CN2600824Y - Testing device connector - Google Patents
Testing device connector Download PDFInfo
- Publication number
- CN2600824Y CN2600824Y CN 02292680 CN02292680U CN2600824Y CN 2600824 Y CN2600824 Y CN 2600824Y CN 02292680 CN02292680 CN 02292680 CN 02292680 U CN02292680 U CN 02292680U CN 2600824 Y CN2600824 Y CN 2600824Y
- Authority
- CN
- China
- Prior art keywords
- electric connector
- test electric
- circuit board
- conducting terminal
- base portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses an electric connector for testing purposes, comprising an insulating body, several conductive terminals positioned inside the insulating body and a holding mechanism, wherein the holding mechanism can hold and fix an integrated circuit chip on the testing electric connector; the conductive terminal consists of a base part, a connecting part extends out from one end of the base part, a head part connected with the connecting part and a splicing part; two opposite side walls of the base part are provided with interference surfaces; the splicing part extends from the base part towards the circuit board, and surface of the splicing part facing the circuit board is spliced with an eutectic joint component; two arm parts extends out from the connecting part, and the arm parts are provided with socket parts; the head part is provided with two bumping posts arranged in parallel; the two bumping posts in the head part of the conductive terminals and the two socket parts of the connecting part can be used to hold the conductive pins of modules of the integrated circuit chip. The testing electric connector is welded and mounted on surface of the circuit board with help of an eutectic joint component, so the testing electric connector can be mounted on either of the two opposite surfaces of the circuit board; therefore, the utility model can increase the space utilization ratio of circuit boards and can reduce the production cost.
Description
[technical field]
The utility model is relevant a kind of test electric connector, refers in particular to a kind of test electric connector that is used for the testing integrated circuit chip module.
[background technology]
In use safe and reliable in order to guarantee the integrated circuit (IC) chip module, nearly all integrated circuit (IC) chip module must detect just before installation and can come into operation, in order to test, needs one tool is fixed in other electronic package and is electrically conducted with other electronic package, and this tool is known as the test electric connector.
Generally after the manufacturing of integrated circuit (IC) chip module finishes,, need carry out burn-in testing for the circuit package that self is existed defective or produced defective in manufacture process screens.If there is defective in the integrated circuit (IC) chip module, its life cycle will obviously shorten.Usually can it be connected on the testing circuit board by a test electric connector, energized also improves the temperature of its surrounding environment, and the integrated circuit (IC) chip module that has defective was lost efficacy as early as possible, just it can be screened and then eliminate.Thereby the integrated circuit (IC) chip module that can avoid having defective comes into operation and make it have all hidden danger in the course of the work.
The test electric connector generally comprises insulating body, conducting terminal and driving mechanism, and insulating body is the basic framework of test electric connector, fills polyester by high temp glass usually and constitutes.Conducting terminal is an elastic parts, and can bear the high temperature in the pre-burning process, and it has high yield limit, good deformation property and stress reduction performance.
The mode industry that electric connector is connected to circuit board has two kinds usually: a kind of is that stitch by conducting terminal is arranged in the through hole of circuit board, these winding modes make that another surface can't be installed other electronic package more relatively, cause the waste of circuit board space; Another kind is by the tin ball is set on the conducting terminal, and ball bonding is connected to circuit board surface and electric connector is connected to circuit board surface by tin.For how test connector being connected to circuit board, the people in the industry it has been generally acknowledged that because of its in use conducting terminal to bear higher temperature, this temperature is generally about 1 50 ℃, if be used in the tin ball is set on the conducting terminal, be connected to circuit board surface by this tin ball bonding and test connector be connected to the winding mode of circuit board, then lower because of tin ball fusing point, generally about 180 ℃, so if environment temperature control is improper in the test connector use, easily softening or thawing with the tin ball, not only cause winding failure between test connector and circuit board, and if the scolding tin material that the thawing of two or more tin ball forms merges, also can cause short circuit, thus industry all adopt stitch by conducting terminal be arranged in circuit board through hole mode and test connector is connected to circuit board.
