102009028600A1 (de) | 2009-08-17 | 2009-08-17 | Positionierung eines Trägerelements |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102009028600A DE102009028600A1 (de) | 2009-08-17 | 2009-08-17 | Positionierung eines Trägerelements |
Publications (2)
Publication Number | Publication Date |
---|---|
DE102009028600A1 DE102009028600A1 (de) | 2011-03-03 |
DE102009028600A8 true DE102009028600A8 (de) | 2011-06-01 |
Family
ID=43524740
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102009028600A Ceased DE102009028600A1 (de) | 2009-08-17 | 2009-08-17 | Positionierung eines Trägerelements |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE102009028600A1 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102012205317B4 (de) | 2012-03-30 | 2018-06-28 | Carl Zeiss Microscopy Gmbh | Verfahren zur Einstellung einer Position eines Trägerelements in einem Teilchenstrahlgerät, Computerprogrammprodukt sowie Teilchenstrahlgerät |
US9558911B2 (en) | 2014-08-01 | 2017-01-31 | Carl Zeiss Microscopy Gmbh | Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3555254A (en) * | 1967-04-17 | 1971-01-12 | Gerber Scientific Instr Co | Error correcting system and method for use with plotters, machine tools and the like |
EP0353585A2 (de) * | 1988-08-04 | 1990-02-07 | Siemens Aktiengesellschaft | Verfahren zur Bahn- und Positionskorrektur eines Werkzeugs eines Roboters |
US6864488B2 (en) * | 1998-10-23 | 2005-03-08 | Canon Kabushiki Kaisha | Charged particle beam exposure method and apparatus |
US20050211929A1 (en) * | 2004-03-29 | 2005-09-29 | Masaki Kurokawa | Charged particle beam photolithography machine, standard substrate for correcting misalignment factor of charged particle beam photolithography machine, correcting method for charged particle beam photolithography machine, and method of manufacturing electronic device |
US20090039285A1 (en) * | 2007-06-13 | 2009-02-12 | Patrick Cooper | Method and device for controlling and monitoring a position of a holding element |
-
2009
- 2009-08-17 DE DE102009028600A patent/DE102009028600A1/de not_active Ceased
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3555254A (en) * | 1967-04-17 | 1971-01-12 | Gerber Scientific Instr Co | Error correcting system and method for use with plotters, machine tools and the like |
EP0353585A2 (de) * | 1988-08-04 | 1990-02-07 | Siemens Aktiengesellschaft | Verfahren zur Bahn- und Positionskorrektur eines Werkzeugs eines Roboters |
US6864488B2 (en) * | 1998-10-23 | 2005-03-08 | Canon Kabushiki Kaisha | Charged particle beam exposure method and apparatus |
US20050211929A1 (en) * | 2004-03-29 | 2005-09-29 | Masaki Kurokawa | Charged particle beam photolithography machine, standard substrate for correcting misalignment factor of charged particle beam photolithography machine, correcting method for charged particle beam photolithography machine, and method of manufacturing electronic device |
US20090039285A1 (en) * | 2007-06-13 | 2009-02-12 | Patrick Cooper | Method and device for controlling and monitoring a position of a holding element |
Also Published As
Publication number | Publication date |
---|---|
DE102009028600A1 (de) | 2011-03-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8196 | Reprint of faulty title page (publication) german patentblatt: part 1a6 | ||
OP8 | Request for examination as to paragraph 44 patent law | ||
R016 | Response to examination communication | ||
R016 | Response to examination communication | ||
R016 | Response to examination communication | ||
R002 | Refusal decision in examination/registration proceedings | ||
R003 | Refusal decision now final |
Effective date: 20111201 |