CN2370547Y - High-temperature aging table for capacitor - Google Patents
High-temperature aging table for capacitor Download PDFInfo
- Publication number
- CN2370547Y CN2370547Y CN 97246388 CN97246388U CN2370547Y CN 2370547 Y CN2370547 Y CN 2370547Y CN 97246388 CN97246388 CN 97246388 CN 97246388 U CN97246388 U CN 97246388U CN 2370547 Y CN2370547 Y CN 2370547Y
- Authority
- CN
- China
- Prior art keywords
- relay
- aging
- connects
- board
- control board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000032683 aging Effects 0.000 title claims abstract description 55
- 239000003990 capacitor Substances 0.000 title claims abstract description 11
- 238000012360 testing method Methods 0.000 claims abstract description 39
- 238000005070 sampling Methods 0.000 claims description 26
- 238000012546 transfer Methods 0.000 claims description 6
- 230000008878 coupling Effects 0.000 claims description 3
- 238000010168 coupling process Methods 0.000 claims description 3
- 238000005859 coupling reaction Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- 238000011160 research Methods 0.000 abstract description 2
- 238000001514 detection method Methods 0.000 description 3
- 230000035882 stress Effects 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to a high temperature ageing table for condenser aging test, including the casing, be equipped with ageing power, high temperature box, ageing board in the casing, its characterized in that still includes the control panel that constitutes by the relay contact and the control appearance that has microprocessor, and ageing power passes through ageing board, control appearance connection control board, control power connection control appearance and control panel are connected to the control panel. Can be widely applied to capacitor production and use factories and research institutes.
Description
The utility model relates to a kind of capacitor high temperature ageing platform, is used for tantalum, mica, film, low Jie, metallization, aluminium electrolytic capacitor carries out high temperature load test, for the user capacitor is carried out burn-in screen and reliability test and analysis.
The capacitor testing equipment that the uses tested electrical verification containers (calling test product in the following text) that adopt connect aging power supply by fuse or resistance more at present, when test product breakdown, test current fusing fuse, need subsequently to show that this test product is a bad product when measuring when electric current is zero by manually ammeter being connected into one by one each test product current branch.Need after the off-test one by one the fuse of fusing to be changed.This equipment has following aspect shortcoming: one, automaticity is low, and labor productivity is low, the bad product position needs manual identified one by one, changes that fuse is more apparent wastes time and energy, and each aging test product quantity is restricted; Two, the blowout current error of fuse is bigger, has a strong impact on test accuracy; Three, all test product branch roads are cut together during aging electric current incision, and overall charging current is big, to the power requirement height of aging power supply, cause that equipment volume is big, cost is high; Four, big to some charging currents, and in fact do not have the test product of quality problems, fuse also can fuse, and causes erroneous judgement; Five, it is low to measure sensitivity, and prohibited data detection is true, and the measurement of the leakage current of test product is lacked precision.
The purpose of this utility model is to provide a kind of automaticity height, can shows the bad product position automatically, overall charging current is little, measure the good capacitor high temperature ageing platform of sensitivity.
The utility model comprises housing, aging power supply, high-temperature cabinet, burn-in board are housed in the housing, it is characterized in that also comprising control board that constitutes by relay contact and the controller that has microprocessor, aging power supply connects burn-in board by described control board, controller connects control board, and the control power supply connects controller and control board; Surface of shell is equipped with the display unit that is connected with controller.
That described control board comprises is aging, charging transfer relay J1, the incision of every station or break away from aging loop double as and detect gating array relay J 2, aging, busy relay J3; Controller comprises controlling of sampling test block, sampling resistor R1, R2; The output relay termination J1 and the current-limiting resistance R3 of aging power supply, relay J 1 connects burn-in board, relay gating array J2 and test product coupling, and relay gating array J2 succeeds electrical equipment J3, the contact A of relay J 3 connects sampling resistor R1 ground connection, and contact B connects sampling resistor R2 ground connection; The input termination sampling resistor R1 of controlling of sampling test block, input termination sampling resistor R2, that output 1 connects is aging, charging transfer relay J1, and output 2 connects every station incision or breaks away from aging loop double as and detects gating array relay J 2, output 3 connects aging, busy relay J3.
