CS181509B1 - Microwave dielectric aerial system for polarised plane rotation,concentration mobility and other semiconductor parameters measuring
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Microwave dielectric aerial system for polarised plane rotation,concentration mobility and other semiconductor parameters measuring
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Application filed by Antonin Buerger, Jaroslav Karlovsky, Jindrich Musil, Frantisek ZacekfiledCriticalAntonin Buerger
Priority to CS846775ApriorityCriticalpatent/CS181509B1/cs
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CS846775A1975-12-121975-12-12Microwave dielectric aerial system for polarised plane rotation,concentration mobility and other semiconductor parameters measuring
CS181509B1
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