CN2482053Y - Semiconductor red laser distance and thickness measuring device without coordination object - Google Patents
Semiconductor red laser distance and thickness measuring device without coordination object Download PDFInfo
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- CN2482053Y CN2482053Y CN01238132.2U CN01238132U CN2482053Y CN 2482053 Y CN2482053 Y CN 2482053Y CN 01238132 U CN01238132 U CN 01238132U CN 2482053 Y CN2482053 Y CN 2482053Y
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 27
- 238000007493 shaping process Methods 0.000 claims abstract description 9
- 230000003321 amplification Effects 0.000 claims description 5
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 5
- 239000013307 optical fiber Substances 0.000 claims description 2
- 238000002844 melting Methods 0.000 abstract description 2
- 230000008018 melting Effects 0.000 abstract description 2
- 238000005259 measurement Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 230000033228 biological regulation Effects 0.000 description 1
- 238000006757 chemical reactions by type Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000005622 photoelectricity Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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Abstract
The utility model discloses a semiconductor red laser no fitting goal distance and thickness measuring device, which is a device for measuring the furnace lining thickness of a melting furnace online. The output end of a locked phase steady frequency circuit (4) of the device is respectively connected with an f <1> amplifying circuit, an f <2> amplifying circuit, and a phase discrimination circuit; the input end of a drive circuit is connected with the f <2> amplifying circuit, the output end is connected with a semiconductor red laser pipe; a cylindrical collimating lens is positioned at the output end of the semiconductor red laser pipe; the input end of a mixer is respectively connected with the f <1> amplifying circuit and the output end of an avalanche diode, the input end of the avalanche diode is connected with a telescope device, the light input opening of the telescope device is provided with a interference filter, and the output end of the mixer is connected with a frequency selecting amplifying circuit and a shaping circuit.
Description
The utility model is a kind of photoelectric detection system, especially a kind of device that the lining thickness of melting furnace is carried out on-line measurement.
It is a state-of-the-art technology that visible light does not have the target of cooperation Detection of Weak Signals technology, as far as we know, domestic still do not have this series products, the thickness measurer of furnace liner that has only Sweden Greotronics company to produce without competition abroad, it can substitute traditional in the past artificial visually examine's method at the on-the-spot thickness of accurately measuring furnace lining of steelshop or glass refinery.What swedish company was used is the He-Ne LASER Light Source.At present, the general laser range finder that uses, be to do light source with the semiconductor infrared light, it is (measured laser reflected detect with the reflecting prism) that cooperate target arranged and to have not yet to see report with range finding, thickness measuring system that the red laser of semiconductor visual is done light source.
Goal of the invention of the present utility model just provides that a kind of volume is little, cost is low, easy modulation, the red laser of semiconductor safe in utilization, that the life-span is long do not have the target of cooperation range finding measuring thickness device.
The red laser of semiconductor of the present utility model does not have the target of cooperation range finding measuring thickness device mainly to be made up of Laser emission part, signal receive section, signal processing part branch, and the output terminal of the phase locking frequency stabilized circuit of this device meets f respectively
1Amplifying circuit, f
2Amplifying circuit, phase discriminator, the input termination f of driving circuit
2Amplifying circuit, output termination semiconductor laser tube, the cylinder collimation lens is positioned at the output terminal of semiconductor laser tube; The input end of frequency mixer meets f respectively
1The output terminal of amplifying circuit and snowslide pipe, the input termination mounting of telescope of snowslide pipe, optical input at mounting of telescope is provided with interference filter, the output terminal selecting of frequency mixer is amplified and shaping circuit frequently, the input end of phase discriminator joins the output termination display of phase discriminator with the output terminal of frequency-selecting amplification and shaping circuit and phase locking frequency stabilized circuit respectively.
Advantage of the present utility model is to compare with equipment at present commonly used, has that volume is little, cost is low, an easy modulation, safe in utilization, advantage that the life-span is long, and concrete relatively is:
1. compare with the thickness measurer of furnace liner that Sweden Greotronics company produces, this kind instrument adopts He-Ne laser to do light source, and this is a kind of gas laser, compares with the red laser instrument of semiconductor that the present invention is used, and its volume is big, and the life-span is short, damages easily; Owing to use high pressure, discharge build-up of luminance, its poor stability; Use the external modulation technology to carry out the light intensity high frequency modulated, technical sophistication, cost height.Be to compare similar radio tube and the semiconductor electronic pipe then of difference therebetween with the semiconductor laser that the present invention uses in this respect.
2. compare with existing infrared range-measurement system, this instrument adopts infrared semiconductor laser pipe or semiconductor light-emitting-diode to do light source, send sightless infrared light, must place a reverberator at tested place during measurement, the infrared light reflection that instrument sends is returned to measure, be that the cooperation target measurement is arranged, this instrument can not be used for the kiln lining thickness measuring of production scene.Apparatus of the present invention use the semiconductor laser of visible red to do light source, the visible red that it sends is directly beaten on testee, by measured object the ruddiness diffuse reflection that device sends being returned to measure, is not have the target measurement of cooperation, only in this way just can be used for kiln lining thickness measuring.
