CN2903997Y - Flash lamp integrated circuit tester - Google Patents
Flash lamp integrated circuit tester Download PDFInfo
- Publication number
- CN2903997Y CN2903997Y CN 200620013681 CN200620013681U CN2903997Y CN 2903997 Y CN2903997 Y CN 2903997Y CN 200620013681 CN200620013681 CN 200620013681 CN 200620013681 U CN200620013681 U CN 200620013681U CN 2903997 Y CN2903997 Y CN 2903997Y
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- module
- integrated circuit
- flashing light
- light integrated
- control module
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Abstract
A flashing lamp integrate circuit measuring instrument comprises a voltage regulation module, a control module, a current testing module, a gating module, testing fixture module and a displaying module; the voltage regulation module supplies power source to control module and current testing module; the gating module controls gating of the channel in gating module; the gating module is electrically connected with the testing flashing lamp integrate circuit through the testing fixture module. The current testing module inspects the static work current of the testing flash lamp integrate circuit and feeds back current testing result to the control module; the test fixture module fixes and electrically connects the testing flashing lamp integrate circuit, and feeds back the signal of testing flashing lamp integrate circuit to the control module; the control module controls the displaying module to display the test result. The utility model using the control module analyzing and processes the signals generated by various modules of the flashing lamp integrate, and has advantages of high testing speed, high efficiency, and high precision.
Description
Technical field
The utility model relates to tester, especially about a kind of tester of testing the flashing light integrated circuit.
Background technology
Because the flashing light integrated circuit can have some flaws usually, for example: big electric current, promptly the static working current of flashing light integrated circuit surpasses a certain predetermined value; Triggerless, when promptly pressing flashing light integrated circuit triggering key, it still keeps the quiescent operation state; The flashing light time is undesired, promptly after the flashing light integrated circuit powers on, and very long have very short that the flashing light time has; Grow bright length and go out, promptly the flashing light integrated circuit powers on afterwards or bright always lamp, or keeps extinguishing without any reflection always.And in production, manufacture process, need pick out flashing light integrated circuit by detecting link usually with these flaws, to guarantee product fine.
The tester of existing flashing light integrated circuit is that a plurality of flashing light integrated circuit to be measured are connected into independent test channel respectively, and the series current table is used to show the working current of a plurality of flashing light integrated circuit on the general supply incoming line.During test, the tester pulls the Test Switchboard of each flashing light integrated circuit correspondence successively, thereby connects in turn the test loop of each flashing light integrated circuit.Observe the flicker frequency of flashing light integrated circuit driving LED (light-Emitting Diode, light emitting diode) and reometer indicate judging as the Pretesting tester whether have flaws such as big electric current or flashing light time is undesired by the tester.
But because the limitation of manual operation speed and the artificial existence of observing the subjectivity factor of judging adopt existing tester to carry out, test speed is slow, efficient is low, easy generation is artificially surveyed by mistake and the test parameter index is random big.
The utility model content
The purpose of this utility model provides the flashing light integrated circuit tester that a kind of test speed is very fast, efficient is higher and error is less.
For addressing the above problem, the technical scheme that the utility model adopted is: a kind of flashing light integrated circuit tester comprises Voltage stabilizing module, control module, testing current module, gating module, test fixture module and display module; Described Voltage stabilizing module provides power supply to control module and testing current module; Described control module is controlled the gating of passage in the described gating module; Described gating module is electrically connected to flashing light integrated circuit to be measured via described test fixture module; Described testing current module detects the static working current of tested flashing light integrated circuit and to described control module feedback current test result; Described flashing light integrated circuit to be measured is fixed and electrically connected to described test fixture module, and with the signal feedback of described flashing light integrated circuit to be measured to described control module; Described control module is controlled described display module and is shown test results.
Compared with prior art, advantage of the present utility model is: utilize described control module analysis, handle the signal that each module of described each module of flashing light integrated circuit tester produces, the described flashing light integrated circuit tester of overall control, need not manually-operated, test speed is very fast, efficient is higher, simultaneously owing to be that program in the described control module is judged test data, so its measuring accuracy is also higher.
