CN2537010Y - Instrument for measuring long persistence fluorescent materials - Google Patents
Instrument for measuring long persistence fluorescent materials Download PDFInfo
- Publication number
- CN2537010Y CN2537010Y CN 01254853 CN01254853U CN2537010Y CN 2537010 Y CN2537010 Y CN 2537010Y CN 01254853 CN01254853 CN 01254853 CN 01254853 U CN01254853 U CN 01254853U CN 2537010 Y CN2537010 Y CN 2537010Y
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- CN
- China
- Prior art keywords
- afterglow
- fluorescent material
- exposure
- material tester
- described long
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Abstract
The utility model relates to an afterglow parameter measurement device for long afterglow fluorescent material, which comprises an excitation source, an exposure control device used to control the sample exposure, and a dark box used for exposure and measuring. A sample base and an afterglow detector used for receiving the sample afterglow optical signals are arranged in the dark box. The output of the afterglow detector is connected with a measuring instrument. When the device works, under the control of the exposure control device. During operation, the samples which are irradiated by the excitation source are exposed, and when the exposure is completed the samples continually release fluorescence that is afterglow. The afterglow detector receives the afterglow, and transfers the afterglow optical signals into electrical signals, then the signals are inputted to the measuring instrument, the brightness and time parameter value of the afterglow are displayed in the measuring instrument. The utility model has the advantages of compact and simple structure, accurate and consistent measured data, and convenient use.
Description
Technical field
The utility model relates to the twilight sunset parameter measuring apparatus of long-afterglow fluorescent material.
Background technology
Long-afterglow fluorescent material claims luminescent powder, light-accumulating powder, noctilucence direction board etc. again.When it was subjected to rayed, part irradiates light energy was absorbed, stores; After illumination stops.To discharge luminous energy gradually.It is widely used in the warning at night sign, the emergent direction board in steamer and public place etc.After-glow brightness and after time are the most important parameters of long-afterglow fluorescent material.At present to ununified, the reliable method of the measurement of these parameters.Existing method is: earlier with long-afterglow fluorescent material after irradiation a period of time under sunshine, daylight lamp or a certain particular lamp, in the darkroom, measure the after-glow brightness of this fluorescent material with nitometer, constantly read the reading value on each moment nitometer, obtain after-glow brightness and concern over time.In all these methods, it all is separate operation that excite and the after-glow brightness of sample are measured, and uses trouble, and consistance is poor.
Summary of the invention
The purpose of this utility model aims to provide a kind of set exposure and measures in one long-afterglow fluorescent material tester easy to use.
Long-afterglow fluorescent material tester of the present utility model comprise excitation source, control sample exposure exposure-control device, be used to the camera bellows that exposes and measure, specimen holder is installed on camera bellows, be provided with the twilight sunset detector that receives sample after-glow light signal in camera bellows, the output terminal of twilight sunset detector links to each other with measurement instrument.
During work, under the control of exposure-control device, sample is subjected to the excitation source radiation exposure, end exposure, it is twilight sunset that sample will constantly discharge fluorescence, receive twilight sunset by the twilight sunset detector, and the after-glow light conversion of signals become electric signal input measurement instrument, instrument show after-glow brightness and after time parameter value.
Long-afterglow fluorescent material tester compact conformation of the present utility model, simple, it utilize exposure-control device and disjunctor exposure, measure camera bellows, with the exposure of sample with measure and organically combine, measurement data accurately, high conformity, easy to use.
Description of drawings
Fig. 1 is that the utility model constitutes synoptic diagram;
Fig. 2 is a kind of concrete structure synoptic diagram of the utility model.
