CN86100541A - The method for designing of a kind of yarn clearer and yarn flaw instrument - Google Patents

Abstract

The invention discloses the method for designing of a kind of electronic yarn clearer and classimat, be characterized in that each ingot replaces the setting level V of all sample sliver average boldness ₁, produce alone by each ingot, and follow each ingot detection sensitivity K variation synchronously; Provide sliver fragment average boldness with continuous sufficient length replace all sliver average boldness corresponding to the level of detection sensitivity as the method for setting level, and derive the theory setting precision of two kinds of sensing forms; Proposed from the final electric signal V that meets V=KS of each ingot, directly to obtain the method for V1 with integrating circuit, and provided 2 embodiment according to slow test theory.

Description

The method for designing of auxiliary electronic equipment electronic yarn clearer and detecting instrument classimat the present invention relates to weave.

Present yarn clearer model is a lot, can be divided into photo-electric and condenser type two big classifications by its sensing form.The purpose of yarn clearer is that the rugosity of yarn defect and length are made accurate judgement and processing, and wherein the discrimination precision to yarn defect rugosity is the main precision basis of yarn clearer, and is particularly important.For this point, existing various yarn clearer has something in common on method for designing, and becomes the principle of design that observe jointly in this field, and these can be summarized as follows:

(1) no matter adopt which kind of method to obtain and replace all yarn sample sliver average cross section rugosity X(supposition quality characterizations) level, prior art all provides a definite yarn defect rugosity by control box according to this reference level and sets level, and unified each ingot that gives detects amplifying unit;

(2) prior art is emphasized each ingot to detect the sensitivity of amplifying unit highly adjustment is in the design code value, and high-quality yarn clearer must guarantee that the sensitivity long-term stability is constant.

Existing yarn clearer is because the difference that obtains the level means that replace X in (1), and each the ingot detection sensitivity in (2) has formed the main quality discrepancy of various yarn clearer owing to from the having or not of conditioning function, what and the strong and weak long-time stability difference that shows.

According to interrelated data and individual practice, think that prior art need do further discussion.Existing analysis-by-synthesis is as follows:

Sliver is by the detection head of each ingot detection amplifying unit, and the cross section rugosity physical message linearity of sliver is transformed into continuous initial electrical signal.When adopting the capacitive sensing mode, initial electrical signal has reflected that the line density of sliver length direction changes, and corresponding to the electric signal of sliver each point, can be understood as the cross section rugosity that characterizes this point of sliver with quality (being cross section point unit weight); When adopting the photo-electric sensing, initial electrical signal has reflected that each point on the sliver length direction directly changes over against the yarn of projecting direction, can be understood as the cross section rugosity that characterizes sliver with the diameter projected of sliver.The amplitude of initial electrical signal is except the cross section rugosity of linearity reflection sliver, be limited by all influence factors of whole detection system, also be limited by other comparatively stable physical factor of sliver, each ingot influenced composite factors such as difference as water capacity, material value, colourity, twist, number variation and environment.Practice shows: owing to detect inconsistent (capacitance sensing) of electric capacity technological parameter, perhaps inconsistent (photoelectric sensing) of photoelectric device conversion efficiency, and each ingot detection head difference affected by environment, each ingot is all inequality to the amplitude of the initial electrical signal of same sample rugosity conversion, in long-time running, owing to detect the capacity variation of electric capacity or the variation of electrooptical device conversion efficiency, and more than other comparatively slow variation of ballast of the total system enumerated, the initial electrical signal of a certain definite sample is variation thereupon also, because initial electrical signal is too little, can not directly be used for " measurement ", generally after obtaining initial electrical signal, a follow-up amplifier is perhaps got it and all or is only got yarn defect increment signal, and they are zoomed into can be for the final electric signal V that measures.As V is shown in the longitudinal axis, sliver section S or yarn defect increment rugosity △ S are shown in transverse axis, make the Fig. 1-1 among Fig. 1.So, a V correspondence of determining must be arranged when sliver has definite rugosity, form the conversion diagram of sliver rugosity with final electric signal.In general, these two kinds of sensing forms of the photo-electric of prior art or condenser type can both guarantee the linearity of this curve under certain conditions, and this is the basis that the detection system of two kinds of sensing forms is rely and existed.Therefore, regard it as straight line, the slope of this straight line can be expressed as the sensitivity that certain ingot of yarn clearer is carved at a time so so long.

Yarn defect rugosity set to be what the multiplying power with the average boldness of all sample slivers characterized, therefore represent the level of all sliver average boldness X to constitute the precision reference that whole yarn clearer designs, no matter represent the level of X how to obtain, its intension all should be that the sliver of X rugosity is corresponding to the final electrical signal amplitude value of a certain sensitivity.If the level V1 with X is shown in the longitudinal axis, be slopes different among Fig. 1-1 from the initial point straight line with the sensitivity K(of detection system) be shown in transverse axis, can make the Fig. 1-5 among Fig. 1.Straight yarn C has promptly shown the corresponding relation of V1 with K among the figure.Be not difficult to find out that for a certain definite sample, C has definite slope, but but be difficult to try to achieve with testing for the slope of the C of a certain definite sample.Because its condition precedent must be the stable of sensitivity, if detection system equipment itself has sufficient stability, because final electrical signal amplitude is not merely to be decided by the sliver rugosity, the physical factor that other of sliver influences sensitivity is a lot, and because of sliver source different, same even sample is also variant in these factors of different length sections, therefore in fact strict, strict restriction must be given to other physical state of sliver, the slope of C straight line among Fig. 1-5 could be made according to the sliver rugosity.Prior art has been predesignated the sensitivity of yarn clearer, on behalf of respective samples straight line C, various yarn clearer from Fig. 1-5 find level corresponding to this sensitivity by respectively identifying oneself rational and suitable way, forms the yarn defect as benchmark according to technological requirement and sets level.The overwhelming majority of existing yarn clearer adopts this form work, this class yarn clearer the time just stipulated all samples all with same sensitivity work in design, in Fig. 1-1 is exactly to have laid down hard and fast rule that this has just produced an adjustment link to straight line (might as well establish be α) for the standard of each ingot sensitivity initial adjustment of yarn clearer and tracking.

Facts have proved that the adjustment of yarn clearer sensitivity always is a weak link, can obtain by the gain adjustment of initial electrical signal follow up amplifier in principle.But, owing to can not find the analogies of the complete equivalence of tested sample X, the very difficulty of harmonizing exactly.Therefore the unanimity of many ingots sensitivity also can only satisfy limitedly, so each ingot of the yarn clearer of actual motion, its sensitivity can not all coincide with the straight line a among Fig. 1-1, presents certain discreteness.As represent maximum discrete boundary with b, c, each ingot sensitivity will be a branch of straight line of dispersing from initial point in b, c two linear extent so.In long-time running, for lacking from conditioning function or from the more weak yarn clearer of conditioning function, this discreteness has further been enlarged.Facts have proved: the sensitivity of photo-electric sensing as a curve that Fig. 1-4 medium sensitivity descends, causes leakage defect mostly, and capacitive sensing is then as b, and the cut-in without ball, the mistake that cause sensitivity to tend towards superiority are cut.It is this because sensitivity departs from the error of bringing, can be referred to as to detect error, its essence is not enough with sensitivity adjustment precision, and the error that each ingot sensitivity consistance difference is introduced is the same, can obtain expressing in Fig. 1-5: we regard the sensitivity of certain ingot reality as corresponding to the C level should give level, and design code sensitivity is regarded the actual level that gives as corresponding to the C level.Therefore, the detection error that the sensitivity variation is introduced its essence is that should give level just exists because of sensitivity is difficult to harmonize at the very start with the actual difference that gives level, and has further been enlarged in long-time running.Rudimentary yarn clearer can only not rely on regular tracking owing to not possessing from conditioning function, and senior yarn clearer then must have sensitivity from conditioning function.Because mandatory requirement sensitivity is stable, can only give deacclimatizing because machine system, sliver influence the change of sensitivity that factors such as the factor of sensitivity and environment cause except other of rugosity of circuit from conditioning function.But, the factor all too that influences detection sensitivity is many, a kind of circuit can only solve one to several influence factors from conditioning function, some yarn clearers are forced to take multiple self-regulated functional circuit, in the hope of the bigger factor of influence as much as possible being made the self-regulated reaction, more have some yarn clearers to consider that yarn clearer sensitivity difficulty gives adjustment, according to factors such as sliver number select the level of X be difficult to guarantee enough precision give circuit stronger from conditioning function.These measures have improved the performance of yarn clearer, obtained technological effect preferably, but, fundamentally all solve all influence factors and still have gap, this merely from the way of circuit self-regulated function-stable sensitivity still symbolic animal of the birth year to stable, removing the detection error of introducing therefrom also can only be satisfied relatively, its another very difficult gratifying problem of bringing is: circuit is increasingly sophisticated, failure rate will increase therefore and inevitably, to such an extent as to influence reliability, former device is selected harsh more, cost is forced to improve, for the user, in order to obtain the better manufacturability energy, have to pay high economic cost and bear the pressure of technical difficulty greatly, increased difficult management.