As the United States Patent (USP) of announcing respectively on February 2nd, 1999, on Dec 5th, 2000 and February 27 calendar year 2001 the 5th, 865, No. 639,6,155, No. 859 and 6,193, No. 525 disclose, existing test electric connector penetrates through hole on the testing circuit board, permanent being connected on the testing circuit board by the weldering tail of its conducting terminal.After this winding form made that the test electric connector is connected to testing circuit board, relative another surface of this testing circuit board can't be installed another test electric connector again, causes the utilized space of testing circuit board to be wasted.
[utility model content]
The purpose of this utility model is to provide a kind of test electric connector that takies the less circuit board useful space.
The purpose of this utility model is achieved in that this test electric connector comprises insulating body, is placed in several conducting terminals and the fixing structure of insulating body, and fixing structure can be immobilizated in the integrated circuit (IC) chip module test electric connector.Junction, the head that is connected with junction and group connecting part that conducting terminal comprises base portion, extends from base portion one end, wherein the two opposite side walls of base portion is provided with interference surface, group connecting part extends setting from base portion to the circuit board direction, and its surperficial winding towards circuit board has the fusibility joint element.The junction extension is provided with two arms, and this arm is provided with carrier.Head is provided with two bumping posts that be arranged in parallel, and two bumping posts of the head of conducting terminal and two carriers of junction can be accommodated the conductive feet of integrated circuit (IC) chip module.
Compared with prior art, the utlity model has following advantage: this test electric connector is to be welded in circuit board surface by the fusibility joint element, then the test electric connector all can be welded in relative two surfaces of circuit board, thereby improves the space availability ratio of circuit board and save production cost.
[description of drawings]
Fig. 1 is the three-dimensional combination figure of the utility model test electric connector.
Fig. 2 is the stereographic map of the conducting terminal of the utility model test electric connector.
Fig. 3 is the analytical test figure of the conducting terminal electric conductivity of the utility model test electric connector.
[embodiment]
See also Fig. 1 and Fig. 2, the utility model test electric connector 1 comprises insulating body 11, several conducting terminals 12 and fixing structure 13, wherein, insulating body 11 offers several terminal storage tanks 111, and these several conducting terminals 12 are placed in several terminal storage tanks 111 that insulating body 11 is offered.This test electric connector 1 is connected on the circuit board 2 and by its conducting terminal 12 and electrically conducts with circuit board 2 with the connecting of conducting strip (not shown) of circuit board 2.
Fixing structure 13 is immobilizated in test electric connector 1 with integrated circuit (IC) chip module (not shown), and the conductive feet (not shown) of the integrated circuit (IC) chip module conducting terminal 12 with test electric connector 1 electrically conducted, and realize being electrically conducted with the conducting strip of circuit board 2 by the conducting terminal 12 of test electric connector 1.
Conducting terminal 12 comprises strip base portion 121, the junction 122 from the extension of base portion 121 1 ends, the head 123 that is connected with junction 122, and group connecting part 124.Wherein base portion 121 1 end broads one end is narrower, and its width relaxes transition on its entire length, and is provided with interference surface 1211 in the two opposite side walls of an end of broad.
Group connecting part 124 extends setting from base portion 121 to circuit board 2 directions, and vertical with base portion 121, roughly is square.Group connecting part 124 is concaved with coniform pit (not shown) towards the middle part, surface of circuit board 2.
Junction 122 is provided with base portion 121 and is connected the connecting portion 1221 that is provided with, and reaches two arms 1222 that extend from connecting portion 1221 two opposite side walls symmetry, and this arm 1222 comprises support sector 1223, extension 1224, elastic 1225 and carrier 1226.Wherein support sector 1223 extends and roughly vertical with connecting portion 1221 from the sidewall of connecting portion 1221, the extending end of extension 1224 self-supporting portions 1223 roughly extends along the direction vertical with support sector 1223, elastic 1225 from the extending end of extension 1224 to the oblique extension of two arms, 1222 axis of symmetry, the extending end of the carrier 1226 own elasticity portions 1225 of two arms 1222 is to the outside relatively oblique extension of head 123 directions, and is formed with smooth continuing surface 1227 in the inside top of carrier 1226.
