DD98164A1 - - Google Patents
Info
- Publication number
- DD98164A1 DD98164A1 DD16442472A DD16442472A DD98164A1 DD 98164 A1 DD98164 A1 DD 98164A1 DD 16442472 A DD16442472 A DD 16442472A DD 16442472 A DD16442472 A DD 16442472A DD 98164 A1 DD98164 A1 DD 98164A1
- Authority
- DD
- German Democratic Republic
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DD16442472A DD98164A1 (en:Method) | 1972-07-14 | 1972-07-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DD16442472A DD98164A1 (en:Method) | 1972-07-14 | 1972-07-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DD98164A1 true DD98164A1 (en:Method) | 1973-06-12 |
Family
ID=5487483
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DD16442472A DD98164A1 (en:Method) | 1972-07-14 | 1972-07-14 |
Country Status (1)
| Country | Link |
|---|---|
| DD (1) | DD98164A1 (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19607795A1 (de) * | 1996-03-01 | 1997-09-04 | Telefunken Microelectron | Verfahren zur Untersuchung von ionischen Verunreinigungen im Innern gemoldeter elektronischer Bauelemente |
-
1972
- 1972-07-14 DD DD16442472A patent/DD98164A1/xx unknown
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19607795A1 (de) * | 1996-03-01 | 1997-09-04 | Telefunken Microelectron | Verfahren zur Untersuchung von ionischen Verunreinigungen im Innern gemoldeter elektronischer Bauelemente |
| DE19607795C2 (de) * | 1996-03-01 | 1999-09-02 | Temic Semiconductor Gmbh | Verfahren zur Untersuchung von ionischen Verunreinigungen im Innern gemoldeter elektronischer Bauelemente |