DD126382A1 - - Google Patents
Info
- Publication number
- DD126382A1 DD126382A1 DD19343176A DD19343176A DD126382A1 DD 126382 A1 DD126382 A1 DD 126382A1 DD 19343176 A DD19343176 A DD 19343176A DD 19343176 A DD19343176 A DD 19343176A DD 126382 A1 DD126382 A1 DD 126382A1
- Authority
- DD
- German Democratic Republic
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DD19343176A DD126382A1 (enExample) | 1976-06-18 | 1976-06-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DD19343176A DD126382A1 (enExample) | 1976-06-18 | 1976-06-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DD126382A1 true DD126382A1 (enExample) | 1977-07-13 |
Family
ID=5504868
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DD19343176A DD126382A1 (enExample) | 1976-06-18 | 1976-06-18 |
Country Status (1)
| Country | Link |
|---|---|
| DD (1) | DD126382A1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001045136A1 (en) * | 1999-12-14 | 2001-06-21 | Applied Materials, Inc. | Method and system for the examination of specimen using a charged particle beam |
| US7528614B2 (en) | 2004-12-22 | 2009-05-05 | Applied Materials, Inc. | Apparatus and method for voltage contrast analysis of a wafer using a tilted pre-charging beam |
-
1976
- 1976-06-18 DD DD19343176A patent/DD126382A1/xx unknown
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001045136A1 (en) * | 1999-12-14 | 2001-06-21 | Applied Materials, Inc. | Method and system for the examination of specimen using a charged particle beam |
| US7528614B2 (en) | 2004-12-22 | 2009-05-05 | Applied Materials, Inc. | Apparatus and method for voltage contrast analysis of a wafer using a tilted pre-charging beam |