The opposite end of head 123 is respectively equipped with bumping post 1231, this two bumping post 1231 keeps at a certain distance away and be arranged in parallel, two surfaces that are oppositely arranged in two bumping posts 1231 are formed with smooth stop surface 1232, and this two stop surface 1232 encloses formation one grasping part 125 with two continuing surfaces 1227 of junction 122.In addition, head 123 convexes with holding section 1233 in its two opposite side walls near junction 122 1 ends.
The grasping part 125 of two stop surfaces 1232 of the head 123 of conducting terminal 12 and two continuing surface 1227 formation that enclose of junction 122 can be accommodated the conductive feet of integrated circuit (IC) chip module and is electrically conducted mutually with conductive feet.
When conducting terminal 12 is placed in the terminal storage tank 111 of insulating body 11, the holding section 1233 of its head 123 and the interference surface of base portion 121 1211 supports the sidewall that terminates in terminal storage tank 111, and with terminal storage tank 111 interference engagement so that conducting terminal 12 is immobilizated in the terminal storage tank 111.
After insulating body 11, several conducting terminals 12 and fixing structure 13 windings of test electric connector 1 are one, to test electric connector 1 earlier is inverted, several fusibility joint elements 3 are fallen to placing on several conducting terminals 12 of test electric connector 1, and be positioned the pit (not shown) of conducting terminal 12 group connecting parts 124 respectively.In the present embodiment, this fusibility conjugative component 3 is the tin ball.After fusibility conjugative component 3 was connected to test electric connector 1, the winding with circuit board 2 was realized on the surface that test electric connector 1 is welded in circuit board 2 after by fusibility conjugative component 3 fusing.
See also Fig. 3, this figure is after test electric connector 1 is welded in circuit board 2, the analytical test figure of conducting terminal 12 electric conductivities to test electric connector 1, the abscissa axis of this figure (figure acceptance of the bid be shown with " test condition ") is the tested condition of conducting terminal 12, the resistance value that records behind the axis of ordinates of this figure (the figure acceptance of the bid is shown with " resistance value ") every conducting terminal 12 of test has 103 conducting terminals 12 tested in this experiment.Be shown with " under the normal temperature " at the abscissa axis subscript, " after 500 hours " reach " after 650 hours " three kinds of test conditions, the resistance value of measured every conducting terminal 12 is denoted as a bit under every kind of test condition, about 50% measured resistance value point of this 103 conducting terminals 12 is arranged in the rectangle frame, and outer rectangular frame has 75% resistance value point in two horizontal lines up and down approximately.
After will testing electric connector 1 and being welded in circuit board 2, do not put into before the convection oven, the resistance value of 103 conducting terminals 12 after tested, as the resistance value distribution of " under the normal temperature " as shown in the abscissa axis among the figure, and the resistance value of all conducting terminals 12 all surpasses 20 microhms.When the test electric connector 1 put into temperature be 150 ℃ convection oven and heat 500 hours after, the resistance value scope that records these 103 conducting terminals 12 such as " after 500 hours " as shown in " test condition " coordinate axis among the figure sign, and the outward appearance of conducting terminal 12 does not find to damage phenomenon on inspection.Putting into temperature when test electric connector 1 is that 150 ℃ convection oven heating is after 650 hours, the resistance value scope that records these 103 conducting terminals 12 such as " after 650 hours " as shown in the abscissa axis among the figure sign, and the outward appearance of conducting terminal 12 does not find to damage phenomenon on inspection.
Analyze above experimental result and find, the conducting terminal 12 of test electric connector 1 was put into the convection oven heating after 650 hours, and its resistance value does not all surpass 25 microhms.Because of the resistance value of the conducting terminal of general test connector can satisfy request for utilization less than 25 microhms, and generally in use can not surpass 100 hours heat time heating time, can satisfy request for utilization so can determine this test electric connector 1 and the winding mode of circuit board 2.
When the testing integrated circuit chip module, earlier it is immobilizated in test electric connector 1 by fixing structure 13, to test the circuit board 2 at electric connector 1 place then and send in the convection oven (not shown), baking box can improve the temperature of this circuit board 2, test electric connector 1 and integrated circuit (IC) chip module and provide circuit board 2 and being electrically connected of integrated circuit (IC) chip module and voltage and signal generator.The integrated circuit (IC) chip module be if self defectiveness or produced defective in manufacture process then just can lose efficacy after after a while in baking box, it can be screened to eliminate.