Fig. 1 is a theory diagram of the present utility model.Comprising f
2Amplifying circuit 21, driving power 22, semiconductor laser tube 23, cylinder collimation lens 24; f
1Amplifying circuit 11, frequency mixer 12, snowslide pipe 13, mounting of telescope 14; Phase locking frequency stabilized circuit 4; Phase discriminator 31, frequency-selecting amplification and shaping circuit 32, display 33.
Fig. 2 is the electrical schematic diagram of the utility model signal emission part.Comprising f
2Amplifying circuit 21, driving power 22, semiconductor laser 23.
Fig. 3 is the electrical schematic diagram of the utility model signal receive section.Comprising f
1Amplifying circuit 11, frequency mixer 12, snowslide pipe 13.
Fig. 4 is the electrical schematic diagram of the utility model frequency-selecting amplification and shaping circuit 32, phase discriminator 31.
Embodiment of the present utility model is as follows:
One, the phase locking frequency stabilized circuit 4: mainly comprise transistor 2N1,2N2,2N3 Sheffer stroke gate 2U2A, 2U2B, 2U3A, 2U4,2U5.
Phase locking frequency stabilized partly provides the required local oscillation signal of total system, and (frequency is f
1), the master shakes, and (frequency is f to signal
2), and the difference signal f that shakes of this master
pAdopt degree of stability less than 5 * 10
-6, frequency is that the temperature compensating crystal oscillator of 15MHz is made local oscillator, behind 10000 frequency divisions, and the frequency f that obtains
pBe 1.500KHz.The master of the native system voltage controlled oscillator output signal frequency f that shakes
2=f
1+ f
p=15.0015MHz, it is sent to the Laser Driven power supply after amplifying by radio-frequency amplifier.Local oscillation signal is after high frequency amplifies, and the frequency that is sent to the reception of frequency mixer and snowslide pipe is f
2The measured signal mixing, take out its difference frequency signal through the low frequency frequency-selecting amplifier, be added to the input end of phase detector.f
pBe sent to phase detector as the reference signal.The main signal that shakes is followed the tracks of local oscillation signal by phase-locked loop and is carried out frequency stabilization.The frequency mixer of frequency locking part adopts MC1496, and voltage controlled oscillator adopts crystal oscillator and gets the basic and f of crystal oscillator frequency
1Approaching, phaselocked loop NE564.
Two, Laser emission part:
The Laser emission part is by f
2Amplifying circuit 21, driving circuit 22 and automatic optical power control circuit and semiconductor laser tube 23 constitute.This installs used semiconductor laser tube 2D4 model is HL6711G, and threshold current is 29mA, and the laser tube Maximum Power Output was 10mW when the electric current that passes through was 48mA.The master that phase-locked part the provides signal that shakes is delivered to the laser tube driving circuit after amplify isolating, make it to send the light signal of high frequency light modulation, driving circuit 1U1 is the continuous modulation circuit of a symmetrical balance, and wherein Vin is the input end of modulation signal, and 2N1～2N5 is middle power high frequency pipe.
The function of automatic light-operated circuit is when variation of ambient temperature, and the output power of laser instrument also will change, and by automatic change laser diode current size, keeps the constant of output power.
Three, photoelectricity receives and detects
This part is by interference filter 15, mounting of telescope 14, and snowslide pipe (APD) D2 forms.The snowslide pipe adopts GT231-A type optical fiber coupling Si to draw logical type low noise avalanche photodide (Si-RAPD).For solving the different operating temperature APD is added different reverses biased, it is constant substantially to increase the factor with the letter that keeps APD, the method that this device adopts is different from routine, but under the situation of the fixing interior circuit light intensity of APD, regulate the APD reverse biased, detect the low frequency distance measuring signal simultaneously, reach setting until the low frequency distance measuring signal, thus the gain of compensation APD.
The effect of interference filter is the parasitic light beyond the elimination 650-670nm wavelength, and system can be worked under white light.Mounting of telescope is used to receive the tested light signal that the measured object diffuse reflection is returned, and to improve receiving sensitivity, the mounting of telescope bore is 60mm, and focal length is 75mm.
Four, mixing, frequency-selecting amplification and shaping
Signal mixer Q2 adopts the 2SK127 mixer tube, and through mixing, the gained signal demand is selected useful difference frequency distance measuring signal by frequency selection network, by common shaping circuit it is shaped as the range finding square wave after amplifying.
The frequency selection network of this device adopts active filter, and it also can amplify signal in filtering, this device is made active device with operational amplifier, constitute multichannel reaction type second order active band pass filter, and strengthen filter effect, satisfy the system-gain requirement simultaneously with the two poles of the earth filtering.Filter parameters at different levels are designed to: centre frequency f
0=1.500KHz, quality factor q=14, the centre frequency gain is 10.