Description of drawings
Fig. 1 is the utility model flashing light integrated circuit tester block scheme;
Fig. 2 is the circuit theory diagrams of control module, testing current module and the gating module of the utility model flashing light integrated circuit tester;
Fig. 3 is the circuit theory diagrams of the display module of the utility model flashing light integrated circuit tester;
Fig. 4 is the logical relation synoptic diagram of 16 path analoging switch chip CD4067.
Embodiment
Below in conjunction with Figure of description the utility model flashing light integrated circuit tester is specified.
See also Fig. 1, the utility model flashing light integrated circuit tester is used for the while and surveys some flashing light integrated circuit, it comprises a Voltage stabilizing module 10, a control module 20, a testing current module 30 that is used to detect the static working current of tested flashing light integrated circuit, 40, one of a gating module that are used to select the test loop of flashing light integrated circuit to be measured is used for fixing and electrically connects the display module 60 of the test fixture module 50 and a test result of described flashing light integrated circuit to be measured.
Described Voltage stabilizing module 10 provides stable operating voltage for described control module 20 and testing current module 30.The signal that 20 pairs of each modules of described control module produce is analyzed and is handled, and each functional module of this circuit is carried out unified management and allotment, plays the effect of overall control.Whether described testing current module 30 provides a canonical reference voltage normal with the static working current of judging described tested flashing light integrated circuit, and to described control module 20 feedback current test results.Described gating module 40 is selected the position of flashing light integrated circuit to be measured by described control module 20 controls.The test data of the logic function of described tested flashing light integrated circuit is back to described control module 20 via described gating module 40, test fixture module 50, and shows test mode and result by display module 60.
Please consult Fig. 2 and Fig. 3 jointly, in this embodiment, described control module 20 comprises a microprogram control unit U1, and what described microprogram control unit U1 adopted is the Mega8 single-chip microcomputer of atmel corp.Described testing current module 30 comprises operational amplifier U4 and analog comparator U5 that model is LM339N that a model is LF444.Described gating module 40 comprises that two models are 16 path analoging switch U2, the U3 of CD4067.Described display module 60 comprises some and described flashing light integrated circuit to be measured LED one to one, and described LED carries out state and final test result thereof in order to the test that shows corresponding flashing light integrated circuit.
The pin 1 of described microprogram control unit U1 and a reset switch K1 electrically connect, and when the work of described flashing light integrated circuit tester is abnormal, can reset by pressing described reset switch K1; TG end (being pin 3) connects the trigger end of described tested flashing light integrated circuit; Pin 4,5 links to each other with out4, the out1 end (being pin 13,2) of described analog comparator U5 respectively, is used to receive the testing current result of described analog comparator U5 feedback; Pin 23,24,25,26 links to each other with A, the B of described analog switch U2, U3, C, D end respectively, is used to control the gating of the passage of described analog switch U2, U3.The VDD1 of described analog switch U2~VDD9 holds (being pin 2~8 and pin 22,23), and the ICLED1 of described analog switch U3~ICLED9 end (being pin 2~8 and pin 22,23) connects with corresponding flashing light integrated circuit to be measured via the golden finger of described connection test fixture 50 respectively.The DSP0 of described microprogram control unit U1~DSP9 end (being pin 2,9,10 and 14~19) respectively with corresponding LED series connection; The negative electrode of each LED is connected to the corresponding pin of described microprogram control unit U1, and anode is connected to the 5v power supply via a resistance; Described LED is used to show the test result of corresponding tested flashing light integrated circuit.
