DD261224A1 - METHOD FOR THE DEEP-SHARP PICTURE OF ROOMED OBJECTS - Google Patents

Abstract

The invention relates to a method for deep-focus imaging, preferably microscopic objects. The depth of field is in this process, regardless of the natural or physical-technical limits, freely choosable. The principle is based on the fact that the object is scanned by means of a suitable image acquisition unit in a freely selectable number of Schaerfeebenen, which have a freely selectable distance between them, and only the respective lying in the respective Schaerfeebene pixels electronically merged to form a new image of the object become. All known light microscopic and ultrasonic techniques as well as electronic methods for increasing the information content or for image evaluation remain applicable.

Description

of the invention Method for the deep-sharp imaging of spatial objects

Field of application of the invention

The invention relates to a method which makes it possible, in particular using known microscopic techniques, to achieve a depth of field t which is substantially above the theoretical

Retical limit of

t = η * ( X + 0.15 ) (1)

• ( ² · ^AA · ^V microns)

is independent of the magnification V ₁₁ .., is freely selectable.

Wed kr *

Innerhalb.des for ¹ light microscopy possible range of magnification is thus enabling imaging quality, which otherwise can only be reached using Easterelektronenniikroskopen "

Sovriil for the science of materials, as well as for many other areas of science and technology are thus new possibilities of microscopy.

Characteristic of the known technical solutions

The. All options for increasing the depth of field reflected in formula (1) are currently being used technically. These possibilities are in detail:

Enlargement of the refractive indices in the object space, eg by embedding the samples in immersion media, transition to higher wavelengths s ^ ·

in the case of object illumination, reduction of the aperture A _9, for example by inserting diaphragms in the beam path illuminating the object and by reducing the magnification V _M. ,

JVL X iCi * *

2ä4.2l ·

In addition, the user of microscopes subjectively by. Modification of the accommodation of the eye affect the depth of field, As an aid to him for this purpose markings are offered in the eyepiece.

These possibilities are extensively illustrated, for example, in the "Handbuch für Mikroskopie" by H. Beyer, VEB Yerlag Technik Berlin, 1977, 2nd edition, page 52 ff. '

Due to the spectral eye curve of the observer, the variation of the o.g. Parameters very quickly their natural limits »

In addition, there are physical-technical limits for refractive index and aperture.

In order to get around this, it is known from DDR patent Kr. 154643 to offer the viewer, in rapid change, pictures of two or more planes of sharpness, thus giving him the impression of an increased depth of field. Main disadvantage of this. Method is the reduction of the resolution. Furthermore, such images can not be documented on a photographic basis.

Modern electronic image processing offers e.g. by contrast enhancement the possibility to increase the image quality. If necessary, this also leads to an increase in the depth of field. Unfortunately, this does not increase "the information content compared to the non-processing image,".

In detail, electronic image processing, e.g. in "Capture and Machine Processing of Image Data" by E. Kasmierczak, Akademie-Verlag Berlin, Ί980.

Other ways to deep-focus imaging of spatial microscopic objects use electron beams bzv / instead of light. Ultrasonic. Electron beam microscopy, in particular scanning electron beam microscopy, permits a depth of field of focus which is greater by a factor of 100 because of its extremely small aperture at the same magnification as compared with the light microscope. The disadvantage is the high equipment and preparative effort. In addition, the application of this technique is limited to highly vacuum-resistant samples. , Detailed on this in "electron microscopy in the solid state physics" of H. Bethge and "3. Heydenreich, VEB German publishing house of the sciences Berlin, 1982, page 108 ff.

L O l Z L · *

The ultrasound microscopy allows enlargements that can also be achieved by light microscopy. Also in terms of resolution and depth of field, both microscopes have approximately the same values. The ultrasound microscope also allows a "subsurface microscopy", that is, you can also make structures visible inside a solid. The application of the present invention to ultrasonic microscopy would greatly enrich them. Literature on this, Z ₀ B. in "An ultrasonic microscope with a penetrating power of several millimeters" in Physik-Information 10 (1984) p. 97.

Object of the invention

The aim of the invention is the deep-sharp imaging of spatial objects on the basis of microscopic techniques. The depth of field should be independent of the o.g. natural or physical-technical limits are freely selectable. This with a picture quality that can only be achieved with EEM recordings.

Explanation of the "essence of the invention

The invention is based on the object of generating an image of a spatial object on an image acquisition and image processing unit on a display. The depth of field of this figure should be independent of the o.g. natural, respectively. be physically selectable limits.

According to the invention, this object is achieved in that a freely selectable number of planes of sharpness is scanned in succession with the image recording unit and only the object points lying in the respective plane are determined by means of the image processing unit and combined to form an electronically generated overall image.

All light microscopic and ultrasonic techniques remain applicable »

The electronically generated image of the object can be subjected to all known machine techniques for image processing.

embodiment

The sample (1) is positioned on the slide of a microscope (2). The selected planes of sharpness are successively set via a motor (3) in conjunction with the image processing electronics (4). By means of the in the image plane of the microscope (8)

attached image capture electronics (5) »z-iB. a CCD component or a video camera, the individual planes of sharpness are scanned. The video information enters the image processing electronics. In this case, the object points lying in the respective focal plane are determined. Their video signal is stored in an image memory (6). After passing through all desired levels of sharpness, the contents of the image memory can be displayed on the display (7) as a deep-sharp overall image following the image processing.

The depth of field can be freely selected via the number of planes of sharpness and their distance between them. Compared with conventional microscopy, which has to make do with only one focal plane, the depth of field can hereby be substantially increased.

Claims (4)

Claim 1. A method for the deep-sharp imaging of spatial objects using an image recording and image processing unit, characterized in that the image recording unit successively a , scanned arbitrarily selectable number of planes of sharpness, from the resulting image information then in the image processing unit only the lying in the set focal plane pixels of an object determined and assembled into an electronically generated overall picture 2. The method according to claim 1, characterized in that the deep-sharp image is carried out in conjunction with light microscopic or ultrasonic techniques. 3. The method according to claim 1 to 2, characterized in that the corresponding focal plane is stored to the determined pixels and thus a profile of the object is possible, 4. The method according to claim 1 to 3, characterized in that the image recording or »image processing is carried out electronically and thus the electronically generated image all known masschinellen techniques for image processing can be subjected. 5β The method of claim 1 to 4, characterized in that the image processing can be carried out optoelectronically.