DE102005037160A1 - Geometrical precision part e.g. optical ferrule, touching method, involves touching precision part with tactile structure, and optically measuring movement of body caused by measuring force at one position of body using interferometer - Google Patents
Geometrical precision part e.g. optical ferrule, touching method, involves touching precision part with tactile structure, and optically measuring movement of body caused by measuring force at one position of body using interferometer Download PDFInfo
- Publication number
- DE102005037160A1 DE102005037160A1 DE200510037160 DE102005037160A DE102005037160A1 DE 102005037160 A1 DE102005037160 A1 DE 102005037160A1 DE 200510037160 DE200510037160 DE 200510037160 DE 102005037160 A DE102005037160 A DE 102005037160A DE 102005037160 A1 DE102005037160 A1 DE 102005037160A1
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- DE
- Germany
- Prior art keywords
- interferometer
- spring
- stylus
- reflective
- movement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
- G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
- G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
- G01B5/012—Contact-making feeler heads therefor
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
Description
Die Erfindung betrifft ein Verfahren und eine Vorrichtung zur taktilen Antastung, insbesondere zur Antastung von geometrischen Präzisionsteilen.The The invention relates to a method and a device for tactile Probing, in particular for probing geometrical precision parts.
Die Erfindung ist besonders geeignet zur Antastung von geometrischen Präzisionsteilen, wie optischen Ferrulen, mechanischen Präzisionsteilen, Düsen, Mikropumpen und dergleichen, insbesondere für Anwendungen mit einstellbarer und konstanter Messkraft in Verbindung mit 3D-Präzisionskoordinatenmessmaschinen.The Invention is particularly suitable for probing geometric Precision parts, such as optical ferrules, precision mechanical parts, nozzles, micropumps and the like, in particular for Applications with adjustable and constant measuring force in connection with 3D precision coordinate measuring machines.
Im Stand der Technik sind verschiedene Anordnungen zur taktilen Antastung von geometrischen Teilen bekannt.in the State of the art are various arrangements for tactile probing known by geometric parts.
In den Druckschriften „Annals of the CIRP Vol. 50/1/2001, S. 361–364 und WO 98/57121 sind Anordnungen zur Abtastung in einem Koordinatenmessgerät beschrieben, bei denen am Ende einer Lichtleitfaser ein kugelförmiges Tastelement angebracht ist, das durch die Faser beleuchtet wird. Die leuchtende Kugel wird auf CCD-Sensoren abgebildet. Damit kann der Kontakt des Tastelementes mit der Werkstoffoberfläche registriert werden. Nachteilig ist, dass die Messkräfte sehr klein und nicht einstellbar sind, so dass der Sensor am Objekt kleben kann. Außerdem sind Antastunsicherheiten im Nanometerbereich nicht möglich. Ferner ist eine Rückführung auf nationale Normale, was für metrologische Präzisionsmessungen erforderlich ist, nicht möglich.In the pamphlets "Annals of the CIRP Vol. 50/1/2001, pp. 361-364 and WO 98/57121 are arrangements described for scanning in a coordinate measuring machine, in which at End of an optical fiber mounted a spherical probe element is that is illuminated by the fiber. The glowing ball will mapped to CCD sensors. This can be the contact of the probe element with the material surface be registered. The disadvantage is that the measuring forces are very high small and not adjustable, so that the sensor stick to the object can. Furthermore Anticipatory uncertainties in the nanometer range are not possible. Further is a return on national standards, what for Metrological precision measurements is required, not possible.
In tm 5/2003, S. 238–243 wird ein piezoresistiver Mikrotaster beschrieben bei dem piezoresistive Widerstände auf einer Siliziummembran zu Brücken zusammengeschaltet sind. Die Membran ist mit einem Taststift zur Antastung der Objekte verbunden. Auch bei dieser Lösung sind Reproduzierbarkeiten im Nanometerbereich nicht erreichbar, da die Piezowider stände die mechanischen Eigenschaften der Siliziummembran nachteilig beeinflussen. Ebenfalls erfolgt keine Rückführung auf nationale Normale.In tm 5/2003, pp. 238-243 a piezoresistive micro-probe is described in the piezoresistive resistors a silicon diaphragm interconnected to bridges are. The membrane is equipped with a stylus for probing the objects connected. Even with this solution reproducibility in the nanometer range is not achievable, there the Piezowider stood adversely affect the mechanical properties of the silicon membrane. Also no return occurs national standards.
