CS211009B1 - The gauge is designed to control measuring microscopes and projection devices designed to measure hardness indentations using Vickers, Knoop, Grodzinski, Brinell, etc. Using this gauge, it is possible to achieve uniform and correct indentation measurements, even when multiple workers perform multiple measurements at multiple sites and on various devices. By using a dipstick, measurement deviations, variable measurement errors, and personal error rates can be determined. The dipstick can be used to train measurements as well as to test work and to select suitable personnel. The gauge is characterized in that it is usually provided on one of its plurality of groups of indentations of the same size in each group but of different sizes in the individual groups whose dimensions are known. The gauge is designed for workplaces dealing with hardness testing and corporate, state or international hardness metrology. - Google Patents

The gauge is designed to control measuring microscopes and projection devices designed to measure hardness indentations using Vickers, Knoop, Grodzinski, Brinell, etc. Using this gauge, it is possible to achieve uniform and correct indentation measurements, even when multiple workers perform multiple measurements at multiple sites and on various devices. By using a dipstick, measurement deviations, variable measurement errors, and personal error rates can be determined. The dipstick can be used to train measurements as well as to test work and to select suitable personnel. The gauge is characterized in that it is usually provided on one of its plurality of groups of indentations of the same size in each group but of different sizes in the individual groups whose dimensions are known. The gauge is designed for workplaces dealing with hardness testing and corporate, state or international hardness metrology. Download PDF

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Publication number
CS211009B1
CS211009B1 CS18580A CS18580A CS211009B1 CS 211009 B1 CS211009 B1 CS 211009B1 CS 18580 A CS18580 A CS 18580A CS 18580 A CS18580 A CS 18580A CS 211009 B1 CS211009 B1 CS 211009B1
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CS
Czechoslovakia
Prior art keywords
gauge
designed
measurements
hardness
dipstick
Prior art date
Application number
CS18580A
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Czech (cs)
Inventor
Vaclav Sedlicky
Peter Vlk
Original Assignee
Vaclav Sedlicky
Peter Vlk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Vaclav Sedlicky, Peter Vlk filed Critical Vaclav Sedlicky
Priority to CS18580A priority Critical patent/CS211009B1/en
Publication of CS211009B1 publication Critical patent/CS211009B1/en

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Abstract

Vynález se týká způsobu uložení informace o vzoru tkaniny do externí paměti poěítače při řízení listových nebo žakárových strojů. Podstata způsobu podle vynálezu spočívá v tom, že se informace vkládají do paměti po proužcích se stejnou střídou vazby. Pro každý proužek se postupně uloží údaj o celkovém poStu útků, střídě vazby a adrese, od níž počínaje se uloží vlastní vzor tvořící střídu vazby daného proužku tkaniny.The invention relates to a method of storing information about a fabric pattern in an external memory of a computer when controlling sheet or jacquard machines. The essence of the method according to the invention lies in the fact that the information is entered into the memory in strips with the same weave pitch. For each strip, data on the total number of wefts, weave pitch and address are stored in turn, starting from which the own pattern forming the weave pitch of the given strip of fabric is stored.

Description

Vynález se týká způsobu uložení informace o vzoru tkaniny do externí paměti při řízení listových nebo žakárových strojů.The present invention relates to a method for storing fabric pattern information in an external memory while controlling sheet or jacquard machines.

U současných listových strojů bývá nositelem informace děrný kartový pás, na němž je vzor tkaniny útek po útku. Z pásu se informace snímá pomocí ohmatáv^cích pák, nebo jehel a prostřednictvím mechanismu převádí na pohyb listů tkacího stroje. Nevýhodami tohoto způsobu uložení jsou například zdlouhavá příprava vzoru, omezená rychlost snímání informace z děrného pásu, technické^ komplikace při párání, nutnost řadit za sebou na kartě více stejných vzorů při výrobě zboží s malou střídou, velmi dlouhá karta u vzorů s extrémně vysokou střídou a podobně.In current sheet-fed machines, the information carrier is a punched card strip on which the fabric pattern is a weft weft. From the belt, the information is read out by means of gripping levers or needles and converted by means of a mechanism to the movement of the weaving machine blades. The disadvantages of this method of storage are, for example, the lengthy pattern preparation, the limited speed of reading information from the punched belt, the technical complications in ripping, the necessity of sequencing multiple identical patterns on the card in the manufacture of small alternate goods. alike.

