JPS5791403A
(en )
1982-06-07
Optoelectronic measuring method of and apparatus for roughness of surface
GB8826640D0
(en )
1988-12-21
Apparatus for determining surface roughness of material
EP0165535A3
(en )
1987-07-15
Device and method for measuring light diffusely reflected from a nonuniform specimen
KR890017521A
(ko )
1989-12-16
3차원 곡면형상의 측정방법 및 장치
EP0418874A3
(en )
1992-02-26
Method and apparatus for scattered light measurements
GB2222886B
(en )
1992-08-19
Method and device for measuring surface roughness
GB2214330B
(en )
1992-09-30
Method and apparatus for enhancing optical photoplotter accuracy
GB2217010B
(en )
1992-10-14
Optical measuring apparatus and method
GB2222262B
(en )
1992-02-12
Method and apparatus for measuring the depth of cracks
GB2235534B
(en )
1993-10-20
Method for determining seismic velocities
EP0348982A3
(en )
1990-08-16
Apparatus for detecting surface potential distribution
CS680288A1
(en )
1991-02-12
Device for surface roughness optoelectronic checking by means of scattering method
EP0423794A3
(en )
1992-03-11
Surface inspecting apparatus
GB2211933B
(en )
1991-07-03
Optical surface waviness measuring apparatus
CS680388A1
(en )
1991-02-12
Device for roughness optoelectronic checking by means of scattering method
GB2245065B
(en )
1994-01-26
Apparatus and method for measuring the depth of a recess
ZA894103B
(en )
1990-03-28
Method and apparatus for measuring rapid optical events
GB2229599B
(en )
1992-09-09
Light scattering measuring apparatus
KR890014991A
(ko )
1989-10-28
3차원 곡면 형상의 측정방법 및 장치
KR890014992A
(ko )
1989-10-28
3차원 곡면 형상의 측정방법 및 장치
GB8806592D0
(en )
1988-04-20
Method & apparatus for evaluating surface of object
GB2187560B
(en )
1990-07-25
Apparatus for measuring surface friction
JPS6410155A
(en )
1989-01-13
Optical surface inspecting method
PL270482A1
(en )
1989-08-07
Apparatus for measuring surface microgeometry
SU1546845A1
(ru )
1990-02-28
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