DD120082A1 - - Google Patents

Info

Publication number
DD120082A1
DD120082A1 DD18677775A DD18677775A DD120082A1 DD 120082 A1 DD120082 A1 DD 120082A1 DD 18677775 A DD18677775 A DD 18677775A DD 18677775 A DD18677775 A DD 18677775A DD 120082 A1 DD120082 A1 DD 120082A1
Authority
DD
German Democratic Republic
Application number
DD18677775A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to DD18677775A priority Critical patent/DD120082A1/xx
Publication of DD120082A1 publication Critical patent/DD120082A1/xx

Links

DD18677775A 1975-06-20 1975-06-20 DD120082A1 (cs)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DD18677775A DD120082A1 (cs) 1975-06-20 1975-06-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD18677775A DD120082A1 (cs) 1975-06-20 1975-06-20

Publications (1)

Publication Number Publication Date
DD120082A1 true DD120082A1 (cs) 1976-05-20

Family

ID=5500735

Family Applications (1)

Application Number Title Priority Date Filing Date
DD18677775A DD120082A1 (cs) 1975-06-20 1975-06-20

Country Status (1)

Country Link
DD (1) DD120082A1 (cs)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0284304A1 (en) * 1987-03-20 1988-09-28 Hewlett-Packard Company Wavelength compensation in an interferometer system
DE4100773C2 (de) * 1991-01-12 1999-09-30 Zeiss Carl Jena Gmbh Interferometrische Längenmeßeinrichtung
WO2009135447A2 (en) 2008-05-06 2009-11-12 Institute Of Scientific Instruments As Cr, V. V. I. The interferometric system with compensation of the refractive index fluctuation of the ambiance

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0284304A1 (en) * 1987-03-20 1988-09-28 Hewlett-Packard Company Wavelength compensation in an interferometer system
DE4100773C2 (de) * 1991-01-12 1999-09-30 Zeiss Carl Jena Gmbh Interferometrische Längenmeßeinrichtung
WO2009135447A2 (en) 2008-05-06 2009-11-12 Institute Of Scientific Instruments As Cr, V. V. I. The interferometric system with compensation of the refractive index fluctuation of the ambiance
WO2009135447A3 (en) * 2008-05-06 2010-01-14 Institute Of Scientific Instruments As Cr, V. V. I. Interferometric system with compensation of the refractive index fluctuation of the environment

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