CN2676187Y - Film disadvantages detection system - Google Patents
Film disadvantages detection system Download PDFInfo
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- CN2676187Y CN2676187Y CN 200320102771 CN200320102771U CN2676187Y CN 2676187 Y CN2676187 Y CN 2676187Y CN 200320102771 CN200320102771 CN 200320102771 CN 200320102771 U CN200320102771 U CN 200320102771U CN 2676187 Y CN2676187 Y CN 2676187Y
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- film
- detection system
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- disadvantages
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Abstract
The utility model relates to a disadvantages detection system, in particular to a film disadvantages detection system used in the process of photosensitive film arrangement. The utility model is composed of a film wrap-up device and an image detection apparatus, and wherein, the film wrap-up device is composed of a drive motor (14), a film feed roller (7), a take-up roller (6), a guide roller (8), a pinch roller (9) and a drive belt (15); the image detection apparatus is composed of a CCD camera (2), an infrared face light source (1) and a regulated power supply (13). The utility model is characterized in that the film disadvantages detection system also comprises a disadvantages position measuring device and a computer image analysis system. The film disadvantages detection system overcomes the unfavorable factors of artificial observation and can detect the defects of the interlayers and record automatically the position of the defects.
Description
Relate to the field
The utility model relates to a kind of disadvantage detection system, particularly a kind of disadvantage detection system that is used for sensitive film arrangement process.
Background technology
In the sensitive film production run, can produce various disadvantages, and these disadvantages can directly have influence on film quality.Film defect in the arrangement process detects, and will determine the existence and the residing position of disadvantage exactly.
It is a kind of desk checking method that film defect detects the normal method that adopts, and it utilizes charge-coupled device (CCD) as detecting unit, and infrared light supply is as illumination.Infrared light supply and detecting unit are installed in the same side of tested film emulsion side.Infrared light shines the film surface of motion, scattering after running into disadvantage, infrared light after the scattering is received by detecting unit, after detecting unit detects the infrared light of scattering, be transformed into the vision signal of standard, deliver to monitor and show, observe display frame, to judge existing and the position of disadvantage by operating personnel.Because this method needs operating personnel's long-term observation display screen, very easily, influence product quality because of tired and carelessness cause omission and false retrieval, this in addition method can't detect the disadvantage that exists between film layers.
Summary of the invention
The purpose of this utility model provides a kind of novel film defect detection system, overcoming the unfavorable factor that manual observation is caused, and can be good at detecting disadvantage that interlayer exists and record disadvantage position automatically.
The technical solution of the utility model is:
A kind of film defect detection system is made up of film wrap-up and image detection device, and wherein, the film wrap-up is made up of drive motor (14), feed roll (7), the roller that takes up (6), deflector roll (8), pinch roller (9), belt (15); Image detection device is made up of CCD camera (2), infrared area source (1) and power supply stabilized voltage supply (13); It is characterized in that this device also comprises disadvantage position-measurement device and computer image analysis system.
A kind of preferred version, wherein said disadvantage position-measurement device detects photoelectric sensor (5) by code-disc (3), photoelectric sensor (4), run-out and film length synchronous detection treatment circuit (10) is formed.
A kind of preferred version, wherein said computer image analysis system is made up of high speed image acquisition board and interface (11) and computing machine and graphical analysis and disadvantage process software (12).
A kind of preferred version, wherein said infrared area source (1) and CCD camera (2) lay respectively at the both sides up and down of tested film.