Provide a yarn defect rugosity with design angle and set level, introduced bigger specification error, this is another defective of prior art.As everyone knows, the X of all sample slivers belongs to the position feature number in the statistics, is certain existence and unknowable in advance amount, sets level for yarn defect rugosity according to limited several conditions by machine, and its intension is in advance with an amount replacement X.Ignored the permissible variation of sample actual number wholly or in part, and sample is converted to difference on the electric weight in the difference of aspects such as water capacity, material value, colourity, twist in physical quantity, introduced specification error with public title number.Please see Figure the Fig. 1-2 in 1, V1 is shown in the longitudinal axis with setting voltage, t is shown in transverse axis with the time, represent the level of X with C corresponding to design sensitivity, so according to fixed actual level that gives of Several Factors such as the public title numbers of sliver, count sliver when topped at all number, it sets level within two straight line aa' scopes, aa' promptly is a specification error with the gap of C, it is not only different because of number number of yarn, and the gear shaper without theoretical derived value, the experimental precision that can only rely on this setting value to obtain, in general, error is bigger, ask for the yarn clearer of sliver average boldness for those by actual measurement, its effect is much better, because the intension of actual measurement is to ask for one of sliver to produce the level of the corresponding a certain sensitivity of rugosity mean value Xi of stator segment length really at random.But the rugosity of sliver is the random occurrence of a normal distribution in the longitudinal direction.Degree of confidence in normal distribution is 99% o'clock, Xi is distributed in X ± 36 zones, an optional Xi is difficult to guarantee enough precision, some yarn clearers select for use the actual measurement number of several ingots to average, often can only become additional that the sensitivity consistance can not enough guarantee, can not offer help the raising of setting accuracy owing to each ingot sensitivity difference.In Fig. 1-2, can represent precision with bb' straight line restricted portion.

Therefore, for those not or yarn clearer with more weak self-regulated ability, the detection error that specification error is introduced with the sensitivity variation can be used Fig. 1-3 clear expression, C represents the level of X correspondence under the sensitivity of design code among the figure, b represents the actual setting level that gives, a is illustrated in the setting level that the actual needs under the constant situation is stablized in sensitivity, actual needs level when a' represents change of sensitivity (decline), therefore detecting error has constituted total error together with specification error, and its intension remains the precision problem that actual needs brings with the actual setting level difference value that gives.

Have strongly from conditioning function for those other, make the yarn clearer of the same setting level of X tool of the sample of any yarn number, Fig. 1-5 can not summarize it, C no longer is the straight line from the fixed slope of initial point, but straight line that is parallel to K, in Fig. 1-1, the design slope of a will be with different test piece number (Test pc No.) numbers difference, this is the difference place.But, this yarn clearer detects for many ingots, still there is strict adjustment link of initial stage, remain the unified fixing yarn defect that send and set level to each ingot, it is constant that each ingot still requires sensitivity to stablize to a certain long-time running of determining number number sample, and 2 principle of design of the method for designing of therefore existing yarn clearer are still suitable.Specification error and the detection error introduced for the detection of yarn defect rugosity have had improvement, but above analysis is also still set up.

In sum, wherein comparatively rudimentary according to the yarn clearer of existing yarn clearer method for designing design, owing to do not have or only have very weakly, introduced bigger specification error and detected error from conditioning function, can not obtain higher shop characteristic; Wherein comparatively senior, because the restriction of this method for designing can only suppress to detect error from giving of conditioning function from circuit, cause circuit increasingly sophisticated, the user pays high economic cost and bears heavy technostress for it.Simultaneously, how prior art obtains on the setting level of X and does not all demonstrate fully the characteristics that X is a statistics position feature number.Setting accuracy is mainly based on experimental precision, so precision remains further to be improved.Because specification error can not be satisfied with, circuit can only weaken the survey error relatively again from conditioning function, therefore, yet there are no a family and provide theoretic design accuracy from the detection resultnat accuracy of yarn defect rugosity.The source of this problem is this method for designing itself.

The prime of classimat is actually the design of a yarn clearer, and existing yarn flaw instrument depends on the yarn clearer of a certain model mostly.Therefore the precision of classimat can not surpass the precision that the yarn clearer prior art can reach.The back level partial circuit of classimat is in the accuracy of detection that further improves yarn defect length, fall end cost and reduce aspect the circuit difficulty that also much remains to be done.

The objective of the invention is to create the method for designing of a new yarn clearer and classimat, this method is in the measurement to yarn defect rugosity, the variation of sensitivity completely adaptation function with NOT-circuit, the detection error that no longer exists the sensitivity variation to introduce, improved accuracy of detection, provided a great convenience to circuit design simultaneously, use low level circuitry technology is provided, the lower grade element obtains the high-quality yarn clearer and the possibility of classimat.

Method for designing provided by the invention can be described like this:

No matter be to adopt photo-electric or condenser type detection means, the detection amplifying unit of each ingot, the rugosity S or the yarn defect increment rugosity △ S conversion of each point zoom into final electric signal V in the longitudinal direction the sample sliver by detection head, make V satisfy expression formula V=KS or V=K △ S, K changes the coefficient that zooms into final electric signal V for the rugosity S or the yarn defect increment rugosity △ S of the sliver length direction each point of certain ingot in the formula, be used for characterizing this ingot and detect amplifying unit in sensitivity in a certain definite moment, allow the K value of each ingot unequal mutually, allow the K value of a certain ingot in long-time running, to morph, the variation range of K value satisfies the usefulness of circuit measuring with the amplitude of final electric signal V, each ingot independently produces the setting level V1 that replaces all sliver average boldness S' simultaneously, make V1=KS', with reference to national standard or technological requirement, and the circuit formula of selecting makes the satisfied expression formula of V, the appropriate selection gained, each ingot is benchmark according to the multiplication principle with separately V1, set up one or one group of yarn defect setting level with the same gain of selecting, carry out level ratio with final electric signal V, finish the differentiation or the state description of yarn defect rugosity, simultaneously the computational length of yarn defect (when the rugosity that adopts the yarn defect and length product surpass the circuit formula of stipulating promptly to be excised) or physical length (according to the regulation of the yarn defect effective length of national standard the time) are converted to the pulse of equivalent length, and then finish the differentiation or the state description of yarn defect length.

The key of this method for designing all sliver average boldness that is how to get a replacement are followed the setting level V1 that sensitivity K changes automatically, an alternative plan is with the sliver average boldness S that determines fragment length " replace; the corresponding V1=KS that changes into of the expression formula of V1 ", in photoelectric type yarn clearer; S " characterize with diameter d i, condenser type then characterizes with Xi, directly separating V1 with integrating circuit from the final electric signal of each ingot is quite effective and simple way, therefore a practical embodiment carrying out method provided by the invention is: from the final electric signal V that satisfies V=KS that each ingot obtains, select the integrating circuit of appropriate time constant according to the requirement of yarn speed and precision, isolate the V1 of the average boldness of continuous measured length fragment sliver really separately corresponding to each ingot sensitivity K, with V1 is benchmark, according to corresponding requirements, set up the yarn defect separately and set level, with the whole of final electric signal V or only get yarn defect increment signal and compare, finish the differentiation of yarn defect rugosity and the conversion of length, finally make suitable processing.

The principal feature of this method for designing can obtain from Fig. 1-5 explaining that the front said that Fig. 1-5 cathetus C represented all sliver average boldness, the level that should give for a certain sample according to different sensitivity.Different samples, C will present different slopes.If put aside the specification error that this method for designing is introduced, so this method for designing shows that the setting level of the actual replacement sliver average boldness that gives follows each ingot detection sensitivity automatically and change and change, and irrelevant with the slope of C straight line.

Irrelevant with the C straight slope, showing needn't be according to unlike material by the yarn clearer of this method for designing, level is set in the restriction of factors such as different numbers, does not have the detection error of introducing because of factors such as numbers, adapts to the sample of various materials such as hair, fiber crops, cotton, chemical fibre and number number automatically.

