CN2879958Y - Inner hemisphere of rear-projection type pecioptometry apparatus - Google Patents
Inner hemisphere of rear-projection type pecioptometry apparatus Download PDFInfo
- Publication number
- CN2879958Y CN2879958Y CN 200620110010 CN200620110010U CN2879958Y CN 2879958 Y CN2879958 Y CN 2879958Y CN 200620110010 CN200620110010 CN 200620110010 CN 200620110010 U CN200620110010 U CN 200620110010U CN 2879958 Y CN2879958 Y CN 2879958Y
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- light emitting
- emitting diode
- hemisphere
- projection type
- interior
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Abstract
The utility model discloses an inner hemisphere of rear-projection type pecioptometry apparatus. A number of holes serving as test points are arranged in the inner hemisphere of pecioptometry apparatus. A light emitting diode is embedded in each hole. All the light emitting diodes are connected by wires. The head of the light emitting diode is in the same height with the inner surface of the inner hemisphere which has an even layer of white paint that covers the head of the light emitting diodes. The utility model has fixed test points light sources arrangement, slow reflective light source and low cost.
Description
Technical field
This utility model relates to a kind of perimetry instrument, particularly a kind of interior hemisphere of back projection type perimetry instrument.
Background technology
The perimetry instrument that uses generally can be divided into two kinds at present.A kind of is back projection type perimetry instrument, its testing light source adopts light emitting diode is embedded in the hole of the some test points on the interior hemisphere of perimetry instrument, having the test point light source layouts fixing, the test point standard, the advantage that cost is low, but because the light direct irradiation of light emitting diode is undesirable to the daylighting test of eyes, the inspection effect is affected, and checks that effect is not as good as front projection type perimetry instrument.Another kind is a front projection type perimetry instrument, its testing light source is located at the interior hemispheroidal front of perimetry instrument, arrive hemisphere surface refraction in the perimetry instrument by light source projects, forming slow reflection source is used for checking, the test effect is than the good test effect of back projection type perimetry instrument, but the testing light source location difficulty of front projection type perimetry instrument, and test point has the deviation less stable sometimes, so location, stability requirement height as light source part cause involving great expense.
Summary of the invention
The purpose of this utility model provides a kind of interior hemisphere of back projection type perimetry instrument, and its test point light source is layouted fixing, have slow reflection source, and cost is low.
The purpose of this utility model is achieved in that the interior hemisphere of perimetry instrument is provided with some holes as test point, and embedding in each hole has a light emitting diode, and these light emitting diodes connect by lead.The head of described light emitting diode flushes with interior hemispheroidal inner surface, and interior hemispheroidal inner surface evenly is coated with one deck whitewash layer, and this whitewash layer covers the head of light emitting diode.
Owing to adopted such scheme, the some Kong Zhongjun as test point that are provided with on the interior hemisphere of perimetry instrument are embedded with a light emitting diode, the head of these light emitting diodes flushes with interior hemispheroidal inner surface, evenly be coated with one deck whitewash layer at interior hemispheroidal inner surface, this whitewash layer covers the head of light emitting diode, the light that light emitting diode is sent passes through the slow reflection source that the whitewash layer forms sensitization intensity unanimity, improves the checkout effect of back projection type perimetry instrument.And because of its test point light source be fixed on the hemisphere, test point is stable, accurate positioning need not the high light source part of service precision, compares with the price of front projection type perimetry instrument costliness, cost of manufacture is reduced widely.
The utility model is described in further detail below in conjunction with drawings and Examples.
Description of drawings
Fig. 1 is a structural representation of the present utility model;
Fig. 2 is the A place partial enlarged drawing of Fig. 1.
The specific embodiment
Referring to Fig. 1, Fig. 2, the interior hemisphere 3 of perimetry instrument is provided with some holes as test point, embedding tightly in each hole has a tack light emitting diode 2, and the head of light emitting diode 2 flushes with the inner surface of interior hemisphere 3, and rough phenomenon can not be arranged; Light emitting diode 2 can not drop out light emitting diode 2 by in hemisphere 3 holes in being adhesively fixed on from the hole; The pin of these light emitting diodes is connected in control circuit by lead.The inner surface of interior hemisphere 3 is coated with the whitewash layer 1 that a layer thickness is 0.04mm equably, and perhaps the coating thickness of whitewash layer 1 all can reach effect same between 0.02～0.5mm.This whitewash layer 1 must spray the head that covers light emitting diode 2, and the light that light emitting diode 2 is sent forms the slow reflection source of sensitization intensity unanimity by whitewash layer 1.The whitewash of whitewash layer 1 adopts water paint, perhaps adopts chemistry painting industry or oil paint all can reach effect same.Hemisphere 3 adopts fiberglass or engineering plastic materials to make in described.
Hemisphere in this is installed in the casing 4 of perimetry instrument, the detected person inserts face and detects in the hole 5, energized, the light that the light emitting diode 2 by the some test points on the interior hemisphere 3 sends see through the slow reflection source that whitewash layer 1 forms and detect.
Claims (4)
1. the interior hemisphere of a back projection type perimetry instrument, the interior hemisphere of perimetry instrument is provided with some holes as test point, embed in each hole a light emitting diode is arranged, these light emitting diodes connect by lead, it is characterized in that: the head of described light emitting diode (2) flushes with the inner surface of interior hemisphere (3), the inner surface of interior hemisphere (3) evenly is coated with one deck whitewash layer (1), and this whitewash layer (1) covers the head of light emitting diode (2).
2. the interior hemisphere of back projection type perimetry instrument according to claim 1 is characterized in that: the coating thickness of described whitewash layer (1) is 0.02～0.5mm.
3. the interior hemisphere of back projection type perimetry instrument according to claim 1 is characterized in that: described light emitting diode (2) is the tack light emitting diode.
4. the interior hemisphere of back projection type perimetry instrument according to claim 1 is characterized in that: the material of hemisphere (3) adopts glass-reinforced plastic material or engineering plastic materials in described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200620110010 CN2879958Y (en) | 2006-02-24 | 2006-02-24 | Inner hemisphere of rear-projection type pecioptometry apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200620110010 CN2879958Y (en) | 2006-02-24 | 2006-02-24 | Inner hemisphere of rear-projection type pecioptometry apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2879958Y true CN2879958Y (en) | 2007-03-21 |
Family
ID=37879796
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200620110010 Expired - Fee Related CN2879958Y (en) | 2006-02-24 | 2006-02-24 | Inner hemisphere of rear-projection type pecioptometry apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2879958Y (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105342611A (en) * | 2015-12-14 | 2016-02-24 | 重庆国特医疗设备有限公司 | Visual field instrument stimulating screen structure |
| CN105455775A (en) * | 2015-12-18 | 2016-04-06 | 邓宏伟 | Eyeball position and extraocular muscle strength measuring apparatus and methods |
| CN105534522A (en) * | 2015-12-14 | 2016-05-04 | 重庆国特医疗设备有限公司 | Perimeter stimulation screen structure |
-
2006
- 2006-02-24 CN CN 200620110010 patent/CN2879958Y/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105342611A (en) * | 2015-12-14 | 2016-02-24 | 重庆国特医疗设备有限公司 | Visual field instrument stimulating screen structure |
| CN105534522A (en) * | 2015-12-14 | 2016-05-04 | 重庆国特医疗设备有限公司 | Perimeter stimulation screen structure |
| CN105455775A (en) * | 2015-12-18 | 2016-04-06 | 邓宏伟 | Eyeball position and extraocular muscle strength measuring apparatus and methods |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20070321 Termination date: 20120224 |