Im Bulletin No. 1631 von Mitutoyo wird ein Tastsystem mit der Bezeichnung UMAP Vision System angeboten. Der Taster, der in einem piezoelektrischen Element gehaltert ist, vibriert mit Resonanzfrequenz. Bei Werkstückkontakt wird die Vibration gedämpft. Die Messkraft ist nicht einstellbar und nicht rückgeführt.in the Bulletin No. 1631 Mitutoyo is called a touch probe UMAP Vision System offered. The button, which is in a piezoelectric Element is held vibrates with resonant frequency. With workpiece contact the vibration is damped. The measuring force is not adjustable and not returned.
Der Erfindung liegt die Aufgabe zugrunde, ein Verfahren und eine Vorrichtung der eingangs genannten Art anzugeben, die eine Antastung mit hoher Präzision und einstellbarer Messkraft ermöglicht.Of the Invention is based on the object, a method and an apparatus specify the type mentioned, the probing with high precision and adjustable measuring force allows.
Erfindungsgemäß gelingt die Lösung der Aufgabe mit einem Verfahren, das die in Anspruch 1 angegebenen Merkmale aufweist und mit einer Vorrichtung, welche die in Anspruch 7 angegebenen Merkmale aufweist.According to the invention succeeds the solution the object with a method that specified in claim 1 Features and having a device which the in claim 7 features specified.
Vorteilhafte Ausgestaltungen sind in den Unteransprüchen angegeben.advantageous Embodiments are specified in the subclaims.
Die Erfindung zeichnet sich durch eine Reihe von Vorteilen aus.The Invention is characterized by a number of advantages.
Die Antastung von Präzisionsobjekten ist mit Unsicherheiten im Nanometerbereich möglich. Die Messung der kraftabhängigen Verlagerung einer Platte erfolgt mit Hilfe von Interferometern, welche Auflösungen von 0,1 nm und weniger gestatten. Damit ist diese Messung auf nationale Normale zurückgeführt und kann als Basis für höchste metrologische Präzision dienen. Die Auslenkung des Taststiftes ist kraftproportional und wird interferometrisch hochgenau gemessen und ausgewertet. Durch die unterschiedliche Auslenkung des Taststiftes ist die Messkraft präzise einstellbar.The Probing of precision objects is possible with uncertainties in the nanometer range. The measurement of the force-dependent displacement A plate is made with the help of interferometers, which resolutions of 0.1 nm and less. So this measurement is national Normal returned and can be used as the basis for highest metrological precision serve. The deflection of the stylus is force proportional and is measured interferometrically with high precision and evaluated. By the different deflection of the stylus is the measuring force precise adjustable.
Die eindeutige Ermittlung von drei Messkraftkomponenten Fx, Fy und Fz kann aus drei Interferometersignalen oder aus einem Interferometersignal und zusätzlicher Erfassung zweier Kippbewegungen mittels Autokollimator erfolgen. So genanntes Kriechen der federnden Elemente sowie des Taststiftes kann dadurch eliminiert werden, dass die Interferometeraus gangssignale ya, yb, yc nach einer definierten Zeit, vom Zeitpunkt der ersten Berührung der Tastkugel mit dem Messobjekt an, abgefragt werden.The unambiguous determination of three measuring force components F x , F y and F z can be effected from three interferometer signals or from an interferometer signal and additional detection of two tilting movements by means of an autocollimator. So-called creep of the resilient elements and the stylus can be eliminated, that the Interferometeraus output signals y a , y b , y c after a defined time, from the time of the first touch of the probe ball with the measurement object, queried.