Five, phase discriminator 31 and display 33
Phase discriminator 31 is that distance measuring signal and reference signal are carried out phase-detecting, and measures phase differential between the two.This device adopts the method for numeral survey phase automatically, carries out phase measurement.E wherein
m, e
mBe complementary distance measuring signal; e
rBe reference signal, U
1Be this schmitt trigger 74HC132; U
2Be XOR gate 74HC86; U
3Be binary counter; U
4Be 74HC10, U
5Be phase place square wave control gate; U
6Be 8 binary counters.P3.5 (is T
1) be 8031 single-chip microcomputers, be used to survey the counting of phase number of times; P4.0 is counter U
6Clear terminal.
This device carries out the control and the commander of whole range measurement system with single-chip microcomputer, and its control total system sequential is in accordance with regulations carried out various work, undertakes data processing simultaneously and shows control.8 single-chip microcomputer 80C552 of 51 series high-performances that system's single-chip microcomputer adopts PHILIPS Co. to produce.The system display part is 7 seven sections LCD display.
The optical system of this device adopts the general optical system of general laser range finder (comprising electro-optical distance instrument), comprises that emission, reception, outer light path dim light and inside and outside light path change this several parts.
Claims (3)
1. the red laser of semiconductor does not have the target of cooperation range finding measuring thickness device, is made up of Laser emission part, signal receive section, signal processing part branch, it is characterized in that the output terminal of the phase locking frequency stabilized circuit (4) of this device meets f respectively
1Amplifying circuit (11), f
2Amplifying circuit (21), phase discriminator (31), the input termination f of driving circuit (22)
2Amplifying circuit (21), output termination semiconductor laser tube (23), cylinder collimation lens (24) is positioned at the output terminal of semiconductor laser tube (23); The input end of frequency mixer (12) meets f respectively
1The output terminal of amplifying circuit (11) and snowslide pipe (13), the input termination mounting of telescope (14) of snowslide pipe (13), optical input at mounting of telescope (14) is provided with interference filter (15), the output terminal selecting of frequency mixer (12) is amplified and shaping circuit (32) frequently, the input end of phase discriminator (31) joins the output termination display (5) of phase discriminator (31) with the output terminal of frequency-selecting amplification and shaping circuit (32) and phase locking frequency stabilized circuit (4) respectively.
2. the red laser of semiconductor according to claim 1 does not have the target of cooperation range finding measuring thickness device, it is characterized in that snowslide pipe (13) adopts optical fiber coupled mode Si to draw logical low noise avalanche photodide 3D2.
3. the red laser of semiconductor according to claim 1 and 2 does not have the target of cooperation range finding measuring thickness device, it is characterized in that semiconductor laser tube (23) 2D4 adopts model to be " HL6711G ".
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN01238132.2U CN2482053Y (en) | 2001-06-06 | 2001-06-06 | Semiconductor red laser distance and thickness measuring device without coordination object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN01238132.2U CN2482053Y (en) | 2001-06-06 | 2001-06-06 | Semiconductor red laser distance and thickness measuring device without coordination object |
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| Publication Number | Publication Date |
|---|---|
| CN2482053Y true CN2482053Y (en) | 2002-03-13 |
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ID=33650806
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN01238132.2U Expired - Fee Related CN2482053Y (en) | 2001-06-06 | 2001-06-06 | Semiconductor red laser distance and thickness measuring device without coordination object |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100388007C (en) * | 2004-08-05 | 2008-05-14 | 南阳孚达光电技术有限公司 | Binocular type laser distance measuring and speed measuring instrument |
| CN102419166A (en) * | 2011-08-17 | 2012-04-18 | 哈尔滨工业大学 | High-precision multi-frequency phase-synchronized laser distance measurement device and method |
| CN106907997A (en) * | 2017-03-17 | 2017-06-30 | 张家港市欧微自动化研发有限公司 | A kind of displacement measurement signal analysis method based on optic fiber displacement sensor system |
| CN106949838A (en) * | 2017-03-17 | 2017-07-14 | 张家港市欧微自动化研发有限公司 | A kind of optic fiber displacement sensor system |
-
2001
- 2001-06-06 CN CN01238132.2U patent/CN2482053Y/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100388007C (en) * | 2004-08-05 | 2008-05-14 | 南阳孚达光电技术有限公司 | Binocular type laser distance measuring and speed measuring instrument |
| CN102419166A (en) * | 2011-08-17 | 2012-04-18 | 哈尔滨工业大学 | High-precision multi-frequency phase-synchronized laser distance measurement device and method |
| CN102419166B (en) * | 2011-08-17 | 2013-08-21 | 哈尔滨工业大学 | High-precision multi-frequency phase-synchronized laser distance measurement device and method |
| CN106907997A (en) * | 2017-03-17 | 2017-06-30 | 张家港市欧微自动化研发有限公司 | A kind of displacement measurement signal analysis method based on optic fiber displacement sensor system |
| CN106949838A (en) * | 2017-03-17 | 2017-07-14 | 张家港市欧微自动化研发有限公司 | A kind of optic fiber displacement sensor system |
| CN106907997B (en) * | 2017-03-17 | 2019-04-26 | 为度科创检测技术（苏州）有限公司 | A kind of displacement measurement signal analysis method based on optic fiber displacement sensor system |
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| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |