DE10054227A1 - Measuring device for monitoring the outer contour of profiles during production - Google Patents

Measuring device for monitoring the outer contour of profiles during production

Info

Publication number
DE10054227A1
DE10054227A1 DE10054227A DE10054227A DE10054227A1 DE 10054227 A1 DE10054227 A1 DE 10054227A1 DE 10054227 A DE10054227 A DE 10054227A DE 10054227 A DE10054227 A DE 10054227A DE 10054227 A1 DE10054227 A1 DE 10054227A1
Authority
DE
Germany
Prior art keywords
measuring device
gap
monitoring
outer contour
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE10054227A
Other languages
German (de)
Inventor
Musa Kazalan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE10054227A priority Critical patent/DE10054227A1/en
Priority to PCT/DE2001/004098 priority patent/WO2002037055A1/en
Publication of DE10054227A1 publication Critical patent/DE10054227A1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

Bei der Herstellung von Profilen durch Extrusion kommt es zu Fehlern in der Aussenkontur, die mit Hilfe einer kontinuierlichen Überwachung frühzeitig genug erkannt werden könnten. Durch den Einsatz von optischen Messgeräten oder Kameras und der zugehörigen Bildverarbeitung wäre eine Überwachung möglich, die jedoch einen grossen Aufwand erfordern würden.Errors occur in the manufacture of profiles by extrusion External contour, which is monitored early with the help of continuous monitoring could be recognized enough. Through the use of optical measuring devices or cameras and the associated image processing would be surveillance possible, which would however require a lot of effort.

Eine kostengünstigere Lösung bietet ein Messsystem nach den in den Patentansprüchen aufgeführten Merkmalen.A more cost-effective solution is offered by a measuring system according to the in the Features listed claims.

Messprinzipmeasuring principle

Das Profil läuft durch ein an das Profil angepassten Kaliber hindurch. Die Lage der Messorte und die die Grösse der Erfassungsbereiche werden durch Aussparungen im Messkaliber festgelegt. Die Spaltbreite zwischen dem Profil und dem Messkaliber ist die Messgrösse. Der Spalt wird durch eine Lichtquelle beleuchtet und die durch den Spalt hindurch tretende Lichtintensität mit einem Sensor erfasst. Änderungen der Spaltbreite aufgrund von Konturabweichungen führen zu einer Änderung der vom Sensor erfassten Lichtintensität.The profile runs through a caliber adapted to the profile. The location the measurement locations and the size of the detection areas are determined by Gaps in the measuring caliber specified. The gap width between the profile and the measurement caliber is the measurement quantity. The gap is created by a light source illuminated and the light intensity passing through the gap with one Sensor detected. Changes in the gap width due to contour deviations lead to a change in the light intensity detected by the sensor.

Der grosse Vorteil dieser Messart ist die quasi berührungslose Messung. Ein weiterer Vorteil liegt in dem relativ leichten Messprinzip. Dies gewährleistet einen kostengünstigen Messaufbau. The big advantage of this type of measurement is the quasi non-contact measurement. Another advantage is the relatively light measuring principle. This ensures an inexpensive measurement setup.  

Erläuterungen zu der SkizzeExplanations to the sketch

11

Bearbeiteter Kaliber mit Aussparungen für Messbereiche
Machined caliber with cutouts for measuring ranges

22

optischer Sensor
optical sensor

33

Lichtquelle
light source

44

Aussparung im Messkaliber
Recess in the measuring caliber

55

Kaliber für lichtdichten Abschluss
Caliber for light-tight closure

66

optische Abdichtung
optical sealing

55

und and

66

können entfallen durch Modulation der Lichtquelle
can be omitted by modulating the light source

Claims (2)

