CN2831143Y

CN2831143Y - Strong voltage detection circuit

Info

Publication number: CN2831143Y
Application number: CN 200520110867
Authority: CN
Inventors: 孙奇辉; 李志罡; 李莉; 朱旬; 姜德志
Original assignee: Haier Group Corp; Qingdao Haier Technology Co Ltd
Current assignee: Haier Group Corp; Qingdao Haier Technology Co Ltd
Priority date: 2005-06-29
Filing date: 2005-06-29
Publication date: 2006-10-25
Anticipated expiration: 2015-06-29

Abstract

The utility model provides a detection circuit for strong voltage, which comprises alternating current power supply to be detected, a single chip computer and direct current power supply which provides power for the single chip computer. The circuit also comprises resistors (R1), (R2) which are connected between the earth wire and the fire wire of the alternating current power supply in series, the input end of the single chip computer is connected with the junction point of the resistors (R1), (R2), and is connected with the ground through a capacitor (C3). Because the utility model adopts the resistors, the voltage to be detected is sampled so that voltage input to the single chip computer is in a range within which voltage can be detected, realizing the detection of strong voltage. Thus, the cost of the circuit is lowered.

Description

A kind of forceful electric power is pressed testing circuit

Technical field

The utility model relates to a kind of forceful electric power and presses testing circuit.

Background technology

In the high voltage electrical system, need measure accurately the magnitude of voltage of high voltage circuit usually, for safety and convenient the application, testing result must be kept apart with high voltage circuit.Existing pick-up unit major part all is to adopt electromagnetic potential transformer, and it is to adopt the capacitance partial pressure method to measure that part is also arranged.

Electromagnetic potential transformer mainly is to be made of primary winding, secondary coil and iron core, primary winding inserts in the tested ac high voltage loop, the magnetic flux of its generation is sent to secondary coil through iron core, and by inducing proportional alternating voltage in the secondary coil, therefore high voltage is kept apart, major part also insulate with oil in the voltage transformer (VT) of voltage levels.With reference to Fig. 1; supply voltage L, N are through step-down transformer T12; the high-voltage variable of AC power is the interchange low-voltage; after D15, D16, D17, D18 full-bridge rectification; through electric capacity E13 filtering, become the low-voltage direct that single-chip microcomputer can detect again, give single-chip microprocessor MCU through resistance R 11 and detect; the effect of capacitor C 13 is interference filters, and diode D19 is used to protect single-chip microcomputer.

And in the capacitance partial pressure method is measured, mainly be by several capacitance series to high voltage circuit, voltage on each electric capacity and tested voltage are proportional, the voltage on an electric capacity of minimum voltage is after electromagnetic type transformer transformation and the measured value that obtains isolating.

The defective of prior art is: in high-voltage detecting circuit, all adopt transformer that the forceful electric power high pressure is become low pressure, processing such as single-chip microcomputer are sent in rectification, thereby have higher cost usually, and the circuit structure relative complex.

The utility model content

Problem to be solved in the utility model provides a kind of forceful electric power and presses testing circuit, can not adopt expensive device realization forceful electric power pressure detections such as transformer in this circuit.

For solving the problems of the technologies described above, the purpose of this utility model is achieved through the following technical solutions.

A kind of forceful electric power is pressed testing circuit, comprise tested AC power, single-chip microcomputer, be the single-chip microcomputer direct current power source supplying power, also comprise the resistance (R1), (R2) that are connected in series with between AC power ground wire and the live wire in the described circuit, described single-chip microcomputer input end links to each other with the tie point of resistance (R1), (R2), and described single-chip microcomputer input end is by electric capacity (C3) ground connection.

Press in the testing circuit at described forceful electric power, be connected in series diode between described direct supply and the single-chip microcomputer input end, diode cathode is connected with the single-chip microcomputer input end.

Above-mentioned forceful electric power presses the direct supply structure described in the testing circuit to be: (T1) becomes the low-voltage alternating current with described AC supply voltage by transformer, via diode (D1) (D2) after the full-bridge rectification that (D3) (D4) constitutes, obtain Rectified alternating current, after electric capacity (E1), (C1) filtering, import voltage stabilizer (W1), with the stable DC electricity that obtains through electric capacity (E2) (C2) after the filtering as the output VDD of direct supply, and VDD links to each other with the live wire of described tested AC power.

Above technical scheme owing in circuit of the present utility model, adopt resistance to realize the sampling of tested voltage, and then make the voltage that is input to single-chip microcomputer in the voltage-measurable scope, has realized that the forceful electric power pressure detects, thereby has reduced circuit cost as can be seen.