Uvedené nedostatky odstraňuje způsob uložení informace o vzoru tkaniny do paměti počítače podle vynálezu. Jeho podstata spočívá v tom, že se informace vkládají do paměti po proužcích se stejnou střídou vazby. Pro každý proužek se postupně uloží údaj o celkovém počtu útků, střídě vazby a adrese, od níž počínaje se uloží vlastni vzor tvořící střídu vazby daného proužku tkaniny.These drawbacks are eliminated by the method of storing fabric pattern information in the computer memory of the present invention. Its essence lies in the fact that the information is stored in strips with the same loop of binding. For each strip, the total number of wefts, the staple bond and the address from which the custom pattern forming the staple bond of the woven fabric strip are stored are sequentially stored.

Informace o vzoru tkaniny je uložena v polovodičových pamětech nebo na jiných médiích, například na děrné, magnetické nebo filmové pásce. Přitom se předpokládá, že řídicí část pro výběr vzoru je elektronická. Informace/o vzoru tkaniny tedy není uložena útek po útku, jak je tomu u dosud používaných zařízení, nýbrž po proužcích, v nichž je stejné střída vazby. Údaje o celkovém počtu útků v proužku, střídě vazby a dále vlastní vzor ve střídě vazby proužku se uloží do paměti pro každý proužek tkaniny v rámci celkového raportu.The fabric pattern information is stored in semiconductor memories or other media, such as punched, magnetic or film tapes. It is assumed that the pattern selection control part is electronic. Thus, the weave pattern information is stored not on the weft, as is the case with the devices used up to now, but on strips in which the same weave is the same. Data on the total number of wefts in the strip, staple bond, and the actual pattern in the staple bond staple are stored for each strip of fabric within the overall report.

Výhodou uvedeného způsobu podle vynálezu jsou mnohem menší nároky na kapacitu paměti, což je u elektronických zařízeni rozhodující.The advantage of the method according to the invention is that the memory capacity is much lower, which is crucial for electronic devices.

Podstata vynálezu je blíže objasněna na popisu přikladu způsobu uložení informace o vzoru tkaniny podle připojeného výkresu,, na němž značí obr. 1 strukturu tkaniny a obr. 2 schematicky uložení údajů do paměti.BRIEF DESCRIPTION OF THE DRAWINGS The invention is explained in more detail by way of example of a method for storing fabric pattern information according to the accompanying drawing, in which FIG. 1 shows the fabric structure and FIG.

Tkanina má například strukturu podle obr. 1 a skládá se z proužků X, 2, J, Každý proužek má jinou vazbu a tedy i jinou střídu vazby. Jestliže se předpokládá, že první proužek χ má celkový počet útků 6 a střídu;vazby X, druhý proužek 2 má jiný celkový počet útků 8 a jinou střídu vazby 2 8td., pak v paměti podle obr. 2 jsou pro každý proužek uloženy informace trojího druhu; cělkový počet útků 6,resp. 8 v proužku, střída vazby X, resp. 2 a adresa 1 0. resp. XI, od níž počínaje je uložen vlastní vzor tvořící střídu vazby daného proužku. Totéž sě opakuje i pro další proužky.For example, the fabric has the structure shown in FIG. 1 and consists of strips X, 2, J. If it is assumed that the first strip χ has the total number of wefts 6 and the duty cycle X, the second strip 2 has a different total number of wefts 8, and another duty cycle 2 8td. kinds; total number of wefts 6, resp. 8 in the strip, the X-bond binding, respectively. 2 and address 1 0. resp. XI, from which, starting from, the actual pattern constituting the splice of the strip is deposited. He repeats the same for other strips.

