CS186165B1 - Scanner for the tensile test at the low temperature - Google Patents

Scanner for the tensile test at the low temperature

Info

Publication number
CS186165B1
CS186165B1 CS210477A CS210477A CS186165B1 CS 186165 B1 CS186165 B1 CS 186165B1 CS 210477 A CS210477 A CS 210477A CS 210477 A CS210477 A CS 210477A CS 186165 B1 CS186165 B1 CS 186165B1
Authority
CS
Czechoslovakia
Prior art keywords
scanner
low temperature
tensile test
tensile
test
Prior art date
Application number
CS210477A
Other languages
English (en)
Inventor
Michal Popelis
Eduard Javorsky
Original Assignee
Michal Popelis
Eduard Javorsky
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Michal Popelis, Eduard Javorsky filed Critical Michal Popelis
Priority to CS210477A priority Critical patent/CS186165B1/cs
Publication of CS186165B1 publication Critical patent/CS186165B1/cs

Links

CS210477A 1977-03-30 1977-03-30 Scanner for the tensile test at the low temperature CS186165B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CS210477A CS186165B1 (en) 1977-03-30 1977-03-30 Scanner for the tensile test at the low temperature

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS210477A CS186165B1 (en) 1977-03-30 1977-03-30 Scanner for the tensile test at the low temperature

Publications (1)

Publication Number Publication Date
CS186165B1 true CS186165B1 (en) 1978-11-30

Family

ID=5357181

Family Applications (1)

Application Number Title Priority Date Filing Date
CS210477A CS186165B1 (en) 1977-03-30 1977-03-30 Scanner for the tensile test at the low temperature

Country Status (1)

Country Link
CS (1) CS186165B1 (cs)

Similar Documents

Publication Publication Date Title
JPS53139397A (en) Viginal probe
JPS5443089A (en) Xxray tester
GB1550073A (en) Optical probe
JPS53138396A (en) Testing system
JPS55134579A (en) Inspecting device
JPS5557860A (en) Followwup monitor for copier
JPS52147075A (en) Multiple region probe
GB2041035B (en) Well testing
JPS5696221A (en) Probe
JPS5647654A (en) Tester
JPS5396878A (en) Multifunction tester
JPS5414288A (en) Temperature monitor
ZA803473B (en) Diagnostic test
JPS53105382A (en) Tester
JPS53143974A (en) Inspecting device
JPS542690A (en) Scanning xxray inspecting device
JPS55122539A (en) Xxray inspecting device
RO76218A (ro) Procedeu pentru obtinerea orzului prajit nemaltificat
ZA784127B (en) Temperature measurement system
JPS5476175A (en) Parts tester
JPS5473278A (en) Tester
JPS5487555A (en) Inspection device
JPS5490881A (en) Probe scanner
CS186165B1 (en) Scanner for the tensile test at the low temperature
CH627613GA3 (en) Device for showing the time