The utility model has the advantages that the automaticity height, can show the position of bad product automatically, saved manually, also need not to change fuse; Each test product branch road is cut one by one when charging, and totally aging electric current is little, and is little to the power requirement of aging power supply, can reduce the equipment integral volume, reduces cost; Because adopt microcontroller, leakage current, charging current measuring accuracy height to test product can improve test accuracy, the control erroneous judgement.
Further specify the utility model below in conjunction with accompanying drawing:
Fig. 1 is a circuit diagram of the present utility model
Fig. 2 is a circuit connection diagram of the present utility model
With reference to accompanying drawing:
The utility model comprises housing, aging power supply 1, high-temperature cabinet 6, burn-in board 2 are housed in the housing, also comprise control board 3 that constitutes by relay contact and the controller 4 that has microprocessor, aging power supply 1 connects burn-in board 2 by described control board 3, controller 4 connects control board 3, and control power supply 5 connects controller 4 and control board 3; Surface of shell is equipped with the display unit that is connected with controller 4.
That described control board 3 comprises is aging, charging transfer relay J1, the incision of every station or break away from aging loop double as and detect gating array relay J 2, aging, busy relay J3; Controller 4 comprises controlling of sampling test block CI, sampling resistor R1, R2, has microprocessor in the controlling of sampling test block CI, and resistance R 1 is less than R2; The output relay termination J1 and the current-limiting resistance R3 of aging power supply 1, relay J 1 connects burn-in board, relay gating array J2 and test product coupling, and relay gating array J2 succeeds electrical equipment J3, the contact A of relay J 3 connects sampling resistor R1 ground connection, and contact B connects sampling resistor R2 ground connection; The input termination sampling resistor R1 of controlling of sampling test block, input termination sampling resistor R2, that output 1 connects is aging, charging transfer relay J1, and output 2 connects every station incision or breaks away from aging loop double as and detects gating array relay J 2, output 3 aging, busy relay J3.
The course of work of the present utility model is as follows:
One, start armed state
Each relay of controlling of sampling test block CI control is in initial condition.This moment, J1 disconnected, and sealed in current-limiting resistance in the loop, and J2 is in closure state, and each aging station is in the aging loop, and aging loop is connected in the A position in the J3 contact.
Two, ageing state
The J1 closure.This moment, breakdown current was greater than rated value when puncturing when a certain station, and the employing resistance R 1 output short-circuit signal on the control board 3 is to the input of controlling of sampling test block CI.For the moment puncture, controlling of sampling test block CI disregards.When duration of short circuit continued for 1 second when above, detect the plate number of guilty culprit according to resulting supervisory signal, and output control signals to aging, the busy relay J3 of this plate through signal output part 3, make this plate enter short circuit and search state, determine short circuit capacitance.Thereafter, controlling of sampling test block CI outputs control signals to the relay J 2 that this station is connected through signal output part 2, cuts off the loop of this station in ageing system.Final system automatically reverts to aging monitored state, and next electric capacity repeats above process when puncturing.System also can reject and not puncture but the rapid electric capacity that increases of leakage current.This aging middle no longer closure of cut station in the time of aging the supervision, can be observed the distribution situation of short circuit puncture electric capacity on the every burn-in board by display screen.
Three, leakage current test mode
Test loop is promptly connected to B in the contact of J3 relay, and the projects such as the upper limit, detection speed of passage, the leakage current index of required detection can be set by keyboard, and current value that data display screen is surveyed also deposits print buffer in.Under this kind state, the controlled conducting in turn of J2 relay array, this moment, this plate J1 relay was in closure state, and test is in the low resistance loop.Aging electric current constant current point is automatically brought to 0.4A, and the device short circuit causes measurement loop overload in the test process to avoid.When patrolling and examining, per 8 elder generations are surely test more in advance, and shows corresponding station.