Die Erfindung wird im Folgenden an Ausführungsbeispielen näher erläutert. In den zugehörigen Zeichnungen zeigen:The Invention will be explained in more detail below with reference to exemplary embodiments. In the accompanying drawings demonstrate:
Bei
der in
Dabei
sind ka, kb, kc, kx, ky Kalibrierfaktoren. Da
mit den Interferometern
Die
in
In
Wird
beispielsweise mit dem Tastelement
Eine
Ausführung
zur Messung von Kräften
F mit zwei Kraftkomponenten Fx und Fy ist in
Die
in
Bei
der in
Die
Ausführung
nach
Eine
weitere Ausführung
zur interferometrischen Messung räumlich gerichteter Antastkräfte F(Fx, Fy, Fz)
ist in
- 11
- Biegesteifer reflektierender Körper, Messwürfelbending Stiff reflective body, measuring dice
- 22
- Festpunktbenchmark
- 33
- Taststiftfeeler
- 44
- Tastelementscanning element
- 55
- Reflektierende Fläche (Interferometerplatte)reflective area (Interferometerplatte)
- 5.15.1
- reflektierende Fläche (Messwürfel (x))reflective area (Measurement cube (X))
- 5.25.2
- reflektierende Fläche (Messwürfel (y))reflective area (Measurement cube (Y))
- 5.35.3
- reflektierende Fläche (Messwürfel (z))reflective area (Measurement cube (Z))
- 66
- Interferometerinterferometer
- 6.16.1
- Interferometer (x)-Richtunginterferometer (X) direction
- 6.26.2
- Interferometer (y)-Richtunginterferometer (Y) direction
- 6.36.3
- Interferometer (z)-Richtunginterferometer (Z) direction
- 77
- Federgelenkspring joint
- 7.17.1
- Rotationssymmetrisches Federgelenkrotationally symmetric spring joint
- 7.27.2
- Federgelenkspring joint
- 7.37.3
- Federgelenkspring joint
- 7.47.4
- Federgelenkspring joint
- 7.57.5
- Federgelenkspring joint
- 7.67.6
- Federgelenkspring joint
- 88th
- Messobjektmeasurement object
- 99
- InterferometermessstrahlInterferometermessstrahl
- 1010
- Autokollimatorautocollimator
- 10.110.1
- Objektivlens
- 10.210.2
- Umlenkspiegeldeflecting
- 10.310.3
- Teilwürfelsubcube
- 10.410.4
- Lichtquellelight source
- 10.510.5
- PSDPSD
- 1111
- ParallelfederrührungParallelfederrührung
- 11.111.1
- Parallelfederrührung (x)-RichtungParallel spring stir (x) direction
- 11.211.2
- Parallelfederrührung (y)-RichtungParallel spring stir (y) direction
- 11.311.3
- Parallelfederrührung (z)-RichtungParallel spring stir (z) direction
- 1212
- Funktionskörperfunction body
- 1313
- Symmetrielinieline of symmetry
- 1414
- Kontaktplattecontact plate
- 1515
- Mittelstückcenterpiece
- 1616
- Stützesupport
- 1717
- Platteplate
- 1818
- Verbindungsstückjoint
- a, b, ca, b, c
- Interferometerstrahleninterferometer
- FF
- Messkraftmeasuring force
- Fx, Fy, Fz F x, F y, F z
- Komponenten der Messkraftcomponents the measuring force
- ka, kb, kc, kx, ky k a , k b , k c , k x , k y
- Kalibrierfaktorencalibration
- ya, yb, yc y a , y b , y c
- InterferometerausgangssignaleInterferometerausgangssignale
- KK
- Konstruktionslinieconstruction line
- αα
- Winkel zwischen zwei einfachen translatorischen Gelenkgruppenangle between two simple translational joint groups
Claims (13)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE200510037160 DE102005037160B4 (en) | 2005-08-06 | 2005-08-06 | Method and device for tactile detection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE200510037160 DE102005037160B4 (en) | 2005-08-06 | 2005-08-06 | Method and device for tactile detection |
Publications (2)
Publication Number | Publication Date |
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DE102005037160A1 true DE102005037160A1 (en) | 2007-02-15 |
DE102005037160B4 DE102005037160B4 (en) | 2007-09-06 |
Family
ID=37680912
