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Application filed by Zdenek Fikar, Miroslav JahodafiledCriticalZdenek Fikar
Priority to CS85475ApriorityCriticalpatent/CS181410B1/cs
Publication of CS181410B1publicationCriticalpatent/CS181410B1/cs
CS85475A1975-02-111975-02-11Method of analysis multilayer colour photographic or film materials,or prints by means of succesive measuring of
CS181410B1
(en)