Description of drawings

Fig. 1 presses testing circuit figure for existing forceful electric power;

Fig. 2 is that forceful electric power of the present utility model is pressed testing circuit figure

Embodiment

With reference to Fig. 2, specify forceful electric power of the present utility model and press the testing circuit structure.

The described forceful electric power of Fig. 2 is pressed and is comprised one in the testing circuit for power transformer T1, is used for tested power supply high voltage alternating current is become the low-voltage alternating current; Described low-voltage alternating current input becomes Rectified alternating current by the bridge commutating that diode D1, D2, D3, D4 constitute after rectification, described bridge structure as shown in the figure; Electric bridge is connected with C1 with electric capacity E1, and described Rectified alternating current becomes direct current after E1 and C1 filtering, and becomes the galvanic current pressure after direct current stabilizer W1 voltage stabilizing; Described galvanic current pressure as the output VDD of direct supply, be used for to the single-chip microcomputer power supply, and VDD is linked on the live wire L of tested AC power after electric capacity E2 and C2 filtering.

Also comprise resistance R 1, R2 in the circuit described in the utility model, and, when described forceful electric power presses testing circuit to be connected with tested AC power, between resistance R 1, R2 serial connection and tested AC power live wire L and the ground wire N; The tie point of resistance R 1 and R2 is connected to analog to digital conversion (A/D) the interface IN1 of single-chip microprocessor MCU, i.e. voltage between power taking resistance R1 and the R2 is linked the A/D interface IN1 of single-chip microcomputer; And diode D5 is serially connected with between Chip Microcomputer A/D interface and the direct supply output VDD, and diode cathode is connected with single-chip microcomputer, and this diode D5 is used to protect single-chip microcomputer to avoid high-tension infringement; And also by capacitor C 3 ground connection, described capacitor C 3 is a filter capacitor to the A/D interface of single-chip microcomputer, is used for the interference of filtering Chip Microcomputer A/D input end, improves accuracy of detection.

When the variation in voltage of tested AC power live wire L, also can carry out respective change by resistance R 1 and R2 dividing potential drop post-sampling to the voltage of the A/D interface IN1 of single-chip microcomputer, the voltage that input end IN1 changes obtains corresponding numerical value after Chip Microcomputer A/D conversion, this numerical value and supply voltage have one-to-one relationship, so just can judge supply voltage according to A/D, thereby reach the purpose that detects supply voltage, described single chip part belongs to the known technology of this area, be not elaborated.

Mentioned above is preferred embodiment of the present utility model, in the foregoing description, by step-down filtering and voltage stabilizing to tested AC power, for single-chip microcomputer provides galvanic current, yet not getting rid of the DC power supply circuit in alternative the foregoing descriptions of mode such as adopting chemical cell or the floating battery of light in the utility model, directly is the single-chip microcomputer power supply.

More than press testing circuit to be described in detail to a kind of forceful electric power provided by the utility model, used specific case herein principle of the present utility model and embodiment are set forth, the explanation of above embodiment just is used for helping to understand method of the present utility model and core concept thereof; Simultaneously, for one of ordinary skill in the art, according to thought of the present utility model, the part that all can change in specific embodiments and applications, in sum, this description should not be construed as restriction of the present utility model.

Claims

1, a kind of forceful electric power is pressed testing circuit, comprises single-chip microcomputer, is the single-chip microcomputer direct current power source supplying power, it is characterized in that:

Also comprise resistance (R1), (R2) in the described circuit, when described forceful electric power presses testing circuit to be connected with tested AC power, resistance (R1), (R2) are serially connected with between tested AC power ground wire and the live wire, described single-chip microcomputer input end links to each other with the tie point of resistance (R1), (R2), and described single-chip microcomputer input end is by electric capacity (C3) ground connection.

2, forceful electric power as claimed in claim 1 is pressed testing circuit, it is characterized in that:

Be connected in series diode between described direct supply and the single-chip microcomputer input end, diode cathode is connected with the single-chip microcomputer input end.

3, forceful electric power as claimed in claim 1 is pressed testing circuit, it is characterized in that described direct supply structure is specially:

(T1) becomes the low-voltage alternating current with described AC supply voltage by transformer, via diode (D1) (D2) after the full-bridge rectification that (D3) (D4) constitutes, obtain Rectified alternating current, after electric capacity (E1), (C1) filtering, import voltage stabilizer (W1), with the stable DC electricity that obtains through electric capacity (E2) (C2) after the filtering as the output VDD of direct supply, and VDD links to each other with the live wire of described tested AC power.

4, forceful electric power as claimed in claim 1 is pressed testing circuit, it is characterized in that:

Described direct supply is a chemical cell.

5, forceful electric power as claimed in claim 1 is pressed testing circuit, it is characterized in that:

Described direct supply is the floating battery of light.