DD138100A1 - OPTICAL MICROMETER - Google Patents

OPTICAL MICROMETER

Info

Publication number
DD138100A1
DD138100A1 DD20705878A DD20705878A DD138100A1 DD 138100 A1 DD138100 A1 DD 138100A1 DD 20705878 A DD20705878 A DD 20705878A DD 20705878 A DD20705878 A DD 20705878A DD 138100 A1 DD138100 A1 DD 138100A1
Authority
DD
German Democratic Republic
Prior art keywords
optical micrometer
micrometer
optical
Prior art date
Application number
DD20705878A
Other languages
German (de)
Inventor
Wieland Feist
Klaus Junghanns
Rolf Roeder
Original Assignee
Wieland Feist
Klaus Junghanns
Rolf Roeder
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wieland Feist, Klaus Junghanns, Rolf Roeder filed Critical Wieland Feist
Priority to DD20705878A priority Critical patent/DD138100A1/en
Priority to DE19792925408 priority patent/DE2925408A1/en
Priority to SE7906369A priority patent/SE7906369L/en
Publication of DD138100A1 publication Critical patent/DD138100A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DD20705878A 1978-08-01 1978-08-01 OPTICAL MICROMETER DD138100A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DD20705878A DD138100A1 (en) 1978-08-01 1978-08-01 OPTICAL MICROMETER
DE19792925408 DE2925408A1 (en) 1978-08-01 1979-06-23 Optical micrometer for radial graduation interval measurement - uses rotatable wedge element for graduation marking image rotation and displacement
SE7906369A SE7906369L (en) 1978-08-01 1979-07-25 OPTICAL MICROMETERS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD20705878A DD138100A1 (en) 1978-08-01 1978-08-01 OPTICAL MICROMETER

Publications (1)

Publication Number Publication Date
DD138100A1 true DD138100A1 (en) 1979-10-10

Family

ID=5513855

Family Applications (1)

Application Number Title Priority Date Filing Date
DD20705878A DD138100A1 (en) 1978-08-01 1978-08-01 OPTICAL MICROMETER

Country Status (3)

Country Link
DD (1) DD138100A1 (en)
DE (1) DE2925408A1 (en)
SE (1) SE7906369L (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4355901A (en) * 1979-10-10 1982-10-26 Wieland Feist Arrangement for measuring the position of an index
US4355902A (en) * 1979-10-01 1982-10-26 Wieland Feist Arrangement for determining the errors the vertical axis of a surveying device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4355902A (en) * 1979-10-01 1982-10-26 Wieland Feist Arrangement for determining the errors the vertical axis of a surveying device
US4355901A (en) * 1979-10-10 1982-10-26 Wieland Feist Arrangement for measuring the position of an index

Also Published As

Publication number Publication date
SE7906369L (en) 1980-02-02
DE2925408A1 (en) 1980-02-21

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Legal Events

Date Code Title Description
ENJ Ceased due to non-payment of renewal fee