Embodiment
With reference to Fig. 1, long-afterglow fluorescent material tester of the present utility model comprises excitation source 1, be used to the camera bellows 3 that exposes and measure, specimen holder 6 is installed on camera bellows 3, be provided with the twilight sunset detector 4 that receives sample after-glow light signal in the camera bellows, twilight sunset detector 4 links to each other with measurement instrument 5, on excitation light path, be provided with exposure-control device 2, be used to control the exciting light that shines sample surfaces.The twilight sunset that sample discharges is received by twilight sunset detector 4, and becomes electric signal to be defeated by measurement instrument 5 the after-glow light conversion of signals.Excitation source 1 can be used mercury lamp, xenon lamp, fluorescent light or metal-halide lamp.Exposure-control device can be the controller that the control excitation source is lighted or closed, and as relay, perhaps also can be mounted in the optical gate between excitation source 1 and the specimen holder 6.
Fig. 2 is an instantiation of the present utility model, it comprises the excitation source 1 that is installed in the light-source box, be used to the camera bellows 3 that exposes and measure, this example, camera bellows 3 has exposure box 3a and measure case 3b two parts, utilize for these two the casees twilight sunset unthreaded hole 11 to be connected, specimen holder 6 is installed, in measure case 3b, be provided with twilight sunset detector 4 at exposure box 3a.Legend, specimen holder 6 usefulness spring carriers 14 support, and are close on the test port of exposure box bottom.The temperature control element 15 of control sample temperature is housed, as thermoelectric cooling module or heating wire on specimen holder.
For making excitation source luminous stable, usually, two electrodes of the mercury lamp, xenon lamp, fluorescent light or the metal-halide lamp that adopt are vertically installed, utilized the light turning mirror 8 that is located in the camera bellows that exciting light is refracted on the specimen holder 6 again, the light turning mirror can be plane mirror or refractive prism.In the illustrated example, exposure-control device 2 be provided in a side of in the camera bellows can around axle 9 rotate 90 ° be used to control the electronic optical gate that excites unthreaded hole 10 and twilight sunset unthreaded hole 11 to open or close, during exposure, optical gate is opened and is excited unthreaded hole 10, it closes twilight sunset unthreaded hole 11 simultaneously, when measuring twilight sunset, optical gate is closed and is excited unthreaded hole 10, and it opens twilight sunset unthreaded hole 11 simultaneously.Twilight sunset enters measure case 3b from the twilight sunset unthreaded hole, becomes electric signal to be defeated by measurement instrument 5 the after-glow light conversion of signals by twilight sunset detector 4.Twilight sunset detector 4 available silicon photodiodes or highly sensitive photomultiplier.
For making the light that shines specimen holder even, can to the light path of camera bellows 3, light diffusing board 7 be set at excitation source 1 as shown in the figure, this light diffusing board can adopt diffuse transmission plate or diffuse reflector.In this example, also installed on the excitation light path in camera bellows be used to control shine the sample light intensity excite the illumination monitoring device, it is made up of part reflective mirror 12 and photodetector 13, part reflective mirror 12 can adopt semi-transparent/catoptron, by it part exciting light is reflexed to photodetector 13, photodetector converts light signal to electric signal and is input to measurement instrument 5, shows light intensity at measurement instrument, so that regulate the light intensity of excitation source in view of the above.Measurement instrument 5 has a serial line interface with employing instrument is for well, PR-305 type instrument as available band RS-232C serial line interface, it is linked to each other with computing machine 16, utilize the twilight sunset signal of each moment fluorescent samples of computer acquisition like this, can obtain the brightness curve of twilight sunset.
Claims (10)
1. long-afterglow fluorescent material tester, it is characterized in that it comprise excitation source [1], control sample exposure exposure-control device [2], be used to the camera bellows [3] that exposes and measure, specimen holder [6] is installed on camera bellows, be provided with the twilight sunset detector [4] that receives sample after-glow light signal in camera bellows, the output terminal of twilight sunset detector [4] links to each other with measurement instrument [5].
2. by the described long-afterglow fluorescent material tester of claim 1, it is characterized in that excitation source [1] is mercury lamp, xenon lamp, fluorescent light or metal-halide lamp.