Tested film is installed on the feed roll of film wrap-up, and film is coupled to the roller that takes up by a series of deflector roll, and the roller that takes up is driven by drive motor.Two deflector rolls are arranged on the transport path of film, make film between these two deflector rolls, be in horizontal direction, and the distance between the deflector roll is short as much as possible, and CCD camera and infrared area source are installed in the both sides up and down of this section film respectively, can avoid film judder that testing result is impacted like this.Send a signal when drive motor starts, image detection device, disadvantage position-measurement device, computer image analysis system start working.The roller that takes up rotates and drives film movements, the CCD camera carries out high speed acquisition to the film of motion, and be converted to digital signal, send the computer image analysis system to, the film of motion drives the code-disc rotation simultaneously, the velocity of rotation of code-disc and the movement velocity of film are synchronous, photoelectric sensor detects the rotation of code-disc, and the having or not of light signal when rotating according to code-disc, be converted to corresponding electric signal, film length synchronous detection treatment circuit carries out shaping filter to the electric signal of photoelectric sensor output, pass to the counter card by the output control gate, follow the tracks of tested film position, the computer image analysis system gathers in real time, show, handle film image and discern disadvantage, record shows the number that film defect occurs, the position of record disadvantage.After the film run-out detects photoelectric sensor by run-out, run-out detects photoelectric sensor and sends a signal, through shaping filter, signal is passed to single-chip microcomputer, single-chip microcomputer is through handling, output one detects the signal that finishes, by exporting control gate to the counter card, the counter card passes to computing machine with the detection signal that finishes, and computing machine sends by I/O control and stops detection signal, by Single-chip Controlling output control gate, stop the counter CalCt, the computer image analysis system stops images acquired and calculates the position that disadvantage occurs, and deposits testing result in computing machine, forms disadvantage report file and preservation.
Be described further this enforcement is novel below in conjunction with drawings and Examples.
Fig. 1 is the rough schematic view of the utility model detection system.
Fig. 2 is the front view of the utility model detection system
Fig. 3 is the utility model pick-up unit film length synchronous detection treatment circuit schematic diagram
Embodiment
A kind of film defect detection system as Figure 1-3, form by film wrap-up, image detection device, disadvantage position-measurement device and computer image analysis system, wherein, the film wrap-up is made up of drive motor (14), feed roll (7), the roller that takes up (6), deflector roll (8), pinch roller (9), belt (15); Image detection device is made up of CCD camera (2), infrared area source (1) and power supply stabilized voltage supply (13), and infrared area source (1) and CCD camera (2) lay respectively at the both sides up and down of tested film; The disadvantage position-measurement device detects photoelectric sensor (5) by code-disc (3), photoelectric sensor (4), run-out and film length synchronous detection treatment circuit (10) is formed; The computer image analysis system is made up of high speed image acquisition board and interface (11) and computing machine and graphical analysis and disadvantage process software (12).
Tested film is installed on the feed roll (7), and film is connected to the roller that takes up (6) by a series of deflector roll (8) and pinch roller (9), and the roller that takes up is driven by drive motor.
Infrared area source (1) is launched sheet by infrared LED (940nm) array, optical filter and lambert and is formed, and power supply is provided by stabilized voltage supply (13).Infrared area source (1) provides uniform illumination for CCD camera (2) in detection system.The CCD camera adopts UP-600 camera, 8mm tight shot.Infrared area source (1) is installed in the top of film film path horizontal segment, and CCD camera (2) is installed in the below.Owing to there are two deflector rolls (8) to support, film path is stable on this section film path.Infrared area source (1) should be able to be adjusted with the position of CCD camera (2), to guarantee CCD camera optimal imaging effect.
Drive motor starts, and drives the roller (6) that takes up and rotates, and sends an enabling signal simultaneously, and image detection device, disadvantage position-measurement device, computer image analysis system start working.CCD camera (2) carries out high speed acquisition to the film of motion, and be converted to digital signal, send information to computing machine (12) by high speed image acquisition board and interface (11), the computer image analysis system gathers, shows, handles film image in real time and discerns disadvantage, and record shows the number that film defect occurs.
Code-disc (3) is connected on the deflector roll by shaft joint, film movements makes deflector roll follow rotation, and drive code-disc rotation, photoelectric sensor (4) acquired signal, by film length synchronous processing circuit (10), the velocity of rotation of code-disc and the movement velocity of film are synchronous, photoelectric sensor (4) detects the rotation of code-disc, and the having or not of light signal when rotating according to code-disc, be converted to corresponding electric signal, film length synchronous detection treatment circuit (10) carries out shaping filter (18) to the electric signal of photoelectric sensor output, pass to counter card (22) by output control gate (20), follow the tracks of tested film position, the computer image analysis system gathers in real time, show, handle film image and discern disadvantage, record shows the number that film defect occurs, the position of record disadvantage.When the film run-out detects photoelectric sensor (5) by run-out after, run-out detects photoelectric sensor and sends a signal, through shaping filter (17), signal is passed to single-chip microcomputer (19), single-chip microcomputer is through handling, output one detects the signal that finishes, by exporting control gate to the counter card, the counter card passes to computing machine (12) with the detection signal that finishes, and computing machine sends by I/O control (21) and stops detection signal, by Single-chip Controlling output control gate, stop the counter CalCt, the computer image analysis system stops handling procedure, and deposits testing result in computing machine, forms disadvantage report file and preservation.In the disadvantage report file, record the length overall of number, position and the film of disadvantage.