The variation that replaces the setting level of all sliver average boldness to follow sensitivity automatically shows: satisfy enough linearities as long as the rugosity of sliver converts final electric signal in Fig. 1-1, irrelevant to the accuracy of detection of yarn defect rugosity so with the sensitivity that detects amplification system, from sensitivity variation angle, can think that this is a kind of adaptation function of sensitivity variation of NOT-circuit, be NOT-circuit compensation completely completely, all needn't worry to introduce to all factors that influence change of sensitivity and detect error.Method according to prior art is discussed can be described below in more detail:

1. no longer there is the adjustment link, adapted to the inconsistent of many ingots sensitivity automatically, simplified operational administrative.

2. the self-regulated that the sensitivity variation that no longer needs the stability owing to detection system equipment to cause is carried out is handled.Reduced element spare and selected requirement, simplified main circuit, reduced cost, provided convenience, made the apparatus manager reduce technostress to circuit designers.

3. the sensitivity that no longer need cause at the physical factor (as material value, water capacity, colourity, twist etc.) of sliver sample itself variation and the self-regulated means taked also needn't be taked at present some parameter (as water capacity) not to be met the regulation of prior art and the preprocessing means that must take.

4., can not introduce the detection error to the variation of environment so if the final electric signal of a detection system when environmental impact factor changes, still guarantees in Fig. 1-1 it is the straight line that sends from initial point with the transformational relation of sliver rugosity yet.

This shows, the circuit design of She Ji detection system only need guarantee not have the zero output of yarn input and have the linear transformation of yarn input can satisfy the high-precision test requirement fully according to the method, if environment to the influence of each ingot can guarantee to stablize (not requiring each ingot influence consistent) so circuit design requirement could be lower.

The problem that can also find this method should note when the specific design easily according to Fig. 1-5, the amplitude of the final electric signal of the first is the usefulness of " measurement " enough, therefore sensitivity has a lower limit K1, and it two is because the restriction of power supply organizational system, and sensitivity should have a upper limit K2.They represent then that in Fig. 1-1 no longer be a certain fixedly straight line but between the dotted line b' and the dotted line c' corresponding to K1 corresponding to K2 to its final electric signal of detection system of a variable gain with the transformational relation of S or △ S.In general, K1 and K2 are not too directly perceived, be difficult to use numeral expression, and the rugosity difference of various samples, can " measure " this principle decision lower sensitivity limit and the upper limit (surpass power supply organizational system allow limit also be a kind ofly can not " measure " state), for each sample, then have different K1 and K2.This shows, directly use K1 and K2 explanation also improper the restriction of detection system sensitivity.If we make transverse axis to time t, the V1 of the corresponding a certain moment sensitivity of all sliver average boldness is shown in the longitudinal axis, so detection system in time and change of sensitivity and V1 that actual needs gives is that available curve C is expressed, Here it is Fig. 1-6.Be not difficult to find out that curve C can be free position, represent the V1 of any sample to follow the state of change of sensitivity automatically, at this moment, the V1 maximum level of just corresponding these samples of V2 when sensitivity K2, V3 is then corresponding to K1.Therefore, direct replacement level to all sliver average boldness monitors and promptly can reach the purpose that monitors K1 and K2.Yarn clearer by this method design should provide V3 and V2 numerical value, and this can not ignore.

Owing to there is not the detection error to yarn defect rugosity, yarn clearer is mainly determined by specification error the precision that yarn defect rugosity detects.The specification error of this method will be in company with the form of electric capacity or photoelectric sensing difference; This is because two kinds of sliver rugosity that method for sensing reflected are different signs.Owing to represent the setting level synchronization of sliver average boldness to follow in sensitivity, therefore irrelevant with circuit to the discussion of specification error, enter process discussion fully, promptly with the sliver rugosity mean value Xi(supposition quality characterization of continuous fragments length) the average boldness X of all samples of replacement, when two kinds of sensing forms, whether there is relative average error, how expresses optimal parameter etc.At first, might as well do one relatively with prior art qualitatively.

The yarn clearer of the prior art of the very approaching employing actual measurement of this establishing method sliver rugosity method.The intension of actual measurement sliver rugosity is the sliver average boldness Xi replacement X with a fragment length that produces at random, if fragment length that method for designing provided by the invention is got equates with it, when sensitivity is stablized when constant, the actual level that gives of prior art is the arbitrary straight line in the bb' scope among Fig. 1-2, its overall absolute specification error then is the gap of the corresponding level of b or b' with C, and the setting level that the invention provides method then is to float in company with Xi up and down and be that the curve d on boundary represents with b and b' at C.Though curve d form can't determine that Xi has statistical relationship with X, because Xi is normal distribution, so Xi is as follows at the different adjacent domain probability of happening of X:

68.3% probability: X-σ＜Xi＜X+ σ

27.3% probability: X-2 σ＜Xi＜X-σ and

X+σ＜Xi＜X+2σ

4.1% probability: X-3 σ＜Xi＜X-2 σ and

X+2σ＜Xi＜X+3σ

This just shows: in the testing process of whole samples, being distributed in the most of the time of Xi is all very approaching with X, and it departs from X probability far away seldom, when sensitivity is constant, can not run off among Fig. 1-2 beyond the bb' linear extent.Probability when this establishing method utilizes Xi to be normal distribution takes place mainly to concentrate near these characteristics that position feature is counted X, approaches X with continuous Xi, to solve the difficulty that X is unable to reach, has obtained tangible precision and has improved.Therefore be reflected among Fig. 1-5 and Fig. 1-6 corresponding to the setting level of change of sensitivity with continuous Xi, not fixedly straight line or curve C, but the C upstream and downstream from curve d, the dotted line bb' of Fig. 1-5 and Fig. 1-6 then is that d is on C boundary up and down, bb' is horn-like, then be that this point will hash out below because this establishing method exists average relative error theoretically.

According to " analysis of sliver uniformity coefficient " (the clean work of the Wang Xian of Shanghai textile scientific research institute), during with quality characterization sliver cross section, have following formula to set up:

Average:

X＝（ $\underset{\mathrm{i\; =\; 1}}{\overset{n}{\mathrm{\Σ}}}$ Xi）/n

Mean difference:

H＝（ $\underset{\mathrm{i\; =\; 1}}{\overset{n}{\mathrm{\Σ}}}$ ｜Xi-X｜）/n

The coefficient of average deviation: U=H/X * 100%

Can think: it is exactly H that the basic rugosity that replaces X to make sliver with continuous Xi is set the setting average error of introducing, and as a whole, can regard as with X+H and replaces X, and the average relative error of setting can be expressed like this:

Average relative error: A=(X+H)/X-1

＝U

In the sliver uniformity theory, X, Xi, H are with quality characterization, when adopting capacitive sensing, and the two lucky synonym, so the average specification error relatively of condenser type promptly is the coefficient of average deviation, note is done:

A electric capacity=U (1)

With photo-electric sensing means the time, can not use the quality characterization rugosity, should characterize with the sliver mean diameter.According to the industrial analysis theory in " analysis of sliver uniformity coefficient ", the irregular association nearly of the not even sliver unit weight of sliver diameter, as represent the diameters on certain cross section point in the sliver with d, represent the gravimetric value of this cross section point sliver unit length with W, then the relation of the two is according to actual measurement with the analysis showed that the existence of following relationship: promptly: m is a constant in the W=mda(formula), the numerical value of a is lower than 2 in the formula, and with the different and difference to some extent of the sliver of separate sources and test method.Therefore, suppose that the sliver average boldness quality characterization of fragment length is X+H, characterizing with mean diameter is di; The average boldness quality characterization of supposing all slivers is X, represents it is d ' with average boldness, so:

H+X＝m·di ^a

X＝m·d′ ^a

When using photoelectric sensing, average specification error relatively should be:

A photoelectricity=di/d-1

So A photoelectricity= $\sqrt[a]{1+U}-1$ (2)

The average A photoelectricity of specification error relatively of expression, (1) formula of A electric capacity and (2) formula show that all this is the amount with the U direct relation.The U value can directly be found on the P12 figure from " analysis of sliver uniformity coefficient ".This be one for the carded sliver of the combing sliver of average level and average level CB(L according to the different Xi correspondence of fragment length) (outer irregularity) or U value curve, appendix of the present invention in after, see Fig. 6.Be not difficult to find out that fragment length is long more, the U value is more little.But after fragment length surpassed 30 meters, curve was quite smooth, and U value changes little, did not spin 30 meters of supposition and be the long segment length of the design's method.Because CB(L) or U value curve irregular and insensitive to the cycle of sliver, irregular its fragment length of cycle main in the sliver is many again in 1 meter, whether therefore this chart can be used as the basis that this method for designing is selected fragment length, and need not to cause specification error to be difficult the control confusing for the sliver cycle is irregular.According to calculating simply, the minimum length of fragment length is chosen as 5 meters and does not cause the precision forfeiture too much.Method for designing therefore provided by the invention recommends to select for use 5 meters average boldness Xi to 30 meters fragment length slivers to replace X.According to simple computation, carded yarn sliver for the average level, when using capacitance sensing, its average specification error is between 3.6% to 2.9%, with the photo-electric sensing time, the a that does not spin in supposition (2) formula is 2, can not introduce appreciable error, and its average specification error is so: between 1.8% to 1.4%; For average combed cotton yarn, when using capacitance sensing, its average specification error relatively is between 2.4% to 1.8%, and with the photo-electric sensing time, its average specification error relatively is between 1.2% to 1%.For the sliver of higher level, then precision is higher.The highest theoretical precision value that the design's method of can thinking that Here it is is differentiated for the yarn defect rugosity of two kinds of sensing forms.

