DE102004012740A1 - Atomic force microscopy substrate surface or physical reaction sampling unit has inductive, capacitive or strain gauge sensor and oscillator directly connected to cantilever - Google Patents
Atomic force microscopy substrate surface or physical reaction sampling unit has inductive, capacitive or strain gauge sensor and oscillator directly connected to cantilever Download PDFInfo
- Publication number
- DE102004012740A1 DE102004012740A1 DE102004012740A DE102004012740A DE102004012740A1 DE 102004012740 A1 DE102004012740 A1 DE 102004012740A1 DE 102004012740 A DE102004012740 A DE 102004012740A DE 102004012740 A DE102004012740 A DE 102004012740A DE 102004012740 A1 DE102004012740 A1 DE 102004012740A1
- Authority
- DE
- Germany
- Prior art keywords
- cantilever
- arrangement according
- sensitive element
- coil
- vibrator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 7
- 238000004630 atomic force microscopy Methods 0.000 title claims abstract description 5
- 238000006243 chemical reaction Methods 0.000 title claims abstract description 5
- 230000001939 inductive effect Effects 0.000 title abstract 2
- 238000005070 sampling Methods 0.000 title abstract 2
- 239000003989 dielectric material Substances 0.000 claims description 2
- 239000003795 chemical substances by application Substances 0.000 claims 2
- 230000008878 coupling Effects 0.000 claims 2
- 238000010168 coupling process Methods 0.000 claims 2
- 238000005859 coupling reaction Methods 0.000 claims 2
- 239000003990 capacitor Substances 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 239000010453 quartz Substances 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
- 230000003068 static effect Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 230000006735 deficit Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
- G01Q10/045—Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q20/00—Monitoring the movement or position of the probe
- G01Q20/04—Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/32—AC mode
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Micromachines (AREA)
Abstract
Description
Die Erfindung betrifft eine Anordnung zur Abtastung der Oberfläche oder physikalischer Reaktionssignale von Substraten nach dem Prinzip der Atomkraft-Mikroskopie. Diese weist einen Grundkörper und einen Cantilever auf, der mit einem Ende mit dem Grundkörper verbunden und mit dem anderen freien Ende mit einer Spitze versehen ist. Der Cantilever ist mit einem Schwingungserzeuger erregbar und steht mit einem Sensorelement zum Auskoppeln eines Messwertes in Wirkungsverbindung.The The invention relates to an arrangement for scanning the surface or physical reaction signals of substrates according to the principle atomic force microscopy. This has a main body and a cantilever connected with one end to the body and with the other free end is provided with a tip. Of the Cantilever is excitable with a vibrator and stands with a sensor element for decoupling a measured value in operative connection.
Eine
Anordnung der eingangs genannten Art ist in der
Die Schwingung oder Schwingungsbeeinträchtigung wird dann als Messsignal mittels eines Sensors ausgekoppelt. Dies geschieht in der bekannten Lösung dadurch, dass der Cantilever mit einer reflektierenden Fläche versehen ist, auf die ein Mess- Lichtstrahl gelenkt wird. Infolge der Schwingung des Cantilevers kommt es dann zu einer Auslenkung des Lichtstrahles, die ermittelt und ausgewertet werden kann.The Vibration or vibration impairment is then used as a measurement signal decoupled by means of a sensor. This happens in the known solution in that the cantilever is provided with a reflective surface is on which a measuring beam of light is steered. As a result of the vibration of the cantilever it comes to a deflection of the light beam, which is determined and evaluated can be.
Für die Genauigkeit der Anordnung ist es von entscheidender Bedeutung, dass die Schwingungen störungsfrei in den Cantilever eingeleitet werden und die Messung des Schwingungsverhaltens ohne wesentliche Störungsbeeinflussung vorgenommen wird. Lange Wirkungslinien, wie sie im Stand der Technik zu verzeichnen sind, tragen zu einer Störbeeinflussung bei.For the accuracy The arrangement, it is crucial that the vibrations smoothly be introduced into the cantilever and the measurement of the vibration behavior without significant interference is made. Long lines of action, as in the prior art recorded contribute to a disturbance.