Způsob uložení informace o vzoru tkaniny je použitelný zejména u listových strojů s elektronickou řídicí jednotkou, která informace o vzoru průběžně z paměti vyzvedává, zpracuje po synchronizaci s listovým strojem a vysílá k elektromechanickým převodníkům.The method of storing fabric pattern information is particularly applicable to sheet-fed machines with an electronic control unit which continuously retrieves the pattern information from memory, processes it after synchronization with the sheet-fed machine, and transmits it to electromechanical transducers.

Claims (1)

Způsob uloženi informace o vzoru tkaniny do paměti počítače vyznačující se tím, že se informace ukládají do paměti po proužcífeh se stejnou střídou vazby, přičemž pro každý proužek se postupně uloží údaj o celkovém počtu útků, střídě vazby a adrese, od níž počínaje se uloží vlastní vzor tvořící střídu vazby daného proužku tkaniny.Method of storing fabric pattern information in a computer memory, characterized in that the information is stored in a memory in a strip with the same alternation of binding, wherein for each strip, the total number of wefts, staple binding and the address from which the own pattern forming the weave of the woven fabric strip.
CS18580A 1980-01-08 1980-01-08 The gauge is designed to control measuring microscopes and projection devices designed to measure hardness indentations using Vickers, Knoop, Grodzinski, Brinell, etc. Using this gauge, it is possible to achieve uniform and correct indentation measurements, even when multiple workers perform multiple measurements at multiple sites and on various devices. By using a dipstick, measurement deviations, variable measurement errors, and personal error rates can be determined. The dipstick can be used to train measurements as well as to test work and to select suitable personnel. The gauge is characterized in that it is usually provided on one of its plurality of groups of indentations of the same size in each group but of different sizes in the individual groups whose dimensions are known. The gauge is designed for workplaces dealing with hardness testing and corporate, state or international hardness metrology. CS211009B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CS18580A CS211009B1 (en) 1980-01-08 1980-01-08 The gauge is designed to control measuring microscopes and projection devices designed to measure hardness indentations using Vickers, Knoop, Grodzinski, Brinell, etc. Using this gauge, it is possible to achieve uniform and correct indentation measurements, even when multiple workers perform multiple measurements at multiple sites and on various devices. By using a dipstick, measurement deviations, variable measurement errors, and personal error rates can be determined. The dipstick can be used to train measurements as well as to test work and to select suitable personnel. The gauge is characterized in that it is usually provided on one of its plurality of groups of indentations of the same size in each group but of different sizes in the individual groups whose dimensions are known. The gauge is designed for workplaces dealing with hardness testing and corporate, state or international hardness metrology.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS18580A CS211009B1 (en) 1980-01-08 1980-01-08 The gauge is designed to control measuring microscopes and projection devices designed to measure hardness indentations using Vickers, Knoop, Grodzinski, Brinell, etc. Using this gauge, it is possible to achieve uniform and correct indentation measurements, even when multiple workers perform multiple measurements at multiple sites and on various devices. By using a dipstick, measurement deviations, variable measurement errors, and personal error rates can be determined. The dipstick can be used to train measurements as well as to test work and to select suitable personnel. The gauge is characterized in that it is usually provided on one of its plurality of groups of indentations of the same size in each group but of different sizes in the individual groups whose dimensions are known. The gauge is designed for workplaces dealing with hardness testing and corporate, state or international hardness metrology.

Publications (1)

Publication Number Publication Date
CS211009B1 true CS211009B1 (en) 1982-01-29

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CS18580A CS211009B1 (en) 1980-01-08 1980-01-08 The gauge is designed to control measuring microscopes and projection devices designed to measure hardness indentations using Vickers, Knoop, Grodzinski, Brinell, etc. Using this gauge, it is possible to achieve uniform and correct indentation measurements, even when multiple workers perform multiple measurements at multiple sites and on various devices. By using a dipstick, measurement deviations, variable measurement errors, and personal error rates can be determined. The dipstick can be used to train measurements as well as to test work and to select suitable personnel. The gauge is characterized in that it is usually provided on one of its plurality of groups of indentations of the same size in each group but of different sizes in the individual groups whose dimensions are known. The gauge is designed for workplaces dealing with hardness testing and corporate, state or international hardness metrology.

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Country Link
CS (1) CS211009B1 (en)

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