Each ingot detects amplifying unit is isolated the sliver average boldness Xi correspondence of a definite fragment length continuously from final electric signal level, and a kind of effective technical means is: connect a long-pending circuit after final electric signal.This so-called slow test.Relevant slow test theory is pointed out in " analysis of sliver uniformity coefficient ": use slow test introduces integrating circuit in circuit after, its essence is that the changes of section to sliver plays the equalization process, therefore the continuous voltage that is obtained promptly is to determine that the sliver average boldness Xi of fragment length is corresponding to certain sensitivity level.This level servo-actuated is in Xi, and also servo-actuated is in the detection sensitivity of this ingot.Its fragment length can be obtained by following formula, promptly has:

L＝n·V'·T

N is 2-3 in the formula, and T is the integrating circuit time constant, and V' is a sliver sample speed.Make that V' is 600 meters/minute, so when fragment length is 5 to 30 meters, T is 0.3 second to 1.6 seconds, and the variable effect of obvious yarn speed changes suitably selection T to fragment length according to yarn speed, can make fragment length be not less than 5 meters, according to above analysis as can be seen, need only fragment length greater than 5 meters, the rugosity setting accuracy of yarn clearer has just had enough assurances, be not difficult to find out accurately also not strict to components and parts nominal numerical value in the integrating circuit.

Obtain after the level that replaces X at each ingot, set up independently yarn defect setting voltage of each ingot,, also can directly select, can handle flexibly by each ingot by waver because the gain coefficient unanimity can be unified to make control by the control box master with multiplication rule.

In adjunction after the slow hookup, the final electric signal of sliver each point rugosity conversion is followed the change of sensitivity curve a of Fig. 1-7 synchronously, the basic rugosity of sliver is set level synchronization and is followed curve b, curve a, it is just the same that the b form can be thought, △ t time of curve b delay curve a, it is the nT time, several approximately seconds, here proposed 2 problems: the first has proposed to detect the stability requirement of amplification system sensitivity, promptly should be little to negligible degree in the variation of nT time sensitivity, in general, do not have the yarn clearer of circuit sensitivity from conditioning function for Fig. 1-4 and this expression of Fig. 1-7, sensitivity within a couple of days so that the more longer time do not have significant change, can ignore the time inertia of nT fully, and think absolute coincidence.Second problem is nt after sliver is gone into groove in the time, and the foundation of setting voltage is not finished as yet, and after sliver went out groove, the setting voltage disappearance of also need delaying time should give relative measures when line design.Should also be noted that to prevent that sneaking into of the two yarns of overlength from forming false Xi signal, cause the detection error, can prevent by strengthening the design of the operational responsibility heart or specialized circuitry for the two yarns that drop into because of gauze connector; Sneak into for two yarns midway, yarn clearer might as well be designed to have the difunctional yarn clearer of two yarn distinguishing abilities.

Investigate the precision that a yarn clearer is differentiated the yarn defect, yes the rugosity of yarn defect and the discriminating precision of length, because the conversion of yarn defect length directly is limited by the precision of yarn defect rugosity, so the discriminating precision of yarn defect rugosity, particularly important.In the prior art,, compare with the detection error that sensitivity variation causes though specification error is bigger, then much smaller, so prior art tolerated specification error, goes to reduce to detect error by the circuit self-regulated of complexity.The detection error that method for designing provided by the invention does not exist sensitivity variation to introduce makes people can seek to replace the establishing method of the setting level of all sliver mean value further, makes specification error littler, and technological effect is better.A kind of setting means that meet the design's method that the present invention proposes, promptly go to replace the average boldness of all slivers can obtain such effect with the fragment sliver average boldness of a continuous sufficient length, promptly, any quarter, any ingot, for the detection of any material and number number sample, the discrimination precision of yarn defect rugosity has been reached enough little approved degree by the yarn clearer of this method design.Owing to obtained the higher overall precision of yarn clearer, obtained technological effect preferably.

Carry out the design, obvious of classimat according to such method for designing, the rugosity of yarn defect is differentiated and must be significantly improved.

The present invention provides 2 embodiment according to this method for designing, and the first has identification function yarn clearer design proposal to two yarns, and it two is classimat design proposals.The latter provides a new circuit design also to the raising of yarn defect length discrimination precision.

These two design proposals all require environment stable to the influence of each ingot, representing the setting level restriction of sliver X is between 0.75 volt to 2.1 volts, the test side that can indicate the DC symbol in respective design is directly checked each ingot, the integrating circuit T that does slow test is 1 second, under the yarn speed of 600 meters of per minutes, fragment length is 15 meters.600 meters of the yarn speed regulation per minutes of classimat.Yarn clearer has yarn speed to select potentiometer, and yarn defect rugosity is set and independently controlled by each ingot waver respectively, the unified yarn defect length setting that gives.Two designs must be checked from DC, guarantee the zero output when not having yarn goes into groove.

Embodiment 1: difunctional yarn clearer design proposal.

Provide drawing that Fig. 2, Fig. 3, Fig. 4 and Fig. 5 are arranged.The power unit drawing omits in the control box.

Produce light modulating signal SO and restituted signal S1 by Fig. 4, SO signal 50KC, pulsewidth 5 μ S, the positive and negative 12V of peak-to-peak value, S1 signal 50KC, pulsewidth 1 μ S, the positive 12V of peak-to-peak value.Among Fig. 4, IC1 IC2 and accessory circuit form the multivibrator of 500K, produce 1 μ S pulsewidth time clock.Form 2 tunnel pulses that logical circuit produces 1 μ S and 5 μ S pulsewidths by two four bit shift register of C423, cycle 50KC finally forms S0 and S1.

S0 gives the T3 of Fig. 2, makes to obtain alternating voltage waveform by infraluminescence pipe T2 modulated luminescence on silicon photocell T4, because C6 and W2, voltage waveform presents the triangular wave shape, and IC1 exchanges amplification, obtains the pulsation alternating voltage on R10.T5, C10 and T6 constitute sampling hold circuit.The S1 restituted signal of S1 termination Fig. 4 of Fig. 2 suitably transfers mirror W2 to make crest voltage on the R10 over against the peak value of S1, thus obtain on the R14 alternating voltage on the R10 on the occasion of envelope voltage.This voltage is delivered to the end of oppisite phase of IC2, and it is 1 subtracter that IC2 is connected into coefficient, suitably adjusts W4, and the A end is output as zero when making no yarn operation.

Yarn when operation arranged, and last acquisitions of R14 voltage is less, the A end obtain one pulse on the occasion of voltage, be equivalent to no yarn move anti-phase linear transformation sliver rugosity voltage of the voltage superposition that obtains.

Suitably adjust W1 and W3, when no yarn moved, making on the R14 was 9 volts of level.Yarn when operation arranged, and when making than the rove bar, the A terminal voltage is no more than 2.1 volts, and carefully during the rugosity sliver, the A terminal voltage is not less than 0.75 volt.

Press button T, the T2 luminous quantity is fallen sharply, be equivalent to occur a big yarn defect, can be in sliver check in service until the subsequent conditioning circuit of cutting knife operate as normal whether.