Die Aufgabe der Erfindung besteht darin, die Wirkungslinien entweder bei der Schwingungserzeugung oder bei der Messwertauskopplung oder bei beiden zu verkürzen, um somit den Fehlereintrag zu verringern und damit die Genauigkeit von Abtastanordnungen nach dem Prinzip der Atomkraftmikroskopie zu erhöhen.The The object of the invention is the lines of action either in vibration generation or in the decoupling or to shorten in both, in order to reduce the error entry and thus the accuracy scanning arrangements according to the principle of atomic force microscopy to increase.
Diese Aufgabe wird durch die kennzeichnenden Merkmale des Anspruches 1 gelöst. Besondere Ausgestaltungen zur Lösung der Aufgabenstellung sind in den Unteransprüchen 2 bis 20 angegeben.These The object is achieved by the characterizing features of claim 1 solved. Special embodiments for the solution The task are specified in the dependent claims 2 to 20.
Die Erfindung wird nachfolgend anhand eines Ausführungsbeispieles näher beschrieben.The The invention will be described in more detail with reference to an embodiment.
Die zugehörige Zeichnung zeigt eine prinzipiellen Aufbau einer erfindungsgemäßen Anordnung in schematischer Perspektivdarstellung.The associated Drawing shows a basic structure of an inventive arrangement in schematic perspective view.
Die
in der Zeichnung dargestellte Anordnung ist mit einem Cantilever
Zur
Schwingungserzeugung ist ein magnetischer Schwingungserzeuger
Durch
das nicht näher
dargestellte Substrat wird die Spitze
Die
Anwendung kann beispielsweise darin gesehen werden, dass mit dem
Cantilever die Oberfläche
eines Halbleiterchips abgetastet wird. Dadurch erhält man aufgrund
der Veränderung
des Schwingungsverhaltens Kenntnis von der Oberflächenstruktur
und somit auch Kenntnis von der Lage von Kontaktpads. Damit kann
die Spitze
- 11
- Cantilevercantilever
- 22
- Grundkörperbody
- 33
- Spitzetop
- 44
- Schwingungserzeugervibrator
- 55
- SpuleKitchen sink
- 66
- Auslegerboom
- 77
- HalteplatteRetaining plate
- 88th
- Sensorsensor
- 99
- Elektrodeelectrode
Claims (20)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004012740A DE102004012740A1 (en) | 2004-03-15 | 2004-03-15 | Atomic force microscopy substrate surface or physical reaction sampling unit has inductive, capacitive or strain gauge sensor and oscillator directly connected to cantilever |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004012740A DE102004012740A1 (en) | 2004-03-15 | 2004-03-15 | Atomic force microscopy substrate surface or physical reaction sampling unit has inductive, capacitive or strain gauge sensor and oscillator directly connected to cantilever |
Publications (1)
Publication Number | Publication Date |
---|---|
DE102004012740A1 true DE102004012740A1 (en) | 2005-10-06 |
Family
ID=34980536
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102004012740A Withdrawn DE102004012740A1 (en) | 2004-03-15 | 2004-03-15 | Atomic force microscopy substrate surface or physical reaction sampling unit has inductive, capacitive or strain gauge sensor and oscillator directly connected to cantilever |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE102004012740A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2571449C2 (en) * | 2011-04-29 | 2015-12-20 | Брукер Нано, Инк. | Scanning probing microscope with compact scanner |
-
2004
- 2004-03-15 DE DE102004012740A patent/DE102004012740A1/en not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2571449C2 (en) * | 2011-04-29 | 2015-12-20 | Брукер Нано, Инк. | Scanning probing microscope with compact scanner |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20111001 |