3. by the described long-afterglow fluorescent material tester of claim 2, it is characterized in that two electrodes of said mercury lamp, xenon lamp, fluorescent light or metal-halide lamp are vertically installed.
4. by the described long-afterglow fluorescent material tester of claim 1, it is characterized in that exposure-control device [2] is the controller that the control excitation source is lighted or closed.
5. by the described long-afterglow fluorescent material tester of claim 1, it is characterized in that exposure-control device [2] is mounted in the optical gate between excitation source [1] and the specimen holder [6].
6. by the described long-afterglow fluorescent material tester of claim 5, it is characterized in that said optical gate is provided in a side of the electronic optical gate that control excites unthreaded hole [10] and twilight sunset unthreaded hole [11] to open or close that is used for that can rotate 90 ° in the camera bellows [3] around axle [9], optical gate open excite unthreaded hole [10] in, optical gate is closed twilight sunset unthreaded hole [11] again, optical gate close excite unthreaded hole [10] in, optical gate is opened twilight sunset unthreaded hole [11] again.
7. by the described long-afterglow fluorescent material tester of claim 1, it is characterized in that [11 are provided with light diffusing board [7] to the light path of camera bellows [3] at excitation source.
8. by the described long-afterglow fluorescent material tester of claim 1, it is characterized in that in camera bellows [3], being provided with the light turning mirror [8] that exciting light is refracted to specimen holder [6].
9. by the described long-afterglow fluorescent material tester of claim 1, it is characterized in that being equipped with on the excitation light path of camera bellows [3] by what part reflective mirror [12] and photodetector [13] were formed and excite the illumination monitoring device, the output terminal of photodetector [13] links to each other with measurement instrument [5].
10. by the described long-afterglow fluorescent material tester of claim 1, it is characterized in that on specimen holder [6], being equipped with the temperature control element [15] of control specimen temperature.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 01254853 CN2537010Y (en) | 2001-11-21 | 2001-11-21 | Instrument for measuring long persistence fluorescent materials |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 01254853 CN2537010Y (en) | 2001-11-21 | 2001-11-21 | Instrument for measuring long persistence fluorescent materials |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2537010Y true CN2537010Y (en) | 2003-02-19 |
Family
ID=33664093
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 01254853 Expired - Fee Related CN2537010Y (en) | 2001-11-21 | 2001-11-21 | Instrument for measuring long persistence fluorescent materials |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2537010Y (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103344618A (en) * | 2013-06-27 | 2013-10-09 | 北京印刷学院 | Fluorescence excitation testing device |
| CN111505267A (en) * | 2020-04-28 | 2020-08-07 | 上海泰辉生物科技有限公司 | Time-resolved immunoassay detection system and detection method |
| CN111630373A (en) * | 2018-01-23 | 2020-09-04 | 浜松光子学株式会社 | Light measurement device and light measurement method |
-
2001
- 2001-11-21 CN CN 01254853 patent/CN2537010Y/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103344618A (en) * | 2013-06-27 | 2013-10-09 | 北京印刷学院 | Fluorescence excitation testing device |
| CN111630373A (en) * | 2018-01-23 | 2020-09-04 | 浜松光子学株式会社 | Light measurement device and light measurement method |
| CN111630373B (en) * | 2018-01-23 | 2023-05-05 | 浜松光子学株式会社 | Optical measurement device and optical measurement method |
| US11703389B2 (en) | 2018-01-23 | 2023-07-18 | Hamamatsu Photonics K.K. | Light measurement device and light measurement method |
| CN111505267A (en) * | 2020-04-28 | 2020-08-07 | 上海泰辉生物科技有限公司 | Time-resolved immunoassay detection system and detection method |
| CN111505267B (en) * | 2020-04-28 | 2023-05-12 | 上海泰辉生物科技有限公司 | Time-resolved immunoassay detection system and detection method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |