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Application filedfiledCritical
Priority to DD18275574ApriorityCriticalpatent/DD116530A1/xx
Publication of DD116530A1publicationCriticalpatent/DD116530A1/xx
H01H1/0015—Means for testing or for inspecting contacts, e.g. wear indicator
H01H2001/0026—Means for testing or for inspecting contacts, e.g. wear indicator wherein one or both contacts contain embedded contact wear signal material, e.g. radioactive material being released as soon as the contact wear reaches the embedded layer