DE102009020059A8 - Measuring device and measuring method for determining a switching time - Google Patents

Measuring device and measuring method for determining a switching time Download PDF

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Publication number
DE102009020059A8
DE102009020059A8 DE102009020059A DE102009020059A DE102009020059A8 DE 102009020059 A8 DE102009020059 A8 DE 102009020059A8 DE 102009020059 A DE102009020059 A DE 102009020059A DE 102009020059 A DE102009020059 A DE 102009020059A DE 102009020059 A8 DE102009020059 A8 DE 102009020059A8
Authority
DE
Germany
Prior art keywords
determining
switching time
measuring
measuring device
measuring method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE102009020059A
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German (de)
Other versions
DE102009020059B4 (en
DE102009020059A1 (en
Inventor
Stefan Dr. Franz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohde and Schwarz GmbH and Co KG
Original Assignee
Rohde and Schwarz GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohde and Schwarz GmbH and Co KG filed Critical Rohde and Schwarz GmbH and Co KG
Priority to DE102009020059.2A priority Critical patent/DE102009020059B4/en
Publication of DE102009020059A1 publication Critical patent/DE102009020059A1/en
Publication of DE102009020059A8 publication Critical patent/DE102009020059A8/en
Application granted granted Critical
Publication of DE102009020059B4 publication Critical patent/DE102009020059B4/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • G01R13/02Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218Circuits therefor
    • GPHYSICS
    • G04HOROLOGY
    • G04FTIME-INTERVAL MEASURING
    • G04F10/00Apparatus for measuring unknown time intervals by electric means
DE102009020059.2A 2009-05-06 2009-05-06 Measuring device and measuring method for determining a switching time Active DE102009020059B4 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE102009020059.2A DE102009020059B4 (en) 2009-05-06 2009-05-06 Measuring device and measuring method for determining a switching time

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102009020059.2A DE102009020059B4 (en) 2009-05-06 2009-05-06 Measuring device and measuring method for determining a switching time

Publications (3)

Publication Number Publication Date
DE102009020059A1 DE102009020059A1 (en) 2010-11-18
DE102009020059A8 true DE102009020059A8 (en) 2011-03-10
DE102009020059B4 DE102009020059B4 (en) 2018-08-02

Family

ID=42978986

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102009020059.2A Active DE102009020059B4 (en) 2009-05-06 2009-05-06 Measuring device and measuring method for determining a switching time

Country Status (1)

Country Link
DE (1) DE102009020059B4 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0278637A2 (en) * 1987-01-29 1988-08-17 Tektronix, Inc. Automatic peak-to-peak amplitude measurement system
US6349267B1 (en) * 1998-09-11 2002-02-19 Agere Systems Inc. Rise and fall time measurement circuit
US6418386B1 (en) * 1999-12-06 2002-07-09 Koninklijke Philips Electronics N.V. High and low voltage measurement in waveform analysis
US20090076751A1 (en) * 2007-09-17 2009-03-19 Hon Hai Precision Industry Co., Ltd. Systems and methods for measuring signal waveforms

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2295236B (en) 1994-10-21 1999-07-28 Allied Signal Inc Method for measuring pulse characteristics of a pulsed RF signal

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0278637A2 (en) * 1987-01-29 1988-08-17 Tektronix, Inc. Automatic peak-to-peak amplitude measurement system
US6349267B1 (en) * 1998-09-11 2002-02-19 Agere Systems Inc. Rise and fall time measurement circuit
US6418386B1 (en) * 1999-12-06 2002-07-09 Koninklijke Philips Electronics N.V. High and low voltage measurement in waveform analysis
US20090076751A1 (en) * 2007-09-17 2009-03-19 Hon Hai Precision Industry Co., Ltd. Systems and methods for measuring signal waveforms

Also Published As

Publication number Publication date
DE102009020059B4 (en) 2018-08-02
DE102009020059A1 (en) 2010-11-18

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