The A of Fig. 3, B, C end join with the corresponding symbol of Fig. 2 respectively, and the S end joins with Fig. 5 corresponding end, and the circuit of Fig. 5 is placed in the control box, produce yarn defect length setting signal, give each ingot from the S end and detect amplifying unit.Now Fig. 3 is explained as follows: A end is sent final electric signal one tunnel forms 15 meters length fragments (establishing 600 meters/minute of yarn speed) through the integrating circuit of R1C1 sliver average boldness here to should the ingot sensitivity level, forms to replace the setting level of X to send respectively in IC2 and IC1.IC1, IC2 are in-phase amplifier, and the output terminal of IC1 forms yarn defect rugosity setting voltage, directly selects suitable class by waver according to arts demand.Represent the mode of yarn defect setting voltage according to common with increment, providing increment to be respectively 0.68 times, 1 times, 1.3 times, 1.6 times and 1.9 times among the figure, can expand as required to the setting voltage of basic rugosity.IC2 forms two yarn setting voltages of 1.41 times of main yarn diameters.The output terminal of IC1IC2 send respectively in the end of oppisite phase of voltage comparator ic 3 and IC4.Another road of final electric signal of A end constitutes the in-phase end that the filoplume signal filter circuit is sent to IC3 and IC4 respectively through R2C2 and R3C3, therefore when fault voltage in the sliver surpasses setting voltage, the length that surpasses of yarn defect has been formed the square-wave pulse that equal length, amplitude are equal to supply voltage, integrating circuit by W3 and C4, become certain level to give the end of oppisite phase of comparer IC5 the square wave length transition, when this voltage is held the setting level of sending here above S, low level zero appears in IC5, cause the work of follow-up cutting knife monostable circuit, excision yarn defect.The IC6 situation is similar with it, excision yarn defect.The output terminal of IC2 is given the in-phase end of IC7 simultaneously.IC7 anti-phase is added with 1 volt of bias voltage, and after yarn was gone into groove, because the output voltage of IC2 is greater than 1 volt, IC7 sent noble potential.C5 voltage slowly rises and gives the in-phase end of comparer IC8.When this voltage was lower than the anti-phase input setting voltage of IC8 or yarn and does not go into groove, low level zero appearred in IC8, and the output voltage of unit clamper C4 and C6 makes the output terminal of IC5, IC6 keep a high position, the cutting knife line-down thus.Suitably adjust W5, postpone about 2.5 seconds time after can making sliver go into groove.After surpassing this time, IC8 changes into high signal, because the effect of T3 and T4 is no longer worked to C4 and C6, recovers the detection of sliver fault.

W1 sets usefulness for adjusting among Fig. 5, and W2 is that yarn speed is selected usefulness, and K switch is that yarn defect length setting is selected.

The DC end can be made the socket form for 15 meters fragment lengths of sliver (during 600 meters/dividing sinker speed) cross section average boldness level detecting end.

Embodiment 2: the classimat design proposal

This grading instrument design is photoelectric sensing six ingot instruments.

The actual drawing that provides has Fig. 2, Fig. 4, Fig. 7, Fig. 8, Fig. 9, Figure 10, Figure 11, Figure 12, Figure 13, Figure 14, Figure 15 and Figure 16.The circuit of power unit and fluorescent tube display part omits.Wherein Fig. 2, Fig. 7, Fig. 8, Fig. 9 and Figure 14 are the due circuit of every ingot, now are explained as follows:

The effect of Fig. 2, Fig. 4 has been described in embodiment 1, has obtained to deliver to Fig. 7 behind the final electric signal from the A end.Existing key drawing 7.The A of Fig. 7, B, C join with the respective end of Fig. 2, the final electric signal of each ingot has been obtained the replacement level of sliver average boldness X by the R1C1 integrating circuit, this level is given IC1, it is that 5 homophase amplifies output that accurate adjustment by W2 obtains gain, has formed one group of accurate yarn defect level setting value and be sent to in-phase end or the end of oppisite phase of IC4 up to the voltage comparator of IC13 in the resistor network that R15 to R25 and W10 form.This group is set the adjustment parameter of level and directly the form that all final electric signal is delivered to another input end of comparer through the filtering circuit (R2C2R3C3 circuit) that removes the filoplume influence is decided according to standard GB 4145-84 yarn defect grade regulation and the design, such as when+1.5d yarn defect the amplitude detection, it sets level is 2.5d, obtains from the R18R19 dividing potential drop.Obtained following result from the output terminal of IC4 to IC13:

The B1 output terminal obtains positive pulse, and its width equivalence is a short slub yarn defect length, and it is that 1.8d(represents rugosity with d that the yarn defect is set level, as follows).

The A1 output terminal obtains negative pulse, and its width equivalence is long bead defect length, and it is 1.45d that the yarn defect is set level.

The G1 output terminal obtains negative pulse, and its width equivalence is long snick yarn defect length, and it is 0.76d that the yarn defect is set level.

All the other C1, D1, E1, F1, H1, I1 and J1 respectively with high level represent yarn defect rugosity reached+1d ,+1.5d ,+2.5d ,+4d ,-30%d ,-45%d and-75%d.

Occur after the yarn defect, the comparator output terminal of IC4 to IC13 has been finished the preliminary description to the conversion of yarn defect length and yarn defect rugosity.

The effect of IC2IC3 is with the IC7 of Fig. 3 and the effect of IC8 in the difunctional yarn clearer design proposal among Fig. 7.Difference is to draw signal E at the output terminal of IC2, and the E current potential shows that at high-order 1 o'clock yarn gone into groove, shows during low level 0 that yarn goes out groove.The state description of D terminal potential is with the output terminal of Fig. 3 IC8.

The C1 of Fig. 7, D1, E1, F1, H1, I1, A1, J1 and E are sent to the respective end of Fig. 9, by the IC1 to IC8(D of Fig. 9 trigger) memory, reached yarn defect shelves setting with the high-order 1 expression yarn defect rugosity of Q end output.The Q output terminal of Fig. 9 IC8 is exported with constituting 1X1 with E, and the 1X1 signal send the 1X1 end of Figure 14, with the sliver force disconnect, because the sliver rugosity is lower than 25% of normal yarn, can't bear the powerful needs of sliver subsequent technique, not as it is cut off reclosing.Talk again below Fig. 9 remaining circuit.

The B1 of Fig. 7, A1, G1, E and D are sent to Fig. 8.CP1 among Fig. 8, CP2 connect from Figure 10, and CP1, CP2 are 2 time clock, CP1 time clock 100KC, and when 600 meters of yarn speed per minutes, each pulse is equivalent to 0.1 millimeter sliver length.IC1, IC2, IC3 are connected into three grades of cascade counters.The B1 positive pulse width is equivalent to short slub yarn defect length, become the CT end that negative pulse is delivered to IC1 by IC24, open the counting door, IC1IC2IC3 begins the clock count to CP1, when the terminal count output 1 of IC2 is a high position, show that yarn defect length has reached 1 mm length shelves level, this high position is remembered by IC10 at once.The length state of short slub in like manner, can be described with the height of current potential at the Q of IC9IC8IC7 output terminal.That A1 and the G1 negative pulse double input end Sheffer stroke gate by IC20 constitutes negative logic or operation, the width of long slubbing or long snick yarn defect is changed into positive pulse, convert negative pulse to by IC26 and give the counter that IC4IC5IC6 constitutes, the analysis by similar short slub linear measure longimetry obtains the description whether the yarn defect reaches 8 centimetres and 32 centimetres at the Q of IC11IC12 output terminal.When yarn defect (long slubbing or long details) length surpasses 40 centimetres, in order to prevent interference to setting voltage, on IC29, deliver to the cutting knife circuit of Figure 14 from the same D of 4 output end signals, the E of IC6, the sliver force disconnect with getting this signal of 1X2 signal.

CP2 clock frequency 10KC, when 600 meters yarn speed of per minute, a recurrence interval is equivalent to 1 millimeter sliver length.Therefore the absolute measurement precision to long slubbing or long details is positive and negative 0.1 millimeter.The B of Fig. 8 meets the B from Fig. 2.

1X2 output terminal among Fig. 9 among 1X1 and Fig. 8 produces in order to the signal to surpassing-75% meticulous sliver and length being reached 40 centimetres long slubbing, the excision of long snick yarn defect, as figure add E and D control signal purpose the former prevent that sliver from having gone out groove, setting voltage causes the cutting knife empty action owing to there is the false details that forms in the integrating circuit of Fig. 7 RIC1; When in the 1X2 signal generating circuit, except E, introducing the D current potential again and then be the control sliver and just going into groove, setting voltage set up as yet improve and cause normal yarn is used as the overlength slubbing and is cut off.

The remaining circuit of existing key drawing 8.

Because the rugosity starting point of the computational length of long slubbing is lower than short slub, therefore the end that should measure length of various yarn defects can be represented in the back edge of the output positive pulse of IC20, for short slub, actual length pulse back edge is slightly prior to edge after the IC20 positive pulse, and the mistiming on length detection precision and edge after this, it doesn't matter.Represent that with the back edge of IC20 the end of arbitrary yarn defect length can receive the facility of circuit design.When the paraphase by IC25 of the pulse back edge (negative edge) of IC20 becomes rising edge, the rising edge of IC25 is represented the end of a yarn defect.With this rising edge triggering IC13(IC13 and IC14 is two monostable triggers), obtain a positive pulse (470 microsecond) at Q end, the output signal of the same D of this positive pulse, E and IC27 and form and control voltage and open the analog switch of IC10 to IC15 among IC15 to IC19 among Fig. 8 and Fig. 9 corresponding signal is exported.When analog switch was not opened, because the ground connection (being R1 to R6 resistance eutral grounding in Fig. 9) of resistance R 1 to R5, making these output terminals was stable electronegative potential output.

Because avoiding yarn just to go into the glitch that groove and sliver go out behind the groove, the adding of D, E signal sends.The effect of IC27 can be understood like this, the input end spreading degree of IC21 reaches the output of the IC10Q end of 1 mm length, F is the state description that yarn defect rugosity surpasses 1d among Fig. 9, when being noble potential 1, the output terminal of IC21 shows that short slub yarn defect does not reach the A1 grade, in like manner G, H are respectively rugosity and whether surpass-30% and+45% state description, and whether they surpass 8 centimetres with length state description all is long slubbing and a length details with high-order 1 sufficient the lowest class with thumb down at the output terminal of IC22 and IC23.The output electronegative potential of IC21, IC22 and IC23 effectively make IC27 constituted negative logic or output, the output 1y end of IC27, if the high-order short slub that detects the yarn defect and reached minimum level, long slubbing or the long snick yarn defect, the interruption application signal of this ingot of 1y signal double as of showing.

The height of 1A current potential shows whether detected short slub yarn defect in No. 1 ingot surpasses the length of 1cm.

Other output terminal current potential height for No. 1 ingot can be described like this:

1B, 1C represent short slub whether surpass 2cm and 4cm, 1D, 1E represent long slubbing or long details whether above 1F, 1G, 1H, 1I, 1K, the 1L of 8cm and 32cm Fig. 9 represent respectively yarn defect rugosity reach+1d ,+1.5d ,+2.5d ,+4d ,-45% ,+45%.

Correspondingly change the front numeral into 2 to 6 as 1 before the label 1A for the corresponding output end of 2 to No. 6 ingots, so whole descriptions of the fault state that is occurred separately in the 6 ingot detecting units.Because the possible minimum of yarn defect appears in several ingots in 6 ingots simultaneously, therefore these respective signal are carried out in Figure 12 or non-processing, carry out interface (and paraphase) at J330 and handle the power supply organizational system that makes it to adapt to microcomputer work by IC13IC14, the final acquisition given in Figure 15 microsystem, supplies with the yarn defect and describes signals collecting.

Return Fig. 8, the 1y signal is output as No. 1 ingot to microcomputer application look-at-me, be not difficult to find out that it appears at edge after the positive pulse of the equivalent yarn defect width that IC20 sends, simultaneously with the minimum level that surpasses the long details of the long slubbing of short slub mutually or output signal carry out and operate, and again with D and E with.Therefore, for curtailment to constitute the yarn defect descriptive grade of minimum level A1(national standard) and the small yarn defect that is not enough to constitute minimum long slubbing and long details all avoided gathering judgment processing to the machine application, also avoided in Figure 12 each ingot to describe equally holding carrying out or interfering with each other when handling.Because D and E signal have been participated in and operation, avoided yarn to go into the false detail signal that the false slubbing signal at groove initial stage and yarn go out behind the groove and sent.The interruption application signal called after 2y of No. 2 ingot to 6 ingots is until 6y.6 look-at-mes through Figure 11's or operation and formed to microcomputer application look-at-me T1(negative level effective through the transistor paraphase).

The Q of IC13 end is given the B end of IC14 simultaneously among Fig. 8, IC14 is connected into the monostable trigger that negative edge triggers, immediately following after the positive pulse of IC13Q end output, the IC14Q end is sent the counter of a pulse to IC6, IC1 to IC8D trigger among IC7 to IC12D trigger and Fig. 9 is clear 0, prepares the measurement of next yarn defect pulse.The Q of IC13IC14 holds when Q sends positive pulse, the corresponding negative pulse that occurs, and these two pulses are added in IC24IC25IC26 and go up entering of blockade disturbing pulse, guarantee the accurate of measurement.

In the several seconds of throwing after yarn is gone into groove,, have the effect of automatic clear, so pre-clear circuit of the initial stage of circuit can omit though IC13IC14 work is invalid.

When microsystem response look-at-me, gather yarn defect information description and make respective handling,, will provide a negative pulse (X output terminal) if the yarn defect is cut off in decision, this negative pulse is delivered to Figure 13, carries out level conversion and paraphase becomes positive pulse by the transistor interface circuit.This positive pulse is given an input end of the AND circuit of IC1 to IC6, with the interruption application signal of each ingot with, from selecting ingot cutting knife circuit, it is high-order if the 1y of No. 1 ingot occurs, 1X will obtain high-order output so, and deliver to the cutting knife executive circuit respective end of Figure 14, and trigger the cutting knife action, the yarn defect is cut off.Calculate according to microcomputer software, about 300 microseconds of the longest differentiation time of a yarn defect, send cutting knife execution pulse and want microsecond more than 200, application look-at-me time span is decided by the monostable time of Fig. 8 IC13, design is given 470 microseconds, the 1y signal length can topped X signal, can select 5100P as electric capacity that will more reliable IC13.Two monostable pulse sums of IC13 and IC14 were 700 microsecond times, were equivalent to 7 millimeters long of sliver length when 600 meters of per minutes, and this is the machine blind area after a yarn defect occurs, that is the minimum interval of 2 distinguishable yarn defects is 7 millimeters.

Figure 10 is a clock pulse generating circuit, and ALE takes from the same-sign end of Figure 15, and microsystem is used the crystal oscillator of 6M, ALE sends the 400KC standard time clock, through interface conversion level, IC1 four frequency divisions, IC2 have very frequently formed the CP1 of 100KC and the CP2 clock of 10KC again.

Finished the task that six ingots are described fault in the sliver by above circuit design, formed one group of signal of describing yarn defect rugosity and length, be shown in A', B', C', D', E', F', G', H', I', K', the L' of Figure 12, above totally 11 signals, the high expression of end points current potential is satisfied, low foot with thumb down.Formed the T1 signal (Figure 11) that interrupts to the microcomputer application, negative level is effective.Have and accept microcomputer cutting knife execution command and from the function (Figure 13) of selecting ingot number.Simultaneously machine is lower than the function that 25% details is excised to the long slubbing that surpasses 40cm or long details and rugosity automatically.

Figure 15 is the microsystem design diagram.Adopt 8039 single chip microcomputers in the MCS-48 series, the main 6M that shakes, 128 unit of internal memory, single-stage is interrupted, and system expands IO interface with four special interface circuits 8243.

System's major function:

1. yarn defect descriptor is gathered, and interrupts in adopting, and interrupts application (low level is effective) by T1 acceptance, all describes signal according to the mouth and mouthful upper arrangement collection yarn defect of appointment among the figure, puts into internal memory R6 and R7 unit, differentiates for microcomputer.

The upper arrangement of R6 and R7 is as follows:

76543210

R6 L' K' J' I' H' G' F' E'

R7 D' C' B' A'

2. yarn defect clear instruction is gathered: before test, manually give 23 kinds of yarn defect excision instructions, lay setting apparatus on the control box panel, make that should excise yarn defect grade sends high level 1, do not excise to be low level.This partial circuit is simple, omits.Microcomputer carries out disposable collection to excision instruction and leaves in Unit 78,79,80, and that arrange concrete position is following (used symbol such as A4 are the yarn defect grade symbol of national Specification):

76543210

R78 A4 A3 A2 A1 B4 B3 B2 B1

R79 C4 C3 C2 C1 D4 D3 D2 D1

R80 I2 I1 H2 H1 G F E

3. cutting knife execution command output should be excised in case microcomputer is differentiated the yarn defect, and the X end is sent a negative pulse from Figure 15, and this signal is delivered to the network of selection certainly of Figure 13.

4. show output: give the fluorescence display part by the specified interface driving circuit.The employing seven segment digital tubes is represented, the attached display circuit of charactron, and this programme does not provide, and connects routinely.Four display digits are the decimal system, and the numeral expression capacity is 0-9999, and the energy displaying symbol, as showing yarn defect grade symbol A4 etc.

