CS194262B1 - Method of testing the semiconductor tensometer - Google Patents

Method of testing the semiconductor tensometer

Info

Publication number
CS194262B1
CS194262B1 CS15073A CS15073A CS194262B1 CS 194262 B1 CS194262 B1 CS 194262B1 CS 15073 A CS15073 A CS 15073A CS 15073 A CS15073 A CS 15073A CS 194262 B1 CS194262 B1 CS 194262B1
Authority
CS
Czechoslovakia
Prior art keywords
tensometer
testing
semiconductor
semiconductor tensometer
Prior art date
Application number
CS15073A
Other languages
English (en)
Inventor
Jiri Cernohorsky
Zdenek Havlicek
Oldrich Straka
Original Assignee
Jiri Cernohorsky
Zdenek Havlicek
Oldrich Straka
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiri Cernohorsky, Zdenek Havlicek, Oldrich Straka filed Critical Jiri Cernohorsky
Priority to CS15073A priority Critical patent/CS194262B1/cs
Publication of CS194262B1 publication Critical patent/CS194262B1/cs

Links

CS15073A 1973-01-08 1973-01-08 Method of testing the semiconductor tensometer CS194262B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CS15073A CS194262B1 (en) 1973-01-08 1973-01-08 Method of testing the semiconductor tensometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS15073A CS194262B1 (en) 1973-01-08 1973-01-08 Method of testing the semiconductor tensometer

Publications (1)

Publication Number Publication Date
CS194262B1 true CS194262B1 (en) 1979-12-31

Family

ID=5333152

Family Applications (1)

Application Number Title Priority Date Filing Date
CS15073A CS194262B1 (en) 1973-01-08 1973-01-08 Method of testing the semiconductor tensometer

Country Status (1)

Country Link
CS (1) CS194262B1 (cs)

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