The internal processes of described microprogram control unit U1 is counted the output pulse of described tested flashing light integrated circuit, if umber of pulse reaches specific quantity in the specific time, thinks that so then described tested flashing light integrated circuit is qualified; Otherwise be defective.Because described flashing light integrated circuit allows certain tolerance on design parameter, and according to the difference of the environment for use that integrated circuit was suitable for, requirement to tolerance is also different, therefore, can utilize the programming software of Mega8 single-chip microcomputer, adjust the judgement scope of described microprogram control unit U1 parameter, to adapt to the different parameters standard.
The in1+ of described operational amplifier U4 end (being pin 3) is connected with a precision resistance Rx1, and it will import the voltage constant of input end in1+ of described operational amplifier U4 to 5V.Resistance R 3, a capacitor C 2 and described operational amplifier be common forms a voltage follower, and the voltage VDD that described operational amplifier U4 is delivered to described analog switch U2 is stabilized in 5V.The OUT1 of described operational amplifier U4 end (being pin 1) output voltage equals described voltage VDD and adds dividing potential drop on the above resistance R 3.Under the normal situation of tested flashing light integrated circuit, its static working current is less than 1uA, so in theory, the output voltage of the out1 end of described operational amplifier U4 should be less than 5.01V, this numerical value is transported to the in1+ end (being pin 5) of described analog comparator U5, by comparing, out1 end (being pin 13) at described analog comparator U5 is exported comparative result to described microprogram control unit U1: if in1+ is greater than in1-, then tested flashing light integrated circuit static working current is excessive, the out1 end output 1 of described analog comparator U5; If in1+ is less than in1-, then tested flashing light integrated circuit is normal, the out1 output 0 of described analog comparator U5; Thus, described microprogram control unit U1 just can judge by the level value that the out1 that reads described analog comparator U5 holds whether tested flashing light integrated circuit is normal.
See also Fig. 4, described model is that 16 path analoging switch of CD4067 have 4 passage control end A, B, C, D, when the Enable Pin INHIBIT of described 16 path analoging switch is low level (being 0), above-mentioned A, B, C, D are provided with varying level respectively, corresponding passage gating in 16 passages of then described 16 path analoging switch.In this embodiment, 9 paths have wherein only been selected for use, i.e. pin 2~8 and pin 22,23 pairing passages.
During work, described gating module 40 is selected a flashing light integrated circuit under the control of described microprogram control unit U1, whether the pulse parameter that the internal processes by described microprogram control unit U1 detects described flashing light integrated circuit meets the requirements, if it is undesirable, then corresponding LED lamp is bright, and described microprogram control unit U1 controls described gating module 40 and selects next flashing light integrated circuit to be measured; If described pulse parameter meets the requirements, whether the static working current that then detects described flashing light integrated circuit meets the requirements, if do not meet, then corresponding LED lamp is bright, and described microprogram control unit U1 controls described gating module 40 and selects next flashing light integrated circuit to be measured; If described static working current meets the requirements, then send a trigger pip, through waiting for, if pulse-free signal output, then corresponding LED lamp is bright, and described microprogram control unit U1 controls described gating module 40 and selects next flashing light integrated circuit to be measured; If described pulse signal output is arranged, then corresponding LED goes out, and described microprogram control unit U1 controls described gating module 40 and selects next flashing light integrated circuit to be measured.Until finishing with the flashing light integrated circuit testing that described flashing light integrated circuit tester is connected.The pairing LED of non-defective unit in the tested flashing light integrated circuit extinguishes.
In the flashing light integrated circuit tester that above-mentioned embodiment is introduced, its design parameter is as follows:
Operating voltage :+8V
Standby current: 25Ma
Maximum operating currenbt: 80mA
Complete machine power: less than 0.5W
Test period: 8s (9 flashing light integrated circuit)
The above only is a preferred implementation of the present utility model; should be pointed out that for those skilled in the art, under the prerequisite that does not break away from the utility model principle; can also make some improvement, these improvement also should be considered as protection domain of the present utility model.