With directly relevant being arranged to of microsystem:

1. counting unit in the internal memory, every grade of yarn defect counting takies 2 unit, adopts the conversion of 2-10 system, and every grade of yarn defect counting is 0-9999 easily.The unit order of presentation begins from Unit 32, successively A1, A2, A3, A4, B1, B2, B3, B4, C1, C2, C3, C4, D1, D2, D3, D4, E, F, G, H1, H2, I1, I2.

2. program sees Table " program the 3rd page table arrangement design " for the 3rd page, the corresponding stroke symbol of the corresponding charactron of a in the table, b, c, d, e, f, g and h.Figure 16 is seen in the arrangement of charactron stroke symbol.

3. operating process, the microcomputer energized, 2 charactrons of left show " 0 " symbol.At this moment, arrange yarn defect excision instruction by technological requirement on the control box panel, then the T0 gauge tap is beaten to electronegative potential, machine enters detected state, the network letter test yarns of can starting shooting defect.When detecting midway or finish to need to show testing result, the INT switch to be dialled to electronegative potential, machine shows yarn defect number one by one by group of four figures pipe, at first 2 show yarn defect grade, then 4 display digits.After all showing end, machine self-verifying INT level, then continues to show for the second time at low level as still.Therefore after the check figures record was errorless, one-level yarn defect number demonstration in the end should be beaten INT to noble potential before extinguishing, otherwise will all show once more.During showing testing result, machine does not have detectability to the yarn defect.The T0 switch keeps current potential constant, and numeral can clear 0 in the internal memory.After showing end, (promptly working as INT dials to noble potential) 2 charactrons in the left side show two " 0 " again.Between a sample detection period, can not stir T0, after changing kind, then must stir the yarn defect according to technological requirement again and remove setting apparatus, again T0 is dialled to electronegative potential.

Detecting in servicely, will show its grade automatically to detected yarn defect just, as A4, E etc.

The software that present design provides is asked for an interview " assembly routine inventory "

Program the 3rd page table arrangement design

The hgfedcba of unit displaying contents

300(H) 11000000 C0(H) show " 0 "

301(H) 11111001 F9(H) show " 1 "

302(H) 10100100 A4(H) show " 2 "

303(H) 10110000 B0(H) show " 3 "

304(H) 10011001 99(H) show " 4 "

305(H) 10010010 92(H) show " 5 "

306(H) 10000010 82(H) show " 6 "

307(H) 11111000 F8(H) show " 7 "

308(H) 10000000 80(H) show " 8 "

309(H) 10010000 90(H) show " 9 "

30A(H) 10001000 88(H) show " A "

30B(H) 10000011 83(H) show " b "

30C(H) 11000110 C6(H) show " c "

30D(H) 10100001 A1(H) show " d "

30E(H) 10000110 86(H) show " E "

30F(H) 10001110 8E(H) show " F "

310(H) 10011000 98(H) show " q "

311(H) 10001001 89(H) show " H "

312(H) 11110000 F0(H) show " I "

313(H) 01111111 7F(H) shows " "