Because of this test electric connector 1 is to be welded in circuit board 2 surfaces by fusibility joint element 3, then test electric connector 1 all can be welded in relative two surfaces of circuit board 2, and like this, the space availability ratio of circuit board 2 improves, and avoids the wasting of resources and saves production cost.
Claims (10)
1. test electric connector, in order to the testing integrated circuit chip module and place on the circuit board, it comprises insulating body, fixing structure and several conducting terminals, insulating body offers several terminal storage tanks, fixing structure fixing integrated circuit (IC) chip module is on the test electric connector, conducting terminal is placed in the terminal storage tank of insulating body, it is characterized in that: conducting terminal is provided with group connecting part near circuit board one side, and this group connecting part engages the fusibility joint element.
2. test electric connector as claimed in claim 1 is characterized in that: conducting terminal also comprises base portion, the junction from the extension of base portion one end, the head that is connected with junction.
3. test electric connector as claimed in claim 2 is characterized in that: the two opposite side walls of base portion is provided with interference surface, and head convexes with the holding section in its two opposite side walls, this interference surface and terminal storage tank interference engagement.
4. test electric connector as claimed in claim 3 is characterized in that: junction is provided with base portion and is connected the connecting portion that is provided with, and is extended with two arms from connecting portion two opposite side walls symmetry, and this arm comprises support sector, extension, elastic and carrier.
5. test electric connector as claimed in claim 4, it is characterized in that: the support sector of conducting terminal arm extends and roughly vertical with connecting portion from the sidewall of connecting portion, the extending end of extension self-supporting portion is along extending with the direction of support sector approximate vertical, elastic from the extending end of extension to the oblique extension of the two arm axis of symmetry.
6. test electric connector as claimed in claim 5 is characterized in that: the extending end of the carrier own elasticity portion of two arms of conducting terminal is to the outside relatively oblique extension of cephalad direction, and is formed with smooth continuing surface in the inside top of carrier.
7. test electric connector as claimed in claim 6 is characterized in that: the head of conducting terminal is provided with two bumping posts that be arranged in parallel, and this two bumping post keeps at a certain distance away, and is formed with smooth stop surface in two surfaces that two bumping posts are oppositely arranged.
8. test electric connector as claimed in claim 7 is characterized in that: base portion one end broad, and mitigation carries out the transition to the narrower width of other end formation.
9. test electric connector as claimed in claim 8 is characterized in that: the group connecting part of conducting terminal extends from the narrower end of base portion, its is provided with vertical with base portion, and roughly be square.
10. test electric connector as claimed in claim 9 is characterized in that: the conducting terminal group connecting part is concaved with coniform pit towards the middle part, surface of circuit board, and the fusibility joint element is placed in this pit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 02292680 CN2600824Y (en) | 2002-12-26 | 2002-12-26 | Testing device connector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 02292680 CN2600824Y (en) | 2002-12-26 | 2002-12-26 | Testing device connector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2600824Y true CN2600824Y (en) | 2004-01-21 |
Family
ID=34151698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 02292680 Expired - Fee Related CN2600824Y (en) | 2002-12-26 | 2002-12-26 | Testing device connector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2600824Y (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101051067B (en) * | 2006-04-03 | 2010-08-11 | 航天科工防御技术研究试验中心 | Comprehensive detection control device design method for electric connector |
| CN101131398B (en) * | 2006-08-22 | 2011-06-15 | 京元电子股份有限公司 | Integrated circuit tester |
| CN106824833A (en) * | 2017-02-28 | 2017-06-13 | 中国振华集团云科电子有限公司 | Resistor screening technology method |
-
2002
- 2002-12-26 CN CN 02292680 patent/CN2600824Y/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101051067B (en) * | 2006-04-03 | 2010-08-11 | 航天科工防御技术研究试验中心 | Comprehensive detection control device design method for electric connector |
| CN101131398B (en) * | 2006-08-22 | 2011-06-15 | 京元电子股份有限公司 | Integrated circuit tester |
| CN106824833A (en) * | 2017-02-28 | 2017-06-13 | 中国振华集团云科电子有限公司 | Resistor screening technology method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20040121 Termination date: 20100126 |