1. Messvorrichtung zur Überwachung der Aussenkontur von Profilen (Kunstoff oder Aluminium) bei der Herstellung, dadurch gekennzeichnet, dass die Breite des Spaltes zwischen Profil und angepassten Messkaliber gemessen wird.1. Measuring device for monitoring the outer contour of profiles (plastic or aluminum) during manufacture, characterized in that the width of the gap between the profile and the adapted measuring caliber is measured. 2. Messvorrichtung nach Patentanspruch 1, dadurch gekennzeichnet, dass zur Messung dieser Spaltbreite der Spalt durch eine Lichtquelle beleuchtet und die durch den Spalt hindurch tretende Lichtintensität mit einem lichtempfindlichen Sensor (z. B. Solarzellen) erfasst wird, wobei die Lichtquelle und der Sensor durch Abschottung gegen Fremdlicht vor äusseren Einflüssen geschützt wird oder auch durch Modulation der Lichtquelle entfallen kann.2. Measuring device according to claim 1, characterized, that to measure this gap width the gap by a light source illuminated and the light intensity passing through the gap a light-sensitive sensor (e.g. solar cells), the Light source and the sensor by shielding against extraneous light is protected from external influences or by modulating the Light source can be omitted.
DE10054227A 2000-11-02 2000-11-02 Measuring device for monitoring the outer contour of profiles during production Withdrawn DE10054227A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE10054227A DE10054227A1 (en) 2000-11-02 2000-11-02 Measuring device for monitoring the outer contour of profiles during production
PCT/DE2001/004098 WO2002037055A1 (en) 2000-11-02 2001-11-02 Measuring device for monitoring the outer contour of profiles during production

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10054227A DE10054227A1 (en) 2000-11-02 2000-11-02 Measuring device for monitoring the outer contour of profiles during production

Publications (1)

Publication Number Publication Date
DE10054227A1 true DE10054227A1 (en) 2002-08-01

Family

ID=7661840

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10054227A Withdrawn DE10054227A1 (en) 2000-11-02 2000-11-02 Measuring device for monitoring the outer contour of profiles during production

Country Status (2)

Country Link
DE (1) DE10054227A1 (en)
WO (1) WO2002037055A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109990712B (en) * 2019-03-28 2020-11-03 唐山钢铁集团有限责任公司 Online calibration method for width gauge

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2241436A1 (en) * 1972-08-23 1974-03-07 Udo Dipl Kfm Peter METHODS AND DEVICES FOR GAP AND VIBRATION MEASUREMENTS IN ROTARY MACHINES
DE2518518A1 (en) * 1974-04-26 1975-11-13 Svenska Traeforskningsinst DEVICE FOR DETERMINING A LAYER THICKNESS OR FOR MEASURING A SURFACE TOPOGRAPHY
DE2513389A1 (en) * 1975-03-26 1976-10-07 Messerschmitt Boelkow Blohm Contactless profile measurement system - uses series of optical detectors aimed at different surfaces of workpiece
DE8806466U1 (en) * 1987-05-18 1988-06-30 Artos Italia S.p.A., La Loggia, Torino Optoelectronic device for non-contact measurement of the dimensions of objects
GB2220480A (en) * 1988-06-22 1990-01-10 Ali Bindernagel Measuring apparatus and its calibration

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4182259A (en) * 1978-10-04 1980-01-08 The Dow Chemical Company Apparatus for measuring coating thickness on an applicator roll
US4730116A (en) * 1985-08-06 1988-03-08 Mitsubishi Denki Kabushiki Kaisha Sheet thickness measuring apparatus by optical scanning
KR900003208B1 (en) * 1986-04-29 1990-05-10 미쓰비시전기주식회사 Checking machine of thickness

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2241436A1 (en) * 1972-08-23 1974-03-07 Udo Dipl Kfm Peter METHODS AND DEVICES FOR GAP AND VIBRATION MEASUREMENTS IN ROTARY MACHINES
DE2518518A1 (en) * 1974-04-26 1975-11-13 Svenska Traeforskningsinst DEVICE FOR DETERMINING A LAYER THICKNESS OR FOR MEASURING A SURFACE TOPOGRAPHY
DE2513389A1 (en) * 1975-03-26 1976-10-07 Messerschmitt Boelkow Blohm Contactless profile measurement system - uses series of optical detectors aimed at different surfaces of workpiece
DE8806466U1 (en) * 1987-05-18 1988-06-30 Artos Italia S.p.A., La Loggia, Torino Optoelectronic device for non-contact measurement of the dimensions of objects
GB2220480A (en) * 1988-06-22 1990-01-10 Ali Bindernagel Measuring apparatus and its calibration

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
(ATM) Archiv für technisches Messen, Blatt V 171- 17, Juli 1969 S.149 u. 150 *

Also Published As

Publication number Publication date
WO2002037055A1 (en) 2002-05-10

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OP8 Request for examination as to paragraph 44 patent law
8130 Withdrawal