SG54993G
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1993-07-09
Method for manufacturing an optical probe
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1989-12-15
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1995-03-17
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1989-03-22
Method for the manufacture of an electro-optic device
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1992-02-26
Method and apparatus for scattered light measurements
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1992-09-30
Method and apparatus for enhancing optical photoplotter accuracy
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1992-08-19
Method and device for measuring surface roughness
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1992-10-14
Optical measuring apparatus and method
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1993-10-20
Method for determining seismic velocities
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1992-02-12
Method and apparatus for measuring the depth of cracks
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1988-07-20
Method for measuring property of pipeline
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1988-08-10
Measurement method & apparatus
CS680388A1
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1991-02-12
Device for roughness optoelectronic checking by means of scattering method
CS680288A1
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1991-02-12
Device for surface roughness optoelectronic checking by means of scattering method
ZA894103B
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1990-03-28
Method and apparatus for measuring rapid optical events
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1994-01-26
Apparatus and method for measuring the depth of a recess
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1992-09-09
Light scattering measuring apparatus
HUT60549A
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1992-09-28
Method for checking generqtors
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1990-10-10
Thickness measuring method
IL85634A0
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1988-08-31
Device and method for measuring light backscattering
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1995-01-18
Apparatus and method for detecting coherent radiation
EP0332300A3
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1989-10-11
Method and apparatus for measuring an interval between two objects
IL89456A0
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1989-09-10
Device and method for measuring light backscattering
AU4540089A
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1990-05-24
A method and an apparatus for checking an object for the presence of filling compound
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1988-05-05
Optical measuring apparatus & method