CS188542B1 - Facility for measuring the conductivity of the semiconductive transparent layers - Google Patents

Facility for measuring the conductivity of the semiconductive transparent layers

Info

Publication number
CS188542B1
CS188542B1 CS687076A CS687076A CS188542B1 CS 188542 B1 CS188542 B1 CS 188542B1 CS 687076 A CS687076 A CS 687076A CS 687076 A CS687076 A CS 687076A CS 188542 B1 CS188542 B1 CS 188542B1
Authority
CS
Czechoslovakia
Prior art keywords
facility
conductivity
measuring
transparent layers
semiconductive
Prior art date
Application number
CS687076A
Other languages
English (en)
Inventor
Jan Jandus
Tomas Zelenka
Original Assignee
Jan Jandus
Tomas Zelenka
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jan Jandus, Tomas Zelenka filed Critical Jan Jandus
Priority to CS687076A priority Critical patent/CS188542B1/cs
Publication of CS188542B1 publication Critical patent/CS188542B1/cs

Links

CS687076A 1976-10-26 1976-10-26 Facility for measuring the conductivity of the semiconductive transparent layers CS188542B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CS687076A CS188542B1 (en) 1976-10-26 1976-10-26 Facility for measuring the conductivity of the semiconductive transparent layers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS687076A CS188542B1 (en) 1976-10-26 1976-10-26 Facility for measuring the conductivity of the semiconductive transparent layers

Publications (1)

Publication Number Publication Date
CS188542B1 true CS188542B1 (en) 1979-03-30

Family

ID=5416712

Family Applications (1)

Application Number Title Priority Date Filing Date
CS687076A CS188542B1 (en) 1976-10-26 1976-10-26 Facility for measuring the conductivity of the semiconductive transparent layers

Country Status (1)

Country Link
CS (1) CS188542B1 (cs)

Similar Documents

Publication Publication Date Title
AU505346B2 (en) Measuring atleast one dimension ofan object
JPS5348387A (en) Device for measuring encephalothlipsis
JPS52132855A (en) Measuring member used together with its cover
JPS52137375A (en) Measuring apparatus
JPS52113767A (en) Measuring device
JPS5382496A (en) Measuring apparatus
JPS52123648A (en) Thickness measuring device
JPS5383657A (en) Measuring apparatus
AU503039B2 (en) Measuring device
JPS52137383A (en) Current measuring device
JPS5358268A (en) Distance measuring theodlite
JPS5337094A (en) Electroochemical measuring apparatus
JPS5339772A (en) Multiple measuring apparatus
JPS538133A (en) Film length indicator
CS188542B1 (en) Facility for measuring the conductivity of the semiconductive transparent layers
JPS52131753A (en) Measuring device
JPS5316674A (en) Device for measuring nap
JPS5357884A (en) Measuring apparatus within visible range
SU617690A1 (ru) Устройство дл измерени температуры
SU603857A1 (ru) Устройство дл измерени температуры
JPS5368159A (en) Measuring device
JPS5292752A (en) Load measuring apparatus
GB1542833A (en) Measuring arrangements
JPS5342073A (en) Measuring device for deposite layer
JPS5332079A (en) Film measuring apparatus