Beneficial effect:
The beneficial effects of the utility model are to show in real time the same of film testing process The time, image is processed, is identified, determine the existence of disadvantage, the synchronous recording disadvantage Several and residing position, and determine detection resolution according to the detection threshold of operating personnel input. Owing to adopt transillumination, also can detect the interlayer disadvantage of film.
Claims (4)
1. a film defect detection system is made up of film wrap-up and image detection device, and wherein, the film wrap-up is made up of drive motor (14), feed roll (7), the roller that takes up (6), deflector roll (8), pinch roller (9), belt (15); Image detection device is made up of CCD camera (2), infrared area source (1) and power supply stabilized voltage supply (13); It is characterized in that this system also comprises disadvantage position-measurement device and computer image analysis system.
2. according to right 1 described film defect detection system, it is characterized in that described disadvantage position-measurement device detects photoelectric sensor (5) by code-disc (3), photoelectric sensor (4), run-out and film length synchronous detection treatment circuit (10) is formed.
3. according to right 1 described film defect detection system, it is characterized in that described computer image analysis system is made up of high speed image acquisition board and interface (11) and computing machine and graphical analysis and disadvantage process software (12).
4. according to right 1 described film defect detection system, it is characterized in that infrared area source (1) in the described image detection device and CCD camera (2) lay respectively at the both sides up and down of tested film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200320102771 CN2676187Y (en) | 2002-11-18 | 2003-11-05 | Film disadvantages detection system |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN02285801 | 2002-11-18 | ||
| CN02285801.6 | 2002-11-18 | ||
| CN 200320102771 CN2676187Y (en) | 2002-11-18 | 2003-11-05 | Film disadvantages detection system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2676187Y true CN2676187Y (en) | 2005-02-02 |
Family
ID=34523602
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200320102771 Expired - Fee Related CN2676187Y (en) | 2002-11-18 | 2003-11-05 | Film disadvantages detection system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2676187Y (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101806922A (en) * | 2010-03-10 | 2010-08-18 | 北京航空航天大学 | Intelligent detection method for film type |
| CN107561027A (en) * | 2017-07-11 | 2018-01-09 | 武汉华星光电半导体显示技术有限公司 | In PI films in NMP content detection devices and PI films NMP contents detection method |
| CN108896572A (en) * | 2018-07-27 | 2018-11-27 | 爱德森（厦门）电子有限公司 | A kind of colloid conveyer belt on-line measuring device and method |
| CN112147159A (en) * | 2020-11-26 | 2020-12-29 | 虎丘影像（苏州）有限公司 | Film defective pixel identification and sorting system |
-
2003
- 2003-11-05 CN CN 200320102771 patent/CN2676187Y/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101806922A (en) * | 2010-03-10 | 2010-08-18 | 北京航空航天大学 | Intelligent detection method for film type |
| CN101806922B (en) * | 2010-03-10 | 2012-09-05 | 北京航空航天大学 | Intelligent detection method for film type |
| CN107561027A (en) * | 2017-07-11 | 2018-01-09 | 武汉华星光电半导体显示技术有限公司 | In PI films in NMP content detection devices and PI films NMP contents detection method |
| CN108896572A (en) * | 2018-07-27 | 2018-11-27 | 爱德森（厦门）电子有限公司 | A kind of colloid conveyer belt on-line measuring device and method |
| CN112147159A (en) * | 2020-11-26 | 2020-12-29 | 虎丘影像（苏州）有限公司 | Film defective pixel identification and sorting system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20050202 Termination date: 20101105 |