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE200510037160 Expired - Fee Related DE102005037160B4 (en) | 2005-08-06 | 2005-08-06 | Method and device for tactile detection |
Country Status (1)
Country | Link |
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DE (1) | DE102005037160B4 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011064339A3 (en) * | 2009-11-26 | 2011-07-21 | Werth Messtechnik Gmbh | Method and arrangement for tactile-optical determination of the geometry of a measurement object |
CN103196568A (en) * | 2012-01-05 | 2013-07-10 | 株式会社三丰 | Wavelength detector and contact probe using it |
CN102116609B (en) * | 2009-12-30 | 2013-12-11 | 鸿富锦精密工业(深圳)有限公司 | Probe verification system and method |
DE102013215959A1 (en) | 2013-08-13 | 2015-02-19 | Carl Zeiss Industrielle Messtechnik Gmbh | Sensor module for a tactile probe of a coordinate measuring machine |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DD40329B (en) * | ||||
DE3920716C1 (en) * | 1989-06-24 | 1990-11-29 | Wild Leitz Gmbh, 6330 Wetzlar, De | |
DE19527268A1 (en) * | 1994-08-22 | 1996-02-29 | Zeiss Carl Fa | Coordinate measuring unit for workpiece undergoing industrial machining |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19880875D2 (en) * | 1997-06-12 | 2000-07-13 | Werth Messtechnik Gmbh | Coordinate measuring device with probe element and this measuring optical sensor |
-
2005
- 2005-08-06 DE DE200510037160 patent/DE102005037160B4/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DD40329B (en) * | ||||
DE3920716C1 (en) * | 1989-06-24 | 1990-11-29 | Wild Leitz Gmbh, 6330 Wetzlar, De | |
DE19527268A1 (en) * | 1994-08-22 | 1996-02-29 | Zeiss Carl Fa | Coordinate measuring unit for workpiece undergoing industrial machining |
Non-Patent Citations (2)
Title |
---|
JP 07-301 510 A mit engl. Abstract |
JP 07301510 A mit engl. Abstract * |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011064339A3 (en) * | 2009-11-26 | 2011-07-21 | Werth Messtechnik Gmbh | Method and arrangement for tactile-optical determination of the geometry of a measurement object |
CN102822618A (en) * | 2009-11-26 | 2012-12-12 | 沃思测量技术股份有限公司 | Method and arrangement for tactile-optical determination of the geometry of a measurement object |
CN102822618B (en) * | 2009-11-26 | 2017-02-15 | 沃思测量技术股份有限公司 | Method and arrangement for tactile-optical determination of the geometry of a measurement object |
US9599456B2 (en) | 2009-11-26 | 2017-03-21 | Werth Messtechnik Gmbh | Method and arrangement for tactile-optical determination of the geometry of a measurement object |
CN102116609B (en) * | 2009-12-30 | 2013-12-11 | 鸿富锦精密工业(深圳)有限公司 | Probe verification system and method |
CN103196568A (en) * | 2012-01-05 | 2013-07-10 | 株式会社三丰 | Wavelength detector and contact probe using it |
EP2613120A1 (en) * | 2012-01-05 | 2013-07-10 | Mitutoyo Corporation | Wavelength detector and contact probe using it |
JP2013140094A (en) * | 2012-01-05 | 2013-07-18 | Mitsutoyo Corp | Wavelength detector, and contact probe using the same |
US8665435B2 (en) | 2012-01-05 | 2014-03-04 | Mitutoyo Corporation | Wavelength detector and contact probe using it |
CN103196568B (en) * | 2012-01-05 | 2017-05-24 | 株式会社三丰 | Wavelength detector and contact probe using it |
DE102013215959A1 (en) | 2013-08-13 | 2015-02-19 | Carl Zeiss Industrielle Messtechnik Gmbh | Sensor module for a tactile probe of a coordinate measuring machine |
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Publication number | Publication date |
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DE102005037160B4 (en) | 2007-09-06 |
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R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20130301 |