Can apply temperature stress, electric stress, time stress to test product with the utility model experimental rig, make test product expose latent defect rapidly, enter early failure period ahead of time, can be widely used in capacitor production, use producer, and research institute.
Claims (2)
1. capacitor high temperature ageing platform, comprise housing, aging power supply, high-temperature cabinet, burn-in board are housed in the housing, it is characterized in that also comprising control board that constitutes by relay contact and the controller that has microprocessor, aging power supply connects burn-in board by described control board, controller connects control board, and the control power supply connects controller and control board.
2. a kind of capacitor high temperature ageing platform as claimed in claim 1 is characterized in that described control board comprises aging, charging transfer relay J1, and every station incision or the aging loop of disengaging double as detect gating array relay J 2, aging, busy relay J3; Controller comprises controlling of sampling test block, sampling resistor R1, R2; The output relay termination J1 and the current-limiting resistance R3 of aging power supply, relay J 1 connects burn-in board, relay gating array J2 and test product coupling, and relay gating array J2 succeeds electrical equipment J3, the contact A of relay J 3 connects sampling resistor R1 ground connection, and contact B connects sampling resistor R2 ground connection; The input termination sampling resistor R1 of controlling of sampling test block, input termination sampling resistor R2, that output 1 connects is aging, charging transfer relay J1, and output 2 connects every station incision or breaks away from aging loop double as and detects gating array relay J 2, output 3 aging, busy relay J3.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 97246388 CN2370547Y (en) | 1997-12-09 | 1997-12-09 | High-temperature aging table for capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 97246388 CN2370547Y (en) | 1997-12-09 | 1997-12-09 | High-temperature aging table for capacitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2370547Y true CN2370547Y (en) | 2000-03-22 |
Family
ID=33954594
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 97246388 Expired - Lifetime CN2370547Y (en) | 1997-12-09 | 1997-12-09 | High-temperature aging table for capacitor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2370547Y (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100412558C (en) * | 2005-01-07 | 2008-08-20 | 统宝光电股份有限公司 | High temperature aging test device for display panel |
| CN104008885A (en) * | 2014-03-12 | 2014-08-27 | 宁波南车新能源科技有限公司 | Supercapacitor performance stabilization device and performance stabilization method |
| CN105572520A (en) * | 2015-12-16 | 2016-05-11 | 湖南耐普恩科技有限公司 | Test process of supercapacitors |
| CN112133558A (en) * | 2020-10-23 | 2020-12-25 | 无锡宸瑞新能源科技有限公司 | Thin film capacitor applied to flexible-direct power transmission system and production process thereof |
-
1997
- 1997-12-09 CN CN 97246388 patent/CN2370547Y/en not_active Expired - Lifetime
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100412558C (en) * | 2005-01-07 | 2008-08-20 | 统宝光电股份有限公司 | High temperature aging test device for display panel |
| CN104008885A (en) * | 2014-03-12 | 2014-08-27 | 宁波南车新能源科技有限公司 | Supercapacitor performance stabilization device and performance stabilization method |
| CN104008885B (en) * | 2014-03-12 | 2017-01-25 | 宁波中车新能源科技有限公司 | Supercapacitor performance stabilization device and performance stabilization method |
| CN105572520A (en) * | 2015-12-16 | 2016-05-11 | 湖南耐普恩科技有限公司 | Test process of supercapacitors |
| CN112133558A (en) * | 2020-10-23 | 2020-12-25 | 无锡宸瑞新能源科技有限公司 | Thin film capacitor applied to flexible-direct power transmission system and production process thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: HANGZHOU TONGCE MICROELECTRONICS CO., LTD. Free format text: FORMER OWNER: CAO JI Effective date: 20060407 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20060407 Address after: Hangzhou City, Zhejiang Province, 311231 South District of Xiaoshan economic and Technological Development Zone High Road No. 77 Patentee after: Hangzhou Tongce Micro-Electronic Co., Ltd. Address before: 310021 No. 88 Peng Pang Road, Zhejiang, Hangzhou Patentee before: Cao Ji |
|
| C17 | Cessation of patent right | ||
| CX01 | Expiry of patent term |