314(H) 11111111 FF(H) there is not demonstration

11111111 FF(H) there is not demonstration

3FF(H) 11111111 FF(H) there is not demonstration

The assembly routine inventory

000：JMP PR MOV RO·＃20H

003：CALL PR2 CLR A·

RETR AK：MOV @RO·A

007：JTF D INC R0

RETR DJNZ R1·AK

D：CALL IX MOV PSW·A

MOV A·＃BFH MOV A·＃EFH

OUTL P2·A OUTL P2·A

MOV A·＃FFH MOVD A·P4

MOVD P7·A MOVD A·P4

OUTL P2·A SWAP A·

MOV T·A MOVD A·P5

RETR MOVD A·P5

PR：DIS I MOV R1·＃4EH

DIS TCNTI MOV @R1·A

SEL RBO INC R1

CALL SC4 MOVD A·P6

MOV R2·＃00H MOVD A·P6

MOV R3·＃00H SWAP A·

CALL SC1 MOVD A·P7

P：JTO PR1 MOVD A·P7

JMP P MOV @R1·A

PR1：MOV R1·＃31H INC R1

MOV A·＃DFH MOV R7·A

OUTL P2·A MOV A·＃FFH

MOVD A·P4 OUTL P2·A

MOVD A·P4 MOV A·R7

SWAP A· JB3 X1

MOVD A·P5 MOV A·R6

MOVD A·P5 JB2 X11

MOV @R1·A MOV A·R7

MOV A·＃FFH JBO X21

OUTL P2·A MOV R2·＃OAH

MOV T·A MOV R3·＃01H

STRT CNT CALL SC1

EN I MOV R1·＃4EH

EN TCNTI MOV A·@RI

JP1：JNTO PR JB4 M1

JMP JP1 JMP N11

IX：MOV A·＃BFH M1：CALL KI

OUTL P2·A JMP N11

MOVD A·P4 X21：JB1 X22

MOVD A·P4 MOV R2·＃0BH

SWAP A· MOV R3·＃01H

MOVD A·P5 CALL SC1

MOVD A·P5 MOV R1·＃4EH

MOV R6·A MOV A·@R1

MOVD A·P6 JBO M2

MOVD A·P6 JMP N21

M2：CALL KI MOV R3·＃02H

JMP N21 CALL SC1

X22：JB2 X23 MOV R1·＃4EH

MOV R2·＃OCH MOV A·@R1

MOV R3·＃01H JB5 M5

CALL SC1 JJMP N12

MOV R1·＃4FH M5：CALL KI

MOV A·@R1 JMP N12

JB4 M3 X31：JB1 X32

JMP N31 MOV R2·＃0BH

M3：CALL KI MOV R3·＃02H

JMP N31 CALL SC1

X23：MOV R2·＃ODH MOV R1·＃4EH

MOV R3·＃01H MOV A·@R1

CALL SC1 JB1 M6

MOV R1·＃4FH JMP N22

MOV A·@R1 M6：CALL KI

JBO M4 JMP N22

JMP N41 X32：JB2 X33

M4：CALL KI MOV R2·＃OOH

JMP N41 MOV R3·＃02H

X11：JB3 X13 CALL SC1

MOV A·R7 MOV R1·＃4FH

JBO X31 MOV A·@R1

MOV R2·＃OAH JB5 M7

JMP N32 MOV R2·＃OBH

M7：CALL KI MOV R3·＃03H

JMP N32 CALL SC1

X33：MOV R2·＃ODH MOV R1·＃4EH

MOV R3·＃02H MOV A·@R1

CALL SC1 JB2 M10

MOV R1·＃4FH JMP N23

MOV A·@R1 M10：CALL KI

JB1 M8 JMP N23

JMP N42 X42：JB2 X43

M8：CALL KI MOV R2·＃OOH

JMP N42 MOV R3·＃03H

X13：JB4 X15 CALL SC1

MOV A·R7 MOV R1·＃4FH

JBO X41 MOV A·@R1

MOV R2·＃0AH JB6 M11

MOV R3·＃03H JMP N33

CALL SC1 M11：CALL KI

MOV R1·＃4EH JMP N33

MOV A·@R1 X43：MOV R2·＃ODH

JB6 M9 MOV R3·＃03H

JMP N13 CALL SC1

M9：CALL KI MOV R1·＃4FH

JMP N13 MOV A·@R1

X41：JB1 X42 JB2 M12

JMP N43 MOV R2·＃OCH

M12：CALL KI MOV R3·＃04H

JMP N43 CALL SC1

X15：MOV A·R7 MOV R1·＃4FH

JBO X51 MOV A·@R1

MOV R2·＃0AH JB7 M15

MOV R3·＃04H JMP N34

CALL SC1 M15：CALL KI

MOV R1·＃4EH JMP N34

MOV A·@R1 X53：MOV R2·＃ODH

JB7 M13 MOV R3·＃04H

JMP N14 CALL SC1

M13：CALL KI MOV R1·＃4FH

JMP N14 MOV A·@R1

X51：JB1 X52 JB3 M16

MOV R2·＃0BH JMP N44

MOV R3·＃04H M16：CALL KI

CALL SC1 JMP N44

MOV R1·＃4EH N14：MOV R0·＃38H

MOV A·@R1 CALL ADD

JB3 M14 N13：MOV RO·＃30H

JMP N24 CALL ADD

M14：CALL KI N12：MOV R0·＃28H

JMP N24 CALL ADD

X52：JB2 X53 N11：MOV RO·＃20H

CALL ADD N41：MOV RO·＃26H

RETR CALL ADD

N24：MOV R0·＃3AH RETR

CALL ADD X1：MOV A·R6

N23：MOV R0·＃32H JB7 X3

CALL ADD JBO X4

N22：MOV R0·＃2AH JB6 X12

CALL ADD MOV R2·＃11H

N21：MOV R0·＃22H MOV R3·＃01H

CALL ADD CALL SC1

RETR MOV R1·＃50H

N34：MOV R0·＃3CH MOV A·@R1

CALL ADD JB4 M17

N33：MOV R0·＃34H JMP X16

CALL ADD M17：CALL KI

N32：MOV R0·＃20H JMP X16

CALL ADD X12：MOV R2·＃11H

H31：MOV R0·＃24H MOV R3·＃02H

CALL ADD CALL SC1

RETR MOV R1·＃50H

N44：MOV R0·＃3EH MOV A·@R1

CALL ADD JB5 M18

N43：MOV R0·＃36H JMP X14

CALL ADD M18：CALL KI

N42：MOV R0·＃2EH X14：MOV R0·＃48H

CALL ADD CALL ADD

X16：MOV R0·＃46H X3：JB1 X5

CALL ADD JBO X9

RETR MOV R1·＃50H

X4：JB6 X6 MOV A·@R1

MOV R2·＃12H JB2 M21

MOV R3·＃01H JMP X7

CALL SC1 M21：CAL KI

MOV R1·＃50H X7：MOV R2·＃OFH

MOV A·@R1 MOV R3·＃14H

JB6 M19 CALL SC1

JMP X10 MOV R0·＃42H

M19：CALL KI CALL ADD

JMP X10 RETR

X6：MOV R2·＃12H X9：MOV R1·＃50H

MOV R3·＃02H MOV A·@R1

CALL SC1 JB3 M22

MOV R1·＃50H JMP X61

MOV A·@R1 M22：CALL KI

JB7 M20 X61：MOV R2·＃10H

JMP X8 MOV R3·＃14H

M20：CALL KI CALL SC1

X8：MOV R0·4CH MOV R0·＃44H

CALL ADD CALL ADD

X10：MOV R0·4AH RETR

CALL ADD X5：MOV R1·＃50H

RETR MOV A·@R1

JB1 M23 AB3：MOV R3·＃14H

JMP X62 MOV R1·＃03H

M23：CALL KI AB4：CALL SC1

X62：MOV R2·＃OEH CALL SC3

MOV R3·＃14H CALL SC2

CALL SC1 CALL SC3

MOV RO·＃40H INC R2

CALL ADD INC R0

RETR DJNZ R1·AB4

PR2：STOP TCNT AB5：MOV R1·＃02H

MOV R2·＃0AH MOV R3·＃01H

MOV R0·＃20H AB6：CALL SC1

AB1：MOV R3·＃01H CALL SC3

MOV R1·＃04H CALL SC2

AB2：CALL SC1 CALL SC3

CALL SC3 INC R0

CALL SC2 INC R3

CALL SC3 DJNZ R1·AB6

INC R3 MOV A·R2

INC R0 ADD A·＃EDH

DJNZ R1·AB2 JNZ AB7

INC R2 INC R2

MOV A·R2 JMP AB5

ADD A·＃F1H AB7：CALL SC4

JNZ AB3 MOV R2·＃00H

JMP AB1 MOV R3·＃00H

CALL SC1 OUTL P1·A

STRT CNT MOV A·＃DFH

RETR OUTL P2·A

KI：MOV A·＃BFH MOV A·@RO

OUTL P2·A SWAP A

CLR A· ANL A·＃OFH

MOVD P7·A MOV P3·@A

RETR MOVD P6·A

SC1：MOV A·＃7FH SWAP A

OUTL P2·A MOVD P7·A

MOV A·R2 INC RO

MOV P3·@A MOV A·＃7FH

MOVD P6·A OUTL P2·A

SWAP A· MOV A·@RO

MOVD B7·A ANL A·＃OFB

MOV A·R3 MOV P3·@A

MOV P3·@A MOVD P4·A

MOVD P4·A SWAP A·

SWAP A· MOVD P5·A

MOVD P5·A MOV A·@RO

MOV A·＃FFH SWAP A·

OUTL P2·A ANL A·＃OFH

RETR MOV P3·@A

SC2：MOV A·@R0 MOVD P6·A

ANL A·＃OFH SWAP A·

MOV P3·@A MOVD P7·A

MOV A·＃FFH MOVD P6·A

OUTL P2·A MOVD P7·A

RETR MOV A·＃DFH

SC3：MOV A·＃FFH OUTL P2·A

MOV R4·A MOV A·＃FFH

AC1：MOV R5·A MOVD P6·A

AC2：NOP MOVD P7·A

NOP OUTL P2·A

NOP OUTL P1·A

NOP RETR

NOP AID：MOV A·@RO

NOP INC A·

NOP DA A·

NOP MOV @RO·A

NOP INC RO

NOP NOV A·@RO

DJNZ R5·AC2 ADDC A·＃OOH

DJNZ R4·AC1 DA A·

RETR NOV @RO·A

SC4：NOV A·＃7FH RETR

OUTL P2·A

MOV A·＃FFH

MOVD P4·A

MOVD P5·A

Claims (5)

1, the method for designing of a kind of electronic yarn clearer and classimat, it is characterized in that: no matter be to adopt photo-electric or condenser type detection means, the detection amplifying unit of each ingot, sample sliver by detection head is zoomed into final electric signal V in the rugosity S or the yarn defect increment rugosity △ S conversion of length direction each point, make V satisfy expression formula V=KS or V=K △ S, K changes the coefficient that zooms into final electric signal V for the S or the △ S of the sliver length direction each point of certain ingot in the formula, be used for characterizing this ingot and detect amplifying unit sensitivity at a time, allow the K value of each ingot unequal mutually, allow the K value of a certain ingot in long-time running, to morph, it is principle that the variation range of K value satisfies circuit measuring with the amplitude of final electric signal V, each ingot independently produces the setting level V1 that replaces all sliver average boldness S ' simultaneously, make V1=KS ', with reference to national standard or technological requirement, and the circuit formula of selecting makes the satisfied expression formula of V, the appropriate selection gained, each ingot is benchmark according to the multiplication principle with separately V1, set up one or one group of yarn defect setting level with the same gain of selecting, carry out level ratio with final electric signal V, finish the differentiation or the state description of yarn defect rugosity, simultaneously the computational length of yarn defect (when the rugosity that adopts the yarn defect and length product surpass regulation promptly with the formula of excising) or physical length (according to the regulation of the yarn defect effective length of national standard the time) are converted to the pulse of equivalent length.

2, a kind of method that replaces all sliver average boldness to set level, it is characterized in that: with the fragment sliver average boldness S of continuous sufficient length " replace all sliver average boldness S ' corresponding to the level V1 of detection sensitivity K as setting level, the corresponding V1=KS that changes into of the expression formula of its V1 ".

3, a kind of method that satisfies claim 1 and 2 simultaneously, it is characterized in that from the detection amplifying unit of each ingot, having satisfied among the final electric signal V of expression formula V=KS, directly isolate V1 with integrating circuit, the V1 of this moment satisfies expression formula V1=KS "; S " fragment length value L by integration circuit time constant T, yarn speed V ' reaches coefficient n and decides, and its expression formula is: n is 2-3 in the L=nTV' formula.

4, a kind of photoelectric-type electronic yarn clearer, it is characterized in that according to claim 1,2, the design of 3 method, each ingot is that 1 second integrating circuit is isolated V1 as setting level with the time constant from the final electric signal V that satisfies expression formula V=KS, as benchmark, according to technological requirement, detect the waver of amplifying unit by each ingot and select identical gain to form the circuit of the yarn defect setting level of each ingot.

5, a kind of six ingot photo-electric classimats, it is characterized in that according to right 1,2 and 3 method design, Fig. 7 according to accompanying drawing, each ingot is from the final electric signal V that satisfies expression formula V=KS, with the time constant is that 1 second integrating circuit is isolated V1, as benchmark, making gain with accurate adjustment is that 5 in-phase amplifier amplifies it, form resistor network at output terminal with resistance of accurately adjusting or potentiometer, therefrom obtain one group of yarn defect rugosity that meets national standard yarn defect rugosity and the initial standard of yarn defect length and set level, independent yarn defect as each ingot is set level, final electric signal V with corresponding each ingot makes comparisons, finish the circuit of the conversion of the description of yarn defect rugosity state and yarn defect length, according to Fig. 8 circuit of accompanying drawing length detection is carried out in the pulse of equivalent yarn defect length with the time clock of 100KC and 10KC frequency, finish the circuit that yarn defect length is described, according to the microsystem of Figure 15 and corresponding assembler inventory circuit and the software that resultant yarn defect classification is differentiated of describing according to yarn defect rugosity and length.

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