Claims (10)
1. flashing light integrated circuit tester, it is characterized in that: the flashing light integrated circuit tester comprises Voltage stabilizing module, control module, testing current module, gating module, test fixture module and display module; Described Voltage stabilizing module provides power supply to control module and testing current module; Described control module is controlled the gating of passage in the described gating module; Described gating module is electrically connected to flashing light integrated circuit to be measured via described test fixture module; Described testing current module detects the static working current of tested flashing light integrated circuit and to described control module feedback current test result; Described flashing light integrated circuit to be measured is fixed and electrically connected to described test fixture module, and with the signal feedback of described flashing light integrated circuit to be measured to described control module; Described control module is controlled described display module and is shown test results.
2. flashing light integrated circuit tester as claimed in claim 1 is characterized in that: described control module comprises a microprogram control unit.
3. flashing light integrated circuit tester as claimed in claim 2 is characterized in that: what described microprogram control unit adopted is the Mega8 single-chip microcomputer of atmel corp.
4. flashing light integrated circuit tester as claimed in claim 3, it is characterized in that: described display circuit comprises some light emitting diodes, each light emitting diode all is connected in series between the corresponding pin of power supply and described Mega8 single-chip microcomputer, and described light emitting diode is corresponding to one by one to show the test result of corresponding flashing light integrated circuit with described flashing light integrated circuit to be measured.
5. flashing light integrated circuit tester as claimed in claim 4 is characterized in that: the anode of described light emitting diode is connected to described power supply, and its negative electrode is connected to the corresponding pin of described Mega8 single-chip microcomputer.
6. flashing light integrated circuit tester as claimed in claim 1, it is characterized in that: the testing current module comprises an operational amplifier and an analog comparator, described operational amplifier adopts the connection of voltage follow that the voltage that described operational amplifier flows to described gating module is stabilized in a predetermined value, and described analog comparator obtains a testing current result and described testing current result is fed back to described control module by comparing the load pressure drop.
7. flashing light integrated circuit tester as claimed in claim 6 is characterized in that: the model that described operational amplifier adopts is the operational amplifier of LF444.
8. flashing light integrated circuit tester as claimed in claim 6 is characterized in that: what analog comparator adopted is that model is the analog comparator of LM339N.
9. flashing light integrated circuit tester as claimed in claim 1 is characterized in that: described gating module comprises two analog switches, and described control module is controlled the passage gating in the described analog switch, tests to select corresponding flashing light integrated circuit to be measured.
10. flashing light integrated circuit tester as claimed in claim 9 is characterized in that: what described analog switch adopted is that model is 16 path analoging switch of CD4067.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN 200620013681 CN2903997Y (en) | 2006-04-19 | 2006-04-19 | Flash lamp integrated circuit tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN 200620013681 CN2903997Y (en) | 2006-04-19 | 2006-04-19 | Flash lamp integrated circuit tester |
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CN2903997Y true CN2903997Y (en) | 2007-05-23 |
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CN 200620013681 Expired - Fee Related CN2903997Y (en) | 2006-04-19 | 2006-04-19 | Flash lamp integrated circuit tester |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103093714A (en) * | 2011-11-01 | 2013-05-08 | 天津三星电子有限公司 | Detecting device and detecting method of light emitting diode (LED) display screen driving board |
CN103529313A (en) * | 2012-07-04 | 2014-01-22 | 纬创资通股份有限公司 | Backlight module driver testing machine bench and testing method, and manufacturing method for power board |
-
2006
- 2006-04-19 CN CN 200620013681 patent/CN2903997Y/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103093714A (en) * | 2011-11-01 | 2013-05-08 | 天津三星电子有限公司 | Detecting device and detecting method of light emitting diode (LED) display screen driving board |
CN103529313A (en) * | 2012-07-04 | 2014-01-22 | 纬创资通股份有限公司 | Backlight module driver testing machine bench and testing method, and manufacturing method for power board |
CN103529313B (en) * | 2012-07-04 | 2016-03-16 | 纬创资通股份有限公司 | Backlight module driving device tester table and method and power panel method for making |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C19 | Lapse of patent right due to non-payment of the annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |